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Product
Full-Featured Life Cycle Test System
LCV
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Configurations for testing to industry standards: IEC, SAE, BCILife Cycle Testing: Perform charge/discharge cycling of batteries or modules to obtain charge and discharge capacity, energy and DC internal resistanceAutomotive Battery TestingStarting, Lighting and Ignition (SLI) TestingTraction Battery Testing
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Product
DC Power Supply
62000H Series
DC Power Supply
The 62000H Series includes 14 different models ranging from 5KW to 15KW, with current range up to 375A and voltage range up to 1000V. The 62000H can easily parallel up to ten units capable of 150KW with current sharing for bulk power applications, for example, battery bank simulation of 450V/150A/67.5KW for electric vehicle and military use. There are 100 user programmable input status on the front panel for automated test application and life cycle ON/OFF test. In addition, the 62000H has a 16 bit digital control with bright vacuum fluorescent display readout. The 62000H series DC power supplies are very easy to operate either from the front panel keypad or from the remote controller via USB / RS232 / RS485 / APG (Standard) and GPIB & Ethernet (optional). Its compact size with 3U only can be stacked on a bench in a standard rack without any difficulty.
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Product
Electric Vehicle Battery Cell Tester
MCV
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The MCV is a low-current life cycle test system for development of primary and rechargeable batteries in various chemistries. Operating from a common microprocessor, multiple circuits in the MCV module can run individual test programs. Additionally, the MCV is designed and built for ease of maintenance and service. The modular construction means that most subassemblies, large or small, remove easily for service outside the cabinet and fast replacement.
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Product
Lifecycle Test System
Model 933
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The Model 933A Life Cycle Test System is a low cost, generic test platform used to perform cycling of keypads, keyboards, membranes, switches, or any product requiring fatigue testing.
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Product
Automotive & Industrial Cycle Testing System
CV
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The CV is Bitrode's economical cycle life test equipment for the network based line of battery laboratory equipment. Designed to work with VisuaLCN Lab Client software, the CV provides standard or fully customized charge, discharge and rest cycles for automotive and industrial batteries. The Model CV is also useful for reserve capacity and charge acceptance testing with recharge.
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Product
Fatigue Rated Low Profile Cells
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Fatigue rated load cells are specifically designed for component durability and fatigue test machines where highly cyclical loading is present. These rugged load cells are extremely resistant to extraneous bending and side loading forces. They are used for material testing, component life cycle testing and structural testing. All fatigue rated load cells are guaranteed against fatigue failure for 100 million fully reversed cycles.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
Accelerated Product Life Cycle
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Delserro Engineering Solutions
Under normal conditions it may take years to gather failure data on the life cycle of new products. Through accelerated life testing the overall time to failure can be reduced to weeks by increasing the frequency of the field loads and by removing insignificant stress components. In addition, life cycle testing on a product can be reduced or accelerated dramatically by increasing the stress levels to higher than normal. Putting a product through Accelerated Life Testing can reduce test time from weeks to days while still achieving satisfactory results saving both time and money.
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Product
Life Cycle & Fatigue Testers
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Switches can use all these operations. Membrane switches, keyboards and keypads will all require a push with a known force. On/Off switches will combine a push and a pull or possibly push on, push off. A rocker switch and toggle switches will require a push in two different places. Rotary switches (and volume controls, potentiometers) need to be rotated clockwise and counter clockwise The standard life cycle and fatigue tester the B886 Simon System has been designed for life cycle and fatigue testing of switches, membrane switches, keyboards and keypads. It contains all the components needed to life and fatigue test a products that need to be pushed. We can also supply different actuators for a push, pull, rocker, toggle, volume control or rotary switch.
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Product
Milliampere-Level Test System
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Shenzhen Sinexcel RE Equipment CO., Ltd
mA class battery test system, mainly used for battery material research, high-precision test, pulse charge and discharge test, DCIR test, cycle Life test. It provides powerful testing equipment for research institutions, universities and experimental centers of battery production enterprises
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Product
LifeTest Software
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In combination with the extended range of PEC test equipment, LifeTest supports the many specific functionalities required in battery testing labs. Drive cycle simulations (FUDS, DST…), thermal performance tests, high speed pulse tests (HPPT), life cycle tests, accelerated ageing tests and internal resistance measurement tests can be easily configured, scheduled, executed and reported from a single platform.
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Product
Test Executive & Development Studio
ATEasy
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ATEasy is a test executive and a rapid application development framework for functional test, ATE, data acquisition, process control, and instrumentation systems. ATEasy provides all the necessary tools to develop, deploy and maintain software components - including instrument drivers, test programs, and user interfaces, as well as a complete and customizable test executive. It is designed to support and simplify ATE system applications with long product life cycles. With ATEasy, test applications are faster to generate and easier to maintain.
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
Automotive Test Solutions
test
The testing and simulation systems from this division are used primarily in the automotive and automotive supplier industry. These are, for example, modular function-testing systems and diagnostic tools for automotive ECUs or bus communication systems for a wide variety of electronic components in automotive production. Electromechanical assemblies and entire car seats are also tested to ensure they function
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Product
Explosive Test Site Range Instrumentation
test
Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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Product
Semiconductors Testing
test
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
Testing Service
CloudTesting™ Service
test
CloudTesting™ Service is an Industry First, On-Demand Testing Service. CloudTesting™ Station is free rent. Fees for Testing IP are paid monthly.
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Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Semiconductor Testers
Test Instrument
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Product
Digital Test Instrumentation
EDigital-Series™
Test Instrument
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Product
High Temperature Component Test Fixture
16194A
Test Fixture
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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Product
Military Communications Test
Test Platform
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
Test Platform
The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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Product
Test Fixture, Axial And Radial
16047A
Test Fixture
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
6TL60 Rotary Test Handler
H79006010
Test Platform
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Product
VITA 62, 3U Test Fixture
TF-3U-7B041-1
Test Fixture
This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
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Product
PXIe Optical Test Modules
Test Module
Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
