Breaker Test Systems
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Product
SIP-90-4 Test System Interface Probe
SIP-90-4
ICT/FCT Probe
Overall Length (mil): 693Overall Length (mm): 17.60Rec. Mounting Hole Size (mil): 57Rec. Mounting Hole Size (mm): 1.45Recommended Drill Size: 1,45 mm
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Product
DC Voltage Test System
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HIGHVOLT Prüftechnik Dresden GmbH
DC test systems are used to test components and complete systems found in electrical power supply systems and operating on DC voltage.
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Product
PXI Test System
APT-1000
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18 Slot NI PXI chassis (PXIe-1065)Amfax MDU with E-StopMAC Panel SCOUT Receiver chassis and tableProgrammable DC power supply4 channels- 0-30V 2AFan Vented 29u Instrumentation rackIndustrial PC i7- Windows 7 or 1024 inch touchscreen LED Monitor on armLight TowerCE CertifiedFully wired and testedFull documentation packDelivery and commissioning on site
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Product
ESD & Latch-Up Test System
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Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.
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Product
Diagnostic Test Tools For Switching Systems
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You know that verification and diagnosis of complex switching operation in a test system has always been an issue. Two of our latest offerings in diagnostic test tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.
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Product
Mobile Handset Voice Quality Test System
BK9024
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If you need to test cellphones, the BaKo Type BK9024 is fast and switches between up to 8 phone chambers at once, making it a great choice for quality control on your production line.
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Product
CT/VT Test System
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Fully pre-wired comprehensive turn test system. *Suitable for CTs up to 6000A & VTs up to 132kV. * Precision to (0.005 class) internal multi-ratio standard CT. * Internal 4KA current source. * State-of-the-art Instrument Transformer Test Set AITTS-98 with computer & printer interfaces. * Electronic potential divider facilitates testing any VT ratio upto 132kV. * Current & potential burdens.
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Product
Material Compatibility Test System (MCTS)
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Automotive squeaks occur when materials in contact rub against one another causing annoying noises from friction-induced stick-slips. Automotive itches are a special category of squeaks that can develop when rubber or plastic rubs against glass or paint. The MB Dynamics Material Compatibility Squeak & Itch Test System (MCTS) is designed and manufactured to subject contacting pairs of materials and actual vehicle parts to precisely controlled interference & motion under in-vehicle environmental conditions in order to acquire, monitor, analyze and report friction and acoustic characteristics with the objective to:
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Battery Test Systems
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Low current model32 channel battery cycler (expandable up to 128 channels)No. of minimum channel : 16 channelsmax. voltage range : ±5Vmax. current range : ±10
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Product
Full Wafer Test System
FOX-1P
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Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Product
Motor Drive Test Systems
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Drive and motor systems present unique challenges for test systems and Intepro combines regenerative active electronic loads to reduce the energy needed to do the tests as well as sophisticate instruments and supply voltages to test these demanding applications and provide meaningful results for the electrical and mechanical power parameters.
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Product
SRS-200A Spectral Radiation Safety Test System
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Hangzhou Everfine Photo-E-Info Co., LTD
SRS-200A is a new generation of portable photo-biological safety test and evaluation equipment. Based on the mainfunctions of the laboratory spectral radiation safety test system, the convenience and operability of test are fully considered.To some extent, the analyzer makes up for on site measurement insufficiency.
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Mixed Signal Test Systems
MTS2010i
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The MTS-2010i are a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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Product
MMIs for Test and System Integration
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Laying out a custom PCB is too time consuming and costly for most rush projects. Pulse Research Lab has developed Mini Modular Instruments ™ to provide cost effective solutions to the most common engineering challenges.
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Product
EMI and EMC Test System
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EMI receiver system. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KB is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem.
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Product
Surge Voltage and Surge Current Testing Systems
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HIGHVOLT Prüftechnik Dresden GmbH
Pulse Voltage Test Systems are used for surge testing on transformers, cables, gas insulated switchgear (GIS), arresters, and other high voltage equipment.
