Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Product
Digital Microscopes
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Our range of products include digi classic digital lcd microscope, digi monozoom i lcd microscope, digi monozoom ii digital microscope, digi zoomstar iii lcd microscope, digi zoomstar iv digital microscope and monozoom e digital microscope.
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Product
Automated Multispectral Microscop
VideometerMic
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The VideometerMic is an automated multispectral microscope incorporating a multispectral scanner head mounted in an xyz-stage for auto-focusing and scanning of samples of size up to 30 mm x 30 mm.
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Product
Scanning Probe Microscopes
SpectraView 2500
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* Ultra-low noise SPM* Colocalized nanochemical analysis by IR, THz, Raman, AFM* Cantilever probes are completely transparent* Versatile configurations: Kelvin Probe chemical potential, electrical, thermal and photon force
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Atomic Absorption Spectroscopy Consumables
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Since the atomic absorption spectrophotometer was first launched in 1968, Shimadzu Corporation has remained at the forefront of the world inorganic analysis industry. Shimadzu still maintains an overwhelming market share with highly-regarded products that are selected as the market standard throughout the world. The extensive product range incorporates fully automatic general-purpose systems, a simple and low-cost AA instrument, and a dedicated soil and plant analyzer. They all share great ease-of-use, high functionality, and excellent reliability. Choose Shimadzu to dramatically enhance the productivity and reliability of your laboratory. Shimadzu products will meet all your demands.
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Product
Quartz Charge Force Rings
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Ring-style sensor configurations measure dynamic compression. Tension measurements are also possible if the unit has been installed with proper pre-load.
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Product
Complex of Visualization and Image Recording for a Video Microscope
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To develop a complex for visual inspection of electronic components (other micro-objects) in order to identify visual defects, record the resulting image and transfer information for processing.
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Product
Deep Ultraviolet Observation System for Microscope
U-UVF248
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Model Capable of High-magnification/High-contrast Deep Ultraviolet (DUV) Observation. A Semiconductor / FPD Inspection Microscopes.
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Product
High-Resolution Scanning Probe Microscope (SPM)
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High-Resolution Scanning Probe Microscope (SPM)
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Product
Cobra Temperature Forcing System for ATE/SLT Test Applications
31000R
System
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.
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Product
High Resolution Microscope for Multi-fiber Connector
D SCOPE MT
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The new D SCOPE MT microscope for MTP/MPO connectors is the fastest on the market. In the same measurement cycle, D Scope MT checks every optical fiber surface condition, and allows the operator to control the cleanliness of the connector endface and guideholes.
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Product
Force Displacement Testers
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Force displacement testing measures how much force is required to displace or deform a specific component or material. It’s an important aspect of quality control in manufacturing as well as material science. It’s necessary to help ensure products are made to the proper standards and to verify the properties of certain materials. Imada provides a range of force displacement testers that provide precise and accurate measurements, with numerous features to help technicians complete testing as quickly and effectively as possible.
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Microscope Photomultiplier Photometers
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HORIBA's microscope photometers are ideal for any lab wishing to quantitate light intensity from a sample on a microscope stage. Initially designed for the most demanding low light level fluorescence kinetics of labeled mammalian cells, these photometers are also just as well suited for mineral analysis or transmission studies.
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Product
Force
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Force instruments are used to measure, apply, or regulate force accurately to prevent damage, improve performance, and ensure safety.
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Load Cells, Weighing and Force Sensors
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We are pleased to offer Load Cells from both Zemic and Vishay. We are the exclusive UK distributor for Zemic load cells.
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Light Microscopes
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Compound light microscopes from Leica Microsystems meet the highest demands whatever the application – from routine laboratory work to the research of multi-dimensional dynamic processes in living cells.
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Microscope
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Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
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Product
Microscopic Melting Point Meter
DRK8029
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Shandong Drick Instruments Co., Ltd.
Determination of the melting point of the substance. Mainly used for the determination of drugs, chemicals, textiles, dyes, perfumes and other organic crystal, the microscope. Measured either by capillary method, and the slides are available - coverslip (hot stage method).
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Product
Carton Force Analyser
CFA
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By measuring the stiffness of the substrate and crease bending resistance the user can optimise cartons for faster running and packaging speeds. The instrument allows individual creases to be analysed identifying problem areas in packaging design or manufacture. Industry research indicates that the packaging speeds of pre-glued skillets is governed by the energy required to open creases. The Hanatek CFA is the first instrument to isolate and accurately measure this key parameter The instrument measures: Bending resistance, bending moment, board stiffness, crease recovery stiffness, crease folding force, crease opening force.
