Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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Product
Battery Management (BMS) Environmental Test System
Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131G
Test Port Cable
The Keysight 85131G is a 53 cm (21 in) long1 semi-rigid cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss of 16 dB or better. Insertion loss is 0.3 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 4 inch radius. Stability1 of the Keysight 85131G is 0.06 dB and phase is 0.16o * f + 0.5o (where f is frequency in GHz).
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Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
In-Line RF Test Platform
AR925
Test Platform
This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
Test Fixture
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
Lens Module Test Platform
Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Product
Complete Network Monitoring
TiSCADA
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After years of advanced Research, laboratory and on-field tests, Techimp has developed powerful and effective tools which can help asset managers to take critical decisions and manage power plants in a cost saving ways. Ti-SCADA implements a Real Time condition control of your asset, through a powerful Human Machine Interface (HMI) fully configurable, web based, displaying graphs, charts, trends, KPI, historical data, alarms and customizable reports. Ti-SCADA is a fundamental component of the new generation of Techimp on line condition monitoring systems. Ti-SCADA is designed as a Service Oriented Architecture (SOA) based on interoperability standard for industrial automation - OPC-UA - allowing high performance asset management solutions, tailored on customer needs, to be implemented.
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Product
Development Board
SOM-DB3520
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Development Board for Qseven R2.1 Modules, Supports Qseven CPU Module. Supports Dual channel LVDS (eDP optional), DP (HDMI/DVI optional) Supports 1 PCIe x4 slot, optional mini PCIe, Supports 2 SATA (mSATA optional), 2 COMs, 1 RJ-45, 8 USB 2.0, 1 USB 3.0.
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Product
Automotive Electronics Functional Test System
TS-5020
Functional Test
The Keysight TS-5020 Automotive Functional Test System is a low cost, scalable test system designed with “just-enough-test” concept for medium complexity electronic control modules, such TPMS, RKE and body electronic modules
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Product
Development System
FE-5131
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Emulates AT89C5131/AT89C5131A Derivatives with 6/12 Clocks/Cycle31K Code MemorySoftware TraceReal-Time EmulationFrequency up to 40MHzMS-Windows Debugger for C and AssemblerKeil Vision2 Debugger CompatiblePLCC, SOIC, QFP and 32-QFN Emulation HeadersSerially Linked to PC at 115Kbaud
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Product
EBIRST 200-pin LFH Coaxial Adapter - 56 SMBs
93-002-202
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
NFC Conformance Test System
T3111S
Test System
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
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Product
Test Systems & Sub-systems Development and Integration
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Research, development and the production of electronic test equipment, systems and subsystems for the industrial, scientific, and defense markets.
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Product
Flexible Cable, 2.4 Mm To 3.5 Mm
85134H
Test Port Cable
The Keysight 85134H is a 62.9 cm (24.75 in) long1 flexible cable with a 2.4 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.31 * sqrt (f) + 0.2 (where f is frequency is GHz) for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 2.5 inch radius. Stability1 of the Keysight 85134H is less than 0.12 dB and phase is less than 0.13o * f + 0.5o, (where f is frequency in GHz).
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Product
Development Board
SOM-DB5830
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Development Board for COM Express® R2.1/3.0/3.1 Type 6 / 10 Modules. Expansion: PCIe x16, PCIe x4, Display Type: VGA, LVDS / eDP, HDMI / DP. ATX form factor with both ATX & AT power support.
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Product
Portable Chassis for Development, Test or Demo
D-Frame
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Elma’s D-Frame engineering development platform combines a rich feature set with portability and easy access for embedded system design efforts. Lightweight with a convenient carrying handle and rubber feet, briefcase shape.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
Development Board
SOM-DB2510
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Development Board for SMARC V2.0/V2.1.1 Pin-Out Modules. Support SMARC V2.0/2.1.1 Module, Display Type: LVDS / eDP, HDMI / DP. Support eSPI, CAN-FD, USB3.2 & up to 14 GPIO, Support 4 Types Power Input. Integrate x86 and ARM Power Input Type.
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Development System
FE-900
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# Emulates Philips P89LPC932 Microcontrollers# Real-Time and Transparent Emulation up to 12MHz# 8K Emulation Memory# Real-Time Trace# Uses Philips Bond-Out Technology# Ceibo Windows Debugger and Keil uVision2# High-Level Support for all C/C++ Compilers and Assemblers# On-Line Assembler and Disassembler# Target Board, ISP Programmer and Power Supply Included# PLCC-28 Emulator Plug Included (TSSOP-28 Optional)
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Product
Development Switch
TTESwitch Lab Space
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The TTESwitch Lab Space supports laboratory testing efforts of Time-Triggered Ethernet applications; user development costs can be reduced by using the internal TTESwitch Controller HiRel ASIC that is also used in flight equipment. With advanced features like speeds of up to 1 Gbit/s, flexible physical layer configuration and three supported traffic classes, it is the optimal switching solution for a large variety of application areas. TTEthernet is a fault-tolerant, real-time communication protocol for safety-relevant systems integrating Ethernet and TTEthernet data flows onto one physical infrastructure.
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Product
RF Testing Platform for ATx05
AT118
Test Platform
The functional test of modern devices with wireless connectivity always requires RF isolated cameras, as the only way to have the parameters controlled and to guarantee operation under the specified conditions.
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Product
ATE Development
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Aero Engineering Support Group
ATE Development Aero Engineering Support specializes in designs and manufacturing of a wide variety of Automatic Test Equipment (ATE) of support for military avionics, commercial avionics, industrial sector, etc. AESG is committed to providing industry leading equipment that are designed to be scalable and expandable ATE capable of providing reliable functional test solutions for any electronic assembly or Circuit Card Assembly. New from Aero Engineering Support is the A2500 system, providing:
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Product
Fully-Automated CTIA-Compliant OTA Test System
TS8991
Test System
The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Product
Scienlab Battery Test System - Cell Level
SL1007A
Test System
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Product
Development Board
SOM-DH5000
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Development Board for COM-HPC® Server pin-out & Size D/E Modules. PICMG COM-HPC Server pinout, COM-HPC Size D and E compatible. Rich extension: 1 PCIe x16, 2 PCIe x8, 5 PCIe x4.
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Product
PathWave Test Executive For Manufacturing Developer Version
KS8328A
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PathWave Test Executive for Manufacturing (PTEM) is a plug-in that enhances the user experience in developing automated test programs using PathWave Test Automation Platform (TAP). With powerful PathWave Test Executive software, we eliminate the need to maintain or develop a test platform by users, especially in a manufacturing environment where a high mix of products exist, the maintenance, enhancement, and control of it could become challenging. Development of a test execution platform should not be a priority for valuable resources, instead optimizing and improving test coverage should be the key area of focus.
