Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Force Calibration
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Trescal provides full Force Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Force Calibration services can be delivered at your site or at our lab. Accreditations for our force calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Intel® Atom™ Processor E3845 1.9 GHz-based EtherCAT Master Controller
Talos-3012
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The ADLINK Talos-3012 EtherCAT master controller, based on the Intel Atom quad-core processor E3845 1.9 GHz, with IEC-61131-3 compliant syntaxes, delivers reliable control for multiple axes and versatile I/O control supporting specialized real-time applications. The Talos-3012 supports up to 64-axis motion control and 30K points within determined cycle times, and is verified for interoperability with various EtherCAT servo drives and 3rd party EtherCAT products.
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Intel® Celeron J1900 & Atom™ E3825/ E3845, 3.5" SBC
MIO-5850
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Intel® Celeron J1900 & Atom™ E3825/E3845, DDR3L-1333MHz 2/4GB on boardDirectX11, OpenGL3.2, OpenCL1.2, Dual display: HDMI, VGA, LVDSCPU bottom up design for system integration and rugged design for variable automation factory environments3 Intel i210 GbE, rich I/O: 4COM, SATA, USB3.0, SMBus/I2C, 16 bit GPIO, full-size Mini PCIe/M.2 E Key, half size mSATA, 12-24V Power input, SIM Card holder, CANBUS with IsolationSupports iManager, SUSI APIs, WISE-DeviceOn and Edge AI Suite
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Digital Video Microscope
BVM-20102
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High-resolution CCD sensor, built-in analog/digital converter, analog and digital signal directly display on the screen, can also simultaneously display on TV and computer through corresponding interfaces; taking photo and video through software; easy operation, reducing user's fatigue and injury.
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Portable Measuring Microscope
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Opto's portable microscope is designed to handle even the most demanding on-site inspections. With its ergonomic design, robust construction and perfectly matched optics configuration, it is a precise and reliable tool.
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Measuring Microscopes, Image Processing
Measuring Microscopes
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Optik Elektronik Gerätetechnik GmbH
Image processing software for dimensional measurements, motorized measuring microscopes and fully automatic measuring machines.
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Fiber Microscope
WL-D200S
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The WL-D200 fiber microscopes provide dual-illumination, both coaxial and oblique, to produce the highest-quality image detail and superior view of fiber end face cleanliness and core condition.
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Product
Complex of Visualization and Image Recording for a Video Microscope
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To develop a complex for visual inspection of electronic components (other micro-objects) in order to identify visual defects, record the resulting image and transfer information for processing.
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Force Sensors
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General purpose force sensors are offered in either stud or axial mounted configurations. They are internally pre-loaded and can be used for dynamic compression, tension, and impact force measurements. Tapped mounting holes on both ends of the radial connector style support link, platform, integrated link, and free-standing installations. The axial mounted type offers protection of the electrical connector and sensor cable from potential damage during drop testing and in free-standing installations. Supplied impact caps facilitate impact and drop force measurements.
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Measuring Microscopes, Image Processing + Drawing Die And Wire Measurement
Easy Low Cost Wire Drawing Die Measuring Microscope
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Optik Elektronik Gerätetechnik GmbH
Simple optical measuring system for diameter and ovality of wire drawing dies with image processing software.
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Intel Atom® Embedded Controller
AMAX-5570E V2
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Optimized BIOS & Embedded OS for 1ms real-time control (Windows & Linux)Achieves 32-axis motion control with 500 μs EtherCAT cycle time under LinuxOPC UA and Modbus TCP/RTU as IT connectivity enabled by CODESYSEtherCAT, PROFINET, Ethernet I/P, and CANopen are OT connectivity feature enabled by CODESYSIntel Atom® quad-core x6414RE processorSystem I/O with 4 x GbE, 2 x USB, 2 x Isolated COM, 1 x HDMI, 1 x 5 pin terminal (dual power input)AMAX-5000 EtherCAT Slice I/O expansion and AMAX-5400 PCIe modules, optional for left side (max.2)iDAQ-964 modules, optional for left sideEMC compliance for energy management and Battery Energy Storage System (IEC-61000-4 Industrial requirement)
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Light Sheet Microscopes
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Discover advanced light sheet microscopy solutions from Leica Microsystems. Our portfolio combines cutting-edge technology with exceptional imaging capabilities to enhance your research.
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48 Ω HMM Pulse Force Probe
PHD-HMM-48-1
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High Power Pulse Instruments GmbH
*High current wafer-level and package-level 98 Ω HMM probing with grounded DUT*Built-in high surge 48 Ω pulse reflection suppression resistor up to 80 A peak*Fast rise time < 0.5 ns due to low inductance GND loop*Variable pitch from 50 µm to 5 mm*Tungsten replacement probe tips*SMA pulse force pigtail*Compatible to PHD-3001A interface*High reliability
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3U CompactPCI Quad-Core Intel Atom® Processor X Series Blade
cPCI-3640 Series
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- Low power quad-core Intel Atom® x6413E Processor (formerly Elkhart Lake)- Up to 32GB DDR4-2400-3200MT/s ECC soldered memory- Optional onboard SSD support- Flexibility in IO selection- Extended temperature -40 to 85 degree C supported
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Universal ZIF (Zero-Insertion-Force) DIP Test Socket
Series X55X
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Universal Zero Insertion Force DIP Test Socket. All pin count sockets go into PCB with either .300 or .600 [7.62 to 15.24] centers. Sockets can be soldered into PCBs or plugged into any socket. Socket fits into Aries or any competitive test socket receptacle.
