Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Product
Universal SOIC ZIF (Zero-Insertion-Force) Test Socket
Series 547
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Universal SOIC Zero Insertion Force Test Socket. Devices with up to 44 pins can be inserted without bending or otherwise damaging the legs, since no force is required to either insert or remove the component from the socket. Accepts SOIC gull-wing and J-lead devices, up to 44 pins on .050 [1.27] lead pitch, body widths from .150 to .600 [3.81 to 15.24].
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Product
Force Calibrating Machines
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Morehouse Instrument Company Inc.
Morehouse Universal Calibrating Machines (UCM) are an easy to use, cost-effective, hydraulic force calibration system that lasts for generations. UCMs built in the 1950s are still operating today! The UCM can be used to calibrate both tension and compression instruments in accordance with ASTM E74, ISO 376, and other internationally recognized force standards.
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Product
3U CompactPCI Quad-Core Intel Atom® Processor Blade
cPCI-3620
Processor Blade
The ADLINK cPCI-3620 Series is a 3U CompactPCI® processor blade featuring a quad-core 4th generation Intel® Atom SOC and soldered DDR3L-1333 ECC memory up to 4GB.
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Product
"Bay Trail" Atom Processor
XMC-120
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Curtiss-Wright Defense Solutions
The XMC-120 from Curtiss-Wright Defense Solutions is a small form factor and low power x86 single board computer (SBC). Designed for space-constrained size, weight and power (SWaP)- sensitive programs, the XMC-120 offers quad-core x86 processing performance with ultra low power and small sized footprint.
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Product
Force
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Force instruments are used to measure, apply, or regulate force accurately to prevent damage, improve performance, and ensure safety.
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Upright Light Microscopes
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Get the publication-quality imaging and customizable upright microscope solution you need for your Life Science research with Leica Microsystems. These powerful imaging systems feature constant color, natural light illumination, superior optics, and configurable options to provide high contrast, brilliant images for your cutting-edge biological research.
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Product
IEC60884 Fig20 Flexible Cord Retention Force Test Apparatus
IEC60884 Fig20
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Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 Fig20 Flexible cord retention force test apparatusMeet the standard: GB2099.1-2008 Article 23.2 and Figure 20, IEC60884 Figure 20, VDE0620 Uses: It is used to check whether the plug wire and the electrical accessory are firmly fixed. Sample range: detachable plug, detachable mobile socket, non-removable plug and non-removable mobile socket
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Product
Scanning Electro-chemical Microscope
920D
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The scanning electrochemical microscope (SECM) was introduced in 19891 as an instrument that could examine chemistry at high resolution near interfaces. By detecting reactions that occur at a small electrode (the tip) as it is scanned in close proximity to a surface, the SECM can be employed to obtain chemical reactivity images of surfaces and quantitative measurements of reaction rates.
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Product
Inverted Metallurgical Microscope
GX53
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Designed for use in the steel, automotive, electronics, and other manufacturing industries, the GX53 microscope delivers crisp images that can be difficult to capture using conventional microscopy observation methods. When combined with OLYMPUS Stream image analysis software, the microscope streamlines the inspection process from observation to image analysis and reporting.
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Product
Force Measurement
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Using state-of-the-art technology, ABB provides purpose built solutions for your force and dimension measurement needs, making it possible for your production output to accurately match the most varying and demanding requirements.
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Industrial Microscope for Materials Science & Industrial Applications
BX53M
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Designed with modularity in mind, the BX3M series provide versatility for a wide variety of materials science and industrial applications. With improved integration with OLYMPUS Stream software, the BX3M provides a seamless workflow for standard microscopy and digital imaging users from observation to report creation.
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Product
Scanning Electron Microscope (SEM)
Prisma E
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Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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Product
Force Sensors For Pull/push Direction
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INELTA Sensorsysteme GmbH & Co. KG
The force sensors can be integrated easily and uncomplicatedly by the regular standard thread.
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Product
Quartz ICP® Force Rings
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Ring-style sensor configurations measure dynamic compression. Tension measurements are also possible if the unit has been installed with proper pre-load. The through-hole mounting supports platform, integrated link, and support style installations using either a through-bolt or the supplied stud.
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Product
Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Stereo Microscopes & Macroscopes
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Leica Microsystems offers customized stereo microscopes for research, industry and education. Our macroscopes for industry, medicine and research offer exceptional optics and ultra convenient operation. Stereo microscopes and macroscopes from Leica enable you to view, analyze and document your specimens in two and three dimensions for any application.
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Product
Scanning Tunneling Microscope for Ultra High Vacuum
STM
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A.P.E. Research instrument is a versatile Scanning Tunneling Microscope, STM, capable of scanning samples of almost any size. It can operate in UHV and in air. The systems have been designed to evaporate (e.g. metals, organic molecules) in UHV directly onthe sample mounted on the STM head.
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Product
ThermalAir Series Temperature Forcing System
ThermalAir TA-3000A
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The ThermalAir TA-3000 high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -65°C to +225°C. Compact! Plus Performance!
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Product
Economic Extreme Power Temperature Forcing System
ECO Cool
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ECO Cool® Economical Powerful - Thermal Forcing System.Exceptionally Powerful, Economical & Reliable
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Product
Advanced Force Measurement
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Accu-Chek offers in-house and on-site calibration services for a wide range of dimensional, metallurgical, and electronic equipment. We also specialize in the maintenance and repair of these instruments.
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Scanning Electron Microscope w/ EDX Laboratory
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Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Stereo Microscopes
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From affordable, high quality, stereo zoom microscopes for exceptional value and performance, though to powerful, high resolution stereo microscopes capable of 320x magnification – all supported with a range of productivity options – there’s a solution in our range of stereo microscopes for every application.
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Atomic Spectroscopy Software
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The range of Agilent atomic spectroscopy software, available with and without compliance solutions, includes SpectrAA, MP Expert, ICP Expert and ICP-MS MassHunter software.
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Force Sensors
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Here at Flintec, our force sensor range provides solutions that integrate effectively into a wide variety of industrial applications. They include customized load pins, extensometers, torque sensors and a range of miniature force sensors.
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Atomic Layer Deposition Systems
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Atomic Layer Deposition (ALD) is a powerful way to build ultra-thin, super-precise coatings, one atomic layer at a time. It’s especially useful and efficient when working with tiny, complex 3D structures, making it a go-to technique in advanced semiconductor manufacturing.
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Product
Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
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Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Measuring Microscopes, Image Processing + Optics Test Equipment
Development And Production Services
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Optik Elektronik Gerätetechnik GmbH
Development and assembly of opto-mechanical building groups, including software development.
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Product
Portable Microscope, X4001mm Field Of View, 1µm High Resolution
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The highest resolution digital field microscope. Ideal for observing plant and animal samples at the cellular level. The ioLight microscope will even display limited structure in blood cells, which are 5-10µm across.
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Product
Compact Hydraulic Vibrator Force Simulator
JF Series
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The JF Series Force Simulator was developed with the emphasis on light weight, compact size and ease-of-use as a general-purpose, compact jack for the Servopulser system. Testing systems installed with the Force Simulator can easily perform endurance, fatigue and simulation tests on small structural members and various other structural members, which helps improve the logical design and reliability of products.
