Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Ergonomics Force Gauges
Series E
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Series E push / pull force gauges make job task analysis and ergonomics analysis simple and accurate, ideal for workplace design, strength assessment, and ergonomic studies. Series E presents the ergonomist and other professionals with a simple and economical testing solution. 100 lbF, 200 lbF and 500 lbF (500, 2,500, and 5,000 N) capacity force gauges are available, along with a wide range of attachments for various applications.
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Force Sensors For Push Direction
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INELTA Sensorsysteme GmbH & Co. KG
Inelta Force Sensors operate with foil strain gauges (DMS)
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Inverted Metallurgical Microscope
GX53
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Designed for use in the steel, automotive, electronics, and other manufacturing industries, the GX53 microscope delivers crisp images that can be difficult to capture using conventional microscopy observation methods. When combined with OLYMPUS Stream image analysis software, the microscope streamlines the inspection process from observation to image analysis and reporting.
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3D Video Microscope
BVM-20104
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The microscope is configured with 1.3M HD industrial camera. VGA image output interface, can be connected to the computer and monitor directly. clear and vivid image, taking photos, SD card storage, auto exposure. Camera is equipped with remote control panel, which makes the operation much easier. Optical lens keep parfocal under zoom, there is no deviation for center; 3D rotary observation
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Fiber Microscope
WL-C400S
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The WL-C series fiber microscopes use coaxial illumination to provide users with maximum detail. It easily can detect the finest scratches and contamination, making it ideal for critically inspecting polish quality.
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Motorized Force & Torque Measurement Test Stands
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Mark-10 offers a wide and unique range of motorized force measurement and torque measurement test stands. Motorized stands offer a significant advantage over manual test stands by providing constant test speed. Some models can be programmed for advanced test sequences to accommodate demanding applications. All motorized test stands carry the CE mark. A test stand is an integral part of a testing system, typically also comprising a force gauge or torque gauge, grips, software, and accessories.
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Electromagnetic Force Micro Tester
Micro-Servo
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This is a multi-functional fatigue testing machine suitable for specimens, structures and full-sized parts. It is an overhead actuator type with a broad test space, so it is ideal for various types of environmental tests, such as those in corrosion tanks or constant temperature tanks.
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High-end Transmission Electron Microscope
CryoARM
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JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.
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Microscope Photoluminescence Spectrometer
Flex One
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Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.
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Force Protection
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The Durham is a high-performance, highly-mobile and easy to emplace Medium Range Day/Night Wireless Surveillance System using a state of the art day camera and a cooled, highly sensitive 640x480 InSb Focal Plane Array thermal camera with 8X continuous optical zoom. The system is image stabilized and has automatic tracking of targets. Each system consists of a Base Station and one Remote Station which can be emplaced up to 5km away for wireless operation or within 500m for fiber optic operation. A single Base Station can monitor and control up to four (4) Remote Stations. The system is powered by a generator, batteries, solar (supplemental power), or vehicle power. Other options available are laser pointers, designators, and a vehicle integration kit.
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Cold Atomic Beam System
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Detailed description of item: Complete cold atomic beam sources for alkaline-earth precision experiments and atomic devices. Small chambers with patented permanent-magnet Zeeman slowers and in-vacuum 2D MOT optics allow high flux with low outgassing and no thermal beam flux at the cold atom port, which provides a CF-133 connection to customer vacuum chamber. Advanced thermal design of the effusion oven allows long-lifetime operation at minimal heating power, with no water cooling. An integrated low-outgassing hot window is provided for coupling of on-axis Zeeman cooling light. Ion and getter pumps integrated into the chamber manage outgassing from the oven at temperatures up to 520 °C. Operating baseline pressures below 1×10-11 mbar can be attained in the customer’s downstream cold atom (typically 3D MOT) science chamber, with suitable pumping speed provided at the differentially-pumped cold beam output port.
