Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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Radio Frequency, Communications, & Navigation Test Systems
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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System Integration
Eastern OptX now offers System Integration for all of our equipment along with other instruments including: RF, microwave, and Optical test equipment, power conditioning, distribution, and back-up, system controllers, and data recording devices. We also offer test solution development including mechanical design, rack layout, and custom control software. Eastern-OptX will help you to design and develop your test solution and deliver a completely assembled and tested system.
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Electric Servo Motor Type 3-axis Vibration Tester
The Electric Servomotor Vibration Test System Is A New Vibration Test System Developed Based On The Control Technology Of AC Servomotors That We Have Cultivated Since Its Establishment.
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Function / Arbitrary Waveform Generators
Teledyne Test Tools generate fixed or arbitrarily defined waveforms and signals for use in the development, testing and repair of electronic systems.
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Caibration Equipment For Lab Use
In the field of high-power semiconductor testing, PONOVO has launched a smart test platform with high-speed high-frequency, high-voltage, high-current power sources, combined with high-speed, high-precision high-voltage, high-current analog acquisition technology and high-speed digital processing control system. The platform can complete the testing of dynamic parameter parameters, static parameters, thermal parameters and mechanical parameters, and power life parameter of various types of high-power semiconductor devices, modules, and chips, which could meet different testing requirements. It is the universal testing platform for automated testing for different application purpose, such as the research and development testing, engineering acceptance test, factory acceptance test, etc.
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Product Test & Measurement Development Software tools
Tequra Requirements
Tequra is a suite of software tools for product test and measurement which enables organisations to develop high-quality solutions faster, simplify support and maintenance, and facilitate continuous improvement.
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RFID Test Instrument
RAIN Xplorer
The CISC RAIN Xplorer is a unique RFID test product developed for convenient tag frequency sensitivity, communication range, and backscatter measurements. The RFID tester is designed for open area tests and measurements in an RF-controlled environment using portable or fixed RF test chambers. The system is supplied with software and a reference tag for self-calibration.
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Power Analyzer
E-Mobility - eDrive, and Electric Vehicle TestingAdvanced and easy to use solutions for complete electric and hybrid vehicle testing in the development, validation and production phase. One-stop solutions for electric motor and inverter testing, battery and battery charge testing, combustion analysis, hydrogen engine testing and more.
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Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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TTCN-3 Compilation & Execution Environment
Titan
Titan is a TTCN-3 compilation and execution environment with an Eclipse-based IDE. The user of the tool can develop test cases, test execution logic and build the executable test suite for several platforms. TTCN-3 is a modular language specifically designed for testing (the acronym itself stands for Test and Test Conformance Notation), standardized by ETSI (see www.ttcn-3.org) and endorsed by ITU.
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Battery and Capacitor Testers
Battery test system developed on the basis of the experience and know-how that we have amassed through implementing numerous custom-built battery evaluation systems.
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Comprehensive Suite of Software Tools for Semiconductor Test Applications
ICEasy Test Suite
Marvin Test Solutions' ICEasy Test Suite is supplied with both the TS-900 and TS-960 semiconductor test platforms and provides a comprehensive set of software tools - facilitating the development and debugging of test programs for semiconductor devices. In addition the suite includes I-V curve and Shmoo plot tools for analyzing a device's DC and AC characteristics. The complete suite of tools interfaces seemlessly with Marvin Test Solutions' ATEasy®, a test executive and test development evironment which is supplied with each TS-900 / TS-960 system.
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Test Workflow Standard
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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EOL/Functional Testing
Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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TMS Test Management Software
LX TMS
To diagnose and analyze electronic components and devices, various tests are required in development, production and service. Equipped with all the necessary standard functions, the test sequencer developed by LXinstuments meets all criteria for a successful and smooth test process. The test item ( DUT ) is examined under various operating conditions for its properties, function and usability. Typical areas of application can be found where the usual complexity of test sequences has to be processed. The test sequencer is therefore suitable for small and medium-sized systems where special functions of other sequencers are not required. The free, cross-platform, open source developer platform .NET serves as a starting point. The integrated WPF (Windows Presentation Foundation) framework ensures a user-friendly program interface.
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Basic Rate and Primary Rate ISDN Network Simulator
Emutel Duo
Emutel Duo is a convenient and flexbile basic rate and primary rate ISDN network simulator. With 3 software selectable S/U interfaces and optional 2 E1/T1 interfaces you can test and develop a full range of ISDN equipment.
