X-ray Inspection Systems
See Also: Inspection Systems, Automated Fiber Optical inspection Systems
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Electron Diffraction System
Modern physics is the post-Newtonian conception of physics. It implies that classical descriptions of phenomena are lacking, and that an accurate, " Modern", description of nature requires theories to incorporate elements of quantum mechanics or relativity, or both. This section includes many of the most important experiments in physics, including e/m tubes, the Franck-Hertz experiment, and nuclear magnetic resonance (NMR)
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Conformal Coating Inspection (CI AOI)
They cover the components, the area around the components and identify most coating issues including cracks, bubbles, insufficient / excess coating, loss of adhesion and other common contaminations. Full coverage inspection for conformal coating.
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ATE & Test Systems
Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
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Batteryless System Logger
SKU-004-01
The Batteryless System Logger is a unique device that was designed to log system data from any serial port, and store the data in the Logger’s non-volatile memory; this is done in the event of a system crash or power outage. The Logger is ideal for companies in the embedded appliance market.The System Logger connects to the embedded system via the serial RS-232 port. It continuously receives log info from the system, and stores this log info on an internal cycle buffer. This info can be retrieved via the serial interface at any time.
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Automated X-ray Inspection (AXI)
Automated X-ray inspection (AXI) is a testing approach based on the same principles as automated optical inspection (AOI). Instead of cameras, X-rays are used to automatically inspect features.
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Vision Measuring System
CNC Vision Measuring System. Supporting non-contact and contact hybridContact measurement of detailed shape is achieved by extra small stylus with minimum diameter of 15um
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Preparative HPLC Systems
Nexera UC Prep
The Nexera UC Prep is a new preparative supercritical fluid chromatography system that offers both the high basic performance developed for the previous Nexera UC model and original state-of-the-art preparative SFC technologies. It resolves a number of issues in preparative tasks, reducing labor and improving efficiency while fitting into pre-existing workflows. Not only does the Nexera UC Prep achieve superior recovery rates for purification, it provides flexible system configurations in a compact design, requiring low installation space and allowing you to maximize lab resources.
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Automatic Driving System
ADS EVO
Vehicle developers face increasing pressure to reduce development times, while vehicle complexity is increasing. The ADS EVO ensures accurate and repeatable global test cycles on chassis dynamometers.
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Automated Testing System
PV-LIT
Thermographic solutions ensure high quality of solar cells and modules.Usable for all types of solar cells and modules (silicon-based or thin-layered)Testing in laboratory and in-line in the course of the manufacturing processTesting of various solar cells and modules through contact and non-contact measurementCell-specific system configuration and determination of test criteria and kind of defects
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Protocol Test System
USB Explorer 260
The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
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SOI Bonding Systems
An accurate wafer bonding process is the key factor in obtaining high quality single crystalline silicon films on insulating substrates. The EVG850 SOI/Direct Wafer Bonding systems are designed to fulfill a wide range of fusion/molecular wafer bonding applications, with main focus on SOI substrates manufacturing. Ultra clean handling of wafers throughout the bonding process assures high-yield and void-free bonds. All essential steps, from cleaning and alignment to pre-bonding and IR-inspection are combined in one high volume production system. EVG850 is the only production bonding system built to operate in high throughput, high-yield environments and guarantees void-free SOI wafers up to 300 mm.The EVG300 series single wafer cleaning systems are designed for efficient removal of particles. In semiconductor processing, efficient cleaning and particles removal prior to critical process steps enables maximum yield. Wafer Bonding is a process which is strongly affected by particles: each particle on the wafer surface produces a void orders of magnitude larger than its diameter, contributing to a dramatic yield loss.
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Automated Surface Inspection for Glossy Components
Flawlessly glossy surfaces are among the most important quality features of many premium products. The smallest surface defects immediately have a degrading effect on the product. The result: disappointed end customers or buyers. At the same time, reflective surfaces are often very sensitive and a challenge for optical metrology. A manual inspection is tedious, expensive, and ultimately always governed by subjective decision criteria. During production, faulty painting or coating processes can cause high scrap rates. Defects that are not detected even during the final inspection can lead to expensive complaints and, in the worst case, to the loss of the customer. Only an efficient, automated surface inspection achieves the highest quality at acceptable costs.
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Modular I/O System
ADAM-5000 Series
ADAM-5000 PC-based SCADA controllers, including the ADAM I/O series, feature an Intel Atom D510 CPU along with control specific features such as watchdog timer, battery backup RAM and deterministic I/O and acts as a automation controller.
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Device Programming Systems
Algocraft develops and markets a wide range of professional systems dedicated to the manufacturing and testing of electronic boards. Our main series of products is the WriteNow! Series of In-System Programmers, which are completely designed and produced by us.
