Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Product
OEM Scan Engines
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Zebra Technologies Corporation
When you choose Zebra as your OEM partner, you get a portfolio of scan engines and devices that deliver industry-leading features, durability and reliability — saving everyone time and money. You save on development time and cost. And, your customers get best-in-class, well-proven solutions that drive time and cost out of their everyday operations.
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Product
Light Sheet Microscopes
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Discover advanced light sheet microscopy solutions from Leica Microsystems. Our portfolio combines cutting-edge technology with exceptional imaging capabilities to enhance your research.
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Product
Microscopes
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Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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Product
Workshop Equipment for Electronics
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PeakTech Prüf- und Messtechnik GmbH
Is a new development for fast and uncomplicated voltage measurements as a two-pole voltage tester with digital LCD display and additional LED display of the current voltage values.
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Product
Electronic Light Table
ELT®/Series
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The ELT/Series software provides powerful imagery and geospatial exploitation tools for a wide range of applications, including intelligence, mission planning and disaster management.
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SQUID Electronics
SEL-1
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SEL-1 is a robust and proven SQUID electronics for high-Tc and low-Tc SQUIDs and magnetometers.
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Product
Scanning Acoustic Microscope
Pulse2
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This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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Product
Industrial Electronic Endoscope
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Xiamen IDEA Electronic Technology Co., Ltd.
1.Railway Electronic Industrial Endoscope testing.2.Large screen color screen to restore the true image. 3.Industrial endoscope.
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Product
Boundary Scan Trainer Kit
QE49
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Qmax Test Technologies Pvt. Ltd.
The QE-49 IEEE1149.1 Boundary Scan Trainer Kit was developed by Qmax to provide user a good understanding and hands on the testing principals of boundary scan namely the scan chain test, interconnect test, non-BS functional testing of logic IC and cluster like a combinational or sequential circuits.
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Product
Electronic Loads/Sinks
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An electronic load offers the possibility of testing the specimen under different loads. Various load changes are simulated, as they can occur in normal operation. For this purpose, the relevant load current is set in a defined range and electronically controlled. For the test, different operating states are either programmed or entered into the system via an interface (USB, RS-232, GPIB...). For easy handling and quick use, there are four operating modes.
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Product
Control Electronics
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Data acquisition and control electronics for optical radiation sources and measurement systems including precision current and voltage supplies for LEDs and tungsten halogen lamps.
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Product
Microscopic Melting Point Meter
DRK8030
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Shandong Drick Instruments Co., Ltd.
Heat transfer material is a silicone oil, in full compliance with USP standard measurement method can simultaneously measure three samples, direct observation of the melting process can be measured colored samples.
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Product
Electronic Component Testing Services
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New Jersey Micro Electronic Testing, Inc.
NJMET is proud to provide procurement and testing services to the commercial, military, aerospace, industrial automotive and medical industries. We also provide custom engineering consultation services. NJMET Inc. is AS9100/ISO9001:2008 certified and has recently successfully completed of The Defense Logistic Agency’s (DLA) laboratory suitability assessment and is qualified to test federal stock classes (FSC) 5961 (Semiconductor Devices) and FSC 5962 (Microcircuits) to DLA’s QTSL test requirements.
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Product
Confocal Raman Microscopes
NRS Series
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Include Class 1 laser safety as standard and share the same comprehensive Spectra Manager™ Suite of measurement and micro-imaging software.
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Product
Electronic Brake Meter
BrakeCheck
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The Bowmonk BrakeCheck is a fully self-contained, portable, battery-powered brake meter that can be used by workshops, government traffic authorities, testing and inspection stations etc. to test and report on vehicle brake efficiency. The unit is MOT approved.
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Product
Electronic Tensile Tester
QT-ETT
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QT-ETT tensile testing equipments are specially designed considering tensile testing requirements for flexible materials that are commonly used in product packaging to study different properties of materials. This instrument utilizes Qualitest's latest embedded control system and operating software, with user-friendly operating interface and intelligent data management system.
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Product
Digital Video Microscope
BVM-20102
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High-resolution CCD sensor, built-in analog/digital converter, analog and digital signal directly display on the screen, can also simultaneously display on TV and computer through corresponding interfaces; taking photo and video through software; easy operation, reducing user's fatigue and injury.
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Product
Portable Measuring Microscope
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Opto's portable microscope is designed to handle even the most demanding on-site inspections. With its ergonomic design, robust construction and perfectly matched optics configuration, it is a precise and reliable tool.
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Digital Inverted Microscopes
WELDinspect
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High-resolution, ergonomic optical inspection systems designed for weld bead analysis and measurement. 4K or Full HD inverted imaging system with motorised zoom, auto-focus, built-in large aperture illumination, and dedicated software for weld bead measurements, analysis, documentation, and reporting.
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Product
Atomic Force Microscope
NX-Hivac
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Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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Programmable DC Electronic Load
M97 series
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The new M97XX series programmable DC electronic load is a new generation product designed from Maynuo Electronic Co.,Ltd. Incorporating high-performance chips, the M97XX series delivers high speed and high accuracy with a resolution of 0.1 mV and 0.01 mA (basic accuracy is 0.03% and basic current rise speed is 2.5 A/μs). M97XX series have wide application from production lines for cell phone chargers, cell phone batteries, electronic vehicle batteries, switching power supplies, linear power supplies, and LED drivers, to research institute, automotive electronic, aeronautic and astronautic, maritime, solar celland fuel cell etc.test and measurement applications. From 150W to 200KW, there are many models to choose from :
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Product
VME System Electronics
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Keysight VME electronics give the highest performance available in a laser interferometer system. Choose from a variety of axis and compensation boards.
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Product
Benchtop Fiber Microscope
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BL-C series X/Y Axial Adjustment benchtop fiber microscope is used to inspect the polished surface or cleaved ends of fiber optic connectors. With a critical view of fine scratches, the BL-C series benchtop fiber optic microscope is an ideal choice for factory post-polish, component assembly, QC inspection of fiber connectors.
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Product
Brinell Optical Scanning System
B.O.S.S.
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Newage Testing Instruments, Inc.
The B.O.S.S. brinell optical scanning system measures your brinell impressions faster, more accurately and more consistently. And it improves your quality control with advanced data acquisition and analysis capabilities, including the ability to save your high-resolution image of our impression to file.
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Product
Flexible Test And Scan Solution For FFC Devices
Ismeca NY32W
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32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for WLCSP and Bare Dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity.
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Product
Web-based Electronic Light Table
RVcloud™
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The RVcloud web-based Electronic Light Table (ELT) is the thin-client variant in our trusted line of geospatial analytic software. Designed with our substantial industry experience and developed using an agile model, RVcloud accelerates delivery of our proven image exploitation capabilities through the cloud.
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Product
Atomic Force Microscope
NaioAFM
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The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
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Product
PC System Electronics
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Keysight PC electronics provide state of the art laser interferometer performance in the convenient PC backplane format. Axis, servo-axis and compensation boards are available.
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Product
Autofocus Optical Fiber Microscope - AFM-700
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Shanghai Fibretool Technology Co.,Ltd.
The AFM-700 is an autofocusing optical fiber microscope.
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Product
64-Channel Boundary Scan Digital I/O Scan Module
JT 2111/MPV DIOS DIN
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The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.This JT2111/MPV DIOS module is also available through our webshop.