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Test System
NFC Xplorer
The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
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Data & Protocol Converter
uMACC
The uMACC is a wholly contained Communications Converter (data converter - protocol converter or translator). Its small size makes it a complete solution for developing & testing both in the lab and in the field.The uMACC can carry up to 4 modules. Each module can be one of the following protocols: 1 dual redundant MIL-STD-1553/1760 interface1 H009 channel5 MMSI channels5 ARINC-429 channels2 ARINC-708 channels2 ARINC-717 channels5 ARINC-825 (canbus) channels2 Serial channels (RS-232/422/485, NMEA 0183)Ethernet (10/100/Gigabit)10 Discrete I/O signalsAnalog to Digital / Digital to Analog
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AINC 429 Multichannel Interface with Additional ARINC-717 Receive & Transmit Channels
DAS-429UNET/RT8-717
The DAS-429UNET/RT8-717 is an ARINC 429, multichannel interface card with additional ARINC-717 receive and transmit channels. Its small size and ability to interface through USB or Ethernet interfaces make it a complete solution for developing, testing and performing system simulation of the ARINC 429 & ARINC-717 bus, both in the lab and in the field.Multiple units can operate via USB ports on the same computer. In addition, multiple units can operate on the same network, by programming each one with a unique IP address, and can be accessed from any computer on the network.The EXC-429UNET/RT8-717 adapter is supplied with C drivers, including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application (only versions 8.1 or higher).
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Tribometers/Abrasion Testers
AEP Technology offers several ASTM, ISO DIN compliant friction and wear tester models optimized for various applications. The modular design allows it to run on one platform (rotary, linear reciprocating, linear, block-to-ring, etc.), and to ensure high repeatability, during the testing process our downward force friction and wear testing machine controls several standard tests. High-end electronics, multi-core 64-bit processor that allows it to use multiple in-situ sensing technologies (recording friction, wear, displacement, force, volume, temperature, humidity, position, speed, etc., during testing) with high resolution Embedded powerful platform imaging head (sections of atomic force microscopes, etc.). Ease of use and robust unique design make AEP Technology a powerful tool in friction and wear testing machine development and production environments.
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Test Software
Yelo Test Environment V5.0
The Yelo Test Environment (YTE) is an automated test environment developed by Yelo. Test sequences can be developed for multiple products and are tailored to customer needs and specifications. Flexibility in testing is a key benefit of the YTE and is provided to the user by allowing management of test sequence order. There is also the ability for the user to change the test limits or parameters for more or less stringent testing depending on requirements.
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Multichannel Memory-Mapped ARINC 708/453 Interface Card
EXC-708mPCIe
The EXC-708mPCIe is a multichannel, memory-mapped ARINC 708/453 interface card that supports two ARINC 708/453 channels, each programmable as transmit or receive. Each channel implements a 64K x 16 FIFO and supports polling and/or interrupt driven operation. The card complies with the PCI ExpressTM Mini Card standard. It’s small size and suitability for Mini Card compatible computers make it a complete solution for developing, testing, integrating 708 interfaces and for performing system simulation of the ARINC 708/453 Weather Radar Display databuses, both in the lab and in the field. In Transmit mode, each ARINC 708 word is written to the FIFO as a block of 100 16-bit words. In Receive mode, each ARINC 708 word is stored in the FIFO as a block of 103 16-bit words. The first two words comprise the 32-bit Time Tag, indicating the word’s time stamp. The next 100 words comprise the 1600 bits of the ARINC 708 word, which are followed by the Status Word.The EXC-708mPCIe card comes complete with C drivers including source code.
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STAR-Ultra PCIe
163
The STAR-Ultra PCIe is a SpaceFibre Multi-Lane interface and link analyser, designed to aid test and development of SpaceFibre equipment. It can transmit and receive SpaceFibre traffic from a host PC at data rates in excess of 10 Gbit/s, and it can record and display SpaceFibre traffic transmitted and received on one SpaceFibre port.
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Boundary-Scan DIMM Socket Tester
ScanDIMM
Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
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Visual Fault Diagnostics and Repair System
ScanExpress Viewer
ScanExpress Viewer™ is a printed circuit board (PCB) CAD data & photograph visualization tool for boundary-scan test development, electronic manufacturing test, and product repair environments.When combined with ScanExpress ADO™ (Advanced Diagnostics Option) for detailed results from ScanExpress Runner™, ScanExpress Viewer displays fault coordinates and connected traces superimposed directly on a board photograph or CAD layout diagram for expedient repair.
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5-Axis Hardware-In-the-loop Systems
Combining a 3-Axis Flight Motion Simulator (FMS) with a 2-Axis Target Motion Simulator (TMS) leads to a 5-Axis motion simulator design. This allows comprehensive HardWare-In-the-Loop tests (HWIL) for testing and development of guided missiles, munitions and other inertial systems. Almost 100% of all HWIL systems worldwide delivered over the last 50 years have been designed and built by ACUTRONIC and CARCO Electronics.
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EMULATION TESTING
STORAGE
SANBlaze Technology, Inc. is a pioneer in storage emulation testing technologies and a leading provider of storage, networking and multifunction solutions for embedded systems. SANBlaze emulation systems are deployed in the test and development labs of most major storage hardware and software vendors worldwide.
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Microelectronic Services
Services for ASIC houses and Integrated Device Manufacturers are IC Wafer / Final Test, IC assembly, Test Program development, product engineering, Flash / EEPROM programming, characterisation / capability studies, yield enhancement, design verification and failure / yield analysis. Das Test Haus are specialists for wafer test, low power, mixed signal and eeprom test.
