MIxed Signal Test Systems
See Also: Mixed Signal, Mixed Signal ATE, Mixed Signal Oscilloscopes, Mixed-Signal Test, Mixed Signal Testers
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Product
Signal, Contact, Receiver, QuadraPaddle, 5 Amp, Male Adapter, .025" Square Post for Wire Wrap
610138118
Signal Contact (Receiver)
Primary mating contact 610138200. (May mate with other Twin Female contacts, as well.)Available in twin-female, crimp/solder, twin male, and wire-wrap design, QuadraPaddle contacts are engineered for flexible interconnect options. Rated at 5 amps continuous (1250 VAC) with a 2 ounce insertion force, QuadraPaddle contacts provide 4 reliable points of contact per pin, outstanding electrical performance, and low mating force.Specifications Operating Voltage & Current 5 Amps Max. Continuous; 600 volt Max. use of wire Mil-W-16878/4Contact Resistance 25 mOhms Max.Measured at 50 mV @ 100 mADielectric WithstandingVoltage (DWV) 1500 VDC Min.Insulation Resistance 5000 MOhms Min.Contact Body BrassContact Plating 30µ” Au over 100µ” NiCycle Life 20,000 CyclesRoHS Directive 2011/65/EU Status CompliantREACH Article 33 Status CompliantECHA Article 59 of Reach Regulation CompliantAVG Mating Force (lbs) 0.24
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Product
Test Requirements Document (TRD) System
TRD Software
System
The Test Requirements Document (TRD) System helps users develop and document the strategy and structure of test programs.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Signal Integrity Test Products
RoBAT RCI
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*TDR & TDT, Measurement Capabilities*Impedance, Skew, Backdrill measurements*Automated Optical Inspection*DC Electrical Test*Now available with 4 heads*24 port (1 port per channel) TDR/TDT unit*Future capabilities – Fully automated VNA test (4 port S-Parameter Measurement)
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Product
PXIe-5654, 10 GHz or 20 GHz RF Signal Generator
783126-01
RF Signal Generator
The PXIe‑5654 features an ideal combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe‑5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications.
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Product
3GHz RF Analog Signal Generator Module
LS3081D
Signal Generator
The LS3081D, 3GHz Single Channel RF Analog Signal Generator, offers industry leading performance, combined with a compact small footprint form factor. The LS3081D features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The LS3081D was designed to offer excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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Product
Optics Test Systems
Scientific Instrument Engineering
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Optik Elektronik Gerätetechnik GmbH
Development, design, manufacture and assembly of opto-mechanical assemblies and complete devices, including software.
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Product
Dual Sensor Enhanced Vision Systems
EVS
System
Enhance your safety and situational awareness while flying with Max-Viz dual sensor enhanced vision systems (EVS) from Astronics. These multi-spectral imagers include a long wave infrared sensor, a visible light + near infrared sensor, and patented blending and dynamic range management image processing to enable pilots to see clearly during day and night.
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Product
PXI Vector Signal Transceiver
Vector Signal Transceiver
The PXI Vector Signal Transceiver (VST) combines the flexibility of a software defined radio architecture and RF instrument class performance. You can use the VST to test a variety of cellular and wireless standards, and you can easily expand the VST's three-slot, 3U PXI Express form factor to support multiple input, multiple output (MIMO) configurations. The VST software is built on LabVIEW FPGA, and features several starting points for your application including application IP, reference designs, examples, and LabVIEW sample projects.
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Product
Test Cell System
qCf FC50/125
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qCf: Our revolutionary test cell system for the professional characterization of fuel cells.
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Product
Immunity Testing Systems
CIS Series
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The CIS series test systems are configured to perform conducted immunity testing according to IEC 61000-4-6. The system includes an ACS series power amplifier, coupling/decoupling Network (CDN), directional coupler, 150Ω to 50Ω adapters, power attenuators, cables and [optional] CSAT software. These systems, when properly configured, are capable of testing your products to all levels given in IEC 61000-4-6 up to 230 MHz. You can choose from three systems. Follow the links below for detailed information, including a comprehensive datasheet listing system specs.
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Ultrasonic Testing Systems
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Matec Instrument Companies, Inc.
Matec designs and constructs a wide range of ultrasonic testing systems, from small laboratory systems designed for simple scanning applications to complex multi-axis systems capable of scanning large parts and complex contour geometries. Click on the links below to learn more about our systems.
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Product
Mixed Signal Oscilloscope 100 MHz, 2 Analog Plus 16 Digital Channels
MSOX3012G
Oscilloscope
The MSOX3012G 100 MHz oscilloscope provides 2 analog plus 16 digital channels, 4 Mpts memory, 1,000,000 waveforms/sec update rate, zone touch trigger with an 8.5-in capacitive touch screen, and standard embedded software with waveform and measurement histograms.
