Beam
a shaft of directed energy.
See Also: Shaft, Beam Analyzers, Beam Load Cells, Beam Profilers, Beam Sensors, Beam Splitters, Electron Beam, E-Beam, Laser Beam, Focused Ion Beam, Laser Beam Analyzers, Laser Beam Profilers
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Laser Rangefinders
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A rangefinder that uses a laser beam to determine the distance to an object.
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Ultrasonic Single Element Probes
SONOSCAN P
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The ergonomic straight beam probes of the SONOSCAN Series for Nondestructive Testing (NDT) comply with the European Standard DIN EN 12668-2. Our ultrasonic transducers are used to check metals, plastics and ceramic materials for discontinuities, such as cracks, inclusions, blowholes and other material flaws.
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Diode Submounts
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Ultra-precise patterning of thin film metals on dielectrics with high thermal conductivity are used for diode submount applications. Via the acquisition of Ion Beam Milling, Inc., SemiGen is the industry leader for laser diode submount fabrication. As each application is different, we work with customers to develop a custom design that perfectly fits their requirements. We have experience producing circuits utilizing substrates of varying thicknesses with high thermal conductivity such as alumina (Al), aluminum nitride (AlN), and beryllium oxide (BeO). SemiGen can deliver laser diode submounts with or without Au/Sn pads depending on your needs.
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E-Beam Power Supplies
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Maximize image quality and repeatability. Designed for scanning electron microscope tools, Advanced Energy’s precision e-beam technologies deliver impressive performance, accuracy, and reliability.
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Gas Filter Correlation CO Analyzer
Model N300
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Teledyne Advanced Pollution Instrumentation
The Model N300 is a microprocessor-controlled analyzer based on the Beer-Lambert law that is used to determine the concentration of carbon monoxide (CO) in a sample gas.The N300 uses Gas Filter Correlation (GFC) to overcome the interfering effects of various other gases (such as water vapor) that also absorb Infrared (IR) light. The analyzer passes the IR light beam through a spinning wheel made up of two separate chambers: one containing a high concentration of CO known as the reference, and the other containing a neutral gas known as the measure. The concentration of CO in the sample chamber is computed by taking the ratio of the instantaneous measure and reference values and then compensating the ratio for sample temperature and pressure.
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Medium Capacity Single Point Bending Beam Load Cells
SPL SERIES
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The SPL Series single point load cell simplifies scale designs, packaging machinery and other industrial weighing equipment. Their single point design eliminates the need for multiple load cells and summing boxes, and thus, simplifies the design and reduces the cost. All SPL Series load cells employ 100% aluminum construction and features a moisture proof sealant which also makes them suitable for damp environments.
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Wavefront Measurement Systems Using the Shack-Hartmann Sensor
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Lumetrics has applied the ingenious Shack-Hartmann sensor to a range of wavefront measurement systems ideal for analyzing optics-related products and materials, from contact lenses to intraocular lenses to laser beam analysis, surface measurement, and phase parameters. While Shack-Hartmann technology may be widely adopted in the wavefront metrology industry, Lumetrics has applied the technology in unique ways and added industry-leading hardware and software features to our systems that offer you significant advantages over our competitors.
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Scanning Electron Microscope
SEM
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Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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Dopant Source
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Attain precise and stable control of relatively low fluxes for dopant constituents in molecular beam epitaxy (MBE) through this compact dopant source. Its small thermal mass gives it excellent responsiveness, reproducibility, and stabilization for advanced doping profiles, plus consistent flux uniformity across an entire platen. Efficient cell heating minimizes thermal load.
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Galvo Mirror Systems
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Thorlabs offers Galvo Mirror Systems for both small (<5 mm) and large (<10 mm) beam diameters. Choose from single- or dual-axis galvo motor options as well as your choice of metallic silver, metallic gold, a dual band dielectric coating for 532/1064 nm, or a broadband dielectric coating for 400 - 750 nm.
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Taper System, CCD Beam Imaging Camera
TaperCamD series
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355 to 1150 nm, standard CCD detectorHyperCal Dynamic Noise and Baseline Correction software (Pat. Pending)CTE Comet Tail Elimination for > 900 nm (Pat. Pending)Port-powered USB 2.0; flexible 3 m cable, no power brick14-bit ADC, 4 MB image buffer & on-board microprocessorWindow-free sensors standard for no fringing25,000:1 electronic auto-shutter, 40 s to 1000 ms1,000:1 SNR (30/60 dB Optical/Electrical)
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X-Ray Beam Monitors
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When standard products just aren’t good enough—or the measurement technology does not yet exist—Sydor Technologies develops technology to enable these complex imaging measurements. Just as we’ve developed next-generation streak cameras and x-ray detectors to meet novel, emerging requirements in national laboratories, we’re doing the same with x-ray beam monitors.
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SAXS
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Anton Paar’s precise and reliable solutions for SAXS/WAXS/GISAXS/RheoSAXS studies provide excellent resolution and the best possible data quality for your daily research of nanostructured materials. The robust systems employ brilliant X-rays as well as scatterless beam collimation and are equipped with a wide range of sample stages to cover many different applications.
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Load Cells
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Selection of load cells must always be guided by the end users particular system requirements and by the application. The PIAB Load Cells range from typical compression/tension load cells to S-beam and shear beam types for stationary applications as well as for mobile weighing systems.
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MBE systems
GEN Family
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Veeco provides the industry’s broadest line-up of innovative and reliable molecular beam epitaxy (MBE) systems.
