Showing results: 2536 - 2550 of 2765 items found.
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ADS2 Product Family -
TechSAT GmbH
The high degree of flexibility of ADS2 is achieved through a clear and straight forward architecture design paired with a highly optimized implementation of its components.- A deterministic publish-subscribe data distribution and scheduling middleware- Adapters for a wide range of client applications and third party tools- HW adapters for a wide range of I/O interfaces- A set of native tools for data visualization and analysis, recording and replay- A comprehensive system health monitor- Human readable system configuration files (structured text)- Scriptable generation of system configuration files- Automatic test execution for high level requirement based test definitions
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TetraTek Products, Inc.
World-class integration of electronic test equipment, instrumentation, test fixtures, automation, load simulation,data acquisition, and software . In partnership with two major leaders in high-technology automation, three very capable machine shops, a custom cabling company, a rapid prototype circuit board fabrication house and two large automated sheet metal manufacturing facilities we offer custom process and test equipment designed and manufactured for convenience and precision. Each component of our systems is carefully consideredto provide you with maximum performance consistent with easy maintainability and long term return on your investment.
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Corelis, Inc.
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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JW8006 Series -
Shanghai Joinwit optoelectronic Tech,co.,Ltd
SLED(Super luminescent light-emitting diode) is a super broadband optical source which is designed for fiber sensor;, optical fiber gyroscope, lab application field. It has the feature as broaden bandwidth, customizable center wave length, high output power, etc. Benchtop (for lab), standard module(150*125*20mm, with modulation function) and mini module(90*70*15mm) is available. The key component is employed the FWHM bandwidth up to 40nm high power SLEDs to ensure the spectrum performance. Stability is ensured by unique ATC and APC circuit. The output power is adjustable by RS232 or RS485 port.
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Freese Enterprises Inc.
Freese Enterprises (FEI) has vast experience, in many industries, in the custom design and construction of physical test fixtures to consistently test a feature or operation of a device or piece of software. FEI can develop test solutions for modules or fully assembled products such as key fobs, RF filters, and cell phones - from complex integrated circuits and custom electronics to automotive components and RF communication devices. In general, the advantages of FEI test fixtures include the separation of the test initialization and destruction from the testing, reusing a known state for more than one test, and assumption by the testing framework that the fixture set-up works.
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CG635 -
Stanford Research Systems, Inc.
The CG635 generates extremely stable square wave clocks between 1 µHz and 2.05 GHz. The instrument''s high frequency resolution, low jitter, fast transition times, and flexible output levels make it ideal for use in the development and testing of virtually any digital component, system or network. Clocks from 1 µHz to 2.05 GHz. Random jitter <1 ps rms. 16 digits of frequency resolution. 80 ps rise and fall times. CMOS, PECL, ECL, LVDS & RS-485. Phase control and time modulation. PRBS for eye-pattern testing. OCXO and rubidium timebase.
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Thorlabs, Inc.
The versatile FiberBench product line includes Single and Multi-Axis FiberBenches as well as a wide variety of compatible components ranging from beamsplitter modules to wave plate units. FiberBenches form the foundation of a nearly infinite array of miniature fiber optic systems that customers have been building for the last decade. When used with the FiberPort Collimators/Couplers, a complete optical circuit can be constructed. The Fiber Launch Platforms are ideal for coupling a free space laser into a single mode, multimode, or polarization-maintaining fiber. Other accessories include fiber mounts, fixed and kinematic collimator adapters, and L-bracket mating sleeves.
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ACMAS Technologies Pvt. Ltd.
Constant Temperature and Humidity Test Chamber from Weiber are environmental test chambers, designed to simulate constant climatic conditions for testing a wide variety of products for their quality, performance, shelf life and stability. They are used to simulate constant temperature and humidity conditions, thereby creating a physiologically ideal environment for product testing. These equipments are most commonly employed for testing electrical devices, electronic parts and components, instruments, biological samples, food items and other manufactured and processed goods and find widespread usage in scientific research organizations, semiconductor industries, material research institutes and other industrial and manufacturing units.