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Laser Warnings Systems
Elbit Systems of America’s laser warning systems use both coherent and non-coherent laser sources. We understand the full scope of issues associated with each laser threat and have the systems engineering expertise necessary to accurately and reliably detect, locate and categorize these threats. Each LWS is equipped with a direction indicator and provides complete threat coverage in a high dynamic range with audio and visual warnings.
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Motor Vehicle Inspect Lines Engineer Program
Foshan Analytical Instrument Co, Ltd.
It is suitable for measurement of motor vehicles equipped ignition engine with max total mass more than 3500kg. Including the dual idle speed method test. Meet the requirement of GB18285-2005"Limits and Measurement Methods for Exhaust Pollutomts from Vehicles Equipped Igintion Eigine under Two-speed Idle conditions and simple Driving Mode Conditions". The system can select the prompt mode of the dirver mode or the prompt mode of lattice screen.
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Wire Systems Analyzer
Console Test Systems (CTS)
Wire Systems Analyzer Commercial Roll around detects and locates faults and detects degradation in electrical interconnect systems ranging from simple to complex. Used to verify the operation of relays, circuit breakers, indicators, switches, diodes, transformers, 1553 couplers, etc.
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Review System
RV-3000
Reduces surface inspection device review time and contributes to greater inspection efficiency! This system uses address information for defects detected by surface inspection equipment to acquire images of defects with a high level of magnification, and categorizes defect types.
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Universal Multichannel System
Power Supply Systems are 100% internally developed and designed to install into a standard 19” relay rack. The mainframes and dedicated HV/LV boards were purposefully designed to provide peak performance in a broad spectrum of operational scenarios and for a vast number of detector types. CAEN mainframe systems are modular, making upgrade and maintenance a breeze.A single mainframe may house and provide control for up to 768 independent channels. Each mainframe may be configured with a mixture of both High Voltage boards for detector bias and Low Voltage boards to drive peripheral electronics.
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Total Reflection X-Ray Fluorescence (TXRF) Products
Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
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System Analyzer
H60
A meter conceived for professionals that know what they want. Functions for CATV systems, MATV systems and IRS systems done in coax or fibre. For free to air or encrypted programs, the H60 features unprecedented capacities for a meter of this size. There is simply no possible comparison with others, Capacity to measure any wanted signal or interference up to 3,3 GHz. The best way to analyze the TV or telephony (GSM or LTE/4G) equipment or installations.
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Optics Test Systems
Contract Measurements And Services
Optik Elektronik Gerätetechnik GmbH
Thanks to our very good laboratory equipment, we offer contract measurements for numerous measuring tasks. In the field of optics, measurement and testing technology, these are, for example, the parameters MTF, focal length, radius, contact dimension, focal length, geometric and optical parameters of cylindrical lenses. Others on request.
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HDT & Vicat Systems
The Instron line of CEAST Thermo-mechanical systems are used to characterize the behavior of plastic materials at high temperatures, measuring the heat deflection temperature (HDT) and the Vicat softening temperature (Vicat). These HDT and VICAT testers range from very simple units for quality control labs to more advanced and automated systems.
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Brake System
Car brakes are no less important than a steering or engine. After all, the safety of the driver of the car, its passengers and other road users directly depends on the serviceability of their work. Even those who always say that brakes are the lot of cowards, deep down they were grateful to them for the opportunity to maneuver successfully on the road and not fly into the ditch.
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Systems Modeling
Altair model-based development (MBD) tools drive fast development for smarter connected systems. Altair customers simulate complex products as systems-of-systems throughout your entire development cycle from early concept design to detailed design to hardware-in-the-loop testing (HIL). Explore more by combining mechanical models with electrical models (in 0D, 1D, and/or 3D) to enable multi-disciplinary simulation and leverage automatic code-generation for your next generation embedded systems.
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Power Systems
In mission-critical field applications deployed in harsh environments, such as a dry desert or an arid mountainous terrain, it is difficult to secure necessary grounding contact.
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Advanced 3D Automatic X-Ray Inspection
V810 S2EX
V810 is "3D Automatic X-ray inspection System" that corresponds to the double side mounting SMT-PCB that is not able to be checked by a transmission-type X-ray machine. It has the ability to detect a wide range of defects, and It have 100% complete defect detection capability in the Hip-defective.And, it is the inspection machine of world's highest level that combines the ability of the ultra-fast test speed and the lowest false call positives further.
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Meter Test System
MTS-50
Kongter Test & Measurement Co., Limited
This meter test equipment features state-of-art designing with high accuracy. It is composed of high accurate (class 0.05% or 0.1%) standard reference meter and power source (up to 50A). This system is particularly designed with modular structure for calibration and test of different single phase/3 phase electronic/inductive active and reactive energy meters.
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System Instruments
bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
