Load Cell Test
See Also: Load Cell Simulators, Load Cells
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Product
Load Cells
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Morehouse Instrument Company Inc.
When high accuracy and low risk are critical, customers rely on Morehouse Ultra-Precision Load Cells. These strain gauge type load cells are often the choice for companies that want their reference standard to have the lowest possible uncertainties. Lower uncertainties allow for shorter set up times, less frequent standard changes, and fewer standards to maintain.
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Product
Load Cells
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Load cells are electronic weight sensors whose purpose is to receive the electrical excitation caused by a certain weight applied to the scale or balance and transmit it to a weight indicator . The load cell is an essential component in any scale or electronic balance and they come in different models and specifications. A Wim load cell is essential for a weighing system where precision, durability and a fair price are required. WIM-Systems manufactures a wide variety of load cell models, one for each need, in addition to offering all the advice you need to choose the model that best meets the particular needs of your weighing system and always backed by WIM-Systems quality and technology.
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Product
Universal Test System
LEON System
Test System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
Audio and Acoustic Functional Test Solution
Functional Test
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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Product
BMS Manufacturing Test System
Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Product
350W Bench Electronic Load, Single Input 150V, 60A, 350W
EL34143A
Load Module
Keysight’s EL30000 Series bench electronic loads consist of three models, all with a built-in data logger. The EL33133A basic performance electronic load offers an economical price, a limited range, and a single 40 A, 150 V, and 250 W input. Two performance models offer additional ranges, the EL34143A single input 60 A, 150 V, 350 W, and EL34243A dual input 60A, 150V, 600 W.
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Product
Benchtop Automated Functional Test
midUTS
Functional Test
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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Product
ARINC-708 Module
M4K708
Test Module
The M4K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M4K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive.
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Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
Test Instrument
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
VLSI Test System
3380P
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
Load Cell Amplifiers
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When a digital display is not required, a Load Cell Central signal conditioner is just the thing for your system. Our load cell amplifiers work great in applications where the weighing system is controlled by a computer or PLC. Once supplied with the appropriate power, these devices provide a regulated excitation voltage to the load cells, and convert a small mV signal into more common signals like 0-10VDC, +/-10VDC, 4-20mA, RS232, RS485, and USB. Our wide range of load cell signal conditioners / load cell amplifiers offer a variety of accuracy and frequency response levels.
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Product
Load Cell Transducer
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Unitech Scales And Measurements Pvt. Ltd
Force can be measured by different methods, one of the most effective and accurate method is by using strain gauge based load cells. Four Transducer class strain gauges are bonded on the specimen and are connected in the form of Whetstone Bridge. The specimens are of different types depending on the requirement such as S, column, beam, ring, shear beam, binocular etc. UNITEH’S Load Cells are used for wide applications rite from commercial weighing scale to industrial process controlling, R & D applications and educational institutions. UNITECH’S manufacture load cells from 1Kg to 100Tons for compression or tension or universal (Compression and tension) applications. We also undertake custom built load cells for specific requirement and for OEM users.
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Product
ARINC-429 Module
M4K429RTx
Test Module
The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Product
Load Cell Amplifier
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Xiamen Elane Electronics Company, Ltd
: 0-50 degrees. Humidity: 30 to 80 percent, non-condensing.Power Supply Requirements:Power Supply voltage: 9 volts DC.Operating current: 5mA, plus bridge current.Bridge Input:Excitation voltage: 5 volts.Bridge Type: Full Wheatstone Bridge.Voltage Output Range: From 0 volts to 4.3 volts.
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Product
Load Cells
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Force Logic UK provides high-quality load cells, load indicators, and force measurement systems for a variety of industries. All our load cells are manufactured in the UK, and have passed through rigorous quality control standards for precise and accurate measurement, load monitoring systems, and industrial weighing applications. They are suitable for the measurement of static loads and dynamic forces in tension or compression, our load cells cover a wide range of mechanical forces, from 1kg to 1000 tonnes.
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Product
Functional Test System
TS-5040
Functional Test
The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
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Product
S-Type Load Cells
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S-Type load cells are low-cost and high performance side mounted load cells suitable for a number of weighing and general force measurement applications. They come with a 6-foot strain relieved integral cable with pigtail leads that are stripped and tinned for electrical interface.
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Product
EBIRST 50-pin D-type To 37-pin D-type Adapter
93-005-418
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Flexible Cable, 2.4 Mm To 3.5 Mm
85134H
Test Port Cable
The Keysight 85134H is a 62.9 cm (24.75 in) long1 flexible cable with a 2.4 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.31 * sqrt (f) + 0.2 (where f is frequency is GHz) for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 2.5 inch radius. Stability1 of the Keysight 85134H is less than 0.12 dB and phase is less than 0.13o * f + 0.5o, (where f is frequency in GHz).
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Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
SSD Test Systems
Test System
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Product
Test Port Cable, 1 Mm
11500L
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 24-cm cable featuring a return loss of 16 dB minimum.
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Product
Load Cells
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Applied Weighing International Limited
Range of tension load cells are suitable for smaller Silo, vessel and tank weighing applications. The load cell can be supplied as a fully welded stainless steel or tool steel. Capacities from 1000kg to 5000kg Fitting options available including threaded bar, rod end bearing and eyebolts. ATEX option available.
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Product
Medalist i1000D
U9401B
In-Circuit Test System
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
