Standard Test Interface Language
IC digital vector test representation standard.
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PXIe-6593, 16 Gbps, 8-Channel PXI High-Speed Serial Instrument
785976-01
PXIe, 16 Gbps, 8-Channel PXI High-Speed Serial Instrument - The PXIe‑6593 is designed for engineers who need to validate, interface through, and test serial protocols. It includes a Xilinx Kintex Ultrascale FPGA to implement various high-speed serial protocols, and it is … programmable in LabVIEW FPGA for maximum application-specific customization and reuse. The PXIe‑6593 takes advantage of FPGA multigigabit transceivers for up to eight TX and RX lanes.
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Iridium Physical Layer Test Systems
PLTS
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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PXIe-8430, 16-Port, RS232 PXI Serial Interface Module
781472-02
16-Port, RS232 PXI Serial Interface Module—The PXIe‑8430/16 is a high-performance interface for high-speed communication with RS232 devices. It features high-performance DMA transfers, multithreading, and multiprocessor support. NI serial interfaces also appear as standard COM ports for compatibility with programs that use serial communications.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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PXI-8432/ 4-Port, Isolated, RS232 PXI Serial Interface Module
779538-01
4-Port, Isolated, RS232 PXI Serial Interface Module - The PXI‑8432/4 is a high-performance interface for high-speed, port‑to‑port isolated communication with RS232 devices. It features high-performance DMA transfers, multithreading, and multiprocessor support. NI serial interfaces also appear as standard COM ports for compatibility with programs that use serial communications.
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Interface
R15-LPCIE
Abaco Systems Embedded Systems’ R15-LPCIE is the latest generation of performance and flexibility for MIL-STD-1553A/B Notice II on a low profile PCI Express module. Available in -40 to +70 temperatures (with relays) and -40 to +85 temperatures (without relays) with one or two dual-redundant channels. The R15-LPCIE includes advanced API (Application Programming Interface) software that reduces application development time.
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20 GHz Differential Probe with ProLink Interface
DH20-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Seno-Con Test System
PANTHER 2K QST
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Ethernet Connectivity for Controlling ARINC-429 Channels and Auto RX Bridging
ENET-A429
eNet-A429™ is an innovative product that provides “remoting” of ARINC operations on 10/100/1000 Ethernet IP/UDP local area networks (LAN). eNet-429 is a small, low-power, rugged device that provides connectivity for 1-8 ARINC 429/575/573/717 Channels – Ideal for remoting ARINC connections for in-field applications or point-point lab usage.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Test Workflow Standard
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Low-Profile High-Performance IEEE488 GPIB Interface for PCI Bus
LPCI-3488A
ADLINK LPCI-3488A GPIB controller interface card, fully compatible with the IEEE 488 instrumentation control and communication standard, is capable of controlling up to 14 stand-alone instruments via IEEE 488 cables. It is designed to meet the requirements for high performance and maximum programming portability. The built-in 2KB FIFO and a block transfer mode provide up to 1.5 MB/s GPIB transfer rate. With the APIs that are compatible with NI-488.2* and VISA support, the LPCI-3488A provides the greatest compatibility with your existing applications and instrument drivers. (* NI-488.2 mentioned here is the trademarks and properties of National Instruments Corporation.)
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3U CompactPCI® 2/4-Port Gigabit Ethernet Card
cPCI-3E10/3E12
The cPCI-3E10 Series is 3U CompactPCI Gigabit Ethernet peripheral card equipped with Intel® 82574L PCIe Gigabit Ethernet controllers. The cPCI-3E10 provides four GbE ports on the front panel (RJ-45) with two switchable to the rear transition module, the cPCI-3E12 provides two GbE ports on the front panel (RJ-45), and the cPCI-3E10-SUB provides two Fast Ethernet ports on the front panel (DB-9). An optional Rear Transition Module (cPCI-R3E10) is available to provide rear access to the GbE ports switched from the cPCI-3E10 front panel.
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Rack based antenna test system
R&S®ATS800R CATR
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique rack based CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Test Fixture Kits
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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USB GPIB (IEEE-488) Interface
GPIB-USB-HS+
This compact USB - GPIB interface offers full function, IEEE 488.2 interface support via any computer with a USB port. The interface can control up to 14 GPIB instruments. The small size and light weight of this interface makes it ideal for portable applications using a laptop computer or for other applications in which the computer has no available internal I/O slots. The interface works with any Windows OS.
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Parallel Electrode SMD Test Fixture
16192A
The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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In-line High-Density ICT System Series 7i
E9988GL
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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IOL & Power Cycling Test Systems
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Radar Test System
UTP 5065
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Component Test Fixture For N1413 With B2980 Series
N1428A
The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
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In-Circuit Test System Rentals
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Mixed Signal, Multi-Functional Test Module
PXIe-ScanIO-112
The PXIe-ScanIO-112 delivers a powerful combination of digital, analog, and AC-coupled testing in a single PXIe module. With 104 boundary-scan controllable digital I/O channels and 8 analog I/O channels ranging from –15V to +15V, engineers gain the flexibility to test a wide variety of board-level designs. The module supports IEEE-1149.6 AC-coupled interconnect testing, configurable single-ended and differential pin operation, and integrates seamlessly with the Corelis ScanExpress™ suite.
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LTE RRM Test System
T4010S
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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In-Circuit Test System
TestStation LX
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Automated Test Systems
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Interface
RXMC1553
Abaco Systems’ RXMC-1553 is the latest generation of performance and flexibility for MIL-STD-1553A/B Notice II on a XMC.0 Mezzanine Card. With one or two dual-redundant channels, the RXMC-1553 includes advanced API (Application Programming Interface) software that reduces application development time.
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Thunderbolt Interface
NLINE-T1553
Supports Full Real-Time Control the Same as a PCI Express Card in a Server! Much Better than a non-real-time USB.Full Hardware Interrupt Handler Support! AltaAPI SDK Provides Easy Integration – Use the exact same code as other Alta PCIe devices! Windows 10 Support Only
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Test Platforms
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