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N2795A -
Keysight Technologies
The N2795A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±8 V), the probe can be used in a wide variety of applications.
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785855-01 -
NI
1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument - The Astronics PXIe-6943 works as a core component of digital test systems that may include switching, analog instrumentation, and an RF subsystem. This instrument features an advanced thermal design, temperate monitoring, … and a high-speed data sequencer for control of stimulus and response patterns. Additionally, the Astronics PXIe-6943 operates at data rates up to 50 MHz with 1 ns edge placement, variable slew rates, and a <3 ns channel-to-channel skew. It also supports synchronized digital test systems from 32 to 224 channels.
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N2796A -
Keysight Technologies
The N2796A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±12 V), the probe can be used in a wide variety of applications.
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Keysight Technologies
Generate and analyze 802.11ad fully coded PHY waveforms for complete component, subsystem, and system performance at baseband, IF, and millimeter-wave. This Reference Solution combines Keysight Technologies software and hardware to provide a flexible testbed for 802.11ad waveform generation and analysis. Software provides the flexibility to generate and analyze 802.11ad waveforms with a wide range of different attributes. Hardware provides the flexibility to support baseband, IF, and millimeter-wave test planes. Create waveform sequences with unique 802.11ad packet structures including Modulation Coding Scheme (MCS), packet length, payload data type, and interpacket gap length, etc.
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2811 LP -
Standard Electric Works Co., Ltd
● Microprocessor-controlled.● Displays and sound warning if external voltage present.● Displays mains voltage, scroll trough menus.● Checks wiring integrity (LEDs and display).● Single button operation.● Auto-off/auto-ranging.● Combined prospective short circuit current, PSC and LOOP tester.● Built-in carry case, test leads in separate pouch.● Loop test for L-E and L-N and PSC.● Voltage test L-N and L-E.● Enables analysis of constituent components in L-E and L-N loops giving resistance of earth, neutral wire, live wire and transformer winding.● Display can be customized for special orders.● 60Hz available on request.
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778572-98 -
NI
26.5 GHz, 50 Ω, Dual-Transfer PXI Transfer Switch Module—The PXI‑2598 is a general-purpose switch module for routing RF or microwave signals in automated test applications. You can use this module for basic signal routing or inserting and removing components in a signal path. The PXI‑2598 is also well suited for passing high-order harmonics from PXI RF Signal Upconverter modules or routing multiple sources to PXI RF Signal Downconverter modules. You can use its onboard relay count tracking to predict relay lifetime and reduce unexpected system downtime.
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LS-45-DB -
Lumistar Inc.
The Lumistar LS-45-DB Dual Channel Bit Synchronizer Daughterboard provides optimal reconstruction of a serial PCM data stream that has been corrupted by noise, phase jitter, amplitude modulation, or base line variations. The all-digitaldesign assures a high performance, consistent product, with excellent reliability and long-term stability. Dual channel design can feed each channel of the LS-55-DD dual decom. The LS-45-DB also has a post D combiner that allows for optimal ratiocombining of the two input signals A unique Built-in-Test feature allows performance verification for the Bit Synchronizer to ensure the highest level of operation. Auto-test BIT is performed for a short duration on the application of power and tests more than 90% of the Bit Synchronizer components. This test verifies that power is properly applied, verifies that there are no internal bit errors, and performs other tests to ensure that the bit synchronizer is fully operational with status indication of results. Command-test BIT performs the same functions and can be initiated by the user at any time through the Lumistar software when used on Lumistar PC products. The user has the ability to generate internal pseudo-random patterns and calculate internal bit error rates with or without the injection of forced errors.Various status indicators are also available through the software. The Bit Synchronizer also contains a BER reader as well as frame sync pattern indicator.
