Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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PLD ISP Feature, GTE 10.00p
K8220A
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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Desktop App Testing
TestFort QA Lab has a wide experience in delivering desktop application testing services to our clients from all over the world.We aim to follow the newest trends in desktop application testing and development in order to provide you with the most suitable and leading edge solutions.If you what your desktop application to take a leading position on the IT market you must be sure that it will be tested in a right and thorough manner. Our professional consultants can help you to choose the most appropriate type of desktop application testing and our experienced testers will help you to perform it in the most efficient way.
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STAR-Ultra PCIe
163
The STAR-Ultra PCIe is a SpaceFibre Multi-Lane interface and link analyser, designed to aid test and development of SpaceFibre equipment. It can transmit and receive SpaceFibre traffic from a host PC at data rates in excess of 10 Gbit/s, and it can record and display SpaceFibre traffic transmitted and received on one SpaceFibre port.
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Waveform Function Generators
Teledyne Test Tools generate fixed or arbitrarily defined waveforms and signals for use in the development, testing and repair of electronic systems.
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Chassis Platform Accessories
Embedded Computing Systems require more than just a chassis housing with backplane, power supply, cooling and payload boards. To complement our wide range of systems, Elma offers a comprehensive range of system level accessories, including I/O solutions, HMI displays, system/power management controllers and test & development boards.
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PC/104-Plus Board
PCI-P104-ADAP
Model PCI-P104-ADAP simply allows for the installation of a PC/104-Plus or PCI-104 board into any Universal PCI, 3.3V or 5V slot. It is a standard PCI bus card that supports 32-bit wide data transfers to and from a PC/104-Plus board. This allows any user the convenience of hardware testing, software development, and debugging of a PC/104-Plus board in a PC environment.
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Manufacturing Test Station
Scan Executive
The Scan ExecutiveTM Manufacturing Test Station is used to apply the same IEEE 1149.1 tests that were developed and used in the lab in a high-volume manufacturing environment without requiring additional development.
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Adjustable Clamshell Bed of Nails Testers
AdjustaBON Family
Designed for quick test development. This fixture can be configured to probe almost any circuit board in just a few hours. Once the perfect test is developed, move this light weight fixture out to the production floor to evaluate your production line test strategy prior to buying permanently drilled test fixtures, or while waiting for your drilled fixtures to be delivered. The AdjustaBON competes with the Flying Prober. There are many advantages over the flying prober. Setup is simple and intuitive and can be much quicker than programming a flying prober. Small size provides versatile bench top operation right where you need it. Maintenance costs are insignificant in comparison. The total cost of this fixture is in many cases less than the yearly maintenance cost of a flying prober. It would be possible to buy one of these fixtures every year for the price paid just to maintain one flying prober and it is about 1/20th the purchase price
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9-Slot, 3U cPCI Serial E-Frame
39E09ZZX94Y3VC2X
Taking a new board level product or system from concept to deliverable requires feature rich development and testing tools. Elma's 3U cPCI Serial test and development platform is the ideal environment for bringing your next project to fruition.
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Multi Protocol Analyzer
LE-8200
The LE-8200 is the top-level model of battery-powered communications protocol analyzer. The LE-8200 has an enlarged display in response to an increasing demand without degrading the excellent portability of the LE Series. It is ideal for development tests of communications systems and industrial equipment, as well as for after-sale services and communication trouble analysis.
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Software
Software for developing, testing, and troubleshootingSoftware upgrades enable faster production, reduce errors, improve precision, and give engineers the time and headspace they need to innovate.
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Horizontal Thermal Shock Test Chamber (2 Zone)
Guangdong Test EQ Equipment co., Ltd.
- Integral structure,the internal overall TIG seamless welding, beautiful appearance; Door lock device adopts lever power opening mechanism.- The use of Chinese color LCD touch man-machine interface + high-performance programmable controller (PLC), with TESTEQ test box independently developed special software, with automatic, intelligent, human control and other characteristics.- TESTEQ patent "Cold and heat balance technology",low temperature constant temperature season can be more than 30%.- Control mode: constant operation mode, program operation mode.- Refrigeration compressor and key accessories are selected international and domestic well-known brands, long-term and reliable operation; Environmentally friendly refrigerant, in line with the requirements of international environmental protection conventions.
