Bias Test
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Product
Testing
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Apogee Labs offers a wide variety of modular chassis types used for test applications with various Data Link Test Modules.
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
110 GHz Frequency Extender, Pulsed DC Bias
N5293AX02
Frequency Extender
The N5293AX02 is a compact and broadband frequency extender with built-in pulsed bias-tee and provides 10 MHz to 110 GHz single-sweep measurements with N5292A test set controller systemized with a PNA/PNA-X B vector network analyzer.
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Functional Testing and Test Engineering
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Customer-supplied or developed in-house• Ruggedization of existing (lab-built) fixtures• Co-develop hardware/software• Deployment, implementation, and training• Engineering evaluation tools• Design verification• Medical device evaluation• Manufacturing test systems• Verification test systems• Go/No-go tests• Serialization, recordkeeping, and datalogging• Troubleshooting failed units with other test platforms
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Product
In-line High-Density ICT System Series 7i
E9988GL
In-Circuit Test System
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Product
POGO-1 High Performance Bias Ball Probe
POGO-1
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
DC BIAS CURRENT UNIT
3265B SERIES
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To evaluate components at currents up to 125 A the 3265B DC Bias Units are used with either the Wayne Kerr 3255B series of Inductance Analyzers or the 3260B Precision Magnetics Analyzer. When one 3265B/25A or 3265BQ/25A DC Bias Unit is connected to an instrument up to 25 A of DC bias current can be set in steps of 25 mA with one unit. Additional DC Bias Units can be added such that with five units connected in parallel it is possible to set DC bias currents up to a maximum of 125 A DC.
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Product
Test Fixture
16047E
Test Fixture
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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Product
Semiconductor Testers
Test Instrument
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Product
2m BNC Test Cable
16048D
Test Port Cable
The 16048D test leads extend the measurement port with a 4-terminal pair configuration. It provides a BNC female connector board to allow attachment of user-fabricated test fixtures.
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Product
ESD Testing & Latch-Up Testing Services
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EAG is an industry leader in ESD testing (Electrostatic Discharge) and Latch up testing. Our highly experienced engineering team use their industry leading knowledge and years or real world experience of the latest semiconductor technologies, circuit design, and device physics to optimize our customer's ESD and latch-up results. Human Body Model (HBM) and Machine Model (MM), Charged Device Model (CDM), Latch-up, Transmission Line Pulse (TLP).
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Product
Disk Drive Test System
Saturn
Test System
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Product
Bias Networks
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RF and microwave bias networks are used in a wide variety of biasing applications for test and measurement requirements in laboratory and production environments. Bias networks provide the means of supplying DC bias to the center conductor of the coax connector for your device while blocking the DC to the RF ports.
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Product
Magneto-electric Testing
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An exciting new area of scientific exploration examines the potential usefulness where magnetic field effects occur simultaneously with ferroelectric effects in materials and structures. Where these two properties, ferromagnetism and ferroelectricity, are coupled in the same material, the material is called a multiferroic. Radiant offers Magnetoelectric response bundle/software package to measure the magnetic coupling of multiferroic or magnetopiezoelectric devices.
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Product
Zero Bias Schottky Detectors
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KRYTAR Zero Bias Schottky Detectors are specifically designed for use in today's high-performance microwave instrumentation and systems. KRYTAR detectors are designed for such applications as power measurements, analyzing radar performance, leveling pulsed signal sources, AM noise measurements, system monitoring and pulsed RF measurements in ultra-broadband and mm-Wave applications.
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Product
Continuous Testing
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Continuous testing is the practice of embedding quality through every phase of the software delivery lifecycle - from planning to production. The goal is to ensure that testing continuously reduces risk and improves application quality.
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Product
Camera Testing
SWIR
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CI systems' SWIR turn-key test stations simulates low light conditions to test special application cameras. An intuitive user friendly software carries out a variety of tests. The test stations are radiometrically calibrated to perform comprehensive SWIR tests.
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Product
Electrical Testing
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Our diverse Electrical Laboratory capabilities include measurements from DC to 20 GHz. The equipment assigned to the laboratory is among the most accurate available for the specific measurements of interest. We believe it is the most comprehensive range of testing disciplines of any laboratory in our industry.
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Product
Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Functional Test
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Product
Ultrasonic Testing
Pundit 250 Array
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The Pundit 250 Array brings a quantum leap in the ultrasonic pulse echo testing. A number of unique innovations make the Ultrasonic multi-channel instrument the best and fastest solution for thickness measurements, detecting defects and localizing objects which cannot be easily detected by any other technology. This includes the assessment of thick concrete elements such as tunnel linings as well as pipes and tendon ducts beyond the rebar layer.
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Product
Vibration Testing
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Sanwood Environmental Chambers Co ., Ltd.
Sanwood , a 23 years of professional Vibration Test System for Automotive parts, vibration table, vibration machine, Electromagnetic vibration table, Vibration Test Chamber manufacturers
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Product
Test Sockets
MEMS Device
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Patented MEMS Sockets from Ardent Concepts use a unique scrubbing action contact set which is ideal for today’s sensitive MEMS devices, including accelerometers, gyroscopes, MEMS microphones and other specialized devices used in mobile electronics applications
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VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
Test Leads
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PMK Mess- und Kommunikationstechnik GmbH
It is used to test and measure the current in a circuit. These are simple devices which are coated and colored to indicate positive and negative with the device connector on one end.
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Product
Dissolution Testing
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Dissolution testing determines the release rate of an active pharmaceutical ingredient in tablet or capsule form as it dissolves into solution.
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Product
Insulation Testing
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Insulation resistance testing is used as a quality control measurement.
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Product
Test Container
MTL 15 | VP 700006
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Maschinenbau Haldenwang GmbH & Co. KG.
The MTL 15 test container works completely independently thanks to the optionally available, fully integrated power generator. Equipped with a hydraulic set-down device including cable remote control, the test system can be set up within 15 minutes and is therefore ideal for changing locations.
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Cloud Testing
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Cloud-based platforms are increasing enterprises’ ability to reduce time-to-market drastically along with eliminating upfront costs. This has led to increased interest in the adoption of cloud-based solutions. However, it brings unique challenges related to data security, privacy, integration, and application performance. These require comprehensive cloud-based testing to ensure your cloud implementations are successful and you realize complete benefits from the cloud solution.
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Product
Testing solutions
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From Manual Testing, to test automation Ideabytes Inc is a one stop shop for all testing needs. Among the specialities Model Based Testing that changes the approach to testing reducing cost and catching faults early. With our methodologies, automated test cases are ready just as the developers are releasing their code. Contact us for a free consultation!





























