Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Electronic Units
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Electronic units for field installation and mounting rack installation control the actuators. They are fed with 115 or 230 V AC. A local control panel allows for easy basic settings.
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Stereo Microscopes & Macroscopes
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Leica Microsystems offers customized stereo microscopes for research, industry and education. Our macroscopes for industry, medicine and research offer exceptional optics and ultra convenient operation. Stereo microscopes and macroscopes from Leica enable you to view, analyze and document your specimens in two and three dimensions for any application.
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Handy Scan 3D
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The truly portable metrology-grade 3D scanners delivering highly accurate measurements.Truly portable and faster than everMetrology-grade accuracy and resolutionUser-friendly and easy to use
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Product
Programmable DC Electronic Load
DL3000
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The DL3000 series is a cost-effective, economical programmable DC electronic load with a friendly human-machine interface and excellent performance specifications. It provides a variety of remote communication interfaces to meet diverse testing needs for design and testing. A wide range of solutions are available for a wide range of industries including automotive electronics and fuel cells.
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Electronic Test And Measurement Systems
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Summaries, information, & tutorials about electronics test and measurement equipment & techniques.
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Electronic Loads/Sinks
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An electronic load offers the possibility of testing the specimen under different loads. Various load changes are simulated, as they can occur in normal operation. For this purpose, the relevant load current is set in a defined range and electronically controlled. For the test, different operating states are either programmed or entered into the system via an interface (USB, RS-232, GPIB...). For easy handling and quick use, there are four operating modes.
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Scanning Magnetic Microscope
Circuit ScanTM 1000
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Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Microscope
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Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
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Measuring Microscopes, Image Processing
Measuring Microscopes
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Optik Elektronik Gerätetechnik GmbH
Image processing software for dimensional measurements, motorized measuring microscopes and fully automatic measuring machines.
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DC Electronic Load
EE15140A
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The EE15140A DC Electronic Load / Works @ 0.0 Volts Input & real time I/O control attach the electronic load block to a heat- sink and your up and running. used them with D to A's, A to D's, Pots, PLC's to control the current. These Electronic Loads can be used for both Discharge & Charging Batteries & Devices
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3D Laser Scanning Systems
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3D laser scanning is a construction, engineering, and architectural tool often used to document the existing conditions (as-builts) of any structure.
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Microscope Imaging Software
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Microscope imaging software from Leica Microsystems combines microscope, digital camera and accessories into one fully integrated solution.
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High Speed DC Electronic Load
6330A series
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The 6330A family offers 8 types of modular loads with power ranging from 30 watts to 1200 watts, current from 0.5mA to 240A, and voltage measurement from 0.5mV to 500V. Each load is isolated and floating, programmable in dual current range and measuring voltage range, and capable of synchronizing with other modules for control operating. The load can be operated in constant current, constant voltage, and constant resistance. With Synchronic parallel control capability, 6330A series loads allow users to parallel and synchronize more than one load together from an internal loading control signal. This feature provides synchronic dynamic loading test for multi-output power and high power test solution. Real time measurement of voltage, current, is integrated into each 6330A load module using a 16-bit precision measurement circuit. The user can perform on line voltage measurement and adjustment, or simulate short circuit test using the simple keypad on the front panel.
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Semiconductor & Flat Panel Display Inspection Microscopes
MX63 / MX63L
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The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
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Electronic Circuit Breaker Unit
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The CorePower® DC or AC Electronic Circuit Breaker Unit replaces conventional thermal mechanical circuit breakers and functions as both a breaker and a switch for controlling loads. By placing ECBUs closer to loads, aircraft manufacturers gain a significant reduction in wire weight, need fewer system components, and lower installation labor costs while increasing safety, efficiency, and reliability. This new smaller unit requires less space and provides more flexible mounting options.
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AFM (Atomic Force Microscope) Optical Platform
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The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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Electronic Toy Tester
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Programmable ultra high resistance tester is used to test the high resistance of different kinds of material.
