Breaker Test Systems
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Product
Edge AI HPC System
AIR-500D
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Edge AI HPC system powered by Intel® Xeon® D-1700 Series processors with support for up to 4 PCIe slots. Intel® Xeon® D-1700 series processor 4x DDR4 SO-DIMM sockets support ECC/nonECC memory up to 128GB.
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Product
RFID Test System
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RFID test system of Peritec is making FPGA board (IF-RIO) the processing of the IF band. This reading of the code, called (Electronic Product Code) EPC is required for RFID tag ISO18000-6 TYPEC of (EPC C1 G2). However, it did not provide treatment too late in the traditional instruments.
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Product
Discrete Device Test System
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capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing.
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Product
Circuit Breaker Testing
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HAOMAI Electric Test Equipment Co., Ltd.
Circuit Breaker Testing is utilised to test the operation of each switching systems and the programming of the entire tripping structure.
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Product
Production Test System
G3 Hybrid
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The G3 Hybrid is a state of the art system for fast Production test throughput in DC test applications. The system combines the most versatile offerings of features in a single system, at the lowest cost. For devices requiring DC and Continuity test capability only, G3H is a very flexible cost-effective Production Test solution. This approach provides a DC test system with the capability to add logic resources (AC/SCAN) as well as analog resources for Mixed Signal. The HILEVEL G3H embraces low cost while supporting SCAN, giving you the ability to toggle every node in your chip.
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Product
Test System
MFTS500
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Computer Gesteuerte Systeme GmbH
The MFTS500-System is specially designed for the testing of electronic control units (ECUs). It can be configured to be used as a development or as a production tester. Every effort has been made during development and design to ensure that the system is flexible and cost effective.
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Product
HSI System Test Panel
TA-500
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This panel was designed to test primarily the NSD360 series of HSI systems. Panel allows running the complete system on the bench. Included is a panel mounted TA-902 API which can also be used for testing external instruments via a panel mounted switch. The API and standard meter drives allow testing many different instruments.
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Product
DC Voltage Test System
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HIGHVOLT Prüftechnik Dresden GmbH
DC test systems are used to test components and complete systems found in electrical power supply systems and operating on DC voltage.
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Product
Circuit Breaker Timer
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* Micro - Controller based technology* Very Compact and lightweight* Very accurate measurements* Available with built - in thermal printer or RS 232 interface* Available in bench top and industrial suit case models.* Economical
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Product
Materials Test Systems
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An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.
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Product
Circuit Breaker Analyzer
CBAnalyzer
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Simple operation requiring minimal trainingVery portable - it's a laptop or tablet pc running our Windows software programNo modification of the circuit breaker is requiredNo electrical connections are requiredRemoval of the circuit breaker from its mounting or cubicle is not requiredTesting can be performed during routine switchingData is easily transmitted over the internet to the users account where it is analyzed and compared with a known good profile (KGP) for that type of circuit breaker to determine: • Overall mechanical condition • Confirm maintenance intervals and lubrication • First trip testing data for arc flash compliance • Arc flash study validation checksPerform detailed analysis and store maintenance records using CBAnalyzer suite softwareAccess to the CBAnalyzer Account Manager which: • is where user accounts are created and each user's role is designated • provides access to your equipment database and test data archives • is where tests are synced • is where your equipment data is entered and stored • is required to use the CBAnalyzer software program
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Product
Memory Test System
T5801
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Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
PXIe System Sync Module, 5 Port
M9033A
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The M9033A PXIe System Synchronization Module is a dual-slot, 5-port module that provides multi-module and multi-chassis synchronization and triggering for Keysight's modular instruments.
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Product
Device Thermal Test Systems
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Thermal Engineering Associates, Inc.
Thermal test system combines the test and measurement capability of dedicated instruments with the ease of operation and data collecting capability offered by graphical-user-interface-driven software operating on an integrated computer.Diodes (PN, Schottky, LED, varactor, PIN), Stacked Diodes (Hi-V Rectifiers & LEDs), Laser Diodes, Transistors (Bipolar, MOSFET, IGBT) & Diodes, Integrated Circuits (Application & Thermal Test Die).
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Product
System on Demand (SoD): HiL Test System
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System on Demand (SoD) is a unique, agile and standardized principle to design HiL test systems. SoD shifts the focus away from technical-only solutions to a proven automated design process – targeting our customer‘s real issues: time, budget and flexibility.
