Filter Results By:

Products

Applications

Manufacturers

Component

Testing of individual hardware or software components or groups of related components.


Showing results: 2581 - 2595 of 2766 items found.

  • High Performance Analog & Mixed Signal Test Solutions

    Applicos - Salland Engineering

    Effective mixed-signal test solutions demand know-how and experience. Low level analog signals need to be stimulated and analyzed near fast switching digital logic. Cross talk, magnetic fields, clock jitter, ground noise and non-linearity of components, are just a few of the problems that must be addressed. Applicos knows what it takes to design and produce high quality mixed-signal test solutions. They have been servicing the mixed-signal test industry since 1993 and have established a distinguished reputation for providing our customers with high performance, cost effective solutions. In 2018 we acquired Applicos B.V. to extend our portfolio for the ATE business.

  • Motor Test for Stepping Motors

    MOTOMEA

    *Stable measurement: Since it uses Prony braking, this model provides stable measurement unaffected by moments of inertia and no coupling loss. In addition, the resulting measurements allow data correlation via the traditional double-balance method.*Precision measurement method: This model’s judgment of synchronization loss achieves high stability using algorithms developed by Sugawara Laboratories. Measurement mode can be chosen based on step angle. For pull-in torque, startup can be measured consistently from the holding state. Allows measurement at 1-Hz resolution.*Broad measurement range: This model offers a range of seven available measurement heads, from 0.5 N to 50 N, allowing use for high-precision measurements. Through selection and use of pulleys, this model can also be used to measure small motors of 0.5 mN·m or less or 500 mN·m motors. Pulley diameters and other settings are easily configured using a personal computer running Windows®. Note: Any of the seven available heads may be attached to a single measurement component.*High-visibility measurement data: Motor characteristics are easily ascertained on automatically plotted performance graphs. Measurement data can be overlaid up to four times. In addition, the cursor can be used to read accurate values from measurement points. Hard copies of data displayed on-screen can be printed from a personal computer.*Can be controlled using standard personal computers: Allows control of measurement operations and display and storage of data from a standard personal computer running Windows®. Data is stored in CSV-format files for compatibility with other software applications.

  • Near Field Probes 1GHz - 10 GHz

    SX set - Langer EMV-Technik GmbH

    The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.

  • ASTRO BRUSHLESS MOTOR

    4535 - Astro Flight Inc.

    The purpose of the development of the 4535 was to deliver the same quality and reliability of our 32XX motors but at nearly 4x the power. Starting at the core of the motor, the 4535 uses the highest grade of sintered samarium-cobalt magnet. Unlike hobby grade neodymium magnets, these samarium-cobalt magnets are able to withstand high operating temperatures without losing magnetic strength or experiencing permanent demagnetization. Ultra-thin laminations are used in the stator to ensure minimal iron losses and maximize efficiency. All components of the motor are rated to at least 200°C to handle high continuous and burst power. Finally, to ensure manufacturing quality, all 4535 motors are designed and manufactured in Astro Flight's facility in Irvine, CA.

  • Analyzer Test Set

    280 Series - Teledyne LeCroy quantumdata

    The Teledyne LeCroy quantumdata 280 HDMI/HDBaseT Video Generator (Tx) and Analyzer (Rx) is small compact, battery powered test set ideally suited for professional A/V integrators and home theatre installers. This convenient test set enables you to conduct basic verification and diagnostic tests on HDMI/HDBaseT cables, video distribution networks and individual A/V components. The HDMI input and output ports support testing up to 18 Gbps data rate and 600 MHz pixel rate and the HDBaseT input and output ports support testing up to 300 MHz pixel rate. The HDBaseT interface supports transmission in Long Reach mode as well.

  • 3 Phase Power Analyzer

    VPA-60080 - Veer Electronics

    VEER Power Analyzer VPA-60080 is result of continuous R & D activities. It is an accurate Instrument to test 3 phase & 1 phase electrical Machines due to high sampling rate & simultaneous measurement of parameters. It has no adjustable components inside so, accuracy remains long time. We provide Free Software VEER POWER ANALYZER TOOL with VPA-60080 to communicate with computer which is capable to collect all parameters from VPA-60080 & generates test report. You can see parameters in different view like Digital, Analog, Graphical etc in real time. You can record test data in real time to eliminates Human error in Testing.

  • COM Express Type 6 Compact Module With Intel® Atom™ Processor E3845

    CEM843 - Axiomtek Co., Ltd.

    The CEM843 Intel® Bay Trail SoC system-on-modules come with 6 PCI Express lanes, eight USB signals, double deck DDR3L SO-DIMM sockets supporting up to 8 GB of system memory, and two SATA-300. The CEM843 utilizes quad cores Intel® Atom™ processor E3845, featuring a wide operating temperature range from -40°C to 85°C. The power-efficient compact module is designed with all necessary components and offers the most updated bus interfaces targeting at POS and kiosk systems, gaming, medical PCs, human machine interface, IoT & M2M-related and industrial automation controllers.