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Product
NEXYGEN DF Force Measuring Software
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The NEXYGEN DF software is an easy-to-use Windows based data analysis package for use with the digital force gauges and torque gauges. Your test results are presented in a spreadsheet format so you can analyse data and perform common mathematical and statistical calculations.
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Product
Sensor Products: Weld Force Probe Auditing System
90061-XH Series
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This system is ideal for field measurement and data logging of forces between the tips of resistance spot welders. The system consists of a handheld sensor and portable readout/ data logger (PMAC 2000).
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Product
Intel Atom® Embedded Controller
AMAX-5570 V2
Embedded Controller
Optimized BIOS & Embedded OS for 1ms real-time control (Windows & Linux)Achieves 32-axis motion control with 500 μs EtherCAT cycle time under LinuxOPC UA and Modbus TCP/RTU as IT connectivity enabled by CODESYSEtherCAT, PROFINET, Ethernet I/P, and CANopen are OT connectivity feature enabled by CODESYSIntel Atom® quad-core x6414RE processorSystem I/O with 2 x GbE, 2 x USB, 2 x Isolated CAN 2.0, 2 x Isolated COM, 1 x HDMI1 x M.2 B-Key (USB3.0 / SATA) expansionAMAX-5000 EtherCAT Slice I/O expansion
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Product
Tensile Compression Force Tester
ESM303
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The ESM303 is a highly configurable single-column force tester for tension and compression measurement applications up to 300 lbF [1.5 kN], with a rugged design suitable for laboratory and production environments. Sample setup and fine positioning are a breeze with available FollowMeTM force-based positioning - using your hand as your guide, push and pull on the force gauge or load cell to move the crosshead at a variable rate of speed.
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Product
Near-field Scanning Optical Microscope
NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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Weld Force Gauges
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This system is ideal for field measurement and data logging of forces between the tips of resistance spot welders.
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Scanning Electron Microscope
E5620
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The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Laser Scanning FLIM Microscopes
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DCS-120 laser scanner: Compact - Flexible - Precise. As technology leader in equipment and techniques for single photon counting, Becker & Hickl offers the DCS-120 systems that are complete laser scanning microscopes for fluorescence lifetime imaging (FLIM) since 2007. The systems use bh’s multi-dimensional TCSPC FLIM technology in combination with fast laser scanning and confocal detection or multi-photon excitation.
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Product
COM Express basic Type 7 with Intel Atom processor
COMe-bDV7
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The COM Express module COMe-bDV7 based on the Intel Atom processor C3000 series extends Kontron's product family of server-grade COM platforms. The COMe-bDV7 as an entry level platform is as a complementary product to the high performance class COMe-bBD7 equipped with the Intel Xeon processor D-1500 series. The COMe-bDV7 module features scalable CPU performance with up to 16 cores.
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Force Transmitter
LKVE/i
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The PIAB LKVE electronic overload protection system consists of a force transmitter with amplifier and an electronic signal processing unit. The PIAB LKVE force transmitter is attached to a stationary line part. The rope is deflected via a slight angle between the two wheels and the clamping jaw. When loaded, the rope tends to straighten and applies a force which is transmitted to the load cell. The load cell in the PIAB LKVE delivers a signal proportional to the force on the load cell. The signal is amplified and is converted to 4-20mA. This standardized signal (4-20mA) allows distances between the force transmitter and the electronic unit to be 500 m.
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Product
Hydraulic Force Gauges
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AMETEK Sensors, Test & Calibration
The hydraulic force gauges from Erichsen are a low cost solution for obtaining general force measurements. With a wide range of styles and sizes, these force gauges are popular in many industries ─ particularly for use in hazardous environments.
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Product
High Resolution Microscope For Multi-fiber Connector
D SCOPE MT LWD
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Designed for inspection of MPO connectors, patch-cords or bulkheads, the D Scope MT LWD checks the cleanliness of the connector face and precisely measures the defects on the optical fiber end-faces. Using Deep Learning technology associated with a high-resolution optical bench, the scratch and defect detection thresholds are significantly improved compared to traditional software.