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Electric Vehicle Test Solution
As the automotive industry advances power conversion and battery technologies, Chroma has been actively working to improve electric vehicle (EV) testing performance and cost by developing flexible automated power conversion test platforms and regenerative battery test systems. Chroma ATE is a world leading manufacturer of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and turnkey test and automation solutions. Chroma’s Automated Test Systems for Electric and Hybrid Electric Vehicles consist of standard test platforms that are combined into one expandable test system that can test most power components in an EV’s power system. Compared to specialized test equipment developed for a single EV model or application, Chroma’s systems provide greater flexibility.
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Test & Evaluation
Scientific Research Corp. STI Division
Test & Evaluation has been a core capability since the company was founded. Our efforts in T&E span from test range capabilities development to test execution and data analysis, with emphasis on joint service capabilities.
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In-Circuit Test Applications
With decades of experience developing test fixtures, we are the recognized industry leaders for solid and reliable quality as well as our outstanding customer service. We fully support our products locally and worldwide for maintenance, repair, and ECO work. Also, 100% wiring verification is part of our Quality Control process, by utilizing automated verification machines for GenRad/Teradyne and HP/Agilent fixture.
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In-Circuit Programmer/Loader
SKU-018-01
The In-Circuit Programmer/Loader (“EasyLoader” or “eLoader”) is a standalone device that was designed to provide a flexible and cost-effective solution for electronic device manufacturers, as well as for hardware design companies and their customers. It allows you to upgrade code on any JTAG/SPI/I2C compliant device (like FPGA/CPLD/EEprom/Flash, etc.) or Microcontrollers at any time of development, testing or production.
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Serial Port Monitor
Serial Port Monitor is a professional and powerful system utility for RS232/422/485 COM ports monitoring. The program monitors, displays, logs and analyzes all serial port activity in a system. This is an ideal way to track down problems that may occur during application or driver development, testing and optimization of serial devices, etc.
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Functional Tester
ESF-2003
The functional tester developed on the basis of our experiences in electric parameters testing technique.Accumulated with 30 years of experiences in electronic testing, Shindenshi Corporation develops this ESF-2003.Shindenshi will provide suitable products to customer for their need.
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3U up to 10 Slots (VPX) / 12 Slots
Designed to be beautiful, this chassis provides flexibility and ease of use to meet all the requirements by test and development engineers. With its exceedingly high-performing 1800W ATX power supply the chassis is designed for up to 120 amperes at 12 volts.
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Multi-Layer Analyzer
GPON Xpert™
The GPON Xpert multi-layer analyzer is a unique protocol analyzer for G-PON products. GPON Xpert is a modular tool designed for R&D, laboratory and field application engineers engaged in the development, testing and deployment of G-PON standard-compliant solutions. GPON Xpert verifies the interoperability of G-PON products offered by different vendors, and indicates compliance of any combination of OLT and ONT/ONU modems to the G-PON standard.
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Battery Management Systems Testing
A Battery Management System (BMS) is an embedded unit performing critical battery functions, including cell monitoring and balancing, pack charge and discharge control, safety, and communications. The BMS must be tested early in development to optimize control algorithms, as well as during manufacturing to ensure reliable functionality. Bloomy’s family of BMS test systems provides a consistent platform for engineers to bring a BMS to market faster, and more reliably.
