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Product
4-CH 14/16-Bit Up to 2 MS/s Simultaneous-Sampling Multi-Function DAQ PCI Express Cards
DAQe-2000 Series
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ADLINK DAQe-2000 series products are simultaneous-sampling multi-function PCI Express DAQ cards to meet a wide range of application requirements. The devices can simultaneously sample 4 AI channels with differential input configuration in order to achieve maximum noise elimination. They also provide 2-CH 12-bit analog outputs with waveform generation capability, which can be performed together with analog input functions. If more analog input or output channels are required, multiple cards can be synchronized through the SSI (system synchronization interface) bus. This makes the DAQe-2000 series ideal for the stimulus/response test.
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Product
In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
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Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Product
PCIe 5.0 Test Platform
PXP-500A
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The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Product
RF Testing Platform for ATx05
AT118
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The functional test of modern devices with wireless connectivity always requires RF isolated cameras, as the only way to have the parameters controlled and to guarantee operation under the specified conditions.
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Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
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Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Product
6TL36 Inline Handler
AM304
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Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
e Data Acquisition 32 ch. Module
CPCI-AD320-6U
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The CPCI-AD320 module provides a 6U high performance data acquisition subsystem. There are 32 thirty-two 100/200 KSPS ADC’s for maximum performance. Or an opt low cost 16 channel version. The Local DSP can be usedto simply move data samples to the CPCI bus or can provide processing functions such as limit checking, FFT’s, digital filtering, etc. Software can be downloaded to the DSP via the CPCI interface.
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Product
4/8-CH 12-Bit 1 MS/s Analog Output Multi-Function DAQ PCI Express Cards
DAQe-2500 Series
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ADLINK DAQe-2500 series are high-speed and high-performance analog output multi-function DAQ PCI EXpress cards. The devices are able to update up to 8-CH, 12-bit analog outputs simultaneously at sustaining 1 MS/s. The reference sources and the output polarities are programmable on per channel basis, combining with the multiplying DAC architecture, ADLINK DAQe-2500 series DAQ cards can generate complex modulated analog signals. The hardware-based arbitrary waveform generation frees the CPU intervention even when all analog outputs are updating at full speed, and the lengths of waveforms are only limited by the system memory.
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Product
Mixed Signal Battery Test System
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The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
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The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
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Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
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Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
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The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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Product
End of Line Test System for Automotive Seats
AS519
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AS519 is specifically designed to perform ECU’s EOL tests in the automotive industry. It integrates a programmable power supply up to 20V 20A with high reading resolution. Interaction with the DUT is established through CAN bus by an interphase adapter in a USB port of the test managing computer.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
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The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
OLED Lifetime Test System
58131
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The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
48-Ch TTL DI/O IDAQ Module
iDAQ-751
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Hot-swappable in iDAQ systemDetachable Euro-type spring terminal connectors48-channel TTL digital I/OsConfigurable digital I/O directionIsolation protection of 60 VDCSupports buffered acquisition/update rates up to 200kHz
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
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The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Industrial Data Acquisition Module for embedded systems with PCIe/104 OneBank expansion
PX1-I440-ADC
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The PX1-I440-ADC is an industrial data acquisition module for embedded systems with PCIe/104 OneBank expansion. This module features eight differential ADC (analog-to-digital converter) inputs based on the Analog Devices LTC2335-16 ADC. Analog to digital inputs terminate to a single 20-pin box header connector.
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Product
Image Sensor Test System
IP750
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Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
Scienlab Battery Test System — Cell Level
SL1002A
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Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
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Product
16-CH 12/16-Bit 100 kS/s Low-Cost Multi-Function DAQ Cards
PCI-9111 Series
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ADLINK PCI-9111 series are 16-CH, 100 kS/s low cost multi-function DAQ card. The PCI-9111 series feature flexible configurations on analog inputs. A RC filter is implemented on each A/D input channel for user to attenuate or filter input signal. The PCI-9111 series provide analog inputs with 5 programmable input ranges for bipolar inputs. The PCI-9111 series also support automatic analog input scanning. PCI-9111DG provides 12-bit A/D resolution while PCI-9111HR provides 16-bit A/D resolution. The PCI-9111 series also feature 1-CH 12-bit analog output, 16-CH TTL digital inputs and 16-CH TTL digital outputs. ADLINK PCI-9111 series deliver cost-effective and reliable data acquisition capabilities, and is ideal for a broad variety of applications.
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Product
Analog Output Module
ND-6021
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- Voltage Output: 0 to 10 V- Current Output: 0 to 20 mA, 4 to 20 mA- Output Isolation: 5000 VRMS- Resolution: 12-bit resolution- Accuracy: ± 0.1% of FSR (current); ± 0.2% of FSR (voltage)
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Product
Tabletop Single Site Test Handler
3111
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The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
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Product
8-CH Thermocouple Input Module
ND-6018
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- Channels: 6 Differential & 2 Single-ended- Input Type: Thermocouple, mV, V and mA- Thermocouple Type: J, K, T, E, R, S, B, N,C- Voltage Range: ± 15 mV, ± 50 mV, ± 100 mV, ± 500 mV, ± 1 V, ± 2.5 V- Current Range: ± 20 mA- Isolation Voltage: 2500 VRMS
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Product
RF-Antenna Communication Links Functional Test
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The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.
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Product
NI Vehicle Radar Test System
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VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Product
PCIe 2.0 Test Platform
PXP-100B
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The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
Windows Driver & SDK for ADLINK USB DAQ Series Data Acquisition Modules
UD-DASK
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ADLINK DASK drivers are the device drivers for custom data acquisition applications for Windows. The DASK driver libraries provide API sets for ADLINK PCI ExpressR, PCI, CompactPCI, PXI and USB data acquisition cards, to access full hardware functionalities, such as buffered/double-buffered data acquisition, pattern generation, digital input/output and etc. For novice users, the built-in CodeCreator utility helps you create your first program in just a few minutes.
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Product
Portable, Integrated O-Level Test Platform
Guardian™
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Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
