Bias Test
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
Bias Tee's
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A bias "T" consists of a feed inductor to deliver DC to a connector on the device side and a blocking capacitor to keep DC from passing through to the receiver.
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Product
Millimeter Wave Zero Bias GaAs Schottky Diode
HSCH-9162
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The HSCH-9162 is suitable for medium-low barrier, zero bias detector applications. The HSCH-9162 is functional through W-band (110 GHz) and can be mounted in microstrip, finline, and coplanar circuits.
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Product
Electrification Testing Solutions
Test System
When looking for a partner to assist with your electrification testing or power electronics testing challenge, Ball Systems has the expertise and experience to ensure your energy storage or power conversion project moves forward efficiently.
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Product
Flexible Cable, 2.4 Mm To 3.5 Mm
85134H
Test Port Cable
The Keysight 85134H is a 62.9 cm (24.75 in) long1 flexible cable with a 2.4 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.31 * sqrt (f) + 0.2 (where f is frequency is GHz) for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 2.5 inch radius. Stability1 of the Keysight 85134H is less than 0.12 dB and phase is less than 0.13o * f + 0.5o, (where f is frequency in GHz).
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Product
Portable, Integrated O-Level Test Platform
Guardian™
Test Platform
Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
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Product
In-Circuit Testing and Test Engineering
Teradyne Z1820
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2048 Pure Pin Test Nodes3 & 6-wire Analog MeasurementsVector Test for VLSI, PLCC’s & ASICSMultiscan II Vectorless TestingIEEE Functional Interface BoardLarge Custom Vector Library
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Product
In-Circuit Testing and Test Engineering
GenRad 2287
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3560 Hybrid Test NodesWindows InterfaceTotal GenRad 227X Migration Capability20 Mhz Clock, Sync, and Trigger, 5 Mhz data ratesVector Test for VLSI, PLCC’s & ASICSTest Express Vectorless TestingMultiple Chain Boundary ScanAnalog Functional Test Module
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Product
Regulatory Testing
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At Mobile Power Solutions, we’re focused on battery testing solutions. Our state-of-the-art lab and experienced engineering team are fully equipped to ensure your battery systems meet today’s rigorous regulatory requirements. We are ANAB accredited to ISO/IEC 17025:2017.
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Product
Bias Tees
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Mini-Circuits is your complete source for bias tees, handling up to 4 Amps DC and covering 100 kHz to 12 GHz!Rugged coaxial modelsTiny surface mount packages as small as 0.15 x 0.15 inExcellent isolation50 and 75 Ohm models
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Product
Test Capabilities
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Eltek International Laboratories
ELTEK Labs has conducted more Electrical Insulation Systems (EIS) and Component Compatibility Testing (CCT) than all other laboratories worldwide combined. ELTEK Labs is proud to be a Third-Party Testing Laboratory for internationally recognized certifying bodies.
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Product
Structural Testing
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Structural testing is used to verify the static strength, or fatigue strength, of a component by applying measured loads. Testing can be done to failure, to contractual requirements, or to validate finite element model predictions.
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Product
Weld Testing
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Supports industries such as Aerospace, Nuclear, Automotive, Commercial Fabrication etc.Welding procedure consultancy and approvalWelder qualification test and codingWelding procedure certificationWelder performance qualificationOn site welding invigilationOffers a complete range of destructive and non-destructive testing facilities.Responsible Welding Co-ordinators available for customer supportCAA Weld Specimen SignatoriesCSWIP Approved Inspectors
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Product
Test Set
TS® 30
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Recognized as the industry standard for basic test sets, the TS30 Test Set provides superior quality at an affordable price. With its high impedance Monitor for DataSafe™ operation, technicians can clip onto a line in Monitor mode without disrupting existing traffic.
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Product
Test Technology
GLP3
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The GLP3-Windows®-testers are our premium testers to test a variety of different complex products. They are preferably used to test electric component groups, run-in test benches, power supplies, cables, washing machines and more and are ideally suited for complex test benches and inerlinkes assembly- and test lines.
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Product
Four Channel Low-Noise DC Bias Card
PI-41702
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The PI-41702 is a four channel bipolar DC Bias supply that can provide an output current up to 100 mA per channel. The output voltage ranges from –8 V to +8 V, and this card has special filter circuitry to reduce the output noise for those applications that require a low noise bias output. Additionally there is a ‘D’ type connector that allows the introduction of laboratory type supplies to reduce the noise further. To change from using the internal power supplies to external power supplies requires repositioning jumpers. The PI-41702 also has voltage and current sense for remote measurement of the voltage and current levels.
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Product
Automated Testing
TestComplete
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Got an aggressive testing schedule? No problem. With this automated testing tool, designed for advanced and novice testers alike, you can create, manage and run tests for any desktop, Web or rich client software. Revel in the easy-to-use interface and script-free testing combined with a powerful set of customization features.
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Product
Test System
BMS HIL
Test System
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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Product
Test Equipment
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H-S Precision is known around the world for our precision rifles and extremely accurate barrels. Engineered from the smallest of details, our team can design custom fixtures for many types of special application testing in addition to supplying standard test equipment. Below are a few of our most popular equipment products that are designed, engineered, and manufactured at our factory in Rapid City, South Dakota.
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Product
Nondestructive Testing
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BMP Testing and Calibration Services Inc.
Achievement is a construct, or rather a phenomenon, which everyone wishes to be a part of. Everyone seeks success to be the best, well-known, and well settled in life. This is why we want to excel in our lives by choosing a promising career for our future.
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Product
Battery Test
1260
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*Basic Battery Load Test*Battery Analysis*Mac*Test*Bad Cell Indicators*Testing the Starter Motor*Low Temperatures Effects
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Product
Cannabis Testing
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Sartorius offers a variety of high-quality products that ensure most accurate test results and allow your testing lab to run smoothly at all times. Our products not only support you in performing super-fast determination of your samples’ moisture and weight, but also in the process of safely preparing of your samples for analytical or microbiological analysis. Our software supports your data integrity through enhanced security settings.
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Product
Testing And Simulation
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Uni- and bidirectional power supplies for testing and simulating batteries, fuel cells, electric drive trains and other components.
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Product
Semiconductor Testing
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Teradyne’s semiconductor test portfolio is transforming the way you test chipsets for automotive, industrial, communications, consumer, smartphones, and computer and electronic game applications. Semiconductor devices span a broad range of functionality, from very simple low-cost devices such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors as well as memory devices.
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Functional Testing and Test Engineering
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Customer-supplied or developed in-house• Ruggedization of existing (lab-built) fixtures• Co-develop hardware/software• Deployment, implementation, and training• Engineering evaluation tools• Design verification• Medical device evaluation• Manufacturing test systems• Verification test systems• Go/No-go tests• Serialization, recordkeeping, and datalogging• Troubleshooting failed units with other test platforms
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Product
Light 0.48 (14.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-62I8-2-S
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Temperature Test
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Function and safety under extreme conditions. In the field of environmental simulation, ENGMATEC offers a wide range of efficient systems for quality assurance, development and production.
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Product
Tunnel Diode Zero Bias Detectors
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A tunnel diode zero-bias detector is a device that converts microwave and millimeter-wave radio frequency (RF) signals into a DC voltage without requiring an external power source
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Product
EMI/EMC Testing
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This type of testing is required for devices, systems, and applications within the military and aerospace industries. Weapons, aircraft, ground and support equipment, electrical, and electronic systems must meet the established requirements.During electromagnetic interference the component's electrical circuit is affected due to either electromagnetic conduction or electromagnetic radiation from an external source.





