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*High Power Laser Beam Dumps & Low Power Beam Traps
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Laser beam dumps for high power laser processing, laser measurement and other applications, and low power beam traps
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Loaded Spectrophotometer
DSCD-900
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DSCD-900 is a highly performance spectrophotometer with test caliber upward. The instrument adopts the geometric conditions of D/8 lighting and observation of CIE recommendations, integration of the full band LED composite light source, double beam optical system, ETC every-time calibration technology, spectral reflectance standard deviation within 0.08, maximum of colorimetric values ΔE*ab is 0.03, to provide all the necessary color formula. It could be widely used for coating, printing, textile, meet plastic, food, medicine, automobile field to meet customers’ measurement requirement.
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FCB Probe Card
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The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.
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Laser
BDS-SM Series
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*Pulse Width Down to 60 ps*Repetition Rate 20 MHz /50 MHz / 80 MHz / CW (Switchable)*Free Beam or Fiber Output*All Electronics Integrated*No External Driver Unit*Simple +12 V Supply*40 mm x 70 mm x 120 mm
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256-Element Active Antenna Innovator’s Kit
AWA-0142
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The AWA-0142 is an active array for 5G wireless applications developed using planar antenna technology resulting in a very low profile, lightweight unit. The surface mount assembled antenna board is based on Anokiwave’s AWMF-0135 Silicon Quad Core IC and demonstrates the performance achievable using low power silicon integration and efficient antenna layout and design. Using the AWMF-0135, the antenna provides +60dBmi (1000 W) of EIRP. The electronic 2D beam steering is achieved using analog RF beam forming, with independent phase and gain control in both Tx and Rx operating modes. The AWA-0142 antenna leads the way in showing how 5G coverage can be rolled out by network operators using the mmW bands, with low power footprint and high energy efficiency, while meeting key operating specifications for data rate, latency, coverage, and reliability.
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Laser Thermal Power Sensors
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Thermal sensors have a series of bimetallic junctions called a thermopile. Radial or axial heat flow through the sensor creates a voltage proportional to the power absorbed as it flows through the thermopile. The reading is not dependent on the ambient temperature since only the temperature difference is measured and not the absolute temperature. The thermopile elements are so arranged that the reading is almost independent of beam size and position. Generally, Ophir specifies ±2% or better uniformity of reading over the surface.
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Spectroscopic Reflectometer
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– Antireflective coating (ARC) on textured (poly-) crystalline silicon solar cellMeasurement– Thickness, Reflectivity, n&kWavelength– 420 – 950 nm (1.3-3.0 eV) : expandableAccuracy (thickness measurement on specular sample)– 104.5 nm for 104.8 nm SiO₂on c-Si* Accuracy can be dependent on the quality of filmThickness range– 10 nm ~ 20 mm (depend on sample)Data acquisition time– < 1 sBeam spot size– ~ 50 mmFocusing of beam– Manual (optional auto-focus)Sample stage– Manual X-Y stage (specify sample size and travel distance)(optional automatic X-Y stage for mapping)
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Power/Position/Size Sensors
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Thermal sensors that measure laser power and single shot energy like standard thermal sensors but in addition measure laser beam position and laser size. This position sensing detector measures laser beam position to 0.1 mm accuracy and laser size measurement of a Gaussian beam to +/-5% accuracy. Measuring laser position is important for laser alignment where the laser position sensor can provide feedback to the laser position control.
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Powered VME430 Crates
9U VME430 6021
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WIENER VME 6021 crate series is the newest generation of generation CERN VME430 compliant VME crates for large size 9Ux400mm cards. Designed for applications in nuclear and high energy physics data acquisition, beam line control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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RF Systems
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With our detailed, end-to-end knowledge of beam generation systems and the way platforms operate in the field, we deliver state-of-the-art radio-frequency and x-ray systems. These integrated and effective systems are built with optimised components and interfaces to achieve the performance, reliability and ease-of-use expected by platform designers, manufacturers and end-users.
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Gridded DC Ion Sources
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Ion-assisted processes like sputtering, etching, and surface treatment depend on a beam that’s stable, uniform, and tightly controlled. Gridded DC ion sources make that happen, giving engineers the precision they need to fine-tune ion energy and current density for reliable results.
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40 Mm Beam Pitch General Purpose Area Sensor
NA40
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Panasonic Industrial Devices Sales Company of America
The NA40 General Purpose Area Sensor from Panasonic offers a slim body design, failure monitoring and easy modification of length with robust aluminum enclosure.
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Camera Based Beam Propagation Analyzer: M2
BeamSquared
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The BeamSquared® system is a compact and fully automated tool for measuring the propagation characteristics of CW and pulsed laser systems from the UV to NIR to Telecom wavelengths. Users can also measure wavelengths above 1.8 microns, including CO2 and terahertz in manual mode (a bench set-up; without the automated optical train) with a Pyrocam IV or IIIHR. Our longer optical train and patented Ultracal™ Calibration makes BeamSquared the most accurate product on the market and is ISO 11146 compliant. Its operational robustness and reliability ensures continuous use applications in industry, science, research and development.
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50% Beam Splitter BK7, Fixed Horizontal-Bend Mount
E1834G
Beam Splitter
The E1834G is a 50% beam splitter in a high performance horizontal mount that offer the high pointing stability for Keysight laser interferometer measurement system. The 8 flexure feet are designed for stable beam pointing.
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Beam Directional Power Supply Battery 40 to 160 kV
CP160B
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Next to the CP120B, the CP160B is the slightly more powerful version of our ultra-light, compact and battery operated constant potential portable X-Ray generators. Allowing penetration reaching up to 30 mm for steel, the CP160B is the perfect tool for specific NDT applications that require repetitive short exposures, as well as security applications.
