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Product
Memory Test Software
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Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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Product
Criterion Temperature & Humidity Benchtop Chambers
BTL-433
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The Criterion temperature/humidity chamber series provides an economical and space-saving solution for a variety of testing requirements. The chamber's interior size is 3.5 inches wider than traditional benchtops, yet the exterior is 20% narrower. The BTL-433 model uses 115V power, meaning no special power hook-ups.
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Product
Chip Tester
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Chip aging test is a very important task. It simulates various environmental and stress conditions of the chip during long-term use, evaluates its reliability and life, and provides effective reference and guidance for chip product design and manufacturing. It is necessary to select high-quality chip testers to ensure accurate test data, thereby further improving the reliability and life of chip products.
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Product
Test and Maintenance of Microsoft Dynamics/D365
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If your business relies on Microsoft Dynamics 365, the cost of overlooking quality can be catastrophic in the form of monetary and reputational damage. Testhouse helps remove those risks so your business can operate with total confidence, giving you the best chance of achieving your desired return on investment.You have a great product from Microsoft, and your implementation partner may have done a good job customising and configuring it to suit your business requirements, but the on-going testing and quality needs of your D365 system must be built into the product lifecycle to guarantee continued satisfaction and business confidence.
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Product
Lightning Generator
2654-1
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The Solar Model 2654-1 Lightning Generator synthesizes electrical impulses needed for testing susceptibility to transients induced in aircraft equipment by lightning strikes.
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Product
Software for the Development and Implementation of Test Programs using IEEE 1641
newWaveX Suite
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We Have a unique suite of tools to support the development and implementation of test programs created using IEEE 1641 to define the signals and tests. These include the entry-level version of newWaveX (newWaveX–Lite), the development versions of newWaveX (newWaveX–SD and newWaveX–PD) and the complete integrated development environment for IEEE 1641, SigBase. These tools provide everything necessary to work with IEEE 1641, from creating simple signals through to implementing and managing a complete 1641 test environment. All of our 1641 tools are commercial off-the-shelf (COTS) items that may be used stand-alone or integrated into a complete test development environment. newWaveX products may be integrated with third party test executives and associated software.newWaveX is an intuitive user-friendly suite of products that does not require specialist training for users to acquire the skills to develop 1641 programs. Completing the IEEE 1641 User/Developer training course (which uses newWaveX Signal Development for the hands-on element), together with the associated 1 day newWaveX–SD User/Developer training course, provides complete information for the newWaveX user. Further support is provided for users of newWaveX packages under the maintenance agreements for those products.
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Product
2-Ch Digital Storage Oscilloscope
2190E
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The 2190E oscilloscope combines performance and value all in one portable solution. With advanced triggering capabilities, long waveform memory up to 40,000 points, and extensive features such as pass/fail limit testing, digital filtering, waveform recorder, and 32 automatic measurements, this oscilloscope offers powerful tools in a small affordable package.
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Product
Taber® Rotary Abrasers
5135 & 5155
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The Taber® Rotary Abraser is an industry standard used in wear and durability testing and is available with either a single test head or dual testing heads, which allows the user to test two different or identical materials simultaneously.
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Product
Scalability Testing
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QAble engineers scalability testing across vertical, horizontal, data, geographic, and multi-tenant dimensions, modelled workloads, capacity envelopes, and elasticity evidence rather than a single peak RPS.
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Product
Functional Testing Service
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Is your software working the way it is intended to? Will it work in the real world as it does in simulations? Is the code really executing as per its outlined specifications? Do various parts of the application interact as planned? Will users find the application functioning as per their requirements or will they get lost in the flow? Functional testing answers all these questions and more:- Tests your application against its intended output parameters to make sure it works the way it is meant to.- Tests if the functions of the application are working as intendedUnderstand if various parts of the application are interacting as planned.- Check if the user navigation is simple, free-flowing, and friction-less.- Functional Testing ensures optimum quality for content, design and user experience.
