Showing results: 1996 - 2010 of 2759 items found.
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Kistler Instrument Corp.
Piezoelectric force sensors, respectively piezoelectric force transducers or load cells, are perfectly suited for the precise measurement of compressive and tensile forces, both in highly dynamic applications and in quasi-static processes. In universities and industry, for basic research or quality assurance: exact data is always essential in order to measure force characteristics and make processes more cost-effective. Thanks to their rugged design, piezoelectric force sensors from Kistler keep precise track of quasi-static and highly dynamic force processes, even when conditions are difficult. Our force sensors can also handle simultaneous measurements of multiple orthogonal force components.
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R347B -
Keysight Technologies
The Keysight R347B noise source covers a 26.5 to 40 GHz frequency range. This waveguide noise source allows you to make accurate and convenient noise figure measurements on millimeter-wave devices. The R347B provides highly precise broadband noise at the input of the system or component under test. The noise figure meter then processes the ON/OFF ratio of noise power present in the system IF, and provides an accurate reading of noise figure and gain. The R347B noise source has remarkable ENR stability over time, which allows longer recalibration cycles and more accurate noise figure measurements.
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B1500A Series -
Keysight Technologies
Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.
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780419-01 -
NI
PXIe, 145 MHz Bandwidth, 16-Bit, 128 MB, I/Q PXI Waveform Generator—The PXIe‑5450 is a 145 MHz, dual‐channel arbitrary waveform generator optimized for I/Q communications signals. It is an ideal instrument for testing devices with I/Q inputs, or as the baseband component of an RF vector signal generator. The PXIe‑5450 also features onboard signal processing (OSP) functions that include pulse shaping and interpolation filters, gain and offset control, and a numerically controlled oscillator (NCO) for frequency shifting. The PXIe‑5450 also features advanced synchronization and data streaming capabilities.
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780419-02 -
NI
PXIe, 145 MHz Bandwidth, 16-Bit, 512 MB, I/Q PXI Waveform Generator—The PXIe‑5450 is a 145 MHz, dual‐channel arbitrary waveform generator optimized for I/Q communications signals. It is an ideal instrument for testing devices with I/Q inputs, or as the baseband component of an RF vector signal generator. The PXIe‑5450 also features onboard signal processing (OSP) functions that include pulse shaping and interpolation filters, gain and offset control, and a numerically controlled oscillator (NCO) for frequency shifting. The PXIe‑5450 also features advanced synchronization and data streaming capabilities.
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Shenzhen FNIRSI Technology Co., Ltd
Key features:• 128 x 160 TFT color display for easy readings, can display measured data and graphics• Powered by 9V battery(not included)• All components are protected by a plastic case, convenient to carry• Automatically detect NPN and PNP transistors, N-channel and P-channel MOSFET, diodes, thyristors, resistors, capacitors and other devices• Automatically test the pins of a component and display on the LCD• Measure the gate threshold voltage and gate capacitance of the MOSFET• Measure bipolar transistor current amplification factor and base-emitter threshold voltage• Two-button operation, automatic shutdown to avoid unnecessary waste• Short detection time: Only 2 seconds (it is normal to cost 1 minute for bulk capacitor detection)
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XM Bond HR -
Viscom AG
Viscom AG offers the new XM Bond HR camera module for dependable inspection of wire bonds. Its characteristics include a 21 mm x 21 mm field of view size and exceptionally fine detail resolution. It is ideally suited for the most precise inspection of thin wires in the production line. With the new XM Bond HR camera module, Viscom advances the configuration possibilities in wire bond inspection for higher in-line inspection quality. This module is particularly recommended for safety-relevant electronics, where thin wires with diameters of e.g. only 20 µm are installed. Products of this kind find use, among others, in various types of signal processing in the automotive and aerospace sectors. The high-quality optical components and sensor chips with first-class resolution and sensitivity achieve superb image quality and sharp detail resolution. Together with its 21 mm x 21 mm field of view size, the XM Bond HR offers a resolution of 4.5 µm per pixel. A telecentric lens ensures that regardless of the distance to an object, an inspection window has the same image scale; for example, the end points of an inspected thin wire are always located at the same positions in the inspection window. In addition, the telecentric optics also prevent areas on the electronic assembly next to tall components from being hidden.
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Kuhne electronic GmbH
First approach is to generate the high frequency directly, at the fundamental, using an oscillatortuned on the desired frequency. Few sensitive issues appears here due to high working frequency as, stability, jitter, phase noise, pulling, pushing, low output power, and cost of the active component to meet the performances
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LPSU -
AWT Global
Low PIM coaxial switch matrix 5 x 6 or 1 x 4 configurationFrequency range 698-2700 MHz.SCPI commands via Ethernet (wired or wireless).Significantly reduces test time for multi frequency PIM applications.Applications: ATE systems, multi-band antenna and component testing.
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LT-01 -
Jinan Leading Instruments Co., Ltd.
LT-01 Leak Tester is applicable in leak testing of pouches, bottles, pipes, cans and boxes of foodstuff, pharmaceutical, medical, daily chemistry, automotive, electronic components, stationary and other industries. It's also applicable in the leak testing of the specimens after falling tests and pressure resistance tests.
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Pickering Interfaces Ltd.
We offer simulation modules for Strain Gauge Simulation – used in mechanical systems to measure the tension or compression of structural components. These modules may also be used to simulate Wheatstone Bridge Pressure Sensors/Transducers. Simulation requires extremely fine setting resolution with high accuracy and temperature stability.
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P700 -
Bemco Inc.
Bemco's Standard P700 Salt Spray and Fog chamber is designed to fill the needs of laboratories that require accurately controlled salt spray and fog tests on small components and assemblies. This unit meets all standard military, commercial, and ASTM salt fog corrosion and humidity corrosion tests.
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LQ404 -
Computer Gesteuerte Systeme GmbH
The qualification tester LQ402 is designed to support up to 12 DUTs (Device under Test), for which the loads are installed in separate load boxes. The system consists out of 3 cabinets. One is for the electronic components with the primary measurement devices and the other two hold the 12 load boxes.
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ABT Series -
High Voltage Inc.
ABT Series test sets are ideal for testing medium voltage electrical components and apparatus. These units are packaged in benchtop cabinets for industrial and commercial use. Standard models range from 10 kV AC – 50 kV AC with ratings from 1 kVA – 3 kVA.
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LQ402 -
Computer Gesteuerte Systeme GmbH
The qualification tester LQ402 is designed to support up to 6 DUTs (Device under Test), for which the loads are installed in separate load boxes. The system consists out of 2 cabinets. One is for the electronic components with the primary measurement devices and the other one holds the 6 load boxes.
