Bias Test
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Test Platform
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
Automate Functional Tests
GXtest
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With GXtest you can automate functional tests and find bugs in early stages. GXtest is easy to configure, use and maintain. It allows running the necessary tests to ensure the high quality of the generated software, finding errors when solving them is less costly.
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Product
Encoder Testing
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HEIDENHAIN offers testing and inspection devices for the adjustment and fault diagnosis of its encoders. The highly accurate inspection devices are universally deployable, capable of being calibrated and interposed within the closed control loop. The testing devices are primarily used for the functional testing and adjustment of encoders. HEIDENHAIN encoders deliver all of the setup, monitoring, and diagnostic data needed.
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Product
DC BIAS CURRENT UNIT
3265B SERIES
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To evaluate components at currents up to 125 A the 3265B DC Bias Units are used with either the Wayne Kerr 3255B series of Inductance Analyzers or the 3260B Precision Magnetics Analyzer. When one 3265B/25A or 3265BQ/25A DC Bias Unit is connected to an instrument up to 25 A of DC bias current can be set in steps of 25 mA with one unit. Additional DC Bias Units can be added such that with five units connected in parallel it is possible to set DC bias currents up to a maximum of 125 A DC.
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Product
Semiconductor Automatic Test
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Qmax Test Technologies Pvt. Ltd.
Semiconductor Automatic Test by QMax
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Product
Game Testing Service
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QAble delivers specialist game testing across gameplay mechanics, performance, device compatibility, multiplayer stability and platform certification, so your game ships with the quality that earns reviews, not refunds.
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Product
Alternate 0.66 (19.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-62J-6
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Level Testing Instrument
LIKON
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F. W. Breithaupt & Sohn GmbH & Co.KG
*Instrument to determine the sensitivity and precision of the level curvature in mounted or unmounted condition*Testing instrument for instruments up to 20kg*250x160mm tiltable base with micrometers*Measuring range +1500’’ bis -1000’’*Made in Germany
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Product
Compatibility Testing
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An application is incomplete if it is not compatible with the user environment so that the user can operate it
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1T1-7-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Playwright Testing Service
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QAble designs and builds Playwright frameworks with stable selectors, parallel CI execution, and architecture that your team can maintain and extend, not just a pile of scripts that pass today and break tomorrow.
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Product
Test Equipment
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Shenzhen Star Instrument Co., Ltd.
Star Instrument Test Equipment - reference meters, test analyzers, power supplies, and more.
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Product
Fatigue Test and Analyzer
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Fatigue Testing and AnalysisFatigue is the progressive and localized structural damage that occurs when a material is subjected to cyclic loading. Continued cycling of high-stress concentrations may eventually cause a crack which propagates and results in leakages.
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Product
IAC Test Light
3502
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Peaceful Thriving Enterprise Co Ltd
For GM1987 and newer GM model 700 TBI and PFI fuel infection system with flat 4-pin connector. For GM vehicles with throttle body or port fuel injection systems, check the electronic control module signal that provides direction to the idle air control motor.
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Product
IEC Testing
International Electrotechnical Commission
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F2 Labs can assist you in testing your electrical products to the applicable IEC standards. The IEC is the world’s leading organization for the preparation and publication of International Standards for all electrical, electronic and related technologies.
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Product
Test & Measurement Cables
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Our test & measurement cables provide customers with a competitive edge over ordinary cable designs by addressing three important criteria for testing electronic components and systems: phase stability, insertion loss stability and repeatable measurements for the cable’s useful life.
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Product
WEIGHING SYSTEM TESTING
1006
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The Tester 1006 has a simultaneous control function of up to 4 load cells in any weighing system, upload and download function for programming the DAT and MC 302 series instruments, but it can also be used as a Calibrator and Peak detector. It is very useful for the correct mechanical installation and for fault diagnosis. The Tester 1006 is supplied as standard with cable for connection to our junction boxes / sum mod. CEM 4 / C and CGS 4 / C. Simultaneous display of the signal of each individual load cell allows to control the entire weighing system, weight distribution, overloads, faulty cells and faulty connections. OUT OF PRODUCTION. Pavone systems provides a new version of Tester 1006: Tester 1008.
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Product
Test Probes and Pins
Probes
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Spring Loaded Test Probes for Circuit Board Testing, "Pogo Pins" Test Electronics sources and stockes a large variety of Test Probes and Spring Loaded Test Pins. Let our applications engineers help you find the correct pin for your test fixture application.
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Product
Soil Testing Complex
GEOMehanika-M
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The developed measuring complex for testing soils with "GEOMECHANIKA-M" stamps includes:Control and registration unit: measuring station based on NI cRIO equipment, MIDA overpressure sensor, wireless access point AWK-3131-EU-T, pneumatic system based on pneumatics CamozziLinear motion sensorsWireless Operator Console TestSet of connecting cables
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Product
Climatic Testing
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The climatics department of E-Labs offers a wide range of chamber sizes from 2 to 3,500 cubic feet. All chambers are equipped with digital controllers that allow for safe and accurate operation at any temperature or humidity level.
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Product
Leak Testing
T SERIES
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The new T series marks the evolution of the leak testers for the industry. A touch of innovation that fosters man-machine interaction thanks to the innovative tempered glass touch capacitive panel and other technological innovations that make the range, the natural evolution of the previous M series, the new benchmark for testing and proof brought.
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Product
Appium Automation Testing
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Appium automation for iOS and Android that runs reliably at scale. QAble builds Appium automation frameworks for native and cross-platform mobile applications, covering iOS, Android, React Native and Flutter, with real device and cloud execution integrated into your mobile CI pipeline.
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Product
High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1H-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Latch-on Test Fixtures
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Latch-on Test Fixtures provide a convenient way for production personnel to quickly and reliably make electrical connections to a product for programming or final test. These custom fixtures eliminate the need to hand-wire products in order to power them up and communicate with them. Typical applications for latch-on test fixtures are metering devices, control panels, and any type of controls that connect via terminal strips.
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Product
Test Set
TS® 30
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Recognized as the industry standard for basic test sets, the TS30 Test Set provides superior quality at an affordable price. With its high impedance Monitor for DataSafe™ operation, technicians can clip onto a line in Monitor mode without disrupting existing traffic.
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Product
Automotive Test Scopes
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Scientech Technologies Pvt. Ltd.
Automotive Test Scopes by Scientech
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Product
Physical Test Equipment
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When assessing a coating for suitability for a particular application the testing of the physical properties such as bendability, impact resistance, hardness, washability and abrasion resistance are all required to provide information for decision making. Testing of the pigments using fineness of grind gauges, determining the specific gravity of the coating using density cups, measuring the viscosity using viscosity cups or rotational viscometers and assessing the drying time all provide information for the coating technical data sheets.
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1T24-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
