X-ray Inspection Systems
See Also: Inspection Systems, Automated Fiber Optical inspection Systems
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Mobile Systems
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Advanced vehicle-based platforms for real-time detection and identification of CBRN threats in complex and variable urban environments.
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Large Format Infrared Inspection Windows
FLIR IRW-xPC/xPS Series
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The FLIR IRW-xPC/xPS joins the existing FLIR IR Window family to help you inspect more efficiently, make inaccessible components accessible, and save money by preventing unplanned downtime. The rectangular polymer windows are impact resistant and provide the largest viewing area available to monitor completely undisturbed assets inside energized electrical equipment. IR Windows-xPC/xPS are durable and stable in harsh environments, making them suitable for most industrial settings as well as for shipboard use.
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High-Accuracy Automated Optical Inspection Systems
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Fully-automated and high-accuracy 3D inspection and measurement systems. High-power, long working distance optics and high-resolution digital camera are perfect for high-magnification applications. These are full-color systems capable of high-accuracy measurements, automated defect detection and color verification.
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Printing Quality Inspection Machine
TQM AVI
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Landrex Technologies Co., Ltd.
Printing Quality Inspection Machine
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System Integration
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More and more customers want integrated systems in which the devices are supplemented with additional components and delivered turnkey. ET System electronic offers all services for this system integration from a single source. The sources and electronic loads are fully wired according to customer requirements, installed in 19 "cabinets and equipped with special features. For example, sources and loads can be combined with one another and supplemented with special interfaces or emergency stop functions. The integration of insulation monitors, interlock functions and the installation of industrial PCs is also possible, as is the installation of special safeguards, for example if each channel is to be safeguarded separately in multi-channel devices.The respective configuration can be based on any machine guidelines and standards, and the systems can be integrated into any existing environment with additional connections. On request, space and connection options for additional devices can be provided in the 19 “cabinets so that customers can easily integrate their own components.
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Metrology System
Echo
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The Echo system is a comprehensive in-line metal film metrology tool for single and multi-layer metal film measurements in leading-edge logic, memory, advanced packaging, and specialty semiconductor devices.
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High-speed In-Line 3D CT Inspection System
X-eye 6300
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Automatically inspects the defects of products in customer's line with high-speed 3D CT tomography.Able to inspect every defects of Double-sided PCBA & BGA mounted components precisely by solving overlapped X-ray image issue.Inspection speed of 3 sec/1FOV from loading to automatic Good/NG judgement.
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Curing Systems
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Manufacturers know that the coating, dispensing and/or potting process doesn't end once the material is applied. Most materials require some sort of finishing step, or cure force, to dry, harden or cure the coating. For those materials that require thermal or UV cure forces, SCS manufacturers cure systems that are robust, reliable and ensure that your process is as efficient as possible.
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GENERAL INSPECTION MACHINE AFTER SOLDER MASK
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DVI is a technology of automated optical inspection, which can inspect deep to the difference from semi-transparent layers or semi-reflective layers.
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Video Inspection
MacroZoom
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Our MacroZoom Video Inspection packages are useful is countless industries. MacroZoom solves the problems that customers have with traditional microscopes, by offering an unlimited working distance, as well as field of view, and hugely generous 1-80x magnification range.
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Metrology System
IMPULSE V
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With tighter wafer-to-wafer and within-wafer uniformity tolerances, integrated metrology systems are in use across various semiconductor processing steps. Based on demonstrated high-resolution optical technology, the IMPULSE V system provides higher sensitivity to thin film residue measurements during the CMP process. The IMPULSE platform boasts the industry’s most reliable hardware with best-in-class reliability and productivity metrics.
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AMD Systems
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Next level professional computing. Leverage NextComputing's unique hardware with stellar processing performance from AMD to create your perfect powerhouse solution; in the server room, at your desk, or on the go.