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Product
Scanning Electron Microscope (SEM)
Prisma E
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Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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Multiphoton Laser Scanning Microscope
FVMPE-RS
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The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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Transmission Electron Microscope
TEM
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Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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Thermal Microscope Stage For Petri Dish
TS-4SMP
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With our TS-4SMP Thermal Stage for Petri Dish, a specimen on a microscope slide or culture dish can be maintained at any temperature between -20°C and +60°C. Setup is easy, takes little time, and the controller will regulate the stage temperature to within +/-0.1°C. The collar on the stage is designed to accommodate a 35mm 'Nunc' petri dish. The collar may also be removed for use with slides.
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Force Gauge
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The Centor range of digital force gauges offers force measurement solutions for every situation. From the simple Centor First II force gauge to the colorful Centor Easy II, we have a wide range of instruments designed for industrial and laboratory use.
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Temperature Controlled Microscope Stage
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Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new feature which will increase the characterisation capabilities of the DSC system is to combine it with imaging capability. The new LINK Digital Imaging module enables additional information to be obtained by correlating optical changes such as colour with temperature. The new TASC analysis tool takes this further. TASC (Thermal Analysis by Surface Characterisation) is a new image analysis capability which enables structural changes in samples to be tracked and quantified optically. It has the unique ability to measure local transition temperatures allowing different points on a sample to be identified. The new DSC system is great tool to use in research and quality control to measure quantitative values for glass transitions, melting peaks and sample purity and, when combined with TASC, even sample homogeneity.
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Intel® Pentium N4200/Celeron N3350/ Atom™ E3900 Series Pico-ITX SBC
MIO-2360
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Embedded Intel® Pentium N4200/Celeron N3350/Atom™ E3900 seriesDDR3L 1866MHz support up to 8BGDual display: 24-bit LVDS+VGA/HDMIFlexible design using integrated multiple I/O: MIOe to approach vertical applications & keep domain knowhow2 COM, 1 SATA, USB3.0, PCIe Mini Card and mSATASupports iManager, SUSI APIs, WISE-DeviceOn and Edge AI Suite
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Portable Microscope, X4001mm Field Of View, 1µm High Resolution
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The highest resolution digital field microscope. Ideal for observing plant and animal samples at the cellular level. The ioLight microscope will even display limited structure in blood cells, which are 5-10µm across.
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Force Sensor Elements
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TE Connectivity (TE) enables OEMs to measure force using MEMS-based technology load cells. The same proprietary piezoresistive silicon strain gage technology used to measure pressure can also be configured into a reliable, low-cost package to measure force.
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High Force Type Spring Probes
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Total length of spring probes for high force is longer than standard type and is more optimized to use for testing PCB. We have 1mm to 2.54mm pitch and you can choose not only tip type but also spring force for each pitch. This makes it possible for you to choose spring probe suits the best for your use.
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1U Rackmount Network Appliance With Intel® Atom™ X5-E3940 Processor And 6 GbE Ports
FWA-2011
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Intel® Atom™ X5-E3940 Processor, 2 x DDR3L 1333/1600/1867MHz SODIMM up to 16GB. 6 x GbE LAN ports with 2 pairs of LAN bypass, 1 x Advantech network module expansion, 1x mSATA slot, 1 x Mini-PCIe slot.
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Force Displacement Testers
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Force displacement testing measures how much force is required to displace or deform a specific component or material. It’s an important aspect of quality control in manufacturing as well as material science. It’s necessary to help ensure products are made to the proper standards and to verify the properties of certain materials. Imada provides a range of force displacement testers that provide precise and accurate measurements, with numerous features to help technicians complete testing as quickly and effectively as possible.
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Thin Mini-ITX Embedded Board with Intel Atom®
AmITX-AL-I
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The AmITX-AL-I is a low-profile Thin Mini-ITX embedded board supporting an Intel Atom® processor E3900 series, Intel® Pentium® processor N4200, and Intel® Celeron® processor N3350 system-on-chip (SoC). The AmITX-AL-I is specifically designed for customers who need optimized processing and graphics performance with low power consumption in a long product life solution.
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Temperature Forcing System
ETF-SERIES
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Precise Temperature Accuracies with Reliable Test Results Temperature Limits: -40/-60 °C to 30 °C Temperature Accuracies: ±2-3°C Temperature Rate of Change: 20-25 deg /min (Non-linear) Maintenance Free Access to The System Self-Sufficient System Compact with small footprints suitable for any space constraint laboratories Low decibel system Suitable for testing electronic chips / devices Environmentally friendly refrigerants Efficient heating Microprocessor based single set point PID temperature controller with data logging Flexible hose up to 2.5-3.0m Interchangeable heads according to chip size. Inbuilt electrical control panel with switchgear system