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Product
Multipurpose Mobile PXI DAQ System
System
The mobile DAQ system achieves seamless integration among signal conditioning, data acquisition, and synchronization that benchtop instruments would not have achieved. By choosing this system over using benchtop instruments, United Technologies Research Center saved hundreds of thousands of dollars.
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Product
Semiconductor Test System
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IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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Product
Nanomechanical Test System
Hysitron TI Premier
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Bruker’s Hysitron TI Premier nanoindenter was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides a broad suite of nanoscale mechanical and tribological testing techniques.
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Product
Signal, Contact, Receiver, QuadraPaddle, 5 Amp, 22-28 AWG, 50µ” Au, Crimp
610138116
Signal Contact (Receiver)
*Please note: The difference between this p/n and 610138216 is the amount of gold plating. See below.P/n 610138116- 50µ" AuP/n 610138216- 30µ" AuPrimary mating contact 610138112. (May mate with other ITA contacts, as well.)Specifications Operating Voltage & Current 5 Amps Max. Continuous; 600 volt Max. use of wire Mil-W-16878/4Contact Resistance 25 mOhms Max.Measured at 50 mV @ 100 mADielectric WithstandingVoltage (DWV) 1500 VDC Min.Insulation Resistance 5000 MOhms Min.Contact Body BeCuContact Plating 50µ" Au over 100µ" NiCycle Life 20,000 CyclesRoHS Directive 2011/65/EU Status CompliantREACH Article 33 Status CompliantECHA Article 59 of Reach Regulation CompliantAVG Mating Force(lbs) 0.24
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Product
Meter Test Systems
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We offer a huge variety of products for meter testing. From the smallest device with the size of a single-phase meter up to customized semi-automatic systems with more than 40 test positions.
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PIM Test Systems
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AWT's Portable PIM testers are powerful yet compact tools for testing and analyzing telecommunications network infrastructure. These testers are ruggedized and can withstand harsh environmental conditions. they are accurate, reliable and easy to operate and they provide a wealth of features ideal for work in the field. Built-in Distance-to-PIM option.
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Product
Smart Aircraft System
System
The Astronics Smart Aircraft System makes that possible. Our patented system enables the immediate, cabin-wide gathering of thousands of data points using sensors & IoT (Internet of Things) technology. The result? You get the insight you need—when you need it. Insight that helps you on every flight. Insight that allows you to improve your operational efficiency, your cabin safety, and your overall passenger experience.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
Test Fixture
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Airframe Electrical Power Systems
System
Rely on Astronics CorePower® airframe electrical power systems, where solid-state technologies deliver highly efficient, clean power that improves aircraft operation through weight and system wiring savings.
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Product
Leak Test System
NorCom 2020
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The NorCom 2020 batch inspects up to 500 devices per cycle for both gross and ultra-fine leaks. The system incorporates a patented full field interferometer that produces reliable, repeatable leak test results. The system eliminates the need for helium mass spectroscopy or krypton testing for fine, and bubble leak testing for gross leaks.
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Function Test Systems
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These specialist Automeg models test the function and integrity of wiring harnesses combined with active components such as relays, switches, contactors, diodes, LEDS, actuators and other active components.Our software takes the complex and traditionally long task of creating functional tests away from the test engineer and allows these to be created automatically, from existing ECAD data and our component library and automated software routines. All the different routes and subtests are automatically calculated in seconds.
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Product
Signalling
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- Quick and easy mounting- Modern LED RGB technology, long life, reduced stock-keeping- Different modes configurable via IO-Link or setting menu- Also as standard version with digital inputs
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Memory Test System
T5830/T5830ES
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Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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Product
Microtester Test Systems
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With the micro probes and the fine-pitch adapters used on them, you are able to contact the finest test structures. E-tests, functional tests, IC tests or high-current tests are made to be affordable, efficient and with a short cycle time. With the integration of HF adapters we also enable the double-sided testing of HF substrates up to high frequency ranges.
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Product
Wafer Chip Inspection System
7940
System
Chroma 7940 wafer chip inspection system is an automated inspection system for postdiced wafer chip inspection.
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Product
Mixed Signal Oscilloscope 350 MHz, 2 Analog Plus 16 Digital Channels
MSOX3032G
Oscilloscope
The MSOX3032G 350 MHz oscilloscope provides 2 analog plus 16 digital channels, 4 Mpts memory, 1,000,000 waveforms/sec update rate, zone touch trigger with an 8.5-in capacitive touch screen, and standard embedded software with waveform and measurement histograms.
