Bias Test
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Jandel Test Unit
HM21
The Jandel HM21 Test Unit has six constant current settings between 100nA and 10mA, and can be used to measure voltages from 0.01mV to 1250mV.
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ATE & Test Systems
Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
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UAT testing
A successful UAT is crucial for deploying systems with no errors and business risks. However, implementing UAT in an agile environment might lead to frequent and reduced cycles of testing. This mandates UAT testers to develop skills of optimized testing techniques, automation and work in collaboration with the development and QA teams.
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Mechanical Testing
A range of processes including:Tensile and Compression Load TestingA test piece or component is subjected to tension (or compression) until either a proof load is achieved or failure occurs.Testing can be carried out on both metallic and some non-metallic materials.
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IL/RL Testing Platform
JW18001
Shanghai Joinwit Optoelectronic Tech,co.,Ltd
To meet the test requirements of MPO devices, we adopt the JW18001 optical device testing platform,JW1608 No-mandrel IL/RL tester module, JW1606 multi-channel optical switch module and form an integrated solution for MPO testing. The application of No-mandrel technique solves the problem that the multi-core optical device can not be winded and needs fiber matching cream, thereby the testing efficiency of the insertion loss and return loss of the multi-core / ribbon fiber has been greatly improved. At the same time, MPO applications can configure a variety of testing mode, test reports, threshold setting function, so multi-core optical device testing is no longer complicated.
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Optical Component Test
Test and characterize modern optical components, including photonic integrated circuits (PICs) and silicon photonics, with unmatched speed, precision and accuracy. Accelerate and improve your design or optimize your production with Luna’s suite of component analyzers and testers.
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Color Tests
LED-Check
LEDs are the standard light source in car cockpits. It is not sufficient to find out if a LED shines, or not. The LED needs to have precisely the specified brightness and color to fulfil its function.The FiberVision LED-Check system tests up to 250 LEDs in less than one second.
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Electrical Testing
Board defects are never an option. Your customer expects perfect boards, each time, every time. Electrical testing is the key in ensuring that the connectivity of a PCB is precisely as specified and that there are no defects or flaws that may cause problems down the line.
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Engineering Testing
At ARC, we know engineering testing, and with our in-house mixed signal test capabilities, we can get you the right test services for what you need. Working with our leveraged partnerships (National Instruments, Keysight and others), we can augment our standard capability with whatever test requirements you have for power, precision analog, high-speed digital, and RF testing up through to 50Ghz.
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Test Services
INFRAMET offers two types of services in field of electro-optical imaging systems: 1)Trainining and consulting; 2)Test services.
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Test Program Development
Today's System-On-Chip-designs require creative development of test system add-ons. Test vector converters for most common simulators are available. Our specification for test program development is available on request. Our specification for test program development is available on request.
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1I8-4-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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CFL Testing Instruments
CFL testing instruments of Lisun Group includes: High Frequency Fluorescent Lamp Test, Adjustable Reference Ballast, Digital Torsion Meter, Multiplex temperature tester, Lamp cap gauge, etc.
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Fatigue Test and Analyzer
Fatigue Testing and AnalysisFatigue is the progressive and localized structural damage that occurs when a material is subjected to cyclic loading. Continued cycling of high-stress concentrations may eventually cause a crack which propagates and results in leakages.
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Automated Testing System
PV-LIT
Thermographic solutions ensure high quality of solar cells and modules.Usable for all types of solar cells and modules (silicon-based or thin-layered)Testing in laboratory and in-line in the course of the manufacturing processTesting of various solar cells and modules through contact and non-contact measurementCell-specific system configuration and determination of test criteria and kind of defects
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Protocol Test System
USB Explorer 260
The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
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UAT Test Management
User Acceptance Testing is the final stage of the Software Development Life Cycle, which is conducted by the users. User Acceptance Testing is extremely important to determine whether the project is working fine as per the end user's point of view. The UAT test management process has to be done in an organized manner to reap maximum benefits from the process.
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OEM Test Leads
At your request , we can produce different test leads configurations with PCM, PCX, PCS Parrot Clips , silicone wire , banana plugs etc.
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Testing and Training Solutions
Teledyne LeCroy offers an broad array of testing services and educational training options. From advanced multi-day protocol training courses to device interoperability testing to calibration and testing service, Teledyne LeCroy offers valuable expertise, in-depth knowledge, leading edge testing solution, and top-notch engineers able help move your projects forward. Whether you need your team to come up to speed on the latest technology or you just need more hands getting your product tested and ready for market, we can help.
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Application Penetration Testing:
Penetration testing (or pen testing) is a simulated security exercise in which ethical hackers attempts to exploit the vulnerabilities of an application system (web or mobile). The objective of this exercise is to identify any possible loopholes present in the system’s defence mechanism which the real hackers could take advantage of. QA Mentor practices the following stages while exercising this:
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1T-2-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Factory Testing
Rosenberger Hochfrequenztechnik GmbH & Co. KG
Efficient factory testing is vital in order to achieve the tightest tolerances, maximum repeatability, high precisi- on and quality in the manufacturing processes, as well as long production machine lifecycles. What‘s more, it helps to reduce manufacturing costs due to minimized replacements, retesting processes, and recalibrations. Online CatalogApplication Notes
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Impact Test Apparatus
SCR Elektroniks make Impact Test Apparatus is used to test the Electrical Accessories / appliances for their mechanical strength.
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Disk Drive Test System
Saturn
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Mechanical Testing
Mechanical testing typically includes measurements of the physical properties of materials. These properties include strength, stress, stiffness, hardness, toughness, resilience, load-through-time or fatigue.
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Test Devices
qCf - quickCONNECT - efficient, accurate, safe!Measurements on internal components of the fuel cell and electrolysis
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No-metal Testing Machine
JINAN PRCISION TESTING EQUIPMENT CO., LTD
It is widely used in the manufacture, test and research dept. of plastic pipe, fittings, and sheet.
