Memory Test Systems
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Product
System Level Test and Burn-in Solutions
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System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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Product
Test System
USB Explorer 280
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The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
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Product
Pneumatic Horizontal Shock Test System
KRD12 series
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The KRD12 series shock test system is used to measure and determine the horizontal impact resistance of a product or package, and to evaluate the reliability and structural integrity of the test unit in a horizontal impact environment. The system can perform conventional half-sine wave, post-peak sawtooth wave, or trapezoid wave shock test to realize the shock energy that the product is subjected to in the actual environment, thereby improving the product or packaging structure.
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Product
Gel Strength Test System
LD-LGST-A10
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Gel Strength Test SystemLD-LGST-A10is mainly used to measure the gel strength of gelatine under the stipulated environment. It has traveling accuracy ± 0.3 % and Test range up to 5 to 1000 g Bloom. It consists of Jelly Strength Tester, Constant Temperature Bath and Refrigerator. Sampling depth can be present arbitrarily in 1 to 60 mm. It consists four kinds of sampling measurement modes: single-step, maintaining, circulating and automatic.
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Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional Test
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Product
Flash Memory In-System Programming File Generation
ScanExpress Flash Generator
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ScanExpress Flash Generator is a tool to quickly create Flash programming files for use with ScanExpress™ software. The application operates as a standalone utility or integrates into ScanExpress TPG for creation and reuse of boundary-scan test files for in-system programming (ISP).ScanExpress Flash Generator combines a board Netlist, scan chain description, and BSDL files to automatically create Flash Programming Information (FPI) files. These files include all information necessary for ScanExpress Runner™ or ScanExpress Programmer™ execution systems to perform read, write, erase, and verify operations—in-system using high performance Corelis hardware.
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Product
Test System
DA-1 ATS
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The DA-1 ATS is an economical Commercial-Off-The Shelf (COTS) build-to-print tester. The test station is compliant with the published drawing package. The system does not include software.
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Product
Audio and Acoustic Functional Test Solution
Functional Test
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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Product
Test Automation Platform Deployment System
KS8000A
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TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher level test executive software environments. The Keysight KS8000A Test Automation Platform (TAP) Deployment System provides a lower cost, scaled down alternative to the full KS8400A TAP Developers System without the graphical user interface, results viewer and timing analyzer. Deploy your existing test software and TAP plugins into manufacturing environments using the KS8000A command line interface or your own interfaces.
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Product
Battery Pack Test System
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*Easy to see now test progress*Can cycle test*Provide Charge, Discharge, Suspend, FOR, LOOP Mode Select*When Charging, set the stop current to stop charging when fully charged so as to avoid overcharging that will damage the battery. When Discharge, set the stop voltage to stop discharge when discharging to lowest so as to avoid over-discharging that will damage the battery.
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Product
VLF Testing and Diagnostics System
PHG 70 TD/PD
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Cable testing and diagnostics with the BAUR PHG 70 TD/PD. With the PHG TD/PD, you get a multifunctional cable testing and diagnostics system that was specially designed and developed for medium-voltage networks. The PHG TD/PD system is also the only cable testing and diagnostics system that gives a comprehensive overview of the quality and ageing condition of the test sample. The diagnostic methods TD and PD are mutually complementary, because on one hand you can detect the complete condition and on the other hand locate * individual faults in the operating resources.* High performance VLF truesinus testing device (3 kW) with regulated output voltageCompact, enclosed design in 19" format* Variable installation option with separate control and voltage unit* Variable connection options to cable stations of different models
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Product
Walking Test System Kit
PGA-710
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The PGA-710 Walking Test System is a complete kit designed to perform the walking test per ANSI/ESD STM97.2 and IEC 61340-4-5. The system consist of several devices designed for portability and to perform several different tests which includes measuring the voltage on a person in combination with floor materials and footwear.The kit includes the PGA-710B Data Logger, the PFM-711B Field Meter, CPM-720B Charge Plate Monitor, the PCS-730B Electrostatic Charger, Hand Held Electrode and the Prostat Autoanalysis Software version 2.0.
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Product
DC Parametric Test System with Curve Trace
DC3
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The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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Product
Eddy Current Test System
CIRCOGRAPH® Product Family
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Foerster Instruments, Incorporated
The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.
