Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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JTAG based Test & Flash Programming Services
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We offer EMS companies and design houses services and solutions in manufacturing testing with bias towards JTAG (IEEE 1149.x Boundary Scan) and functional test: System-level DFT rule checking for production testing and inspection. Test strategy development and optimization for test cost reduction. JTAG, functional, and emulation-based test development and deployment. Product testing and troubleshooting services. Ultra fast in-system programming solutions (Flash, EEPROM).
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Rapid Test Development
TestEZ® Development Suite
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Count on the Test EZ® Development Suite for complete, efficient, cost-effective test development and execution for electronic test systems.
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Manufacturing Test Only System
MTO
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The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
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Product Support Equipment
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The TTU/515E or O/I Level Test Set was developed to provide a full end-to-end test of the NACES and FAST electronic sequencers used on the NACES ejection seat. The O/ITS provides simulated inputs and measures the timing of initiator firing sequencer outputs. The O/ITS, via a serial channel in the test connector, performs discrete element diagnostics on all the sequencer's redundant electronics and verifies its full functionality.
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LTE RF Communication Subsystem
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The Delaire USA LTE RF Communication Subsystem is designed to provide a versatile solution for the testing needs of the next generation wireless systems. With the LTE test subsystem developers can build an end-to-end test environment for complete system operation. From end user equipment and eNodeB base stations to full system functionality, the LTE RF Communication subsystem allows developers to test and evaluate equipment and system performance in a controlled laboratory environment.
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AC and DC Power Sources
CFS100 Series
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The CFS100 Series programmable AC or DC output power sources are cost effective source of power for development, test and production applications requiring anywhere from 800VA or less to 4000VA of single phase AC or DC output.
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Radio Conformance Analyzer
RCA G9200
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LTE test solution for development, verification and conformance testing of LTE mobile equipment. The G9200 RCA is able to perform analysis of LTE mobile devices at all layers from the physical to the application layer, and is suitable for development, conformance, pre-conformance, and production test applications.
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Basic Rate and Primary Rate ISDN Network Simulator
Emutel Duo
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Emutel Duo is a convenient and flexbile basic rate and primary rate ISDN network simulator. With 3 software selectable S/U interfaces and optional 2 E1/T1 interfaces you can test and develop a full range of ISDN equipment.
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FlexVNX+ 8-Slot Test And Development Platform Aligned To SOSA And VITA 90 Standards
39S08VPXZZY2VAND
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Elma’s all-new FlexVNX+ Test and Development chassis is the next generation portable test platform designed to accelerate development and test of VNX+ plug-in cards (PICs) aligned to The Open Group® SOSA™ Technical Standard and VITA 90.
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In-Circuit Programmer/Loader
SKU-018-01
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The In-Circuit Programmer/Loader (“EasyLoader” or “eLoader”) is a standalone device that was designed to provide a flexible and cost-effective solution for electronic device manufacturers, as well as for hardware design companies and their customers. It allows you to upgrade code on any JTAG/SPI/I2C compliant device (like FPGA/CPLD/EEprom/Flash, etc.) or Microcontrollers at any time of development, testing or production.
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1050MHz Spectrum Analyzer
SM-5010
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Is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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Application Lifecycle Management
ALM
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Manage and track the various stages of an application's life, including requirements gathering, design, development, testing, deployment, maintenance, and retirement.
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500Mz Spectrum Analyzer
SM-5005
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Is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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Visual Fault Diagnostics and Repair System
ScanExpress Viewer
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ScanExpress Viewer™ is a printed circuit board (PCB) CAD data & photograph visualization tool for boundary-scan test development, electronic manufacturing test, and product repair environments.When combined with ScanExpress ADO™ (Advanced Diagnostics Option) for detailed results from ScanExpress Runner™, ScanExpress Viewer displays fault coordinates and connected traces superimposed directly on a board photograph or CAD layout diagram for expedient repair.
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CompacFrame Type 39PS, Short VPX Payload Test And Development Platform
Type-39PS
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Elma’s Short VPX CompacFrame platform is designed to accelerate development and test of boards designed to fit a smaller form factor of 3U boards (3U x 100mm deep). Accommodates up to 4-slot OpenVPX or 2 VPX power & ground only backplanes.
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In-Circuit Test Applications
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With decades of experience developing test fixtures, we are the recognized industry leaders for solid and reliable quality as well as our outstanding customer service. We fully support our products locally and worldwide for maintenance, repair, and ECO work. Also, 100% wiring verification is part of our Quality Control process, by utilizing automated verification machines for GenRad/Teradyne and HP/Agilent fixture.
