Bias
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Product
Low Input Bias Current Op Amps (≤100 pA)
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Low input bias current op amps are required whenever the difference of currents or voltage is small and needs to be measured accurately. These op amps are used so that the signal is not loaded down by the input of the op amps. Low input bias current op amps are critical for interfacing sensors in applications from photodiodes, pH meters, or other electrometer related functions to downstream electronics. Analog Devices has many precision op amps that fit the definition and range of these applications.
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Product
Universal Multichannel System
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Power Supply Systems are 100% internally developed and designed to install into a standard 19” relay rack. The mainframes and dedicated HV/LV boards were purposefully designed to provide peak performance in a broad spectrum of operational scenarios and for a vast number of detector types. CAEN mainframe systems are modular, making upgrade and maintenance a breeze.A single mainframe may house and provide control for up to 768 independent channels. Each mainframe may be configured with a mixture of both High Voltage boards for detector bias and Low Voltage boards to drive peripheral electronics.
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Product
Impedance Analyzer
6632
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Frequency range: DC, 10Hz to 1/3/5/10/20/30MHz/50MHz. Basic accuracy up to ±0.08%. Automatic Level Control (ALC). Output impedance 25Ω/100Ω, switchable. Equivalent Circuit Analysis . Built-in DC Bias voltage ±12V. Ultra-high measuring speed < 3ms. Built-in the Dielectric constant-εr. Built-in the Permeability-μr. Support PC Link Software.
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Product
Micro probes 1 MHz up to 1 GHz
MFA 02 set
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The two in the set included micro probes are used to measure low-frequency magnetic fields up to 1 GHz, e.g. at signal conductors (150µm), SMD componets (0603-0201) or IC pins. The MFA micro probes are guided by hand. An amplifier stage is integrated into the probe head. The amplifier stage (9V, 100mA) is powered via the BT 706 Bias tee. It has an impedance of 50 Ohm. The micro probes are connected via the Bias tee to a spectrum analyzer or an oscilloscope. The MFA 02 set delivery of Langer EMV-Technik GmbH includes correction lines. With the help of the correction lines the probe output voltage is converted either into the respective magnetic field or to the current which is running through the conductor.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1Z-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.02 (29.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-62T1-4
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Bias Network, 45 MHz to 50 GHz
11612B
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The Keysight 11612B broadband high power bias network can be used in a wide variety of biasing applications for test and measurement requirements in laboratory and production environments. Bias networks provide the means of supplying dc bias to the center conductor of the coax connector for your device while blocking the dc to the RF port.
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1B-6
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1Z-10
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1T24-7-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1L18-2-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1UN-7
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1T1-6
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Biased and Unbiased HAST Testing
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Considered within the semiconductor industry as the fast and effective alternative to Temperature Humidity Bias testing (THB), Highly-Accelerated Temperature and Humidity Stress Test (HAST) is a critical part of the device package Qualification process and is used to evaluate the reliability of non-hermetic packaged devices in humid environments.
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Product
Two Diode Assembly, P/N 6030C
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Two Diode Assembly, P/N 6030CEach diode is rated for 400 Amps, 1200 PIVTwo diodes are installed on one heatsinkDimensions: 8”H x 8”W x 10”DEstimated weight: 20 lbs.When A is greater than B, Battery 2 is reversed BiasWhen B is greater than A, Battery 1 is reversed Bias
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Product
Bias Tees From 0.03 MHz To 85 GHz
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Pulsar offers a large variety of bias tees that cover frequencies from DC to in both surface mount and connectorized packages. Many models are available with voltages up to 100 volts and currents up to 8 amps and custom requirements are welcomed. Options include higher voltage and current, higher RF input power and a choice of either an RF connector or a feedthrough connection for the DC input port.
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Product
Test System
ITC57300
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The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Product
RF Bias Burn-In System
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These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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Product
Regulators For Bias Supply
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Renesas' low cost linear regulators generate a low voltage bias supply from intermediate distributed voltages commonly used in telecom and datacom applications. These devices may be used as start-up or as continuous low power regulators.
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Product
Modulator Driver
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A compact bias control board designed to maintain the linear operating point of optical intensity modulators. Featuring a compact miniature design for OEM integration, the BCB-4 allows for a stable Q+, Q-, Min and Max operation over long periods of time. With a USB 2.0 DC power and monitor interface standard, the BCB-4 unit is the ideal choice for industrial and OEM applications when paired with any of Optilab’s wide variety of optical modulators. Please contact us at +1(480)719-1502 or email sales@oequest.com for more info.
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Product
Single And Dual 32k Digital MCA & Pulse Processor
Hexagon Family
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Hexagon is a high precision 32k MCA available in single and dual input channel versions. This compact, high performance desktop MCA includes features such as an input stage for signal conditioning, a fast analog-to-digital converter (ADC), digital signal processing algorithms, High Voltage and Preamplifier outputs for detector bias and preamp power. Hexagon is ideally suited for applications using high energy resolution semiconductor detectors such as HPGe, Silicon, CZT as well as scintillation detectors such as NaI and LaBr3. It can manage both positive and negative signals from resistive feedback or transistor reset preamplifier detectors as well as signals coming from PMT anodes.
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1I35-7-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Waveguide Harmonic Mixer, 40 to 60 GHz
11970U
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The Keysight 11970U waveguide mixer is a general-purpose harmonic mixer employing a dual-diode design to achieve flat frequency response and low conversion loss. These are achieved without external dc bias or tuning stubs. Manual operation and computer-controlled hardware operation are simplified because mixer bias and tuning adjustment are not required.
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Product
Broadband Detectors
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These waveguide bandwidth detectors use silicon beam lead diodes on a planar stripline circuit to obtain an extremely rugged and compact device. Most millimeter wave broadband detectors have very poor VSWR due to the difficulty in obtaining a good wideband impedance match to the diode. To overcome this problem, these detectors utilize two diodes and an internal matched termination and 3 dB hybrid as shown below. This circuit allows a VSWR of 2.0 or better over a full waveguide bandwidth for most of these detectors. Detectors for waveguides WR-8 and smaller use a single zero bias GaAs diode. The high sensitivity zero bias GaAs diodes can also be special ordered for use at lower frequencies when highest sensitivity is required.
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Product
High Output Current Op Amplifiers ≥ 100mA
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Analog Devices high speed , high output current (≥100 mA) op amps deliver high output current while driving low impedance loads with excellent linearity. Whether it's high output current, low input bias current, wide bandwidth, high slew rate, or low distortion, no one sets more performance standards for next-generation designs with the widest portfolio of leading edge products than Analog Devices.
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1P-7-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1L24-4
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1T30-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Universal In-Line Test Platform
Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1Z1-2-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02





























