Bias Test
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Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
Test Instrument
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
110 GHz Frequency Extender, Pulsed DC Bias
N5293AX52
Frequency Extender
The Keysight N5293AX52 is a broadband frequency extension module designed for use with Keysight’s new PNA / PNA-X-based millimeter-wave solutions. It is a compact, lightweight, and ruggedize frequency extender module with built-in bias tee for pulsed DC bias operation. It interfaces with the Keysight N5292A test set controller. The modules allow users to extend the frequency coverage of a base PNA / PNA-X Series network analyzers to a range of 10 MHz to 110 GHz. For more information about cable and accessories for use with network analyzers, please visit Network Analyzer Accessories.
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Product
Dual Channel, Low-Noise DC Bias Card
PI-41701
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The PI-41701 is a dual channel bipolar DC Bias supply that can provide an output current up to 100 mA per channel. The output voltage ranges from –8 V to +8 V and features programmable current limits with LED indicators and software interrupt to show/alert the user if the channel is in current limit. This card has special filter circuitry to reduce the output noise for those applications that require a low noise bias output.
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Product
Configurable Functional Test System
ATS-5000
Test System
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
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Product
Regulators For Bias Supply
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Renesas' low cost linear regulators generate a low voltage bias supply from intermediate distributed voltages commonly used in telecom and datacom applications. These devices may be used as start-up or as continuous low power regulators.
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Product
NI Vehicle Radar Test System
Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Product
Memory Test System
T5830/T5830ES
Test System
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
In-Circuit Test System
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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Product
DC Bias Current Power Supply
TH1775
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Shenzhen Chuangxin Instruments Co., Ltd.
TH1775 is a DC Bias Current Source (or DC Magnetization Current Source) used for inductance measurement of inductors and transformer windings with DC bias current. Except for constant current output, low additional error and wide frequency response range are important for bias current inductance measurement. High frequency LCR meter could be used, when the frequency response range is wide enough. MPU controlled auto current balance technology is adopted to realize AC+DC current overlap and constant current output from 0 to ±20A. Two TH1775 can be paralleled to supply a maximum current up to 40A.TH1775 permits high frequency measurement up to 1 MHz and can be directly controlled by TH2816A, TH2817A, TH2818 and TH2819. TH1773/TH1775 with its low additional error, wide frequency response range and sweep output function is widely used in DC biased inductance measurement. TH1775 also provides a perfect solution for magnetic material analysis.
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Product
Bias T's
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Centric RF offers Coaxial Bias T's so that a DC voltage can be applied to the rf signal path. These Bias Tee's (aka bias t) currently are offered with sma and 2.92mm connectors. Bias T's are implemented by attaching a broadband inductor to the circuit trace, with the power rating of the bias tee being determined by the size of the inductor.
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Product
RF Bias Burn-In System
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These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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Product
Test Adapters / Aeroflex Test System
52xx / 5300
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We develop and manufacture test adapters for your existing interface including documentation and test program
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Product
Test System
DA-2 ATS
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The DA-2 ATS is an economical Commercial-Off-The Shelf (COTS) build-to-print tester. The test station is compliant with the published drawing package. The system does not include software.
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Product
Scope of Testing
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As of January 2018, the BACnet Testing Laboratories Working Group (BTL-WG) updated the BTL Testing Policies to state that all BACnet functionality in a product requires testing for BTL Certification of the product.
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Product
Electric Testing
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Our Capabilities*Dielectric Withstand*Hi-Potential Testing*Voltage Drop*Contact Resistance*Gate Leakage*Insulation Integrity*Dielectric Integrity
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Product
Test Benches
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Atec has made test equipment throughout all of its 65-year history. Test benches for aerospace and energy uses represent a significant segment of our experience. Atec has produced test benches involving hydraulics, mechanicals, electromechanicals, electronics, pneumatics, motors, and digital automation. Atec test benches have performed for challenging measurements, factory production, problem analysis and component overhaul scenarios. Today, complex test benches have capable data acquisition, control and communication systems integral in their electronics. Atec’s ADAQ™ system, based on COTS components and software, is proven and popular in test bench applications. DCUs, ECUs, FADECs and earlier analog or mechanical control units are easily interfaced.
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1I-6-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Hardness Testing
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DeFelsko offers handheld digital hardness tests in compliance with two different recognized hardness scales: Shore and Barcol. Our PosiTector SHD Shore Hardness Durometer is available in both Shore A and Shore D scale to measure the indentation hardness of non-metallic materials. The new PosiTector BHI Barcol Hardness Impressor is ideal for measuring the indentation hardness of soft metals, harder plastics and fiber-reinforced plastics.
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Product
CRM Testing
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QAble delivers specialist CRM testing across workflow automations, platform integrations, data migration, reporting accuracy, and UAT support, ensuring that your CRM implementation runs without failures that drop leads and corrupt pipeline data.
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Product
Semiconductor Test
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Tecap SPACE offers all the functions necessary to control test systems (ATE) for the semiconductor test. Tecap is hardware-independent and can be used with all customer-specific concepts.
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Product
Functional Test
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For a functional test the WEETECH test systems simulate reality and enforce switching operations that can only be tested in an embedded condition. In doing so voltages, currents, time intervals and other measurement categories are adjusted and switching sequences are processed in a way, it would happen in reality.
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1A-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Test Accessories
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For in-house designed ATE systemsFor any customer’s existing systemProviding complete electrically- and mechanically-designed units from the customer’s own specificationsUtilize our build-to-print services to duplicate your existing design
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1B-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1T1-6-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Test Prods
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Test prod with 4mm plug, test prod with 2mm pin, safety test prod, test prod 2mm, test prod 4mm, miniature test prod.
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Product
Safety Testing
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Whitelegg has over 80 years of experience in the design manufacture of market-leading electrical safety test equipment. Our unrivalled range of electrical test equipment serves a wide variety of safety testing and precision measurement applications for use in a variety of industries including manufacturing, construction, education, utilities, aerospace, calibration and anywhere else where there is a requirement for electrical safety testing or precision resistance measurement.Test equipment is cost effective, helps you to minimise expense, improve efficiency and increase profit. Whether you need electrical test equipment, environmental test, power analysers or HV Test Equipment, we stock the products to meet your demands, all backed by our first-class technical support if you have any problems using the equipment.
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Product
Connector Test
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A connector test system which provides expansion of up to 160 Kelvin pair connections. The system incorporates high voltage AC and DC power supplies with a maximum output of +/- 2100 Volts peak for Hi Pot, Insulation resistance measurement. LCR bridge control is provided with 4 terminal multiplexing in order to add precision capacitance, inductance and resistance measurement capability. An integral H.V. capacitor bias option permits capacitance measurement to be made at up to 2.1kV.
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Product
Wireless Test Standards Software
test
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license





























