Bias Test
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Test Contactor/Probe HEad
cRacer
The cRacer™ test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
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Stand-Alone Test Fixture
MA 2013/D/H/Pylon
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 24,00 kg
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Phase Noise Testing
The systems are based in the UK although testing for any company world wide will be undertaken.
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DSL/Gfast Test Software
Test Sentinel is a full suite of automated DSL and Gfast tools that allow a user to easily perform experiments and run standardized testing. This is the same set of tools used in our DSL and Gfast Testing Services to perform a wide variety of requests including Broadband Forum standardized tests and the Broadband Forum Gfast Certification.
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Product Testing
Cotton Electric Services, Inc.
Cotton Services is accredited through the National Association of Independent Laboratories (NAIL). Our Testing equiptment goes through a calibration process at least once a year and on-site tests are routinely performed by factory officials to ensure testing accuracy. Cotton Services Employees are certified in equipment maintenance and testing procedures. All products are tested at or above minimum test ranges set by the industry.
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Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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SSD Test Systems
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Function Test Fixtures
Modulized UUT BFT Test Fixture, Multilevel BFT Fixture, Over Clamp Test Fixture, Rack Mount Test Fixture, Self Contained Pogopin Test Fixture, Simple Low Cost PCBA Test Fixture, Tight Seal Required RF F/T Fixture, and more from IST Engineering
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Package Test
WinWay’s commitment to technology, quality and service ensures our interface solutions go above and beyond to exceed your expectations. Our products and services have a proven track record of delivering customer success in semiconductor testing. The Company offers comprehensive test interface solutions ranging from wafer-level test, package-level test to thermal management.
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1I8-4-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Wear Testing Machine
M-2000
Jinan Testing Equipment IE Corporation
Model M-2000 Wear Testing Machine is to be used test the anti-wear performance for metal and non-metal specimen under the sliding, rolling, and sliding-rolling condition. The Wear Testing Machine can also test various materials under dry-friction and wet-friction. The wear testing system can calculate friction work & friction coefficient by the data acquired. The Wear Testing Machine is widely used in universities, research & scientific institutes.
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Temperature & Humidity Testing
DATASYST Engineering & Testing Services, Inc.
DATASYST can simulate both high and low temperature with humidity conditions. Cycle rates are dependent upon individual chamber capabilities and whether or not a unit under test is powered or not. DATASYST provides humidity testing for a range of industry specifications and can work with you on your customized testing requirements.
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Judder testing machine
This machine is used to measure and evaluate friction characteristics such as temperature, frictional force, sliding velocity, etc. of steel plates, friction materials, ATF and additives of wet clutches.
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Automated Test Environment
AS5657-ATE
The AS5657 Automated Test Environment (AS5657-ATE) is designed to automate device compliance testing according to the SAE-AS5657 “Test Plan/Procedure for AS5643 IEEE-1394b Interface Requirements for Military and Aerospace Vehicle Applications”. The purpose of this tool is to automate and simplify the task of AS5643 compliance verification and testing, which of course is essential for device compatibility within avionics and aerospace programs.
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Continuous Testing Platform
Cycle
Cycle is a single continuous testing platform for your entire team. Other continuous testing solutions are designed for software development; focused on building software.
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Stand-Alone Test Fixture
MA 2011/D/H
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1000Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,00 kg
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Partial Discharge Test
INDIPORT
For medium voltage switchgear - partial discharge test in a few minutes - without shutdown.
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Test Software
Includes everything a test engineer needs to fully characterize his transistors from 10MHz to 110GHz in power and noise.
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testing facilities
Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Mechanical scanning of the component is required for the automatic imaging ultrasonic testing technology. Depending on the test requirements, the size and shape of the component and the required cycle times, we offer different solutions.
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Grid-Connection Testing System
This system is a power supply test system that performs grid-connection testing of distributed power sources (solar cells, fuel cells, gasoline engines, etc.)Enable inverter device testing that complies with the Agency for Natural Resources and Energy’s “Guidelines for System Interconnect Technical Requirements” and the Japan electrical Safety & Environment Technology Laboratories (JET) publication “Testing Methods for Small Solar Cell Power Generation System and System Interconnection Safety Devices”.
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Functional Test
Products and systems used to monitor and record data that characterizes the physical integrity and performance of aircraft, engines, and other large structures, as well as automate the functional testing of complex electronic systems.
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1T-2-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Network Performance Testing
From homes and offices through to production plants: everyone is looking at network service providers and equipment manufacturers to ensure outstanding network performance for work and play. Yet, what is ‘outstanding’ network performance’ all about?
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Spectroscopic Analyzer / Test
Optokey's products offer complete sample characterization solutions and yield situationally sensitive spectrum data and detailed insight into the elemental and molecular composition of the sample. These systems and proprietary software can be precisely tailored to customer's requirements to sense a wide range of analytes, including organics, heavy metals, and biomolecules (DNA, peptides, lipids, etc.) and other materials.
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Surge and Test Generator
STG 600
BAUR Prüf- und Messtechnik GmbH
Cable fault location with the BAUR STG 600. The STG 600 surge and test generator is a multifunctional cable fault locator for low voltage networks. The surge and test generator is used for cable testing as well as for precise location of high-resistive and intermittent faults in low voltage cables.* Specifically for use in low-voltage networks* High surge energy: 600 or 1000 J** Light, compact and transportable* Single systems for cable testing and faults location
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Test Clips
Angled Nose allows tight hold on 66 blockUse on 110 block with jumper and bed of nailsUse on larger cables with single piercing nail
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Metallurgical/Metallographic Testing
A partial view of our Metallurgical examination areas, showing metallurgical microscopes with digital filar micrometers. These instruments, along with our cross-sectioning and polishing equipment, make the Optical Metallography facilities at Pacific Testing among the most extensive in the industry. In addition, these facilites are under the supervision of our Chief Metallurgist, with a Ph.D. in Metallurgy.
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ADI Test Fixture
TA-6500
The TA-6500 test fixture combines the features of the OEM's Instrument Servo Tester(T307962), the Pointer/Flag Test Fixture(T307951) and the AD-650/600 Test Panel(T334043) all into one panel to facilitate testing of these Attitude Director Indicator's. The panel switches and adjustment pots are labeled to match the test procedure numbers and the duplicity in marking makes it easier for the technician to understand each function. The UUT interface is through a 96 pin zero insertion force(ZIF) type connector to minimize contact wear. The expanded localizer and nav input pins J2-34/35 are exposed on the panel to facilitate the insertion of a 200 ohm shunt when required. The fixtures rear panel has connectors for the required dual API/Synchro transmitter interface while the panel switches provide the correct routing of each.