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Sophisticated Audio and Video Test Patterns
VQL
VQL Instantly reveals your video display, codec, scaler, converter or other video device performance VQL test patterns cover all 3 levels of video QA/QC: Instant visual-aural Quality Estimation Objective Measurements of video and audio performance Fully automated (unattended) Quality Control VQL features: Compatibility with all commonly used software or hardware codecs and media players VideoQ VQV / VQMA / VQTS / VQDM compatible tests Wide range of video frame sizes: from 192x108 to 4096x3072 Variety of bit rates up to uncompressed 4:4:4 4K @60 fps, 48 bit per pixel Variety of video and audio formats, color spaces and level schemes All test patterns remain suitable for accurate measurements even after low bitrate coding, heavy scaling and/or cropping, e.g. after down-conversion for mobile devices Standard, custom and semi-custom tests for development labs, content processing facilities, CDN systems, software developers and high volume manufacturers
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RF/Wireless Test Fixtures
Test‐Head Engineering develops and manufactures RF Test Fixtures which allow the testing of RF and Wireless modules and components.
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Functional Test Systems
With extensive experience in functional test equipment, a world-wide service and support organization, and a broad range of software/hardware options, we will supply cost-effective production-ready test solutions to meet your test challenges. Proposals developed by our functional test engineering team include a detailed description of system requirements, test instrumentation, estimated test cycle times (as applicable), footprint, and other key specifications.
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Data & Protocol Converter
uMACC
The uMACC is a wholly contained Communications Converter (data converter - protocol converter or translator). Its small size makes it a complete solution for developing & testing both in the lab and in the field.The uMACC can carry up to 4 modules. Each module can be one of the following protocols: 1 dual redundant MIL-STD-1553/1760 interface1 H009 channel5 MMSI channels5 ARINC-429 channels2 ARINC-708 channels2 ARINC-717 channels5 ARINC-825 (canbus) channels2 Serial channels (RS-232/422/485, NMEA 0183)Ethernet (10/100/Gigabit)10 Discrete I/O signalsAnalog to Digital / Digital to Analog
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Common Electromechanical Universal Testing Machine
WDW-D series
Jinan Testing Equipment IE Corporation
WDW series computer control electromechanical universal testing machines (UTM) is designed according to ASTM, ISO, DIN, EN standards etc.. It is computer-controlled and precision. Our electromechanical universal testing machine (UTM) is widely suitable for metallic and nonmetallic materials for tension, compression, bending, shearing and low cycle test. The electromechanical universal testing machine features as high precision, high stability and high reliability. Graph, test result display, data processing and printing can be done easily by its PC system and printer. Completed with modulus for metal, spring, textile, rubber, plastic and other material test, our electromechanical universal testing system is widely used in many fields such as industry factories, research and development, test institutes and training centers etc. WDW common series electromechanical universal testing machines (UTM) adopt rigid load frames, accurate load weighting system, advanced PCIE measuring & control system and intuitive modular application software. Configured with wide range of accessories for applications, the materials universal testing machines (UTM) can provide the best testing solutions for your individual application needs. With 20 years’ experience of materials testing industry and based on abundant application knowledge, we are completely capable of configuring the best solutions and more accurately testing systems for the manufacturers involved in load frame, core measuring and control elements, software package, grip/fixture that based on their specified test application and other requirements.
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HV DC Voltage Generators
Fivestar HV Testing Equipment Co., Ltd.
HV DC voltage generators are used to generate high voltage DC test voltages for routine, type and development test on components and complete systems found in electrical power supply systems and operating on DC voltage (HV transmission systems etc). There are K and M series, and available for indoor and outdoor.
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Boundary-Scan DIMM Socket Tester
ScanDIMM
Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
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Test Program Modules
The BRAT Test Program developed will provide functional validation of an assembly based on customer supplied documentation. This does not include hardware (e.g., Interface Test Adaptors), documentation (e.g., technical orders), travel or travel related per diem, or site verification test or installation.
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Product Support Equipment
The TTU/515E or O/I Level Test Set was developed to provide a full end-to-end test of the NACES and FAST electronic sequencers used on the NACES ejection seat. The O/ITS provides simulated inputs and measures the timing of initiator firing sequencer outputs. The O/ITS, via a serial channel in the test connector, performs discrete element diagnostics on all the sequencer's redundant electronics and verifies its full functionality.
