Memory Test Systems
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Product
Integration of Inline Test Systems
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The test system and adapter can also be integrated in inline test systems. Additional communication can take place via interfaces (e.g. RS232, DLL). We have already created numerous integrations for different manufacturers.
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Product
Motor Drive Test Systems
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Drive and motor systems present unique challenges for test systems and Intepro combines regenerative active electronic loads to reduce the energy needed to do the tests as well as sophisticate instruments and supply voltages to test these demanding applications and provide meaningful results for the electrical and mechanical power parameters.
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Product
Meter Test System
MTS-50
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Kongter Test & Measurement Co., Limited
This meter test equipment features state-of-art designing with high accuracy. It is composed of high accurate (class 0.05% or 0.1%) standard reference meter and power source (up to 50A). This system is particularly designed with modular structure for calibration and test of different single phase/3 phase electronic/inductive active and reactive energy meters.
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Product
Reflective Memory
VME-5565
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The VME-5565 Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board can be configured with either 64 Mbyte or 128 Mbyte of onboard SDRAM. The local SDRAM provides fast Read access times to stored data.
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Product
Mixed Signal Test Systems
MTS1020i
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The MTS-1020i is a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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Product
Silicon-Microphone 8Ch Auto Test System
BK9015
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Based on the BK3011 MEMS Mic Tester, the BK9015 is our fully automatic 8 channel MEMS (Silicon) mic sweep tester. Testing up to 8 DUT's simultaneously, the BK9015 can test 8 mics simultaneously and sort them according to passing grade and cause of failure! Because it uses a sweep test, it can check characteristics for the entire frequency range. Your data can be viewed in real time or stored so you can analyze problems or trends.
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Product
SSD Test System
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The Neosem’s SSD test system combines advanced SSDtest hardware, software and environmental chamber into a single platform and supports all popular storage interfaces including PCIe, SAS & SATA and fast emerging protocols such as NVMe and AHCI.
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Product
Environmental Test Systems
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Manufactured products can be exposed to both thermal and mechanical stresses.These should not be considered separately, as the effects may be linked.IMV can supply vibration-test systems combined with climatic chambers to provide complete vibration, temperature and humidity environmental testing.These systems can be custom-designed to meet your application.
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Product
Integrated 5G mmWave Test System
IQgig-5G
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The IQgig-5G is a fully-integrated, non-signaling solution for testing 5G mmWave products at both the 28 GHz and 39 GHz frequency bands. All signal generation, analysis, and RF front-end routing hardware are self-contained inside a single chassis. The IQgig-5G is license-upgradeable to support the pre-5G and 3GPP standards evolution with up to 1 GHz of tester bandwidth. The IQgig-5G solution has three bi-directional source and measurement ports each with 2.92mm connector coaxial interface.
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Product
In-line Testing system
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Automatical testing of electronic or automotive components and devices
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Product
Low Voltage Burn-in and Test System
Max 450
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For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in
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Product
CDM Test System
1100-CDM series
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Tokyo Electronics Trading Co., Ltd.
Model 1100-CDM is the latest model developed as a successor to the conventional CDM-550, and supports testing methods (Field-Induced CDM) that conform to international standards. In addition, a camera and a high-accuracy robot can apply CDM stress to a precise position.
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Product
Brake Test Systems
Giant 8000 Series
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Customer perception of vehicle quality is closely related to the NVH behaviour of the vehicle. With the HORIBA ATS Brake testing system, NVH relevant design features are analyzed and various metrics stored in the database of the automation system. For friction borne vehicle NVH problems coming from the brake and its components the GIANT 8000 Series is the ideal tool to resolve it. The GIANT 8000 Series is superior NVH test system providing you with the best testing conditions for all types of vehicles. Test brake fixtures could be tested with a complete wheel suspension system. In a semi acoustic chamber NVH tests could be realized and drum brakes and disc brakes including the vehicle axle could be tested.
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Product
8k Frame memory Board
GG-169
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GG-169 is a frame memory board that supports high-speed data transfer and can input and output uncompressed 8K video.With 12G-SDI × 4 lines (up to 8 lines with the use of an optional expansion board) equipped as standard, it achieves real-time output of 8K / 59.94p.
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Product
High Temperature Test System
129620A
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Solartron Analytical, specialists in the design of precision impedance test equipment, has joined forces with high temperature Furnace specialists Carbolite, and sample holder specialists NorECS to produce a range of advanced high temperature materials characterization test systems.
