Test Connectors
-
Product
68-Pin Micro-D Male Solder Bucket With Backshell
40-962B-068-SB-M
-
This connector is designed to allow users to directly terminate with soldered connections to the 68-Pin SCSI Style Micro D connector. Pickering Interfaces recommends the use of purchased cable assemblies for applications where most or all of the contacts are in use.
-
Product
100-Pin Micro-D Connector, Straight PCB Mount, Female, 2-56 UNC Screwlocks
C100SFX-1PS-5A
-
Female straight PCB mount 100-pin Micro-D connector allows a user to create their own PCB based termination solution. Interfacing PCBs should be designed with suitable clearances for the voltage the application requires.
-
Product
Portable, Integrated O-Level Test Platform
Guardian™
-
Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
-
Product
Batterie Inspektor
-
By combining the most diverse hardware and software modules, Batterie Inspektor™ delivers innovative, automated, and digitalized battery testing at every stage of manufacturing. With this flexible test platform, all modules can be adapted to their respective quality requirements. Manufacturing is simplified through a scalable and standardized framework for both new projects and upgrades.
-
Product
50-Pin Ribbon Breakout DIN Rail Mount
40-967-550-M
-
This accessory is designed to be used for terminating a 50-Pin ribbon cable connector. A 200-Pin to Quad 50-Pin ribbon header cable accessory is available that allows it to be used to terminate a 200-Pin connector. The accessory is suitable for mounting on DIN rails. The ribbon cable termination includes a strain relief.
-
Product
Electrification Testing Solutions
-
When looking for a partner to assist with your electrification testing or power electronics testing challenge, Ball Systems has the expertise and experience to ensure your energy storage or power conversion project moves forward efficiently.
-
Product
EBIRST 78-pin D-type To 68-pin Female SCSI Adapter
93-006-222
-
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
Product
VLSI Test System
3380D
-
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
-
Product
160-Pin DIN41612 Connector, Straight PCB Mount, Female
C1604FX-4PS-0A
-
Accessory allows a user to create their own PCB based termination solution. This female connector is modified to enable it to be fitted to Pickering's 40-967-160-F cable assembly
-
Product
PXI Semiconductor/IC Test System
-
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
-
Product
JTAG Functional Test
JFT
-
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
-
Product
Environmental Control System Test Platform
-
The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
-
Product
96-Pin Micro-D Connector Block, Male DIN Rail Mounted
40-966-096-M
-
Suitable for mounting on DIN Rails this connector block provides a simple method of connecting to 96-Pin SCSI Style Micro-D connectors. The screw terminals use a rising cage clamp mechanism to minimize risk of copper strand breakage. The metal shell includes an internal insulation barrier under the carrier board.
-
Product
NI Real-Time Test Cell Reference System
778820-35
-
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
-
Product
SCB-12, Nano-Pitch Connector Block, 8 SE DIO, 1 QSFP+
787419-01
-
8-Pin 3.5 mm Pitch Connector to Nano-Pitch I/O, QSFP28 Terminal Block - The SCB-12 converts the Nano-Pitch connector to the industry-standard QSFP28 connector for interfacing I/O signals to plug-in data acquisition. This Terminal Block features the QSFP28 variant of the quad small form-factor pluggable (QSFP) transceiver for high-capacity data communication. The SCB-12 combines with shield cables to provide low-noise signal termination. Additionally, the SCB-12 supports the Nano-Pitch I/O Interconnect System that provides data transfer at 24 Gbps per lane and compatibility with PCI Express, Serial Attached SCSI (SAS), and SATA protocols. The SCB-12 breaks out the NanoPitch connector to a QSFP28 connector as well as an 8-pin connector for general-purpose DIO signals.
-
Product
Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
-
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
-
Product
Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
-
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
-
Product
SoC Test System
T2000
-
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
-
Product
Wireless Device Functional Test Reference Solution
-
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
-
Product
Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
-
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
-
Product
37-Pin D-Type Connector Block
92-965-037-F
-
This connector block provides a simple method of connecting to 37-Pin D-Type connectors. The screw terminals use a rising cage clamp mechanism to minimize risk of copper strand breakage. PTFE cables are recommended for use with this connector block to maximise copper cross-sectional area and insulation properties.
-
Product
Iridium Physical Layer Test Systems
PLTS
-
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
-
Product
Communications Test System for Frontline Diagnostics
ATS3000P
-
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
-
Product
Test Port Cable, 1 Mm
11500K
-
Connect test ports to devices, fixtures, or probe tips with this 20-cm cable featuring a return loss of 16 dB minimum
-
Product
68-Pin SCSI Micro-D Male Connector Block
92-965-068-M
-
This connector block provides a simple method of connecting to 68-Pin SCSI Style Micro-D connectors. The screw terminals use a rising cage clamp mechanism to minimize risk of copper strand breakage.
-
Product
Connector, 104-Pin D-Type Male, Solder Bucket, 5A
92-960-104-M
-
This 104-pin male D-type connector allows users to create their own cable assemblies. Cable connection is via solder buckets - supplied without backshell. This connector is not compatible with Pickering modules that use the 104-pin D-type connector.
-
Product
37-Pin D-Type Male Solder Pin HV
92-960-037-MHV
-
This accessory is designed to allow users to directly terminate a cable with soldered connections. When the product is used without a backshell users should make their own cable strain relief arrangements and ensure appropriate electrical safety precautions are observed.
-
Product
SSD Test Systems
-
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
-
Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
-
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
-
Product
Hybrid Single Site Test Handler
3110
-
Chroma Hybrid Single Site Test Handler 3110 is a full range ATC (Active Thermal Control) test handler capable of handling device bodies up to 120x120mm with 450kg force load.
