Electronics Test
Devices whose quality of operation is based on the effects of electrons.
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Product
Electronic DC Load
DL Series
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Industry’s Easiest-To-Use DC Load – Vitrek’s DL Series Electronic Loads are available in a multiple configurations to meet your unique application requirements. No other electronic DC load on the market today is easier to use. Equipped with a full color LCD touchscreen display, the unit can quickly be set up for your next test. In addition, the DL is equipped with a comprehensive self-test that ensures that all loading and measurement circuitry is functioning properly.
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Product
Electron Microscope Analyzer
QUANTAX EBSD
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QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM
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Product
AC Electronic Load
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The electronic AC loads cover a wide variety of different voltage, current and power ranges. All the AC loads are programmed with 11 different sine, square and DC waves. With 5 crest factor variations of each, a total of 55 waveforms are available. An external input is also provided to enable the user to amplify signals from a waveform generator.AC Loads allow real world operating conditions to be simulated. Typical applications include circuit breaker, transformer & UPS output testing along with general laboratory and research work.
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Product
Modular DC Electronic Load
63600
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Chroma Systems Solutions, Inc.
Chroma’s 63600 Modular DC Electronic Load is designed for testing multi-output AC/DC power supplies, DC/DC converters, chargers, batteries, adapters, and power electronic components. They are excellent for use in research, development, production, and incoming inspection applications. The 63600’s state-of-the-art design uses DSP technology to simulate non-linear loads using an unique CZ operation mode allowing realistic loading behavior.
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Product
Electronic Warfare
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Data Patterns has developed a line up of State of the Art Integrated solutions for spectrum monitoring, wideband searching, ECM & ESM, direction finding for Airborne and Ground Mobile Applications standard Products include VHF/UHF Search Receiver, HF Search Receiver, Monitoring Receiver & Jammers.
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Product
Wireless Electronic Flight Bags
webFB
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The ultra-compact webFB easily fits in the palm of the hand, yet incorporates the capabilities of both an AID and a wireless server. The built-in AID safely gathers essential data from the aircraft's ARINC 429 and 717 databuses and conveys it to custom software or EFB apps hosted on the internal server. Using a wireless connection to portable EFB tablets, the webFB securely delivers this valuable information right to the fingertips of the flight crew.
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Product
Electronic Pilot Balloon Theodolite
TEBAL 2
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F. W. Breithaupt & Sohn GmbH & Co.KG
*Available in 12/2016*Observe, measure and transfer angles of elevation and azimuth of the flight of an ascending pilot balloon at predetermined time intervals to a tablet/laptop/PC*Determine wind speed and wind direction at certain air layers with an easy-to-use software*Ruggedized design*Easy to use*Quick measurement*Quality made in Germany*Reliable data and documentation
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Product
SoC/Analog Test System
3650-S2
Test System
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Three Phase Electronic Meter DTS999
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Bofa Instrument & Equipment Co., Ltd
DTS999 series Single Phase energy Meter are new and high-tech products adopting special large-scale IC, latest micro-electronic technology and SMT production crafts. It is designed for rough working condition and components selection as foundation, so it can ensure the long-term stable operation. DTS999 series Electronic Single Phase Watt-hour Meter features long life, high accuracy, high reliability, high allowable overload, little power consumption, small size & light weight, etc.
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Product
Electronic Components
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We supply a wide range of components and materials to the electronics industry, such as: integrated circuits for personal computers, semiconductor materials for system LSI, optical communication materials for telecommunications, components for display devices seen in smartphones and projectors, and materials used in solar cells and lithium batteries.
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Product
High Precision Electronic Load
PEL-8000
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PEL-8000 series adopts high-performance chip high-speed and high-precision design, providing resolution of 0.1mV, 0.01mA (basic accuracy is 0.03%, basic current rise rate is 2.5A / US)
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Product
Electronic Circuit Breaker Unit
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The CorePower® DC or AC Electronic Circuit Breaker Unit replaces conventional thermal mechanical circuit breakers and functions as both a breaker and a switch for controlling loads. By placing ECBUs closer to loads, aircraft manufacturers gain a significant reduction in wire weight, need fewer system components, and lower installation labor costs while increasing safety, efficiency, and reliability. This new smaller unit requires less space and provides more flexible mounting options.
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Product
4kW Electronic Load
PT04-110
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For Telecom Rectifier and Power Supply testing. This model has been developed to accommodate testing of both 110V and 48V telecommunications power systems or Power Supplies. It is also useful as a general-purpose variable Load. Its founding principle is simplicity – ease of use, enhanced reliability, greater value for money and wider applicability.