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Product
Circuit Tester
69105
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Tests circuits rated from 80 to 600 volts AC/DC.High-visibility neon lamp indicator.High-impact, sealed 5-11/16'' (144 mm) probes on long 24'' (610 mm) leads for convenience in testing motors, fuses, relays, switches, etc.Resistor between each probe and lead.Reliable electronic components.
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Product
Rack-Mountable CATR Chamber for 5G NR mmWave Signals
ATS800R
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The R&S®ATS800R CATR based 5G NR mmWave test chamber provides a very compact over the air (OTA) testing environment for testing 5G FR2 antennas, modules and devices in R&D. The R&S®ATS800R has a very small footprint and wide frequency range, and offers maximum functionality and test coverage in a small space. The flexible setup options and range of extensions make the R&S®ATS800R a solid and future-proof environment for your FR2 testing needs.
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Product
PXI High Density Precision Resistor Module, 4-Channel, 2.5Ω to 472Ω
40-298-120
Programmable Resistor Modules
The 40-298-120 is a high density programmable resistor module with 4 channels which can be set between 2.5Ω and 472Ω with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
Paragon™ Software
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Its highly intuitive and configurable interface provides quick and easy access to advanced functionality, such as automatic GR&R calculation, built-in diagnostics, a unique database search engine wizard and superior reporting; increasing efficiency and providing 100% confidence in your bond testing results.
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Product
PXI High Density MUX BRIC, 6-Chan, 80-Pole
40-570-113
Multiplexer Module
This range of High-Density Multiplexer is part of our BRIC family. These MUX's are designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is also possible, without limitation). These multiplexers are ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. They are available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts. All version are supported in a BRIC8 construction that occupies eight PXI 3U mechanical slots, one of which provides the PXI interface and power.
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Product
Acceleration Simulation Mode (ASM) for Single Driven Axle Vehicles
ASM_AF | VP 230045
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Maschinenbau Haldenwang GmbH & Co. KG.
The ASM-AF roller set is used in test centres and is suitable for vehicles with a single driven axle. It was designed for the exact measurement of the exhaust gas behaviour of vehicles during their transient emission test and permits a driving resistance simulation for the exhaust gas tests ASM-5015 and ASM-2525 (Acceleration Simulation Mode) in accordance with the specifications BAR '97. The ASM-AF is built into the base.
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Product
PCI Programmable Resistor Card 4-Channel 2 Ohm To 255 Ohm
50-294-013
Programmable Resistor Modules
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
Battery Pack ATS
8700
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Chroma transfers its successful experience in 8000 ATS which is quite well-known in the power electronics industry to the battery application field by developing the Test Items specifically for the battery industry. It can perform automatic tests on the Battery Management System (BMS), semi products and finished products tests on the production line as well as provide long term maintenance and service to the battery module. 8000 (8700) ATS has flexible hardware architecture that can select a variety of hardware devices, such as DC Power Supply, Electronic Load, LCR Meter and 6 1/2 digits Meter, etc. to comply with different automatic testing requirements for various applications. In addition new hardware and test items can be expanded to meet the demands for inspecting the highly customized battery products with diversified tests. The capabilities supported are:
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Product
Low & High Voltage Differential Probes
T3
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Teledyne Test Tools Low & High Voltage Differential Probes offer end user versatility with all models powered by an external universal power supply and work with any Oscilloscope with a high-impedance BNC input. The range consists of one Low Voltage and three High Voltage models with varying bandwidths to satisfy a wide array of customer applications.
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Product
Full Band (1200 ~ 1700 nm) Tunable Laser Source
CA9813
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This specification describes and defines Advanced Lab Instruments CA9813 full band CW tunable lasers with applications to test and measurement equipment. It provides fast wavelength tuning, high power output, and high power stability. Advanced Lab Instruments tunable laser products support full-band, and other single-band operation. A full-band tunable laser is also available, covering 1200 ~1700 nm wavelength range, with seamless tuning.
