Product

Test System

ITC57300

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Integrated Technology Corp.

ITC57300 - Integrated Technology Corp.

The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.

Product

Shunt Voltage References

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Analog Devices Inc.

Analog Devices Inc.

Analog Devices offers a broad line of shunt precision voltage references that combine excellent accuracy and temperature stability with low noise and small packages. These devices operate in a manner that is functionally equivalent to a Zener diode. The bias current must be set higher than the sum of the maximum quiescent current of the voltage reference and the maximum expected load current. Since shunt voltage references are typically biased with a resistor, the voltage reference can operate on a wide range of input voltages.

Product

Precision Low-Loss Multiplexers

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Maury Microwave Corporation

Maury Microwave Corporation

Maury’s line of diplexers (DP-series) and triplexers (TP-series) are designed for applications which require combining/ splitting signals at or around harmonic frequencies (nFo) and are connectorized for design-in and test and measurement applications.DP-series diplexers are designed using low-pass and high-pass filters and pass bias between the low-frequency (or Fo) port and the common (or DUT) port.TP-series triplexers are designed using low-pass, bandpass and high-pass filters and pass bias between the low-frequency (or Fo) port and the common (or DUT) port.Power handling is rated at 100W CW (average) and typical insertion loss is better than 0.5dB between the low-pass (Fo) and common ports.DP- and TP-series multiplexers are ideal accessories for passive, active and hybrid-active multi-harmonic load pull systems.

Product

Highly Accelerated Stress Test Chambers

HAST

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ESPEC North America, INC.

HAST - ESPEC North America, INC.

Our HAST systems have a modern design that's easier to use: Automatic humidity filling; Automatic door lock; A more square workspace; allowing more product to be loaded;Convenient, hermetic power-pin system for bias testing. We are now able to offer a hermetic port system to allow special signal lines like coax or fiberoptics to be run into the chamber.