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RAPID SCANNING AUTOCORRELATOR/CROSSCORRELATOR
FR-103HP
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The FR-103HP is a compact NL crystal autocorrelator, suitable for moderate and high power lasers (Pav>5mW). It is available with a scan range >60ps (suitable for pulsewidths within 10fs-15ps) and covers a wide range of wavelengths with easily interchangeable plug-in detector modules. The standard FR-103HP provides ‘real-time’ pulsewidth monitoring capability for rep rates down to 1kHz.
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JTAG Boundary Scan Tools
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Blackhawk has teamed with Corelis, an EWA company, to offer customer Intuitive and High Performance JTAG Boundary Scan Tools that are compatible with our JTAG emulator product line. This allows developers not only to debug code on TI devices but also leverage boundary scan testing using the same emulator hardware.
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FIBER OPTIC MICROSCOPES
SpecVision
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SpecVision is a video probe that engages directly with Krell polishing machines. This permits the viewing of polished optical surfaces while connectors or bare fibers are still loaded in the polisher. This in-line video inspection technique minimizes material handling and potential damage/contamination that may occur when transferring components from the polisher to a traditional microscope. SpecVision can interface with Scepter, SpecPro and Rev Polishers.
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Electronic Ballast Production Line Tester
UI2000-OK
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• Eight windows for displaying input characteristics, output characteristics, convenient for comparison and analysis. • Frequency response for testing input current up to 1 MHz, suitable for precise testing of various kind of electronic ballast. • High speed testing, finish testing input and output characteristics within 1 minute. • Portable with built-in chip micro-processor, particular suitable for development and spot production. • Parameters, waves and curves of input, output and startup can be printed. • Communicating with PC, special software provided and both Chinese version and English version available. Run in WINDOWS3.2, WINDOW95 or WINDOWS98, nice interface between people and computer, easy to operate.
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Electronic AC/DC Voltage Tester
ET60
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The ET60 voltage tester requires no batteries as it measures AC/DC voltage up to 600V in electrical circuits, outlets, light fixtures and anywhere else AC/DC voltage testing is required.
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Atomic Force Microscope
AFM Heron
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New, fully motorized AFM HERON (HERO of Nanotechnology) which allows to perfectly align a cantilever, laser and photodiode by just one click on a command button. The scanning settings and landing parameters are also automated that allows to avoid any time consuming adjustment operations, thus leaving more time to researcher for designing the experiment and performing more accurate measurements.
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Electronic Component Testing Services
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New Jersey Micro Electronic Testing, Inc.
NJMET is proud to provide procurement and testing services to the commercial, military, aerospace, industrial automotive and medical industries. We also provide custom engineering consultation services. NJMET Inc. is AS9100/ISO9001:2008 certified and has recently successfully completed of The Defense Logistic Agency’s (DLA) laboratory suitability assessment and is qualified to test federal stock classes (FSC) 5961 (Semiconductor Devices) and FSC 5962 (Microcircuits) to DLA’s QTSL test requirements.
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Laser Scanning Microscope
OLS4100
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The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
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SQUID Electronics
SQUIDViewer Software
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Our LabView® based control software for Windows® is the most convenient way to adjust and supervise your system.
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Scanning XPS Microprobe
PHI Quantera II
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The core technology of the PHI Quantera II is PHI’s patented, monochromatic, micro-focused, scanning x-ray source which provides excellent large area and superior micro-area spectroscopy performance. Spectroscopy, depth profiling, and imaging can all be performed over the full range of x-ray beam sizes including the minimum x-ray beam size of less than 7.5 µm. In addition to superior XPS performance characteristics the PHI Quantera II provides two in situ sample parking stations which enables the automated analysis of all three sample platens in a single user defined analysis queue.
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Laser Scanning Microscopes
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The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
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250 Watt Electronic Load Module
N3307A
Load Module
The Keysight N3307A is a 250 W (0-30A, 0-150V) electronic load module for use in either the N3300A or N3301A electronic load mainframe in system applications. The N3307A load module is fast and accurate, for programming in constant current, constant voltage, or constant resistance modes, or for making voltage, current or power measurements. The N3307A can also digitize waveforms.
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