Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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Boundary Scan / JTAG Test Development System
onTAP Development
The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
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Training Services
Austin Labs offers a full line of advanced protocol training classes. All classes are instructor led and guide students through the protocol specifications while using hands on labs with trace analysis to help students discover how the protocol is implemented. To create a reliable product, the user must first understand the technology and know how to use the tools needed to develop, test and debug the relevant host or peripheral specification. Here at Austin Labs we provide everything you need.
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Pattern Converter for WGL/STIL to ATE
VectorPort
VectorPort is a versatile, low-cost test development tool for converting WGL or STIL vectors to targeted ATE tester formats, including pattern, timing, and pinmap data. VectorPort can read and write all major formats in both parallel (Flat) vectors and serial (SCAN) vectors.
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TPS Development
Partech is an acknowledged leader in providing Test Solutions for the ADF, delivering high quality, indigenous in-country support for key defence platforms. Partech has developed Test Solutions for the following platforms:*S-70B-2 Seahawk operated by RAN*FA-18A/B Hornets operated by*RAAF*F35 Lightning II joint strike fighter
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High-Excitation-Force Water-Cooled Range
K-series
K-series, high excitation force water cooled vibration simulating test systems fully developed by IMV.Advanced performance from the K-series will significantly improve the test environment.
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Test Automation Service
Test Automation framework and test development. Mobile Test Automation. Test Automation execution and maintenance.
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PCIe 3.0 and 4.0 Compliance Testing
Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 3.0 and PCIe 4.0 specification. This solution combines a Summit Z416 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 3.0 and PCI Express 4.0 Link and Transaction Layer Compliance Testing.
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Private Cloud Device Hosting Management Solution
ZAPFARM
ZAPFARM is a private cloud device hosting management solution that allows organizations to manage mobile devices and conventional workstations under test to offer their testing and development teams to manage applications under test and test cycles for Cross-Platform/cross-environment applications development and testing remotely.
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Consulting
Consulting Services by LXinstruments including test process consulting, development of product specifications, pretests and feasibility studies, development of applications and support, examination of test equipment and process capability, and more.
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LTE Emulation for End-to-End QOS Validation
IxLoad-Wireless XAir2
Keysight Network Applications and Security
Ixia’s XAir2 load module provides LTE user equipment (UE) emulation that enables a powerful IxLoad eNodeB Layer 1 to 7 test solution. With complex UE modeling, it offers realistic and easily-configured traffic models and call patterns. Using IxLoad’s real-world subscriber modeling, testers do not need to be protocol experts to develop test realism. From a single tool, users can perform capacity tests, detail a cell throughput, measure voice and video quality, model a wide variety of mobility scenarios.
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Tribometers/Abrasion Testers
AEP Technology offers several ASTM, ISO DIN compliant friction and wear tester models optimized for various applications. The modular design allows it to run on one platform (rotary, linear reciprocating, linear, block-to-ring, etc.), and to ensure high repeatability, during the testing process our downward force friction and wear testing machine controls several standard tests. High-end electronics, multi-core 64-bit processor that allows it to use multiple in-situ sensing technologies (recording friction, wear, displacement, force, volume, temperature, humidity, position, speed, etc., during testing) with high resolution Embedded powerful platform imaging head (sections of atomic force microscopes, etc.). Ease of use and robust unique design make AEP Technology a powerful tool in friction and wear testing machine development and production environments.
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Software Capabilities
In test system development, the best hardware is only usable if its software control environment is robust and easy to use. If you are a test system developer, you need to look at both the hardware and software aspects of your vendors of choice.
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JTAG Boundary Scan
Our partnership with JTAG Technologies enables us to provide you with a comprehensive JTAG Boundary Scan Test Development Service.
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Air Tightness Detector
FQ
Fuzhou Fuguang Electronics Co., Ltd.
FQ series air tightness tester is the latest high-precision non-destructive testing equipment developed by Fuguang Electronics. The equipment mainly uses compressed air as the medium to apply a certain pressure to the inner cavity or surface of the product to be tested, and then uses a high-sensitivity sensor to detect changes in pressure to determine the tightness of the product to be tested.
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Rapid Test Development
TestEZ® Development Suite
Count on the Test EZ® Development Suite for complete, efficient, cost-effective test development and execution for electronic test systems.
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SoC Tester
UltraFLEXplus
The UltraFLEXplus combines new instrument and software capability with a revolutionary tester infrastructure that provides a step-function improvement in throughput and engineering efficiency – all while leveraging the cumulative test IP developed over the UltraFLEX’s 15 year history .
