In-circuit Test Systems
See Also: In-circuit, Incircuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-Circuit Test, In-circuit Testers
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AC Hysteresis Graph Test System
DX-2012SA
Under continuous frequency of 1 kHz to 500 kHz, automatic measurement of magnetic hysteresis loop of the soft magnetic materials such as silicon steel, precision alloy, non-crystal and ferrite, accurate measurement on the dynamic magnetic characteristic parameters such as amplitude permeability µa, loss angle d, loss iron Pc, remanence Br and coercivity Hc.
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Test System
ETS788XL
The 50/100 MHz ETS788XL system is the compact protable version of our ETS788. Made with the new high-performance precision components of our Griffin series, this portable powerhouse offers an optional tough road case and ready to go to any test site needed. Just pop off the covers and get started. Whether it's research, Failure Analysis, or single-event effects testing, his powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date.
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VME Test System
VMETS
Measurements of system performance include Bus Utilization, Transfer Rates and Statistics. As data is acquired the Min, Max and Average values are updated and displayed in graphical form.
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High Voltage Switching Test System
The advanced development of new technologies, such as SiC and GaN, have opened the opportunity for more efficient and higher voltage/power performance in switching and power management circuits. Their high cutoff frequencies, low on-state resistance, and very high breakdown voltages can increase power supply power handling densities approaching hundreds of watts/inch. Reliability of these new technologies and techniques is critical for realizing practical applications. While Silicon devices have a rich history of proven reliability, these newer compound semiconductor technologies are too new to have a reliability history and have not been well proven. Further, process variations, even in well-controlled lines, yield widely varying results. This has driven the need for additional testing and to burn-in devices prior to delivery.
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In-Circuit Testing and Test Engineering
Teradyne Z1820
2048 Pure Pin Test Nodes3 & 6-wire Analog MeasurementsVector Test for VLSI, PLCC’s & ASICSMultiscan II Vectorless TestingIEEE Functional Interface BoardLarge Custom Vector Library
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Test System
DA-2 ATS
The DA-2 ATS is an economical Commercial-Off-The Shelf (COTS) build-to-print tester. The test station is compliant with the published drawing package. The system does not include software.
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Function Test and In-Circuit Test
CT350
ICT test points: max 2736 CAD Data import Automatic program generator Powerful debugging tools Test coverage analysis Paperless repair station Logging- and statistic functions Full graphical functions Panel and multisite tests Fast adapter exchange High Pin Count-Interface On table optional usable shelf part.
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Telecom Test Systems
4301 Series
The 4301 is designed to work with a standard arbitrary wave form generator or signal source that can be triggered. The system can be ordered with an optional Fluke 281 arbitrary waveform generator, which comes pre-programmed and integrated into the 4301 system. When equipped with the Fluke 281 option, the 4301 provides a complete solution for GR-1089 Section 10/ATIS-0600315.2007 testing.
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FADEC/EEC Test Platform
The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Radio Frequency, Communications, & Navigation Test Systems
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Zero-distance Drop Test System
KRD40 series
KRD40 series drop tester, mainly simulates the resistance to drop and impact of large and heavy packaging products. Its strong power system and unique sample holder facilitate easy loading and unloading of oversized and overweight items and automatically rise to the setting. After the height, the drop test is completed. It can realize the drop test of the edge, surface and angle of the sample. This equipment is mainly used to evaluate the ability of product or packaging to withstand drops during transportation and loading and unloading, so as to improve product and packaging design.
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Tire and Wheel Testing Systems
Advanced Telemetrics International
Tire and Wheel Testing Systems can be custom designed and manufactured for practically any application. The inductively powered system is used to wirelessly measure tire pressure and temperature during testing.
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Mechanical Shock Test System
BW-MST-E5000
The Mechanical Shock Tower develops the kinetic energy electromagnetically. An iron core "bullet" is attracted to the magnetic core of the solenoid by the dense magnetic field that is created as current flows through the field coil of the shock tower. As the bullet is drawn into the center of the magnetic field the acceleration increases exponentially as the gap reduces to zero on impact causing the high impact shock
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General Purpose Functional Test Systems
Keysight Technologies’ TS-5000 Family of Electronics Functional Test Systems offers a wealth of choices in general purpose instruments, power supplies, switch loading and DIO capabilities in a multiple rack heights, seamlessly connected with open architecture software Test Exec SL, all immaculately assembled and thoroughly tested so you don’t have to.
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Low Voltage Test System
CKT T1
The CKT T1 is a compact size solid-state test system featuring 128 test points.
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Battery Formation and Testing System
BFS 2000
BENNING Elektrotechnik und Elektronik GmbH
For many decades now, BENNING has designed and manufactured charge/discharge converters for the battery industry. These converters are used in both the production and testing processes involved in battery manufacturing and for series-testing of batteries. BENNING's BFS battery production and testing system provides a solution which makes it easier to control and monitor production and test processes which saves both time and energy. When used in power stations and rail applications (mobile version), it can be used to test and maintain a wide range of battery types.