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Product
Controlled impedance test system
CITS900s4
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CITS900s4 is the seventh generation of Impedance test system from polar, and typically the most popular model for customers who are new to impedance control. CITS900s4 provides both differential and single ended measurement capability along with 4 channels to provide flexible probe connection.
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High Voltage Test & Measurement System
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Hard-wearing and technically-sound High Voltage Test & Measurement System is developed to provide accurate results. These systems are widely used in power, electrical, engineering and other industries. They are designed using heavy-duty spare-parts to add strength with life to the systems. They are ideal to provide accurate results without any flaw to ensure to provide the best performance. These systems are perfect combination of easy usage, durability and high accuracy in results.
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Product
PXI based Test Systems Module
PXI XJLink2
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The PXI XJLink2 module allows the integration of XJTAG into PXI-based test systems. PXI XJLink2 has one JTAG controller that can be connected to up to 4 JTAG chains, which are configurable for pinout and voltage. It is easily integrated with LabVIEWTM with a full set of Virtual Instruments (VIs) included.
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Thermal Imaging System for Electronics Testing
ETS320
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Whether the goal is product testing or scientific research, heat can be an important indicator of how a system is functioning. The FLIR ETS320 is a non-contact thermal measurement system that pairs a high-sensitivity infrared camera with an integrated stand, for hands-free measurement of printed circuit boards and other small electronics.
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Product
V4 Marine Communications System - V4 NAVTEX Test System
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The ICS Electronics Limited V4 NAVTEX Test system may be used for type approval, general performance testing and production testing of NAVTEX receivers.
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Automatic Electrical Protective Equipment Test Systems
CBC-50С (CBC-100C)
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Automatic systems CBC-C-series are designed for high-voltage withstand testing of electrical protective equipment and insulated hand tools. The tests are carried out with AC voltage (CBC-50C: UAC ≤ 50 kVRMS; CBC-100C: UAC ≤ 100 kVRMS) at industrial frequency (f = 50 Hz).
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Wafer Level Multi-Die Test System
ITC55WLMD
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The ITC55WLMD series of test systems has been developed by ITC to be stand-alone UIL test systems configured specifically to test on wafer. The systems include an ITC55series UIL tester and inductor box, a current limiter module and a system controller
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Optics Test Systems
Front Window Scanner For Wedge Angle Measurement
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Optik Elektronik Gerätetechnik GmbH
Scanning of complete automotive windshields to measure the wedge angle and thickness change, especially in the HUD area.
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Product
Resonant Testing System
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Originally designed to precrack specimens for fracture mechanics, the current versions offer much more possibilities due to a modular concept:*Bending up to 160 Nm*Tension/Compression up to 8 kN*Torsion
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Product
Universal Testing Systems (Up To 300 KN)
3400 Series
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Instron’s 3400 Series universal testing machines offer dependable performance across a broad spectrum of mechanical testing applications, with force capacities ranging up to 300 kN. These systems are well-suited for basic tensile, compression, flexural, peel, puncture, friction, and shear testing, and can be easily configured using a wide selection of grips and fixtures from Instron’s accessory catalog. Built with user safety and efficiency in mind, each system incorporates Instron’s proprietary Operator Protect technology, ensuring a secure and intuitive testing environment.
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Product
Automated Relay Test System
Relay Master
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Relay Master is an automatic relay test system capable of testing from one to 64 relays simultaneously without having to remove them from the rack. System automation improves efficiency and reduces track time requirements. The PC-based system stores test parameters and results in a database for ease of reliability and trending analysis.
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Product
Nanomechanical Test Systems
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Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Automatic Circuit Breaker Test Systems
UPA-1 (UPA-3)
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These portable systems for primary injection testing of circuit breakers which are used in in AC circuits of industrial frequency.
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Test Fixture Kits
Test Fixture
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Product
Microtester Test Systems
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With the micro probes and the fine-pitch adapters used on them, you are able to contact the finest test structures. E-tests, functional tests, IC tests or high-current tests are made to be affordable, efficient and with a short cycle time. With the integration of HF adapters we also enable the double-sided testing of HF substrates up to high frequency ranges.
