Standard Test Interface Language
IC digital vector test representation standard.
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PCIe-8244, 4-Port, USB3 Vision Frame Grabber Device
782890-01
The PCIe‑8244 is a USB 3.0 interface device designed for use with USB3 Vision cameras. USB 3.0 is ideal for high-data-rate machine vision applications. USB3 Vision cameras also offer plug‑and‑play functionality and ease of use through a standardized catalog of functions.
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Universal Test System
LEON System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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sbRIO-9881, Non-Enclosed, 1-Port C Series CANopen Interface Module
785966-01
The sbRIO‑9881 is a high-speed CANopen interface for developing CANopen applications in LabVIEW software on CompactRIO hardware. CANopen is the application layer that sits on top of the CAN physical layer often used for industrial automation applications. The sbRIO‑9881 can transmit/receive process data objects (PDOs) and service data objects (SDOs) according to CiA‑DS 301. The sbRIO‑9881 is compatible with only CompactRIO systems. Non-enclosed modules are designed for OEM applications.
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Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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PSI5 Sensor Interface Card
SET-1640
PSI5 is an open standard based on existing sensor interfaces for peripheral airbag sensors and has already proven itself in millions of airbag systems.
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Avionics Test & Simulation Interfaces
Connect your PC laptop, desktop and tablet computers to avionics databuses with pocket-sized Ballard USB interfaces. Ease of use, versatility and comprehensive databus functionality have made these rugged adapters the industry favorite for avionics test, analysis and simulation in the lab and in the field. Avionics labs routinely integrate Ballard interface cards and full-featured network appliances into their test setups for powerful and reliable databus connection.
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USB Interface for 1-2 MIL-STD-1553 Channels
NLINE-U1553
The NLINE-U1553 implements the latest USB 3 SuperSpeed technology for 1-2 dual redundant, independent 1553 channels. Full function capability for Bus Controller (BC), multi-RT (mRT), and Bus Monitor (BM). Also, o-scope signal capture on the first channel to troubleshoot bus signals. All built-in a small, rugged cable assembly that allows the customer to easily connect with standard 1553 jack connectors, or make their own custom cable with a Lemo break-away standard. USB 2 backward compatible (but not recommended – USB 3 offers superior throughput performance).
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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MIL-STD-1553 PC104-Plus Interface Card
PC104P-1553
Alta Data Technologies’ PC104P interface module is a multi-channel (1-4) 1553 card supported by the latest software technologies. The PC104P card is based on the industry’s most advanced 32-bit 1553 FPGA protocol engine, AltaCore™, and by a feature-rich application programming interface, AltaAPI™, which is a multi-layer ANSI C and Windows .NET 2.0 (MSVS 2005 C++, C#, VB .NET) architecture. This hardware and software package provides increased system performance and reduces integration time.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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PCIe-8430, PCI Express, 8-Port, RS232 Serial Interface Device
780591-01
The PCIe‑8430/8 is a high-performance interface for high-speed communication with RS232 devices. It features high-performance DMA transfers, multithreading, and multiprocessor support. NI serial interfaces also appear as standard … COM ports for compatibility with programs that use serial communications.
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ESD Test System
58154 Series
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Vehicle Multiprotocol Interface Device
The Vehicle Multiprotocol Interface Device excels in applications requiring real-time, high-speed manipulation of hundreds of CAN frames and signals, such as hardware-in-the-loop (HIL) simulation, rapid control prototyping, bus monitoring, automation control, and more. The NI-XNET device-driven DMA engine enables the onboard processor to move CAN frames and signals between the interface and the user program without CPU interrupts, minimizing message latency and freeing host processor time for processing complex models and applications.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Digital Test Instruments
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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PXI-8532, 1-Port, PXI DeviceNet Interface Module
781063-01
1-Port, PXI DeviceNet Interface Module—The PXI‑8532 is a high-speed DeviceNet interface for developing applications with the NI‑Industrial Communications for DeviceNet driver. DeviceNet is based on the CAN physical layer and increases strength and interconnectivity by specifying various parameters, such as the required cable length, connectors, and baud rates. DeviceNet specifications are managed by OVDA, Inc. You can program the PXI‑8532 to add high-performance master/scanner or slave capabilities to DeviceNet networks.
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Interface
3508 MMS ECM
The 3508 Electrical Conversion Module (ECM) provides six (6) RS-232 outputs and ten (10) RS-232 inputs. Built around Maxim 1488 & 1489 chips for true RS232 levels and voltage tolerance, all outputs come up in the 1, mark or idle state. Electrically this is a negative output voltage, the start bit is always a 0 or a positive voltage level.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Fastest In-Circuit Test Platform
TestStation
Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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4 or 8 Channels In-Line Real-Time ARINC-Ethernet Converter
NLINE-EA429
NLINE-EA429™ is an innovative product that provides “remoting” of ARINC operations on 10/100/1000 Ethernet IP/UDP local area networks (LAN). NLINE-EA429 is a small, low-power, rugged device that provides connectivity for 1-8 ARINC 429/575/573/717 Channels – Ideal for remoting ARINC connections for in-field applications or point-point lab usage.
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High Speed Test Bench
AT444
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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PXI-8513 , 2-Port, Software-Selectable PXI CAN Interface Module
780688-02
2-Port, Software-Selectable PXI CAN Interface Module—The PXI‑8513 is a software-selectable Controller Area Network (CAN) interface for developing applications with the NI‑XNET driver. NI‑XNET Software‑Selectable CAN Interfaces offer the best flexibility for CAN development with onboard transceivers for High-Speed/Flexible Data‑rate, Low-Speed/Fault Tolerant Single Wire CAN as well as any external transceiver. The PXI‑8513 excels in applications requiring real-time, high-speed manipulation of hundreds of CAN frames and signals, such as hardware‑in‑the‑loop simulation, rapid control prototyping, bus monitoring, automation control, and more. The NI‑XNET device-driven DMA engine enables the onboard processor to move CAN frames and signals between the interface and the user program without CPU interrupts.
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PXI Interface Module, AIT ARINC 429
M3407A
Interface to the LRU in avionics test solution 4, 8, 16, or 32 software programmable Tx/Rx channels with full error injection/detection Programmable high/low speed operation Real-time recording and post analysis of multiple channels Concurrent operation of all Tx/Rx channels PXI triggers, star trigger, and PXI 10 MHz clock
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RJ45 (Ethernet 100 Base T) to 90 Series Interface (R)
J90RJ45R
RJ45 Ethernet connector for VPC Tripaddle 90 series RCV moduleUp to three connectors per moduleFor Cat 5 Fast Ethernet cable IEEE 802.3 standard100 Base-T
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ATE Self Test Fixtures
AL663
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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Optimize Throughput And Cost For MmWave 5G Device Functional Test
Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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Interface
RAR-MPCIE
The RAR-MPCIE is very small (30mm x 40.95mm x 4.7mm) and lightweight for applications deployed in highly constrained environments where platforms require minimum SWaP solutions. It is designed for those working in avionics test and simulation for field and test support, and for use in data logging in which it offers significant advantages and flexibility.
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
