PXI Functional Test
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
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Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
Automatic Calibration Function oH Meter
AH-151
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The pH meter AH-151 with automatic calibration function performs pH measurement by automatically cleaning the electrode with cleaning solution and performing calibration with standard solution, making it possible to drastically reduce maintenance work. In addition, by spraying the calibration solution, the consumption of calibration solution has been reduced. The spray amount of the cleaning solution can also be adjusted according to the condition of contamination, which contributes to cost reductions. With periodic cleaning and calibration, stable and highly reliable pH measurements are possible.
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Product
Function / Arbitrary Waveform Generators
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Teledyne Test Tools generate fixed or arbitrarily defined waveforms and signals for use in the development, testing and repair of electronic systems.
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Product
AFDX ® / ARINC 664 Test And Simulation PXI Module
PXI-C664
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*Supports IEEE 802.3 10/100/1000 Mbit / s full duplex Ethernet connections*Uses SFPs to support both electrical and optical interfaces*Half-size PCI / PCI-X modules*Simulates multiple AFDX® / ARINC 664 end systems*Stard Ethernet processes simultaneous to AFDX® / ARINC 664*Up to 128 output VLs and 512 input VLs*Upper layer protocol handling (ARINC 653, UDP, IP) managed onboard*DMA for high data rate applicationsWindows XP / 7, Linux, and LabVIEW Real Time Drivers & APIs (others on request)*Easy to use tool for configuring AFDX® / ARINC 664 end systems (XML based)
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Product
Function Test Systems & Equipment
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Cincinnati Test Systems (CTS) provides our customers with turnkey systems that include the design, manufacture and support of custom built lean cell and automated functional equipment testing solutions. We are a recognized global leader for providing test solutions integrated with advanced technology, precision instrumentation, information software written by CTS engineers with proven experience, and supported by a team of technical application specialist.
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Product
Single Function Installation Testers
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A handheld insulation resistance and continuity tester. Its unique integrated safety probe puts the LCD and test probe in the user's line of sight whilst making measurements.
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Product
Through Connector Functional Test Fixtures
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Circuit Check is a pioneer in the development and implementation of access mechanisms enabling testing of circuits through on-board connectors.
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Product
6 Channel Function Generator / Flow Simulator
DP-cPCI-2601
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DP-cPCI-2601 is a 6 Channel 2MS/s Waveform Generator with high frequency performance, versatility and compact size in an economical cPCI bus format. Signal output in the range of 10 mHz to 5 KHz with 14 bit vertical resolution makes this single slot, 6U-sized cPCI card a powerful solution to meet most demanding test stimulus.DP-cPCI-2601 uses Direct Digital Synthesis (DDS) technique to generate stable and accurate output waveforms down to 0.01 Hz resolution. DP-cPCI-2601 offers Sine, Square, Ramp, Triangle, Pulse as built-in wave shapes and user defined arbitrary waveform.DP-cPCI-2601 can frequency sweep any of its function outputs. User can sweep upwards using linear sweeps.
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Product
PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
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InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Product
Automated Functional Testers
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Don Alan testers are compact integrated systems with very few if any connected instruments. This reduces the unit cost of the test systems dramatically. With the lower unit cost, more test systems can be made available. Having more testers provides redundancy and higher throughput and allows duplication of the same test process in house by the customer. This means the customer can effectively handle warranty return issues on the spot (the retest results get tied to the original test results for warranty analysis). It also allows customers to do sample based quality assurance.
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Product
16-Channel DAC Function Card
ProDAQ 3510
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The ProDAQ 3510 DAC function card is a ProDAQ high-density card that fits into ProDAQ VXIbus motherboards and LXI function card carriers. This high-density card contains 16 independent, 16-bit DAC channels, and each channel is equipped with its own DAC. The ProDAQ 3510 DAC function card is specially designed for DC, low-frequency, and current loop applications.
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Product
2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
Fluctuation Sound Analysis Function for O-Solution
OS-0526
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Although the magnitude of the sound is not so large, there are many “unpleasant sound” in the world. For example, “rattling” and “humming“ sounds generated from interior items while driving a car, or abnormal sounds such as “buzzing“ sounds that can be heard in the rotation sound of a small motor, etc. Sounds with significant temporal fluctuation often feel unpleasant even the magnitude of sound (level) is not so large.
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Product
PathWave BenchVue Function Generator App
BV0002B
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The PathWave BenchVue function generator app helps control function generators intuitively, load/design arbitrary waveforms, and build automated tests quickly.
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Product
Thermal/Multi-Function Data Logger
51101
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Chroma Systems Solutions, Inc.
