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Testing of individual hardware or software components or groups of related components.


Showing results: 2596 - 2610 of 2766 items found.

  • Software-based Electroacoustic Test System

    SoundCheck - Listen Inc

    The SoundCheck®system from Listen includes everything you need to perform audio measurements on a wide range of devices – the software, the audio interface, other test interfaces and accessories, and test sequences. The system is centered around the SoundCheck software. This powerful package controls and communicates with the measurement hardware, and includes all the stimuli, algorithms and analysis functionality needed to develop and run virtually any electroacoustic or audio electronic test. It is paired with hardware ranging from a simple, all-in one audio test box to sophisticated discrete components for a complete test system. In addition to Listen hardware, a range of 3rd party products and test accessories are fully supported within SoundCheck.

  • Microbolometer Sensors

    Calibir GX Family - Teledyne DALSA

    The Calibir GX camera family features our latest microbolometer sensor, designed, fabricated, and packaged in our own foundry. With great sensitivity in longwave infrared range (8-12 µm), it features both shutter and shutterless operation and rapid image output on power up while delivering uniform response over the entire operating temperature range, making it an ideal component for thermal imaging systems requiring uninterrupted image acquisition. The GX series also offers our own advanced 21-bit ADC design for unparalleled intra-scene dynamic range without the need for a gain reduction, allowing for the best possible NETD over a vast range of temperature (>600C).

  • Simulation Systems

    Bloomy Controls, Inc.

    Bloomy offers Simulation Systems for Hardware in-the-Loop (HIL) and open loop test of electronic controls and mechanical actuators for all types of transportation and defense systems including aircraft, rail, automobiles and ships. These systems, now deployed at major aerospace, locomotive and military manufacturers and research facilities worldwide, provide world-class, high-fidelity simulated environments for use in both closed-loop and open-loop testing. Because Bloomy’s Simulation Systems are largely constructed from COTS components, time to first test can be reduced significantly, and their highly-customizable nature allows your test system experts to provide your unique IP to differentiate your product from your competitors.

  • Resistors

    Vishay Intertechnology, Inc.

    A passive two-terminal electrical component that implements electrical resistance as a circuit element. In electronic circuits, resistors are used to reduce current flow, adjust signal levels, to divide voltages, bias active elements, and terminate transmission lines, among other uses. High-power resistors that can dissipate many watts of electrical power as heat may be used as part of motor controls, in power distribution systems, or as test loads for generators. Fixed resistors have resistances that only change slightly with temperature, time or operating voltage. Variable resistors can be used to adjust circuit elements (such as a volume control or a lamp dimmer), or as sensing devices for heat, light, humidity, force, or chemical activity.

  • Vector Signal Generator

    SMBV100B - Rohde & Schwarz GmbH & Co. KG

    The state-of-the-art R&S®SMBV100B vector signal generator sets standards for its class. Ultra high output power, fully calibrated wideband signal generation and intuitive touchscreen operation make the R&S®SMBV100B ideal for all kinds of applications.Always in line with the latest major digital communications standards, such as 5G NR, LTE and WLAN, the SMBV100B is the preferred test solution for receiver and component characterization.The R&S®SMBV100B has many GNSS options that transform the instrument into a reliable, full-featured GNSS simulator. Advanced simulation capabilities can run realistic and complex yet repeatable GNSS scenarios under controlled conditions.

  • Sub-systems

    Ducommun Inc

    Our self-contained, in-house components design and fabrication capacities ensure the breadth of sub-assemblies offered from rapid prototyping and proof of concept to full production. Ducommun has produced many high performance millimeterwave band sub-assemblies for commercial and military system applications. Among them, the K and Ka band directional Doppler Radar front ends are in production. Several hundreds of sets have been delivered. In addition, Ducommun has delivered Ka through W band engineering prototypes for plasma detection system, automotive Radar, speed Radar, automatic test set, radio telescope, missile terminal guidance, telecommunication system etc. applications.

  • 6TL36 Plus In-line Test Handler w/Bypass

    EA923 - 6TL Engineering

    - Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE

  • USRP-2900, Software Defined Radio Device Bundle

    784113-01 - NI

    USRP-2900 Software Defined Radio Device Bundle - The USRP-2900 Teaching Bundle includes two USRP (Universal Software Radio Peripheral) Software Defined Radio Devices, turnkey courseware, and other accessories such as USB 3.0 cables and SMA attenuators. Students can use USRP … Software Defined Radio Devices with LabVIEW to experiment with real-world signals in introductory communications and digital communications laboratories. The USRP-2900 Teaching Bundle helps students experiment with FM radio, GPS, GSM, Bluetooth, and ISM signals. The bundle also includes components of a lab station that students can use to gain hands-on experience with live communication links between multiple USRP Software Defined Radio Devices.

