Bias Test
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Product
Prototyping & Test Consulting Services Solutions
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Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Asynchronous System Level Test Platform
Titan
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The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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High-Power Low-Loss Pulsed Bias Tees
MBT series
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The MBT-series of bias tees is based on Maury's patented broadband capacitor (US Patent 9,614,267) which simultaneously enables the industry's widest bandwidth, lowest insertion loss and lowest return loss in a coaxial bias tee up to 18 GHz. In addition, its unique design makes it ideal for pulsed applications, including pulsed IV and pulsed load pull characterization, without distorting the voltage and current waveforms.
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Semiconductor Test Software
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Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Environmental Control System Test Platform
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The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
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Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
PCI Express 4.0 Test Platform
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The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
110 GHz Frequency Extender, Pulsed DC Bias
N5293AX52
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The Keysight N5293AX52 is a broadband frequency extension module designed for use with Keysight’s new PNA / PNA-X-based millimeter-wave solutions. It is a compact, lightweight, and ruggedize frequency extender module with built-in bias tee for pulsed DC bias operation. It interfaces with the Keysight N5292A test set controller. The modules allow users to extend the frequency coverage of a base PNA / PNA-X Series network analyzers to a range of 10 MHz to 110 GHz. For more information about cable and accessories for use with network analyzers, please visit Network Analyzer Accessories.
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Test Handler
M4841
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High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
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Product
SAS Protocol Test System
Sierra M124A
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The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
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NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Custom Test System Solutions
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No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Disk Drive Test System
Saturn
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The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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In-Circuit Testing and Test Engineering
Teradyne Z1890
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2048 Pure Pin Test Nodes3 & 6-wire Analog MeasurementsVector Test for VLSI, PLCC’s & ASICSMultiscan II Vectorless TestingIEEE Functional Interface BoardLarge Custom Vector Library
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Zero Bias Schottky Detectors
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Fairview Microwave’s line of coaxial packaged zero bias Schottky detectors feature matched inputs for excellent VSWR, voltage sensitivity levels that range from 100 to 500 mV/mW for small signal detection, negative video output polarity, and can withstand maximum input power levels up to +20 dBm CW. Operating temperature range covers 0°C to +90°C and storage temperature of -65°C to +125°C. These zero bias Schottky detectors utilize compact cylindrical package outlines that are made of passivated stainless steel and offer a variety of popular input/output SMA and BNC connector configurations that make them ideal for use with precision test and measurement, instrumentation, and subsystems assemblies. Numerous applications include power measurement, leveling pulsed signal sources, AM noise measurements, radar or missile guidance systems, monitoring system level performance, and pulsed RF measurements.
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Memory Test System
T5851/T5851ES
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The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
High Power Switch and Bias Module
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Macom Technology Solutions Holdings Inc.
MACOM’s High-Power Switch and Bias modules are extensively used in 4G and 5G TDD base stations as well as aerospace and defense applications. The PIN Diode Switch features high power handling, low insertion loss, and super board band performance. The integrated bias controller utilizes a boost circuit and provide the driver circuitry to the switch. The modules require only a single 5 V supply, and a single TX / RX control signal which greatly reduced the customer design complexity.
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Memory Test System
T5833/T5833ES
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T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Testing
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Underwriters Laboratories Inc.
Our independent, rigorous testing process helps ensure that your products align with applicable requirements and expectations. We deliver innovative, customized options that aim to streamline testing processes, reduce costs and help speed products to market around the world. And our global team’s knowledge helps you stay ahead of the curve on evolving requirements, materials and technologies.
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Test Software
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With many years of experience solving real world applications, Circuit Check has acquired extensive software expertise. Our attention to code quality and optimization, as well as our internal code review process, ensures our customers receive efficient and readable code.
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Qualification Testing
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Qualification, functional, and operational testing are important steps in evaluating how well spacecraft, launch vehicles, and other mechanical/electrical systems perform under severe loading conditions that occur during launch and operation.
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HIGH FREQUENCY DC BIAS
6565 SERIES
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The 6565 HF DC Bias Unit is a specialized accessory designed to work seamlessly with the Wayne Kerr 6500 series analyzers, including both the 6500B Precision Impedance Analyzer and the 6500P HF LCR Meter. Its primary function is to supply DC bias current to the Device Under Test (DUT) during AC measurements, enhancing the testing capabilities of the 6500 series analyzers for comprehensive component analysis.
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Test SIP
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VoIP, Video, and IPTV products must withstand and continue to function when facing all the conditions that occur on the Internet. These include attacks from hackers exploiting vulnerabilities in security and protocols as well as the common phenomenon of congestion, delay, jitter, drops, and so on. VoIP, Video, and IPTV products must demonstrate robustness and resiliency in the face of unusual and/or illegal conditions.
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Conformance Tests
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According to german Duden conformance means ‘in agreement, accordant’ (from Late Latin conformitas – similarity). Any check on compliance of a test object with its specification can therefore be regarded as a conformance test. A conformance test has become established in the field of networked systems.
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Loudspeaker Testing
TTC
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The weakest link in your measurement chain is your chamber, the new TTC chambers solve these problems...*Anechoic chambers have massive footprints:The TTC gives you equal or better results with a compact footprint*Achieving repeatable measurements is difficult in an anechoic chamber:The TTC guarantees the microphone and loudspeaker positions*Anechoic chamber accuracy suffers at low frequencies:The TTC is capable of measuring below 20 Hz*Results are not transferable between most test chambers:The TTC meets international standards IEC 60268-21:2018 & IEC 60268-22:2020*Most chambers are difficult to calibrate and awkward to use:The TTC is calibrated and is ready to interface to your microphone and analyzer
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Test System
Tessy
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TESSY automates the whole unit test cycle including regression testing for your embedded software in C/C++ on different target systems. As an easy-to-install and easy to operate testing tool TESSY guides you through the unit test workflow from the project setup through the test design and execution to the result analysis and reporting. TESSY takes additionally care of the complete test organization as well as the test management, including requirements, coverage measurement, and traceability.