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Monitoring Systems
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Once a dynamic event is detected, the system instantly informs the control system or other external devices and acts as a digital recorder by capturing important data before and after the event. This information can be used to alert the operator to change process settings or schedule maintenance.
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Vacuum Systems
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Custom vacuum systems, and retrofits into existing systems, are also available.Electrogrip has extensive in-house and customer system design experience ...Mechanical, flow, and thermal simulation;Mechanical design and fabrication;Software system automation.DepEtchPro control software permits rapid automation, without programming:Process systems and robotic motion control are automated with job files and icon setup.Always under user control, hence permitting unlimited field upgrades.
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Energy Dispersive X-ray Spectroscopy
EDS
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Materials Evaluation and Engineering
EDS is an elemental chemical microanalysis technique performed in conjunction with each of the SEMs at MEE. Features or phases as small as about 1 micron can be analyzed.
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ATE & Test Systems
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Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
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Metrology System
Atlas V
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The new Atlas V metrology system is designed to measure several key steps that include buried features, not visible by CD-SEM and other techniques. Through remarkable improvements in the optical systems, mechanical sub-systems and software algorithms, the Atlas V system can precisely measure the very subtle variations for device parameters and reveal weak process corners for engineers to improve their process robustness in the fab.
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Switching Systems
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DEV offers a range of matrix and redundancy switches, as well as de-/multiplexers. Beside custom configurations, we provide our flexible switching systems in different sizes, for L-Band and CATV Frequencies.
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Printed Circuit Board Inspection System
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NIDEC-READ offers an array of testing equipment used to conduct open/leak tests on motherboards, as well as many other printed circuit boards. They can be flexibly configured according to applications in terms of size, type, and the number of test pins required.
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Automated X-ray Inspection (AXI)
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Automated X-ray inspection (AXI) is a testing approach based on the same principles as automated optical inspection (AOI). Instead of cameras, X-rays are used to automatically inspect features.
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Thickness and Flaw Inspection
OmniScan MX ECA/ECT
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With thousands of units being used throughout the world, the OmniScan® MX is a field-proven, reliable instrument that is built to withstand harsh and demanding inspection conditions. Compact and lightweight, its two Li-ion batteries provide up to 6 hours of manual or semi-automated inspection time.
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CUSTOM SYSTEMS
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Tristan’s specialties include custom systems (magnetic, cryogenic, scanning, multichannel SQUID, variable temperature systems, magnetic fields, and microwave) based on a core technology of system building and expertise in cryogenics, refrigeration, software (upper level control and embedded) and electronics design.
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Systems
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We design and build discrete systems and complete solutions for communications, ISR and protection of forces. Our products include reconnaissance, communication and navigation systems; geo-location systems; EW systems; threat warning systems and adversary emulation systems.
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X-Ray Flaw Detectors
XXQ/XXG/XXGH Series
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XXQ series are suitable for the material directional of thin iron plate, aluminum, rubber and so on, may get very good picture quality and clarity.
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Software Module with a Virtual Gage for Real-Time Inspection and Assembly
Verisurf Build
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Verisurf BUILD is the industry-leading tool for real-time model-based inspection, tool fabrication, and computer-aided assembly.Inspect position and profile, set details and fabricate tools, jigs, and fixtures faster and at lower cost than any other process or software.Evolved and perfected from a large installed base at today’s modern aerospace, automotive, and industrial tooling manufacturers.
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System Controllers
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Kratos Defense & Security Solutions, Inc.
- Precise and accurate six-axis tracking control- An easy-to-use graphical user interface accessible from anywhere on the network- Optional integrated control capabilities and hardware, such as an integrated spectrum analyzer, beacon receiver, uplink power control, auto acquisition, carrier monitoring & logging, and much more
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System Controller
T96
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The T96 Controller is a universal controller supporting all the standard Linkam stage families, providing complete control of the system.The T96 can be controlled through the LINK software using the USB interface or the high resolution LinkPad, an ergonomic touch screen display, which enables the user to quickly enter experimental parameters for the hotstage.
