Energy Meter Test
See Also: Energy Meters, Phase Meters, Power Meters
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Analog Optical Power Meter - PXI
Power 1500 Series
The Power 1500 Series analog power meter brings cost-effective test and measurement. The Power 1500 provides logarithmic analog output as well as a digital optical power meter for applications that require real-time feedback.
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VDI Erickson PM5B MM–Wave Power Meter with W-Band Sensor, Optional Tapers to 1.5 THz
N1913PM5B
N1913PM5B is a Virginia Diodes, Inc./Erickson PM5B calorimetric mm-wave power meter, with a W-Band sensor for power measurement over a frequency range of 75-110 GHz.
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Digital Power Meter
66205
The 66205 is the 2nd generation of the 66200 series power meter designed specifically for single channel measurement. Its state of art design is capable of providing highly accurate power measurements to meet the requirements of IEC 62301/EN50564 standards. Functionality improvements of the 66205 increase power measurement capabilities to a wider range of applications. The Smart Range function is one of the most important new features added to the 66205 power meter. Smart Range allows the power integration mode to perform active power measurements with the measurement range in auto mode. Chroma’s proprietary design automatically selects the appropriate range, based on changes in sensed voltage and current, ensures the best accuracy when integrating the measurements over time. The 66205 provides 10 selectable current measurement ranges from 5mA up to 30A. External sensor options A662017~A662020 are available to increase the current measurement range. Six selectable voltage ranges are available up to 600V.
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Cable Free ATE
CABLEFREEATE
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Optical Power Meter - PXI
Power 1400 Series
The Power 1400 Series optical power meter provides fast monitoring of signal power from -60 to +10 dBm and broad wavelength range of 750 to 1700 nm. With a logarithmic amplifier, it avoids gain-jumps faced by multi-stage linear amplifier power meters.
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Infotainment Test for Automotive Applications
Multimedia operating interfaces are complex control and display devices for functions such as entertainment, telephony, on-board computers and vehicle settings. The functional test of such complex control units and their networking within the vehicle architecture presents a particular challenge in every phase of the product design process.
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100Hz/120Hz/1kHz/10kHz Handheld LCR Meter
U1732C
20,000 counts resolution0.2% accuracy Wide LCR ranges with 4 selectable test frequencies (100Hz, 120Hz and 1kHz and 10kHz)Auto identification(Ai) which automatically determines and displays component type and measurements Detailed component analysis with ESR, Z, D, Q, functions Battery life of 16 hours/Ac-powered IR-to-USB connectivity for data logging to PC
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P-Series Modular Power Meter (LXI Compliant)
N8262A
The Keysight N8262A P-Series modular power meter enables LAN-based automated measurements of peak, peak-to-average ratio and average power. The N8262A enables fast, efficient, and cost-effective creation and reconfiguration of your ATE system. Owing to LXI test standardization and its interoperability with existing test assets, your system can be up and ready in no time.
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AC/DC Single Phase Digital Power Meter 100 kHz
T3PM1100
AC/DC Single Phase Digital Power Meter 100 kHz.
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100Hz/120Hz/1kHz/10kHz/100kHz Handheld LCR Meter
U1733C
20,000 counts resolution0.2% accuracy Wide LCR ranges with 5 selectable test frequencies (100Hz, 120Hz and 1kHz, 10kHz and 100kHz)Auto identification(Ai) which automatically determines and displays component type and measurements Detailed component analysis with DCR, ESR, Z, D, Q, functions Battery life of 16 hours/Ac-powered IR-to-USB connectivity for data logging to PC
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Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Design for Testability (DFT Test)
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Precision LCR Meter, 20 Hz to 2 MHz
E4980A
The E4980A precision LCR meter provides the best combination of accuracy, speed, and versatility for a wide range of component measurements. Offering fast measurement speed and outstanding performance at both low and high impedance ranges, the E4980A is the ultimate tool for general R&D and manufacturing test of components and materials. LAN, USB and GPIB PC connectivity enhances your design and test productivity.
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Display Driver Test System
T6391
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Modular Functional Test Platform
LX-OTP2
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Fastest In-Circuit Test Platform
TestStation
Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Test Fixture Kits
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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RF Testing Platform for ATx05
AT118
The functional test of modern devices with wireless connectivity always requires RF isolated cameras, as the only way to have the parameters controlled and to guarantee operation under the specified conditions.
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Off-Line Base Test Platform
6TL19
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible, and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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CPE Design Verification System
Jupiter 310
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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Conformance Test System
TS8980
The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
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Functional Test Fixtures
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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ARINC-708/453 2-Channel Test & Simulation Module for the Weather Radar Display Databus
M8K708
The M8K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M8K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive. Each channel implements an 64K×16 FIFO and supports polling and/or interrupt driven operation.The M8K708 comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application. In addition, Excalibur produces adapter cables that convert the carrier board I/O Molex™ connector to two twinax CJ70-49 connectors. The cable may be purchased at an additional cost.
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TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
Stopper kit includedYAVCANCON2 for fixture identification not included
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