  • DC Magnetic Flux Leakage Testing

    ROTOMAT / TRANSOMAT Product Family - Foerster Instruments, Incorporated

    With the new generation ROTOMAT DA and TRANSOMAT DA flux leakage test systems FOERSTER is setting new standards in continuous quality assurance of ferromagnetic steel tubes. The test systems enable the reliable detection of natural and oblique defects, regardless of their angle or length, in addition to standardized longitudinal and transversal defects. The miniaturization of sensors together with highly integrated electronic components dramatically increases the number of channels. This makes a more precise and finer scan of the surface possible, giving a more complete set of information regarding detected defects. The newly introduced C-Scan visualizes these defects in high-definition and real-time, resulting in a completely new evaluation of the tubes to meet rising quality requirements.

  • Eddy Current Flaw Detector

    US-525M - United Western Technologies Corp

    The US-525M multi-channel eddy current testing instrument is a rugged industrial rack-mounted instrument offering multi-channel testing, integral digital strip chart, as well as Ethernet control and data transfer to meet your in process testing requirements. This instrument offers up to eight channels, with a frequency range of 20 Hz to 10 Mz, a high signal-to-noise ratio, a bright 12-inch diagonal color LCD flat-panel screen, and data storage of 32 Gig. It offers input/output (I/O) capability, USB and Ethernet connectivity, as well as three discrete alarm gates with independent outputs per channel. for your on-line bar, tube, wire and specialty component testing needs.

  • Custom Testing

    Global Testing Services Inc.

    You create a custom test plan (a file that lists a series of tests to be run), to meet requirements specific to your environment and apply that test plan to any number of clusters. You specify the order in which tests run and the specific components to be tested. After you set up your custom test environment, you run the test procedure from SMIT and view test results in SMIT and in the Cluster Test Tool log file. For information about customized testing, see Setting up custom cluster testing.*Fixture Design*Fixture Fabrication*Custom Test Stands*Prototype Testing Services*Product Safety Testing Services

  • PWM to Voltage Output D/A Converters

    Analog Devices Inc.

    Analog Devices’ pulse-width modulation (PWM) to voltage output D/A converters convert a PWM input to an accurate, stable, buffered voltage without the ripple, slow settling, and external passive components of discrete filter implementations. Our PWM D/A converters measure the period and pulse width of a PWM input signal and immediately update the D/A converter output with up to 12-bit accuracy and no software coding required. This family of D/A converters is available with 8-bit to 12-bit resolution, dual and quad channels, integrated references, and with high temperature operation. Applications include isolated motor control, automotive headlights or industrial lighting, and other applications that benefit from the simple control interface.

  • LCR Meter

    TH2826 - Changzhou Tonghui Electronic Co., Ltd.

    TH2826 series is a new generation impedance test instrument and firstly in conformity with LXI standard inland. It fulfills most low-voltage parameter measurement needs for components and materials with its basic accuracy (0.1%), wide frequency range(from 20Hz to 5MHz). The instrument is widely applied in microphone, resonator, inductor, ceramic capacitor, LCD, varactor and transformer .etc to analyze electrical performance and test low-ESR capacitor and high-Q inductor. With the super high test speed, TH2826 series is especially for frequency response curve analyzing of detector and piezoelectric device on auto production line. Its multiple output impedance mode can be used for different standards of inductor or transformer manufacturers.

  • LCR Meter

    TH2826A - Changzhou Tonghui Electronic Co., Ltd.

    TH2826A is a new generation impedance test instrument and firstly in conformity with LXI standard inland. It fulfills most low-voltage parameter measurement needs for components and materials with its basic accuracy (0.1%), wide frequency range(from 20Hz to 2MHz). The instrument is widely applied in microphone, resonator, inductor, ceramic capacitor, LCD, varactor and transformer .etc to analyze electrical performance and test low-ESR capacitor and high-Q inductor.    With the super high test speed, TH2826A is especially for frequency response curve analyzing of detector and piezoelectric device on auto production line. Its multiple output impedance mode can be used for different standards of inductor or transformer manufacturers.

  • DSP Trainer

    Salicon Nano Technology

    Digital Signal Processing is a technique that converts signals from real world sources (usually in analog form) into digital data that can then be analyzed. Analysis is performed in digital form because once a signal has been reduced to numbers; its components can be isolated, analyzed and rearranged more easily than in analog form. Digital Signal Processing (DSP) applications are becoming more prevalent in everyday use. Because of this widespread usage and advances in computer technology, the DSP algorithms themselves are being subjected to more demanding specifications. There is a constant need for designing systems with lower power, higher speed and less space and to achieve this we are developing new algorithms, techniques.

  • Common Armament Test Set

    MTS-209 - Marvin Test Solutions, Inc.

    The MTS-209 is a state-of-the-art portable test set for various armament systems used on the F-16, F-15, F-18, TA-50, FA-50 and additional aircraft. The MTS-209 supports a wide range of Alternate Mission Equipment (AME) including launchers, pylons, and racks. It combines the test capabilities of an I-Level test set in a compact, rugged, flight-line qualified enclosure. The MTS-209 performs parametric functional tests on AME components including Launchers (LAU-117, 16S210, LAU-127,, LAU-128, LAU-129, LAU-7,etc.), bomb racks (MAU-12, MAU-50, SUU-20, TER-9, etc.), Remote Interface Units (RIUs) and Pylons. The MTS-209 can also test MIL-STD-1760 aircraft stations and weapon systems.

Get Help