PXI Functional Test
-
Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
Test Fixture
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
-
Product
Function Modules
-
NAI offers over 70 smart, field-proven function modules covering a wide variety of I/O, Measurement and Simulation, Communications, Ethernet switch and SBC functions. With Off-the-shelf development and quick integration speed, NAI's function modules provide the ability to reconfigure and respond to changing design specifications reducing NRE charges and offering obsolescence protection all with unmatched flexibility with countless hardware & software combinations. Each smart function module has dedicated FPGAs on-board with memory map-based configurability, programmable PID loop support and health monitoring via Built-In-Test. A single API provides programmability across all leading to a more I/O-intensive, distributed, smart and total cost-effective mission system.
-
Product
Basic Unit - Medical Equipment Functional Test Module System
GS-X
-
The GS-X Testing System consists of a Basic Unit and various plug-in test modules which the user can purchase as required. The range of functions of these Module-Box is being continuously expanded, and presently includes functions for testing the following devices: - Infusion pumps, Cardiac pacemakers, Defibrillators, High-frequency Surgical equipment, electrical safety ECG Simulation, Equipment for electro-stimulation.
-
Product
PXI Instrumentation Modules For Automated Test Systems
-
PXI-based test systems often require a variety of general-purpose instrumentation such as digital I/O, waveform generators, voltage & current sources and DUT power supplies.
-
Product
Function Tester with Low Number of Channels
UTP 6010 RF
-
The UTP 6010 is one of our smallest test systems and therefore a cost-effective entry into our UTP tester series.The fast system is used to implement scalable functional test applications for a test item (single device under test) with multiple RF channels and mixed-signal test options. Depending on the adapter, the DUT can be tested at circuit board level (FKT) or when installed at the end of the line (EOL).Depending on the test item requirements, we configure the appropriate number of channels and integrate the necessary interfaces directly in the adapter or tester. The test speed, production volume and overall complexity of the UTP 6010 interfaces can be varied according to your requirements.
-
Product
200 Vdc External Voltage Bias Fixture
16065A
Test Fixture
Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
-
Product
Functional Verification Platform
Riviera-PRO
-
Riviera-PRO™ addresses verification needs of engineers crafting tomorrow’s cutting-edge FPGA and SoC devices. Riviera-PRO enables the ultimate testbench productivity, reusability, and automation by combining the high-performance simulation engine, advanced debugging capabilities at different levels of abstraction, and support for the latest Language and Verification Library Standards.
-
Product
Function / Arbitrary Waveform Generator
DG2000 Series
-
With frequencies up to 100 MHz, 16Bit Resolution, and arbitrary waveforms of up to 16 Mpts the DG2000 reproduces any waveform with high signal fidelity. SiFi II adds additional filtering capabilities making this one of the most flexible generators on the market.
-
Product
Functional Testing
-
Thanks to our partnership with 6TL engineering (www.6tlengineering.com), we can build complete ATE (Automatic Test Equipment), i.e., turnkey solutions for your testing needs using, high quality, efficient, and modular base test platforms with a short delivery time.
-
Product
Test Line • Equipment For Testing For Function
-
The test equipment is used for qualitative functional testing of discharge power supply units and / or ionization units from the static line and air line (discharge). The devices are usually operated with a single button and indicate via LED, whether the device under review functions properly.
-
Product
Rack based antenna test system
R&S®ATS800R CATR
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique rack based CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
-
Product
Custom Test System Solutions
Test System
No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
-
Product
Waveform Function Generators
-
Teledyne Test Tools generate fixed or arbitrarily defined waveforms and signals for use in the development, testing and repair of electronic systems.
-
Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
Test Instrument
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
-
Product
Integration and Functional Testing
-
Exactest provide test analysts of the highest calibre only. Those who think "anyone can test software" are mistaken. Many key skills are required depending on the project and test phase being undertaken.
-
Product
AIT PXI Express Test & Simulation Instruments
-
Avionics Interface Technologies
AIT’s Test & Simulation Instruments for MIL-STD-1553, ARINC 429, ARINC 664/Avionics Ethernet, and Fibre Channel are available in PXI and PXI Express form factors and are supported by software drivers for Windows, Linux, and LabVIEW Real Time. All instruments are also supported by Software Development Kits which provide API’s for C/C++, C#, and LabVIEW.
-
Product
Drive Controller Function Test
-
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
-
Product
30 MHz Function / Arbitrary Waveform Generator
DS345
-
Stanford Research Systems, Inc.
The DS345 Function Generator is a full-featured, 30 MHz instrument that uses an innovative Direct Digital Synthesis (DDS) architecture.
-
Product
H(3)TRB & HTGB Test Systems
Test System
SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
-
Product
Pulse Function Arbitrary Noise Generator
81150A
Arbitrary Waveform Generator
1 - 120 MHz pulse generation with variable rise/fall time1 - 240 MHz sine waveform output14-bit, 2 GSa/s arbitrary waveforms512k samples deep arbitrary waveform memory per channel Noise with a selectable crest factor and signal repetition time of 26 days FM, AM, PW, PWM, FSK modulation capabilities up to 10 MHz1 or 2 channel, coupled and uncoupled Differential outputs
-
Product
In-Circuit Test
TestStation LH
Test System
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
-
Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
-
Product
8-Channel VME Function Generator
V340
-
The V340 provides eight independent DDS-synthesized waveform outputs, each programmable for frequency and amplitude. Any output may be switched to a front-panel test connector, allowing in-crate calibration check without removing field cables.
-
Product
Fastest In-Circuit Test Platform
TestStation
Test Platform
Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
-
Product
Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
-
Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
-
Product
RSE Wireless EMC Spurious Emission
TS8996
Test System
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
-
Product
ABex Terminal Module for Extending the Functionality of the PXI-501
ABex TM-501 MFI
-
The ABex TM-501 is an ABex terminal module that extends the multifunction measurement card PXI-501 with additional features. It is located in front of the PXI-501 card.It expands the analog outputs voltage range of the PMUs to -10V up to +40V. Additionally it features a shunt current measurement unit to measure currents up to 500mA
-
Product
Miscellaneous Function Cards
ProDAQ 3900 Series
-
The ProDAQ 3900 Series function cards are high-density cards that fit into ProDAQ VXIbus motherboards and LXI function card carriers. ProDAQ instruments are versatile, providing users with the highest channel density and functionality available on the market.
-
Product
Functional Testing
-
Functional Ethernet testing is done during the research and development phase of a product or service. It can cover many parameters depending on the DUT and the application. Using Xena’s products, your range of functional Ethernet testing includes:*Multicast*40/100G PCS and PMA Layer*Transparent Transport*Energy Efficient Ethernet (EEE)*Microbursts and random IFG*Synchronous Ethernet*Automotive Ethernet*1588v2 Performance Testing*Regression testing*Kernel drivers and NIC testing*Hardware emulation (ASIC*)