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Battery PACK (500v-1000v)Test System
Shenzhen Sinexcel RE Equipment CO., Ltd
PACK test equipment adopts sinexcel, firstly adopts three-level AC scheme, and the detection process supports multi-gear switching. The device integrates voltage, temperature, pressure and other auxiliary channels, and CAN also integrate various communication protocols such as temperature box, water cooler, mainstream CAN CANFD 485, etc. It supports a variety of practical and innovative functions such as data one-click automatic export, which meets all aspects of PACK battery electrical performance testing.
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Test System for Circuit Breakers
Spitzenberger & Spies GmbH & Co. KG
Thermal testing with long-time currents up to 550 A. Magnetic testing with short-time currents up to 2000 A. Control software. Customer specifically adapted. 4 candidate records with pneumatic adapting.
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Speed Switch Sensor & System Testing Device
The SpeedMaster with Pulse Pilot provides independent, real time, and complete verification of an entire speed monitoring system to ensure that alarms and shutdowns are working as expected.
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Stand-alone I-V Test Systems
OAI offers a complete line of high performance I -V Testers. I -V Testers and I -V Rider software may be ordered as a stand -alone system or integrated into any OAI Solar Simulator. Three standard ranges of I -V Testers are available; ≤1A, 1 -5A, 5 -10A, and 20A. Higher current testers are available as custom options. An OAI Application Engineer will work with you to insure that the I -V Tester and I -V Rider software you choose is optimized for your specific application.
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ECM Noise Under RF Test System
BK8020
The BaKo Type BK8020 ECM Noise Under RF Test System tests microphones under RF noise, using a ‘Direct Injection Test’ in the frequency range of 5MHz~2.5GHz with an amplitude modulated (AM) disturbance signal of 1kHz. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When you finish testing, you can print data as an MS Excel report or save it for comparison and analysis.
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Flammability Test System
COMP0804CAP
Active flammability test system according to IEC 60384-14 Ed4. For testing X & Ycapacitors up to 1uF. The test system includes control of the nominal AC supply via an integrated variac up to 1800V. Impulse amplitudes are programmable up to 8kV which covers all requirements. X1 capacitors are stressed up to 4kV, X2 and Y4 capacitors up to 2.5kV and Y2 capacitors up to 5kV.
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Ferroelectric Test System
RT66B
Radiant's Rt66B offers amazing performance at an affordable price. The Rt66B is a perfect entry level system for measuring Ferroelectrics. This system does include Radiant's famous Vision Data Management System which offers all the standard measurements of ferroelectrics including Hysteresis, Fatigue, Waveform, C/V, I/V, PUND and much more.
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Optics Testing Systems
SHSInspect
SHSInspect instruments are widely used in R&D and production when performance, reliability and efficiency counts most. Based on the state-of-the-art wavefront sensor SHSLab, Optocraft offers measurement modules, turnkey instruments and automated tools for a great variety of applications in the field of optics and optical systems, such as:*objective lens testing*testing of optical elements and windows*surface shape measurement*inline measurement and automation
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Device Thermal Test Systems
Thermal Engineering Associates, Inc.
Thermal test system combines the test and measurement capability of dedicated instruments with the ease of operation and data collecting capability offered by graphical-user-interface-driven software operating on an integrated computer.Diodes (PN, Schottky, LED, varactor, PIN), Stacked Diodes (Hi-V Rectifiers & LEDs), Laser Diodes, Transistors (Bipolar, MOSFET, IGBT) & Diodes, Integrated Circuits (Application & Thermal Test Die).
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Ventilator Test System
4070
The Certifier® FA Ventilator Test System 4070 is capable of testing multiple parameters of ventilator performance. It is designed to measure air, oxygen, and nitrous oxide flow and pressure in institutional, home care, field service, laboratory, and production applications. The Certifier FA ventilator test system is a battery-operated flow analyzer that can also test a variety of other medical equipment such as anesthesia gas delivery machines and oxygen concentrators.
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Mobile Test Systems
The systems include A+A+A+ LED solar simulators, high-resolution electroluminescence testers and various other tests that you can easily integrate into your transport of choice or directly into a container on site.
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In-Circuit Test Applications
With decades of experience developing test fixtures, we are the recognized industry leaders for solid and reliable quality as well as our outstanding customer service. We fully support our products locally and worldwide for maintenance, repair, and ECO work. Also, 100% wiring verification is part of our Quality Control process, by utilizing automated verification machines for GenRad/Teradyne and HP/Agilent fixture.
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Mixed Signal, Multi-Functional Test Module
PXIe-ScanIO-112
The PXIe-ScanIO-112 delivers a powerful combination of digital, analog, and AC-coupled testing in a single PXIe module. With 104 boundary-scan controllable digital I/O channels and 8 analog I/O channels ranging from –15V to +15V, engineers gain the flexibility to test a wide variety of board-level designs. The module supports IEEE-1149.6 AC-coupled interconnect testing, configurable single-ended and differential pin operation, and integrates seamlessly with the Corelis ScanExpress™ suite.