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X-ray Analytical Microscope (Micro-XRF)
XGT-9000
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- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
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General Purpose Quartz Force Sensors
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General purpose force sensors are offered in either stud or axial mounted configurations. They are internally pre-loaded and can be used for dynamic compression, tension, and impact force measurements. Tapped mounting holes on both ends of the radial connector style support link, platform, integrated link, and free-standing installations. The axial mounted type offers protection of the electrical connector and sensor cable from potential damage during drop testing and in free-standing installations. Supplied impact caps facilitate impact and drop force measurements.
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Electromagnetic Force Fatigue And Endurance Testing System
EMT Series
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High-speed repeated load tests can be carried out with a maximum velocity of 2 m/s, and maximum stroke of ±50 mm, using clean and quiet electromagnetic force as the driving power, without the use of oil. The test space is large so environmental tests can also be carried out using the constant temperature tank (option).
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Force Sensors And Strain Sensors
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Force and strain measurement in machines, installations, and tools.
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Compact Hydraulic Vibrator Force Simulator
JF Series
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The JF Series Force Simulator was developed with the emphasis on light weight, compact size and ease-of-use as a general-purpose, compact jack for the Servopulser system. Testing systems installed with the Force Simulator can easily perform endurance, fatigue and simulation tests on small structural members and various other structural members, which helps improve the logical design and reliability of products.
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Force Sensors For Pull/push Direction
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INELTA Sensorsysteme GmbH & Co. KG
The force sensors can be integrated easily and uncomplicatedly by the regular standard thread.
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Eyepiece-less Stereo Microscopes
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Vision Engineering’s eyepiece-less stereo microscopes are better for users and for business. Their ergonomic design lets the operator sit back in a comfortable position, and the expanded pupil technology delivers an enhanced 3D view of the subject. The relaxed natural posture makes it easy and to work with tools and to manipulate the subject. Greater comfort and ease of use directly translate into greater productivity and quality.
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Tactile Pressure and Force Measurement
I-Scan® System
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This versatile tactile pressure measurement system is tailor-made by choosing from over 200 pressure sensors to meet your specific application requirements.
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Force & Strain Measurement
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Load cells, tank weighing devices, balances, scales, force gauges, torque sensors and strain gauges including diaphragm, dual parallel, linear, rosette, T-rosette, and torsion and shear types.
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Force Sensors
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Is defined as a transducer that converts an input mechanical force into an electrical output signal. Force Sensors are also commonly known as Force Transducers.
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Force Testing
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Force testing is a way of determining how an object will react when it is subjected to tensile or compressive loads
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Force
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Force instruments are used to measure, apply, or regulate force accurately to prevent damage, improve performance, and ensure safety.
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Load Cells & Force Transducers
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BLH and Nobel Weighing Systems offer a wide variety of load cells and force transducers, ranging from the unique KIS load cell and weigh module to the VPG transducers range of products. Our many years of experience, our state-of-the-art instruments, and the exceptionally broad range of components that go into our systems allow us to deliver high-quality solutions tailored to your needs.
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Load Cells, Weighing and Force Sensors
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We are pleased to offer Load Cells from both Zemic and Vishay. We are the exclusive UK distributor for Zemic load cells.
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Semiconductor / FPD Inspection Microscope
MX61L
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Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Scanning Electron Microscopes
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Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
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Infrared Microscope
DDR200/300 NIR
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The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
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Industrial Microscope Solutions
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Industrial microscopes are a vital tool used for measuring, quality control, inspection, and in soldering and manufacturing. Each industrial microscope we offer uses complex designs that provide unique solutions for the inspection process and aim to improve resolution and sample contrast.
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Stereo Zoom Microscopes
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Our product range includes a wide range of gemstar stereo zoom binocular microscope, gemstar stereomaster binocular stereo zoom microscopes, zoomstar iii trinocular stereo zoom microscopes, zoomstar ii trinocular stereo zoom microscopes, zoomstar vi trinocular stereo zoom microscopes and zoomstar v trinocular stereo zoom microscopes.