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Product
Benchtop Test System
300 Series Benchtop ATE
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The Circuit Check 300 Series benchtop ATE Test Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 300 Series Benchtop ATE, test procedures can become automatic, with test steps and go/ no-go limits easily programmable in common tabular form. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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Product
Test System
ITC57300
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The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Product
Motorized Force Test System
MT Series
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In the past, film extruders, paper producers, converters, and woven/non-woven fabric producers have had the choice of test stands and universal test machines which are either value-priced peak-force-only machines, or expensive computer-operated integral-load cell machines. Now you can have the best of both worlds in a single instrument. The series MT-1500, a simple to use computer operated tester, with Quality Control software for automatic calculation and graphical display of break, elongation, yield, modulus, and other, tension and compression force information.
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Product
PIM Test Systems
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AWT's Portable PIM testers are powerful yet compact tools for testing and analyzing telecommunications network infrastructure. These testers are ruggedized and can withstand harsh environmental conditions. they are accurate, reliable and easy to operate and they provide a wealth of features ideal for work in the field. Built-in Distance-to-PIM option.
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Product
High Voltage Isolation Test Systems
HT 9460 and 9464
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Accurate and non-destructive production testing of ac Isolation Voltage and Partial Discharge. With over 450 systems installed worldwide the 946X series of test systems are the standard and system of choice used by the majority of semiconductor manufacturers that produce optically isolated devices.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
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Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
WEIGHING SYSTEM TESTING
1006
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The Tester 1006 has a simultaneous control function of up to 4 load cells in any weighing system, upload and download function for programming the DAT and MC 302 series instruments, but it can also be used as a Calibrator and Peak detector. It is very useful for the correct mechanical installation and for fault diagnosis. The Tester 1006 is supplied as standard with cable for connection to our junction boxes / sum mod. CEM 4 / C and CGS 4 / C. Simultaneous display of the signal of each individual load cell allows to control the entire weighing system, weight distribution, overloads, faulty cells and faulty connections. OUT OF PRODUCTION. Pavone systems provides a new version of Tester 1006: Tester 1008.
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Product
Test Adapters / Aeroflex Test System
52xx / 5300
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We develop and manufacture test adapters for your existing interface including documentation and test program
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Product
NI's Electrical Functional Test Solution
Functional Test
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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Product
Traveling Wave Tube Test System
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Yelo has a wealth of experience in developing and customizing test systems for the Travelling Wave Tube (TWT) market. TWT testers feature specialized power supplies, measurement equipment, and comprehensive control and safety systems.A rugged PLC is used to control all voltages and perform all monitoring functions. User interface and datalogging functions are provided by a supervisory PC that is electrically isolated from the PLC. Power Supplies are solid state with optical fibre barriers to ensure that all control/monitoring is carried out at safe voltages, and with maximum noise immunity. All safety interlocks are hardwired, and the testers are equipped with emergency shutdown features for added security.
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Product
Tire Rolling Resistance Test System
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This system measures the rolling resistance of each tire accurately. In addition to the simultaneous measurement of tire loss resistance and rolling resistance coefficient for each drive by mode operation (JC08, WLTC), coasting test, constant acceleration/deceleration test and transient mode test are able to be performed. Furthermore, measurement of driving noise/ vibration of the tire, effect of the tire loss due to the temperature change can be verified by adding options.Conforming the JIS D 4234: 2009 and ISO 28580: 2009.
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Product
High Power LED Test System
Lumere-GM
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Evolusys Technologies Sdn. Bhd.
Lumere GM is a LED test and measurement system for various parameters of LED light. It is a high-accuracy system with a temperature-controlled CCD, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. The Lumere GM is used in laboratory applications and in the production of high-power LEDs.
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Product
Protective Relay Test System
MTS-5100
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The MTS-5100 is the only all-in-one relay test set with a direct front panel interface for all functions, without exception!
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Product
High Voltage Switching Test System
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The advanced development of new technologies, such as SiC and GaN, have opened the opportunity for more efficient and higher voltage/power performance in switching and power management circuits. Their high cutoff frequencies, low on-state resistance, and very high breakdown voltages can increase power supply power handling densities approaching hundreds of watts/inch. Reliability of these new technologies and techniques is critical for realizing practical applications. While Silicon devices have a rich history of proven reliability, these newer compound semiconductor technologies are too new to have a reliability history and have not been well proven. Further, process variations, even in well-controlled lines, yield widely varying results. This has driven the need for additional testing and to burn-in devices prior to delivery.