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Product
Programmable DC Electronic Load
63000 Series
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The 63000 Series programmable DC electronic loads are reliable, precision instruments primarily designed to test switching power suppl ies, A/D power suppl ies, power electronic components, adapters, 3C batteries and chargers. Its maximum 350W rated power makes it suitable for testing numerous types of lower power devices. The 63000 Series offers models in two operating voltages 150V models, with 250W and 350W power levels up to 60A in a single unit. Their compact and light weight design make these loads easy to move around which is ideal for R&D and design validation. Each model of the 63000 Series has unique user-def ined waveform (UDW) funct ion capable of simulating real-world custom waveforms. In addition, a data storage function has been built in for saving and recalling up to 100 stored settings at any time. For automated testing, these save and recall functions can save a great deal of time. The 63000 Series has 3 power ranges that can precisely measure the voltage and current in real time. Since short circuit testing is a critical test item, the 63000 provides short circuit simulation to effectively address application demands for power and automated testing.
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Product
Electronic Data Logging
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Although our Karlan Monolog PC software is first choice for data logging, viewing and printing, sometimes it’s not practical or impossible to use a PC. Situations like this call for our KCU-6L. This is a combined control unit and 10 year data logger. It is supplied with PC software for downloading and storing logged data in a format that goes straight into our Karlan Monolog PC software suite. For more information, please contact us
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Product
Electronic Units
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Electronic units for field installation and mounting rack installation control the actuators. They are fed with 115 or 230 V AC. A local control panel allows for easy basic settings.
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Product
Scanning Electron Microscopy
SEM
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Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Product
Auditor Universal Electronic Testers
AUET-DC Series
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The Auditor Universal Electronic Testers (AUET) have a broad range of features to accommodate most requirements. These instruments are designed to be bench top mounted and are available in several configurations and various single or multiple torque ranges. They are also available with file capability (DC) models. The DC models require PC software Auditor Tool Manager (ATM).
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Product
High-end Transmission Electron Microscope
CryoARM
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JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.
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Product
Electronic Warfare MMI and HMI Simulators
MS 1600
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The EW IFU (Electronic Warfare Interface Unit) interfaces between Cockpit electronics viz., RWR Display Unit (DU), New control Box (NCB), CMDS Control/Display units and Simulator Host Computer (HOST). The EW IFU transmits the status of the cockpit control units to the host, receives display data from the host and transfers the same to RWR DU, NCB and CMDS CCU/CDU. The display data for the RWR DU received from the host would comprise of the complete symbol data in respect of emitters that are to be displayed based on the data from the Instructor Station (IS) and control input from the cockpit. The display unit receives and presents the data as symbology on the display screen. The EW IFU based on the PC–AT.
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Product
Communications Test System for Frontline Diagnostics
CTS-2750
Test System
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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Product
Electronic Speed Controller
AFI-ESC1220
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The AFI-ESC1220 is an Electronic Speed Controller designed to drive BLDC motors. It meets the industrial requirements of high power and high voltage application for electronic vehicles, airplanes, boats and medium duty industrial machinery. It is rated at 24KW.
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Product
Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
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"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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Product
Scanning Electron Microscope
JSM-IT510
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Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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Product
Electronic Loads/Sinks
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An electronic load offers the possibility of testing the specimen under different loads. Various load changes are simulated, as they can occur in normal operation. For this purpose, the relevant load current is set in a defined range and electronically controlled. For the test, different operating states are either programmed or entered into the system via an interface (USB, RS-232, GPIB...). For easy handling and quick use, there are four operating modes.
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Product
Electronic Transformer Test System
UI2000-ET
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• Input characteristics analysis 1) Measure Vrms (10-300V) Lrms (0.04-4A) W, PF, Hz, total harmonic and 0-50 component of harmonic 2) Accuracy: ± (0.4%reading + 0.1%range + 1digit) • Output characteristics analysis 1) Measure lamp voltage (1-60V) lamp current (03-20A) lamp power, crest factor and oscillatory frequency 2) Accuracy: Class 2 • It can print without compute, and provide the communication port for PC
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Product
VME System Electronics
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Keysight VME electronics give the highest performance available in a laser interferometer system. Choose from a variety of axis and compensation boards.
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Product
COMMON RAIL Electronic Diesel Injection Analyzer
EDIA-PRO
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The EDIA-PRO is an enhanced version of the proven EDIA-5 analyzer. To meet expectations of our customers we created a system for automatic evaluation of injection system parameters based on measured waveforms. This makes the diagnosis easier and faster. Additional possibility of fast evaluation of cylinder compression and ability to check starting performance along with control valve measurement mode are perfect complement to diagnostic capabilities of EDIA device.
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Product
Digital PIN Electronics Module
P128C200M
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The P128C200M module provides measurement and control of parameters of integrated circuits using parametric measurement methods, as well as functional and algorithmic control. The module implements a synchronization system that ensures the operability of a group of modules when they are installed in the AXIe-1 crate.