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Product
Wafer Probe Test System
STI3000
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The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
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Product
EHV Circuit Breaker Analyzer
DigiTMR S2
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The Vanguard DIGITMR S2 is an inexpensive, easy to use digital circuit breaker analyzer. The DIGITMR S2 can be operated stand-alone or can be computer-controlled. It can fully analyze a circuit-breaker’s performance by testing the contact time, stroke, velocity, over-travel, and contact wipe. Contact and motion analysis can be performed for all breaker contact operations (Open, Close, Open – Close, Close – Open, and Open – Close – Open). Timing results are recorded and displayed on the 240 x 128 pixels back-lit LCD screen and can also be printed on the built-in 4.5″ wide thermal printer.
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Product
DynoLAB Test Cell Supervisory System
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SAKOR Technologies’ DynoLAB™ data acquisition and control systems offer reliable, cost effective automation of all types of dynamometer test systems. As with all SAKOR products, the DynoLAB system undergoes a continuous program of upgrade and improvement, regularly expanding and enhancing DynoLAB’s capabilities.
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Product
Automated Robot Test System
ATS-8000A
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High Power Pulse Instruments GmbH
The ATS-8000A test system is a fully automated 2-pin probing solution for HBM, TLP, HMM and CC-TLP on package- and wafer-level.Future extension for CDM is optional.
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Product
Electrical Test System TY-CHECKER
Type E Series
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High-speed, high-precision testers offered with a broad lineup, matching a range of test point numbers. Can be used alone and on our press systems.
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Product
AirTech Test Systems
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Hillger NDT has developed AirTech testing technology for the requirements of air-coupled testing. Our USPC 4000 AirTech ultrasonic testing system and our robust AirTech sensors consisting of optimized transmit and receive probes deliver optimal results under demanding conditions.
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Product
Distribution Transformer Test System
DTTS Series
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Shanghai Jiu Zhi Electric Co., Ltd.
The DTTS Series Distribution Transformer Test System are self-contained test sets incorporating all features necessary for testing single and three phase distribution transformer.
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Product
Circuit Breaker Testing Equipment
HISAC Swift
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HISAC Swift - Circuit Breaker Operational Analyser is meant for checking the performance of the MV Circuit Breakers. The Analyser contains various intelligent measuring modules designed for measuring parameters such as contact timings of Main/PIR & Auxiliary contacts, Close/Trip Coil Current characteristics and Static Contact Resistance of R, Y & B poles simultaneously. The results can be directly viewed on the TFT touch screen display in graphical as well as numerical form. It is possible to print the graph on a built-in thermal printer or download record to PC for further analysis on CPLOT software. This all in one instrument is best suited for gang operated CBs.
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Product
LED Driver Automatic Test System
ATE-2
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•This system includes 2 groups (left and right); the 2 groups can work in turn, so that to improve the work efficiency. For example, if the left is on working, then the right can make wire connection. •It can test 4 LED drivers input and output at one time. •The equipment can connect with electronic load and LED load, the two difference loads can be fast switch under the control of computer. •Enable to print out the series number and parameters of sub-quality products by working with a micro-printer, •Enable to achieve the bar-code record function by working with a bar-code scanner. •The test report can be saved as Excel file for consult, statistic and analysis purpose. •Good software interface to freely choose the difference parameters combination, so that to meet different demands. All the parameters can set limit, and with the quality analysis function.
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Product
DC Parametric Test System with Curve Trace
DC3
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The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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Product
Tensile Testing System With Thermostatic Chamber
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This thermostatic chamber is ideal for long-stroke tensile testing of large-elongation materials such as rubber and plastic in controlled temperature environments.
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Product
Interface Test System (ITS)
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The SecuControl ITS is a modular test block designed to meet the stringent safety, reliability, and performance needs of IEC-based substations. With fully finger-safe construction, keyed STP test plugs, and built-in CT Shorting, the ITS enables safe, repeatable secondary injection testing, without the risk of open CT circuits or accidental trips. It is the ideal solution for structured, standardized testing across protection systems.
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Product
Production Test System
G3 Hybrid
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The G3 Hybrid is a state of the art system for fast Production test throughput in DC test applications. The system combines the most versatile offerings of features in a single system, at the lowest cost. For devices requiring DC and Continuity test capability only, G3H is a very flexible cost-effective Production Test solution. This approach provides a DC test system with the capability to add logic resources (AC/SCAN) as well as analog resources for Mixed Signal. The HILEVEL G3H embraces low cost while supporting SCAN, giving you the ability to toggle every node in your chip.
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Product
Protocol Test System
USB Explorer 260
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The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