  • USRP-2901, Software Defined Radio Device Bundle

    784114-01 - NI

    USRP-2901 Software Defined Radio Device Bundle - The USRP-2901 Teaching Bundle includes two USRP (Universal Software Radio Peripheral) Software Defined Radio Devices, turnkey courseware, and other accessories such as USB 3.0 cables and SMA attenuators. Students can use USRP … Software Defined Radio Devices with LabVIEW to experiment with real-world signals in introductory communications and digital communications laboratories. The USRP-2901 Teaching Bundle helps students experiment with FM radio, GPS, GSM, Bluetooth, and ISM signals. The bundle also includes components of a lab station that students can use to gain hands-on experience with live communication links between multiple USRP Software Defined Radio Devices.

  • PXIe-5451, 145 MHz, 16-Bit, 512 MB, PXI Waveform Generator

    781204-02 - NI

    PXIe, 145 MHz, 16-Bit, 512 MB, PXI Waveform Generator—The PXIe‑5451 is a 145 MHz, dual‐channel arbitrary waveform generator capable of generating user-definied waveforms, standard functions, and I/Q communications signals. It is an ideal instrument for including in systems for testing devices with I/Q inputs, or as the baseband component of an RF vector signal generator as wells as time-domain signals like envelope tracking. The PXIe‑5451 also features onboard signal processing (OSP) functions that include pulse shaping and interpolation filters, gain and offset control, and a numerically controlled oscillator (NCO) for frequency shifting. The PXIe‑5451 also features advanced synchronization and data streaming capabilities.

  • PXIe-5451, 145 MHz, 16-Bit, 128 MB, PXI Waveform Generator

    781204-01 - NI

    PXIe, 145 MHz, 16-Bit, 128 MB, PXI Waveform Generator—The PXIe‑5451 is a 145 MHz, dual‐channel arbitrary waveform generator capable of generating user-definied waveforms, standard functions, and I/Q communications signals. It is an ideal instrument for including in systems for testing devices with I/Q inputs, or as the baseband component of an RF vector signal generator as wells as time-domain signals like envelope tracking. The PXIe‑5451 also features onboard signal processing (OSP) functions that include pulse shaping and interpolation filters, gain and offset control, and a numerically controlled oscillator (NCO) for frequency shifting. The PXIe‑5451 also features advanced synchronization and data streaming capabilities.

  • PXIe-5451, 145 MHz, 16-Bit, 2 GB PXI Waveform Generator

    781204-03 - NI

    PXIe, 145 MHz, 16-Bit, 2 GB PXI Waveform Generator—The PXIe‑5451 is a 145 MHz, dual‐channel arbitrary waveform generator capable of generating user-definied waveforms, standard functions, and I/Q communications signals. It is an ideal instrument for including in systems for testing devices with I/Q inputs, or as the baseband component of an RF vector signal generator as wells as time-domain signals like envelope tracking. The PXIe‑5451 also features onboard signal processing (OSP) functions that include pulse shaping and interpolation filters, gain and offset control, and a numerically controlled oscillator (NCO) for frequency shifting. The PXIe‑5451 also features advanced synchronization and data streaming capabilities.

  • Near Field Probes 30 MHz up to 3 GHz

    RF1 set - Langer EMV-Technik GmbH

    The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.

  • Converter Of Electrical Quantities

    Metra Blansko a.s.

    The converters are intended for the conversion of electrical quantities DC signal which is either in form of the DC voltage, or the DC forced current. They can be used in connection with indicating pointer instruments, calibrated in units of the measured quantity, or with a recorder or, eventually with a digital instrument. Wide range of possibilities are provided by them, also as sensors for regulation and control porposes in the fields of industrial measurements and, last but not least, as needful components for aquisition of technological enviroment picture applied for evaluating and processing computer systems. The converters are designed for continuous operation. They are designed as independent, built in the plastic casing. Each converter comprises the input circuits for the galvanic separation of the proper measuring circuit and the output amplifier for the output signal conversion to the unified output.

  • Automated Optical Inspection

    AOI - ficonTEC Service GmbH

    No complex assembly process is complete without the ability to inspect and characterize the many different components used. ficonTEC’s fully automated INSPECTIONLINE systems acquire high-resolution pictures of the surfaces of interest and performs optical inspection based on the user’s criteria. For example, facet inspection of laser diodes, QC for coatings, surface inspection, top/bottom/side-wall inspection of semiconductor chips, and die sorting are just some of the many inspection tasks performed routinely by ficonTEC’s suite of inspection tools. As for all of ficonTEC’s systems, a modular approach permits the inspection platform to equipped with additional features – automatic tray handling and various feeding philosophies, testing capabilities (e.g. LIV), top/bottom chip inspection, and in-situ labelling.

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