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Functional / Non-functional Software Testing Services
Expert team with holistic experience and knowledge of software testing, development, and core business processes. We boast a comprehensive suite of software testing services that cover Functional and Non-functional testing,
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Software for the Development and Implementation of Test Programs using IEEE 1641
newWaveX Suite
We Have a unique suite of tools to support the development and implementation of test programs created using IEEE 1641 to define the signals and tests. These include the entry-level version of newWaveX (newWaveX–Lite), the development versions of newWaveX (newWaveX–SD and newWaveX–PD) and the complete integrated development environment for IEEE 1641, SigBase. These tools provide everything necessary to work with IEEE 1641, from creating simple signals through to implementing and managing a complete 1641 test environment. All of our 1641 tools are commercial off-the-shelf (COTS) items that may be used stand-alone or integrated into a complete test development environment. newWaveX products may be integrated with third party test executives and associated software.newWaveX is an intuitive user-friendly suite of products that does not require specialist training for users to acquire the skills to develop 1641 programs. Completing the IEEE 1641 User/Developer training course (which uses newWaveX Signal Development for the hands-on element), together with the associated 1 day newWaveX–SD User/Developer training course, provides complete information for the newWaveX user. Further support is provided for users of newWaveX packages under the maintenance agreements for those products.
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VFTLP+ Test System
4012
The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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Semiconductor Test
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Data Logging and Analysis With Tecap
Tecap provides such a tool for simple online overview. This tool is useful to analyse the stability of the developed test program. It is easily to recognize if the program shows the expected repetitive accuracy.
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Complete Network Monitoring
TiSCADA
After years of advanced Research, laboratory and on-field tests, Techimp has developed powerful and effective tools which can help asset managers to take critical decisions and manage power plants in a cost saving ways. Ti-SCADA implements a Real Time condition control of your asset, through a powerful Human Machine Interface (HMI) fully configurable, web based, displaying graphs, charts, trends, KPI, historical data, alarms and customizable reports. Ti-SCADA is a fundamental component of the new generation of Techimp on line condition monitoring systems. Ti-SCADA is designed as a Service Oriented Architecture (SOA) based on interoperability standard for industrial automation - OPC-UA - allowing high performance asset management solutions, tailored on customer needs, to be implemented.
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EMULATION TESTING
STORAGE
SANBlaze Technology, Inc. is a pioneer in storage emulation testing technologies and a leading provider of storage, networking and multifunction solutions for embedded systems. SANBlaze emulation systems are deployed in the test and development labs of most major storage hardware and software vendors worldwide.
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Electric Motor Testing
EPT Series
The EPT Series of testing systems are developed as open, modular solutions that provide complete product testing platforms.
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Protocol Testing Software
IOL INTACT®
To meet the needs of its higher layer protocol based conformance testing, we have developed a custom software test tool and API, named IOL INTACT® (Improving Networks Through Automated Conformance Testing). A modular and cross-platform API with built in packet generating, scheduling, triggering, and filtering capabilities offering fully automated protocol analysis and testing, the IOL INTACT software is used in a number of our Testing Services including IPv6, Routing, and Home Networking.
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DFT Consulting
SiliconAid Solutions provides expert consulting services for all aspects of semiconductor Design-for-Test (DFT) development and implementation. Staffed by experts with proven track records from major semiconductor manufacturers, SiliconAid focused expertise provides you resources when and where you need them the most.
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Specialized Machines And Custom Test Stands
PSE AG has been developing test stands for many years for a wide variety of clients and uses. If you don’t see exactly the specialized test stand you need for your innovative research, we will design and develop it for you. The following are some examples of test stand solutions that we have developed in cooperation with research institutes and industry clients:
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Embedded Engineering Solutions
Our engineering solutions support the development of safety-critical embedded systems. We support systems, hardware and software engineering, software V&V including multicore timing analysis, the development of efficient automated test environments, and develop custom tools to meet verification needs.
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Tool for the Automated Analysis of Measured Data
TRACE-CHECK
Day-to-day testing of newly developed features produces large amounts of data that are never analyzed or used. Sporadic errors often remain undetected and problems relating to complex real-time behaviour are generally hard to identify. To resolve such issues, TraceTronic has designed the tool TRACE-CHECK. This software has been successfully applied in test automation environments,
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Source And Measure WiFi And Bluetooth Signals
IQview
The LitePoint IQview® simplifies WiFi and Bluetooth® device development with powerful tools to both source and measure WiFi and Bluetooth signals and analysis capabilities providing insight into device behavior. The IQview offers seamless compatibility with the IQflex® manufacturing solution enabling test software developed on the IQview to run on the IQflex platform widely deployed in manufacturing environments.