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Product
In-Circuit Test (ICT) Fixtures
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At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Product
6TL60 Rotary Test Handler
H79006010
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6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Product
In-System Test Programming System
WriteNow
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Based on proprietary WriteNow! Technology, the WriteNow! Series of In-System Programmers is a breakthrough in the programming industry. The programmers support a large number of devices from various manufacturers and have a compact size for easy ATE/fixture integration. They work standalone or connected to a host PC, and are provided with easy-to-use software utilities.
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Product
NI's Wireless Connectivity Functional Test Solution
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The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
Cobot Testing System
CT6
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The CT6 cobot testing system introduces the benefits of automation to the testing of biomedical devices and components. This system pairs a collaborative robot with a 5900 or 6800 Series universal testing system to increase the efficiency of small to mid-sized testing labs that require a high degree of flexibility in their testing systems. The CT6 is designed to handle a wide range of medical components, including drug delivery, sample collection, and wound closure products.
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Product
Universal Test System
LS6601A
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LS6601A Universal Test System is based on LXI bus, primarily used for functional electronic product or system verification, test parameters. Because the system design is based on LXI bus structure, so its addition to general characteristics of versatility, scalability, but the architecture of the system more flexible, the test system is not limited to one or more cabinets, but may be needed test network and multiple LS6601A and can be easily grouped into one or more of the ground test system, depending on the test mechanism, form a powerful set of test, control, simulation, simulation, data management as one; distributed in different places .
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Product
Portable Ruggedized Test System
BADGER
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Badger systems utilize NI's CompactRIO (cRIO), Single Board RIO (sbRIO), and/or CompactDAQ (cDAQ) hardware. The Badger product line offers high speed data acquisition/control and flexibility in an industrial package. Badger chassis and instrumentation have a 50 g shock ratings and a wide -40 to 70 °C operating temperature. These systems are ideal for automotive, industrial automation, remote monitoring, field service, and advanced control applications.
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Product
System Test
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Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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Product
Digital Circuit Breaker Analyzer
CT-7000 S3
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The CT-7000 S3 is Vanguard’s fourth generation EHV circuit breaker analyzer. The CT-7000 S3 is available with 3 (part number 9021-UC) or 6 contact timing channels (part number 9100-UC). The CT-7000 S3 can fully analyze a circuit breaker’s performance by measuring the main contact and resistor contact time, stroke, velocity, over-travel, bounce back and contact wipes. Both contact and motion analysis can be performed on all circuit breaker operations (OPEN, CLOSE, OPEN-CLOSE, CLOSE-OPEN, and OPEN CLOSE-OPEN). The CT-7000 S3’s timing window is selectable between 1 second, 10 seconds, and 20 seconds.
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Product
Vibration Testing System
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Wewon Environmental Chambers Co, Ltd.
Vibration Testing is performed to determine if a product can withstand the rigors of its intended use.
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Product
VLF Test System
BAUR PHG 70 portable
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Portable, high performance test generator with VLF truesinus technology. The BAUR PHG 70/80 portable VLF test systems are used for cable and cable sheath testing of medium-voltage cables of up to 50 kV and electrical equipment.* 3 voltage shapes in one device: VLF truesinus, VLF square wave and DC voltage* For medium-voltage cables of up to 50 kV operating voltage* Cable testing, fault conditioning, cable sheath testing
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Product
Flying Probe Test System
A8a
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The A8a test system provides the flexibility of flying probe testers while delivering high throughput testing for bare board printed circuit boards (PCBs). The target market for the A8a is the electrical test of tablet and PC motherboards and high density interconnect (HDI) products for smart phones. The A8a is designed for high productivity, reliability and test accuracy. To achieve high throughput the key feature of the A8a is a new dual shuttle system, which reduces the product exchange time to zero seconds in automation mode. In combination with the fast test speed of up to 140 measurements/second the A8a will give customers a competitive test solution for batches up to 5000 boards. A typical cycle time of a 4-up smart phone board is about 2 minutes.
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Product
Transformer Test System
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Transformer testing instrument, can be used as a stand-alone device and has the highest efficiency. Can be used in power transformers, network communication transformers, etc.
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Product
Handheld Circuit Breaker And Timer Analyser
CAT-H Series
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The operation of the breaker can be initiated in different ways (e.g. from a control room, by a local breaker or externally by a test device) depending on the test conditions. Various time measurement triggers are available to record a measurement under a different test condition:*Coil control channel*Continuous current clamping channel*DC voltage channel
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Product
PCI Express 4.0 Test Platform
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The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
