Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Surgical Microscopes
The surgical microscopes of Leica Microsystems are exactly geared to the requirements of microsurgery. A compact optical unit delivers clear and sharply focused images and the modular system gives the surgeon optimum maneuverability.
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FOV Micro Measuring Microscope 4.0
The new ultra-compact digital micro measuring microscope from Opto is the perfect tool for on-site measurements in production.
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Digital Microscopes
Zarbeco Digital Microscopes include Video toolbox PC software for taking still and moving images, measurement, labelling, draw-on features. They will have the best image quality at an affordable price with magnification options, digital camera options, and software options to meet your imaging needs.
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Force Gauges
A digital force gauge, often called a push pull force gauge or tension and compression force gauge, is used in material testing, quality control and assurance, research, development, product testing, laboratory and educational applications. PCE Instruments' (PCE) digital force gauge products are the benchmark of quality and performance. PCE digital force gauge devices provide measurements in kilograms (kg), grams (g), ounces (oz), pounds (lbs) and Newtons (N) of force (f), depending on the force gauge model. Most PCE digital force gauge products are handheld, portable devices that also can be used with a universal test stand. There are several different force gauge products available online in the PCE web shop.
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Nanomechanical Test Instruments for Microscopes
Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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ThermalAir Desktop Series Temperature Forcing System
ThermalAir TA-1000A Desktop System
The ThermalAir TA-1000 high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -25°C to +200°C.
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Force Calibrating Machines
Morehouse Instrument Company Inc.
Morehouse Universal Calibrating Machines (UCM) are an easy to use, cost-effective, hydraulic force calibration system that lasts for generations. UCMs built in the 1950s are still operating today! The UCM can be used to calibrate both tension and compression instruments in accordance with ASTM E74, ISO 376, and other internationally recognized force standards.
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TOC-L For Monitoring A Microscopic Algae Biomass
Biomass is considered a prospective new energy source. The dry weight method has been typically used to determine the amount of microscopic algae in biomass. However, Shimadzu proposes a new method, one that is rapid, easy, and accurate, utilizing the TOC-L total organic carbon analyzer.
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Force Load Cells
TE Connectivity (TE) offers load cell assemblies for test and measurement applications that require high performance or unique packaging. Our broad range of packaged load cells feature foil strain gages enabling OEM's to measure force with low cost and high reliability. The gages produce a high level of output signal for a low operating stain using inorganic materials to offer long term stability. Load cells are gaged in a variety of materials from high strength stainless steel to special alloys.
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Peel Back Force Tester
PBFT
Precisely measure the peel back force of carrier tape to verify your packaging systems are within specification. Results can be printed and stored with the outgoing product.
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High Force DMA
DMA+ Series
*The new DMA+ series instruments are dynamic testing machines based on a innovative concept of one-piece high rigidity test frame.*They are dedicated to the accurate analysis of the viscoelastic properties of most advanced materials.
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Scanning Electron Microscope
JSM-IT510
Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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Peel Force Tester
PT-55
V-TEK Peel Force Testers are built to test, confirm, and record proper sealing strength of cover tape to carrier tape. This ensures parts are secure and protected, yet will release at the designated force. The PT-55 Peel Force Tester incorporates new technology and performance features to make set up easy, maintenance minimal, and calibration accurate. The lightweight design can accommodate 8-120mm tape widths and operates at peel speeds of 120mm/min or 300mm/min.
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Electron Microscope Analyzer
QUANTAX EDS for TEM
Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
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Forced Air Cryogenic Cooling
FixTreme TE
FixTremeTE is a cost-effective standalone alternative to mechanical or forced air cryogenic cooling. When paired with a Testforce dbGuard Series RF shielding test enclosure, performing at temperature RF & microwave functional testing is simple.
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Thermal Microscope Stage
TS-4MP
With our TS-4MP Thermal Stage, a specimen on a microscope slide or culture dish can be maintained at any temperature between -20°C and +60°C. Setup is easy, takes little time, and the controller will regulate the stage temperature to within +/-0.1°C
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ATOM Handler
The ATOM-IC Handler is a benchtop handler designed for use on engineering test floors and in development operations. Its innovative design allows for maximum flexibility and minimum cost and maintenance.
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COM Express basic Type 7 with Intel Atom processor
COMe-bDV7
The COM Express module COMe-bDV7 based on the Intel Atom processor C3000 series extends Kontron's product family of server-grade COM platforms. The COMe-bDV7 as an entry level platform is as a complementary product to the high performance class COMe-bBD7 equipped with the Intel Xeon processor D-1500 series. The COMe-bDV7 module features scalable CPU performance with up to 16 cores.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Fiber Microscope
WL-D200S
The WL-D200 fiber microscopes provide dual-illumination, both coaxial and oblique, to produce the highest-quality image detail and superior view of fiber end face cleanliness and core condition.
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Scanning Magnetic Microscope
Circuit ScanTM 1000
Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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3D Video Microscope
BVM-20102B
High-resolution CCD sensor, built-in analog/digital converter, analog and digital signal directly display on the screen, can also simultaneously display on TV and computer through corresponding interfaces; taking photo and video through software; easy operation, reducing user's fatigue and injury.
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Carton Force Analyser
CFA
By measuring the stiffness of the substrate and crease bending resistance the user can optimise cartons for faster running and packaging speeds. The instrument allows individual creases to be analysed identifying problem areas in packaging design or manufacture. Industry research indicates that the packaging speeds of pre-glued skillets is governed by the energy required to open creases. The Hanatek CFA is the first instrument to isolate and accurately measure this key parameter The instrument measures: Bending resistance, bending moment, board stiffness, crease recovery stiffness, crease folding force, crease opening force.
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Wafer Cathodoluminescence Microscope
Säntis 300
Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
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Digital Automated Interferometer and Microscope for Surface Inspection
DAISI-V3
The ultimate production interferometer for measuring end-face geometry on single-fiber connectors, equipped with a revolutionary «no-exterior-moving-parts» mechanical design.
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Inverted Metallurgical Microscope
GX53
Designed for use in the steel, automotive, electronics, and other manufacturing industries, the GX53 microscope delivers crisp images that can be difficult to capture using conventional microscopy observation methods. When combined with OLYMPUS Stream image analysis software, the microscope streamlines the inspection process from observation to image analysis and reporting.
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Quartz Impact Force Sensors
Impact-style sensors are specifically designed for impact force measurements. The sensor is typically mounted in a free-standing manner with the installed impact cap directed toward the oncoming object with which it will collide.
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Atomic Absorption Spectrometer
Atomic absorption spectroscopy (AAS) determines the presence of metals in liquid samples. Metals include Fe, Cu, Al, Pb, Ca, Zn, Cd and many more. It also measures the concentrations of metals in the samples. Typical concentrations range in the low mg/L range.
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Acoustic Microscope
AMI P300
The FastLine P300 Acoustic Microscope is specifically designed for accelerated throughput, semiautomated screening of microelectronic devices on the manufacturing floor.
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Digital Push And Pull Force Gauge
HG-2-1000
Shenzhen Chuangxin Instruments Co., Ltd.
Digital push and pull force gauge is a universal portable force device, testing push and pull load. It is small, light, easy to take, multi-function, high precision. Applicable for all products doing push and pull load test, insert and pull out force test, destroy test, etc. It also can be combined with the machine and clamp to make up a small tester for different purposes.