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Near Zero Footprint SMT Spring Pin Sockets
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Ironwood Electronics socket is a device size or near device size footprint test socket incorporating industry standard high performance spring pins. Ironwood can design a socket to work with any type IC packages- BGA, LGA, QFN, DFN and even leaded devices where you need to fit a socket in place of your device to allow fast, easy testing and development.
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Solid-State Battery Mold Kit
BMK1
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BMK1 Solid-State Battery Mold Kit is designed for solid-state battery, liquid battery or in-situ electrochemical research where stable assembly pressure, reliable sealing and repeatable cell geometry are important. It supports laboratory-scale testing, method development and custom battery fixture projects. Key features include controlled assembly, sealing, or compression depending on the model, suitable for custom electrode, electrolyte and separator configurations, and useful for universities, battery research groups and materials development labs. Applications include solid-state battery and electrolyte evaluation, in-situ testing, and electrode material screening.
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In-Circuit Test Programming Services
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Acculogic offers in-circuit / ATE test programming services for the most widely used Automated Test Equipment / platforms, in our state of the art test development laboratories. Staffed by a highly skilled team of engineers with an impressive track record in providing test solutions to customers in a variety of industries.
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Digital I/O Vector Development Software
DIOEasy
Digital I/O
DIOEasy offers test engineers an efficient tool for developing, debugging, and executing digital test vectors for Marvin Test Solutions' GX5050 series, GX5150 series, GX5280 series and GX5291, GX5292, GX5293 and GX5295 dynamic digital instruments.Digital I/O (DIO) systems are very complex and typically require a substantial amount of programming effort to define data vectors. In order to simplify vector development, Marvin Test Solutions developed Windows-based DIOEasy, providing users with an easy to use interface. Toolbars and menus provide quick access to vector editing and viewing tools.
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Product Test & Measurement Development Software tools
Tequra Requirements
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Tequra is a suite of software tools for product test and measurement which enables organisations to develop high-quality solutions faster, simplify support and maintenance, and facilitate continuous improvement.
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High Current Calibrator
MC151
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MC151 Current calibrator is an accurate current source capable of 120 A. Typical uses include calibration of current sensors, current probes, current transformers, shunts, ammeters, DMMs or as stable current source for test and development applications. The calibrator is equipped with a built-in multimeter that can be used for simulation of programmable transconductance or current amplifier.
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PLD ISP Feature, GTE 10.00p
K8220B
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The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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Integrating Sphere with Side Assistant Opening
IS-*MA**P/IS-*MA**C
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According to IES LM-79 Clause 9.1.2, it request the 4π geometry configuration and 2π geometry Integrating Sphere for the LED Testing. Lisun Group developed the integrating sphere with side assistant Opening in A Molding Technology to meet the requirements.• Painting material of integrating spheres is according to CIE Pub.No.84 (1989) • The painting material is BaSO4 coating: ρ (λ) ≥0.96 (450nm~800nm) and ρ (λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectance ρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in all functional lamp testing jigs: the vertical is for E40/E27, the horizontal is for T5/T8/T12 tubes and the Testing Holder Base for LED street luminiares. All of the testing jigs can allow the lamp be tested up and down in the sphere. • Power Cable, Power Terminal and Auxiliary lamp position has been built-in (Auxiliary lamp is option). • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • Ordering Code: IS-1.5MA55P or IS-1.5MA55C (Φ1.5m, IS-1.5MA55P means square side opening is 0.5×0.5m, IS-1.5MA55C means cycle side opening diameter is 0.5m). IS-1.75MA66P or IS-1.75M66C (Φ1.75m and side opening is 0.6m). IS-2.0MA77P or IS-2.0MA77C (Φ2.0m and side opening is 0.7m). • Other size such as diameter 2.5m, 3.0m can be special order according to customer’s request
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Tabletop Single Site Test Handler
3111
Test Handler
The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
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Solid-State & Pouch Cell Test Cell
SSP1
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SSP1 Solid-State & Pouch Cell Test Cell is designed for solid-state battery, liquid battery or in-situ electrochemical research where stable assembly pressure, reliable sealing and repeatable cell geometry are important. It supports laboratory-scale testing, method development and custom battery fixture projects. Choose the test cell or mold according to electrolyte type, target pressure, electrode size and required characterization method. For spectroscopy or imaging experiments, confirm window material, beam path and sealing requirements before ordering.
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Open Top BGA Sockets
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Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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Air Tightness Detector
FQ
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Fuzhou Fuguang Electronics Co., Ltd.
FQ series air tightness tester is the latest high-precision non-destructive testing equipment developed by Fuguang Electronics. The equipment mainly uses compressed air as the medium to apply a certain pressure to the inner cavity or surface of the product to be tested, and then uses a high-sensitivity sensor to detect changes in pressure to determine the tightness of the product to be tested.
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Eclipse Test Development Environment
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The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