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Product
Multi-Spectral UV/Laser Range Stimulator
Phantom™
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The Phantom is a long-range laser and ultraviolet (UV) stimulator capable of testing aircraft electro-optical sensor suites up to 5 km. Phantom can operate as an independent laser and/or UV stimulator or can be integrated with our other electro-optical and radio frequency range systems (see GTESS and PRTS). The Phantom provides both a laser threat and a synchronized temporal missile plume signature to stimulate both the aircraft’s laser and missile warning systems. Training aircrew to counter maneuver a Laser Beam Riders (LBR) threat is considered essential to survival and in-air training. The Phantom can be deployed either on a shoulder or tripod mount.
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Product
USB-6356, 8 AI (16-Bit, 1.25 MS/s), 2 AO (3.33 MS/s), 24 DIO USB Multifunction I/O Device
782260-01
Multifunction I/O
8 AI (16-Bit, 1.25 MS/s), 2 AO (3.33 MS/s), 24 DIO USB Multifunction I/O Device - The USB-6356 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI-STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB-6356 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Product
Multipurpose Debug Board
DB40 Debug Module
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The DB40 Debug Card is designed for debugging of COM Express and PC/104 boards. It includes the following features: - Port 80/81 decoding for Power On Self Test (POST) via LPC - Interface to SPI Flash for BIOS update - Interface to Board Management Controller (BMC) for update - Power and Reset buttons and status LEDs The DB40 Debug card can only be used on products that have the appropriate FFC debug connector designed for this purpose. (Includes DB40 Debug Module, two 40-pin FFC cables, and 14-pin cable for SP100 DediProg USB to SPI programmer.)
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Product
802.11ad & ay (WiGig) Test System
IQgig-IF
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When used in conjunction with IQgig-RF, it supports over-the-air (OTA) testing of WiGig RF modules and end-products. The IQgig family products provide total test solution for R&D characterization and high volume manufacturing.
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Product
Configurable Functional Test System
ATS-5000
Test System
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
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Product
SystemSolutions
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Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your yourdevice, not on your test system.
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Product
Hardness Testers
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We offer a comprehensive range of hardness testers for Rockwell, Brinell, and Microhardness testing on materials such as metals.
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Product
ARINC825 Cards
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AIM’s ARINC825 cards can work either with full functionality as an active CAN node for testing and simulating or in listening only mode for monitoring and recording purposes of Avionic CAN bus (ARINC825) applications on up to 4 electrically isolated CAN bus nodes concurrently. All nodes are in conformance with the ISO11898-1/-2 standard. They are accessible by software separately and can be used as 4 independent CAN bus nodes. An onboard IRIG-B time decoder allows users to accurately synchronize single or multiple modules to a common time source. All supported signals are available through front I/O and rear I/O interface. ARINC825 cards consist of FPGA based CAN interface controllers as well as a FPGA based 32-bit microcontroller core and a separate processor for IRIG-B synchronization with high resolution time stamping. All nodes are operating concurrently at CAN bus high speed bit rate of up to 1Mbit/s with the intelligence to process scheduling of CAN frames in real time onboard to significantly off-load the host processor.For embedded applications the AMC825-4 PMC module is available in a conduction cooled version. Using AIM’s family of PCI, CPCI (3U and 6U) and VMEbus carrier cards for PMC our clients have off the shelf solutions in a broad range of card formats. ARINC825 (CAN bus) modules are delivered with an Application Programming Interface (API) and Driver Software compatible with Windows, Linux and VxWorks.An ARINC825 Resource Component is available for AIM’s PBA.pro™ databus test and analysis tool including Tx and Rx simulation capabilities, a Chronological Bus Monitor and support for decoding of payload data within CAN messages. This allows to implement a powerful ARINC825 (CAN bus) analyzer or a complete test system in conjunction with other AIM avionics databus interfaces and PBA.pro™ supported 3rd party hardware.
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Product
DIN Scratching Tool
1538
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The Elcometer 1538 DIN Scratching Tool has interchangeable carbide cutters for the preparation of specimens to be used for corrosion testing.