Models with 1, 8, and 64 channels on-line data recording. Multi-sets linked to a PC for hundreds of channels are doableSupports B, E, J, K, N, R, S, and T type thermal couples with ITS-90 defined temperature rangeIndividual channel cold junction compensation withTemperature resolution up to 0.01℃, error down to (0.01% of reading+0.3℃)Voltage full range ±480VDC, ±10VDC; resolution 1mV, 10uV; error down to (0.1% of reading+1mV), (0.015% of reading+100uV)1000VDC channel to channel isolation, full protection for testing points with charge and guarantee for accurate measurementsThermal couple open circuit detectionPC-based operation with powerful software for recording and analyzing data1 and 8 channel models are USB powered. No battery or external power supply is required
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Wireless Functional Test Fixtures
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Circuit Check’s wireless fixture technologies reduce debug time, simplify ECO’s and reduce maintenance. This allows for the highest test performance, ability to probe denser smaller targets and achieve ultra-high node counts. Higher density more complex circuit boards complicate testing requirements. Smaller more tightly spaced test pads create a wiring challenge for the fixture fabricators, test engineers and maintenance personnel. Wireless fixtures solve the challenges associated with the nest of wires found in long wire fixtures. Wireless fixtures replace the “nest” of wires with copper traces on a multilayered printed circuit board called a Translator Board (T-Board).
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Product
8-Channel VME Function Generator
V340
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The V340 provides eight independent DDS-synthesized waveform outputs, each programmable for frequency and amplitude. Any output may be switched to a front-panel test connector, allowing in-crate calibration check without removing field cables.
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Product
EBIRST 78-pin D-type To 68-pin Female SCSI Adapter
93-006-222
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Function Generators
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Respective dual channels function/arbitrary waveform generator. Sine wave output up to 160MHz, full-band resolution of 1μHz. Pulse waveform up to 50MHz (or 40MHz), adjustable time of rising, falling and duty ratio. Sampling rate of 500MSa/s and vertical resolution of 16bit. 6-bit high-precision frequency meter compatible with TTL level signal. Arbitrary wave storage of 8~32M points, 7GB non-volatile waveform storage. Multi modulation function::AM,FM,PM, ASK,FSK,PSK, BPSK, QPSK,OSK,PWM, QAM, SUM . 16bit digital arbitrary wave (TTL level) DARB. 16th Harmonic Generation Function. Protocol output: I2C, SPI, UART (TTL level). 8 Inch high-resolution TFT color LCD,WVGA(800×480). Standard interface: USB Host, USB Device, LAN, 10MHz clock source input/output. Frequency sweep and burst output. Easy-to-use multi-functional knob and numeric keypad
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Incircuit and Functional Test Systems
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REINHARDT System- und Messelectronic GmbH
We offer test systems which vary in their expansion and can be used for different ranges of automatic testing.
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Product
Functional Test Fixtures
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Businesses rely on Circuit Check’s functional test fixture expertise. Functional test typically applies full operational power to a loaded printed circuit board in order to determine if the PCBA performs functions as designed. This type of test often involves custom built test equipment and custom test fixturing. Circuit Check supports all forms of functional test strategies.
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Product
PXI-5402, 14/16-Bit, 20/40 MHz Arbitrary Function Generator
779655-01
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20 MHz Bandwidth, 14-Bit PXI Waveform Generator—The PXI‑5402 is a 20 MHz function generator capable of generating standard functions including sine, square, triangle, and ramp as well as other signals like psuedorandom noise and DC signals. This function generator can generate signals from -5 V to +5 V and uses direct digital synthesis (DDS) to precisely generate waveforms.
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Product
PXI System for LRU Test
ARINC 629
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PXI System for LRU Test Support. The system shown here was developed in support of Boeing 777 LRU Production Test.
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Product
Function Generator
FG-52
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*0.05Hz ~ 5MHz FUNCTION GENERATOR*LINEAR / LOG SWEEP FUNCTION*DUTY CYCLE COUNTROL*INVERT FUNCTION*AUTO RANGE AUTO GATETIME COUNTER*0.001Hz COUNTER RESOLUTION
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Product
Dual Channel Arbitrary Function Generator
TGF4000
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High resolution, low jitter pulses can be generated up to 100MHz as can wide bandwidth white noise. A extensive array of modulations is provided using internal and external sources. Gated, burst and sweep modes can use internal or external trigger sources. Remote control via USB and LXI compliant LAN (standard) can be supplemented by optional GPIB if required.
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Product
Single Function MIL-STD-1553 Test & Simulation PCIe Card
ASE1553M-x
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Single Function MIL-STD-1553 Test and Simulation module for PCIe with 1, 2 or 4 dual redundant streams.
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Product
Radar Test System
UTP 5065
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Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Product
Breakout Box for Easy Access to PXI-501 Functions
PXI-501 ACS-001
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The PXI-501 ACS-001 is an extension for the PXI-501. It provides 4mm sockets do directly connect a DUT to the PXI-501 source and measurement functionallity. It’s especially recommended for laboratory environments and debugging purpose.
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Product
Functional Tester
ESF-2003
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The functional tester developed on the basis of our experiences in electric parameters testing technique.Accumulated with 30 years of experiences in electronic testing, Shindenshi Corporation develops this ESF-2003.Shindenshi will provide suitable products to customer for their need.
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Automated Test Equipment
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These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
