Data Test Sets
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Product
8-CH Relay Output Module
ND-6063
Data Acquisition Module
- 8-CH relay outputs- Output Type: 8 Form A- Contact Rating: AC: 0.5 A / 125 V; DC: 1 A / 30 V or 0.3 A / 110 V; ON/OFF Interval Time: 3 ms- Breakdown Voltage: 500 VAC (50/60 Hz)
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Product
In-Circuit Test System Calibrations
Test System
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Product
Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Product
Conformance Test System
TS8980
Test System
The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
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Product
Memory Test System
T5830/T5830ES
Test System
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
Test Instrument
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
8-CH Analog Input Module
ND-6017
Data Acquisition Module
ADLINK's NuDAM data acquisition modules make up a total acquisition network and control system. Up to 256 NuDAM modules an be romotely controlled on any RS-485 network from a host computer, via a single serial RS-232, allowing communication from as far as 4000 feet from the host. Based on the RS-485 multi-drop network system, each module has a unique address ID, whereby simple ASCII command & response protocols through the standard RS-485 interface can control all the NuDAM modules in the RS-485 network. The NuDAM modules provide direct communications with a wide variety of sensors, perform all signal conditioning, scaling, linearization and conversion, and can acquire measurements of temperature, pressure, flow, voltage, current, and multiple digital signal types.
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Product
28-CH PPI Module
ND-6058
Data Acquisition Module
- 8255 PPI mode 0 emulation- Channels: 24 DIO and 4 DI
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
High Speed Data Acquisition Module
ADQ214
Data Acquisition Module
The ADQ 214 data acquisition card features dual channels, 14-bit resolution, 400 MSPS capture rate with 1.4 GHz analog input bandwidth, and a memory buff er of 64 MSample per channel. The combination of high speed, high resolution and wide bandwidth makes it ideal for broadband applications such as IF sampling of RF signals and high-speed data recording. PXI Express, USB interfaces.
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Product
Component Test Fixture For N1413 With B2980 Series
N1428A
Test Fixture
The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
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Product
Thermal Vacuum Data Acquisition and Control Software
TVAC 7000
Data Acquisition Module
Equipment used in space applications needs to go through stringent environmental tests in order to prove that it can survive the extreme conditions experienced during launch and while in space. Some of the key environmental tests include vibration, thermal vacuum, and electromagnetic compatibility. Thermal vacuum test is crucial to confirm the equipment is able to operate under the space vacuum condition.
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Product
Data Acquisition System
DAQ973A
Data Acquisition System
Get the next-generation data acquisition (DAQ) system with a three-slot mainframe and your choice of nine plug-in modules. Interface with the DAQ using Keysight BenchVue DAQ software or use the intuitive graphical front panel with task-oriented, self-guiding menus.
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Product
Display Driver Test System
T6391
Test System
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
4-CH 14/16-Bit Up to 2 MS/s Simultaneous-Sampling Multi-Function DAQ PCI Express Cards
DAQe-2000 Series
Data Acquisition Module
ADLINK DAQe-2000 series products are simultaneous-sampling multi-function PCI Express DAQ cards to meet a wide range of application requirements. The devices can simultaneously sample 4 AI channels with differential input configuration in order to achieve maximum noise elimination. They also provide 2-CH 12-bit analog outputs with waveform generation capability, which can be performed together with analog input functions. If more analog input or output channels are required, multiple cards can be synchronized through the SSI (system synchronization interface) bus. This makes the DAQe-2000 series ideal for the stimulus/response test.
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Product
Test Platforms
Test Platform
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Product
EV Power Components End of Line Test Platform
Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Product
Universal Test System
LEON System
Test System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
BMS Manufacturing Test System
Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Product
Test Systems
Test System
Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
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Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
Test Fixture
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Product
Industrial Data Acquisition Module for embedded systems with PCIe/104 OneBank expansion
PX1-I440-ADC
Data Acquisition Module
The PX1-I440-ADC is an industrial data acquisition module for embedded systems with PCIe/104 OneBank expansion. This module features eight differential ADC (analog-to-digital converter) inputs based on the Analog Devices LTC2335-16 ADC. Analog to digital inputs terminate to a single 20-pin box header connector.
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Product
6TL10 Table Top Test Base
H71001000
Test Platform
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
Data Acquisition System
DAQ
Data Acquisition Module
Data Acquisition (DAQ) systems are used to collect information for the purpose of documenting or analyzing an electrical or physical phenomenon, for example: temperature or pressure. They serve as a focal point in tying a wide variety of sensors together that indicate temperature, flow, level or pressure. The sensors convert a physical occurrence into a measurable electrical signal, which can be factored into command and control decisions. These high-speed DAQ systems feature different analog and digital input and output modules that can be used with a wide range of signal types including 4-20 mA current, thermocouples, and RTDs.
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Product
5G Carrier Acceptance Test System
NetOp
Test System
R&S®NetOp is the leading platform for network operator device acceptance test, covering all leading tier 1 operators.As one-stop shop for Protocol, IMS, Data Performance, E911 GNSS the supported carriers include:North America: AT&T, Verizon Wireless, T-Mobile USLatin America: America MovilChina: China Mobile, China Unicom, China TelecomJapan: NTT DoCoMo, Softbank, KDDI
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Product
Windows Driver & SDK for ADLINK USB DAQ Series Data Acquisition Modules
UD-DASK
Data Acquisition Module
ADLINK DASK drivers are the device drivers for custom data acquisition applications for Windows. The DASK driver libraries provide API sets for ADLINK PCI ExpressR, PCI, CompactPCI, PXI and USB data acquisition cards, to access full hardware functionalities, such as buffered/double-buffered data acquisition, pattern generation, digital input/output and etc. For novice users, the built-in CodeCreator utility helps you create your first program in just a few minutes.
