In-circuit Test Systems
See Also: In-circuit, Incircuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-Circuit Test, In-circuit Testers
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Product
Cable Fault and Test System Vans
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Whether you are working on-site, in the countryside or an urban environment, having the right equipment available when conducting fault location operations is vital. When the correct tools can be accessed easily, fault-location time speeds up dramatically, and faults can be dealt with more efficiently. Megger’s range of cable test vans offer solutions to the challenges of fault location in the real world, no matter the environment. Our test van systems have been developed in collaboration with end users to ensure that they live up to the standards of daily fieldwork. Our vans are designed to be adaptable to the end users needs so that the most appropriate tests may be carried out for the cable in question, regardless of whether it is low, medium or high voltage.
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Product
Long-Stroke Tensile Testing System For Vulcanized Rubber
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Capable of Measuring Even Specimens with a Large Break Strain A tensile test method for vulcanized rubber is stipulated in JIS K6251 (Rubber,vulcanized or thermoplastic-Determination of tensile stress-strain properties). One of the properties of vulcanized rubber is significant elongation. This long-stroke tensile testing system for vulcanized rubber has a long stroke that is required for calculating these tensile characteristics of rubber, and accommodates dumbbell specimens Nos.1 through 6 stipulated in JIS K6251.
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Product
Electrical Test System TY-CHECKER
Type P Series
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Manual press systems made to suit your purpose.
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Product
Memory Test Systems
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ICs that record and retain data are called memory devices. Our memory test systems are optimized for volume production of memory semiconductors, a market where low-mix high-volume production is the norm, and feature industry-best parallelism (the ability to test a large number of semiconductors at the same time).
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Product
Test DVD For OmniMic Precision Measurement Systems
OMDVD Version 1
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The Dayton Audio OMDVD Test DVD brings the ease of the OmniMic V2 system to measurements of 5.1-channel audio systems. It’s the essential tool for professional installers and home theater enthusiasts to ensure proper audio calibration and optimization of a home theater or multichannel music system for the highest possible performance. The full functionality of the OmniMic V2 measurement system is now available through every channel of a 5.1-channel audio system thanks to the OMDVD Test DVD’s suite of high-quality test tones, and an intuitive menu structure that has been optimized for ease of use.
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Universal Testing Systems (Up To 300 KN)
3400 Series
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Instron’s 3400 Series universal testing machines offer dependable performance across a broad spectrum of mechanical testing applications, with force capacities ranging up to 300 kN. These systems are well-suited for basic tensile, compression, flexural, peel, puncture, friction, and shear testing, and can be easily configured using a wide selection of grips and fixtures from Instron’s accessory catalog. Built with user safety and efficiency in mind, each system incorporates Instron’s proprietary Operator Protect technology, ensuring a secure and intuitive testing environment.
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Product
Test Fixture (SMD Components)
16034E
Test Fixture
Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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Product
DC Parametric Test System with Curve Trace
DC3
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The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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Product
Manufacturing Test Only System
MTO
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The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
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Product
PXI System for LRU Test
ARINC 629
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PXI System for LRU Test Support. The system shown here was developed in support of Boeing 777 LRU Production Test.
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Product
Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Product
Circuit Breaker Test Systems
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Crest has over a decade of experience of designing and manufacturing test systems for testing all the different kinds of switchgear and controlgear.
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Product
Diving Technology Test Systems
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
The imaging ultrasonic testing systems of the USPC 30XX series are optimized for testing a wide variety of materials and provide high-resolution findings in the form of A, B, C, D and F images. The hardware consists of an industrial PC, in which a motor controller and an ADC card are installed, as well as a HILL-SCAN pulser/receiver unit. An overview of the available systems is given in Table 1.
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Product
Stress Testing System
Load Dynamix
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LoadDynamix (former Swifttest) is famous for its IP based converged storage system stress testing, including iSCSI, SMB/CIFS, NFS, FC and HTTP/HTTPS based storage systems. Its GUI interface is very easy to use and allow customer engineer to fully configure all the parameters at the protcol layer. Nearlly all the major IP storage system manufacturers have LoadDynamix products in their test lab.
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Product
Tan Delta Test System
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Diagnostic test that indicates the degree of cable insulation degradation. Rather than using only a VLF instrument to perform a go/no-go proof test, the Tan Delta, used in conjunction with a VLF hipot, permits the user to grade the deterioration level of many cables in order to prioritize replacement, rejuvenation, or to determine what additional tests may be useful.
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Product
In-Circuit Emulator
DS-251
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# Real-Time and Transparent In-Circuit Emulator for 251s# Uses Intel and Atmel Licensed Bondout Technology# Standard 256K Emulation Memory# Real-Time Trace up to 128K Frames Deep, 128 Bits Wide# Complex Hardware Breakpoints# Supports Both Binary Mode and Source Mode# MS-Windows Debugger# High-Level Support for Popular C-Compilers# Full Support of Local and Global Variables# On-Line Assembler and Disassembler# Performance Analyzer
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Product
Embedded System Test Automation Software
ECU-TEST
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ECU-TEST is the software for automation tests used in the validation of embedded systems within the automotive industry. It can be used when designing, implementing, and evaluating different tests. It will generate intuitive test reports.
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Product
PCI Express 5.0 Test Platform
Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Product
Component Test Fixture For N1413 With B2980 Series
N1428A
Test Fixture
The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
Mobile Handset Voice Quality Test System
BK9024
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If you need to test cellphones, the BaKo Type BK9024 is fast and switches between up to 8 phone chambers at once, making it a great choice for quality control on your production line.
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(2500kN+) Fatigue Testing Systems
8806
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The precision mechanical systems, combined with the advanced features of the 8800 digital controller and Dynacell™ load cells, enable Instron to supply fully-integrated turnkey solutions to meet the most demanding applications. The system can be used to cover a broad range of static and dynamic test applications, covering metals, rebar, high-force fracture mechanics, aerospace panels, civil engineering components, wire ropes, or concrete.
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Product
4U 8-Slot CompactPCI® System with Redundant Power Supplies
cPCIS-6418U
System
The cPCIS-6418U Series Subsystem is designed for maximum density and has 8 horizontal slots for 6U cPCI boards with 80mm RTMs. The chassis is 4U in height and standard 19" rack mount width.
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Product
GPP-95-2 Test System Interface Probe
GPP-95-2
ICT/FCT Probe
Overall Length (mil): 375Overall Length (mm): 9.53Rec. Mounting Hole Size (mil): 85Rec. Mounting Hole Size (mm): 2.15Recommended Drill Size: #44 or 2.15 mm
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Product
CRPA Test System
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The Spirent CRPA Test System is a development of Spirent’s GSS9000 Series platform for testing Controlled Reception Pattern Antenna (CRPA) systems with a separate RF output per antenna element. The CRPA Test System generates both GNSS and interference signals. Users can control multiple antenna elements. Null-steering and space/time adaptive CRPA testing are both supported by this comprehensive wavefront approach.
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Product
Hydraulic Test Systems
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Genuen specializes in hydraulic test stands, including component tests, pumps, motors, valves, actuators, fatigue, load frames, and burst testers. As an industry leader in custom test systems, we focus on hydraulic solutions that leverage off-the-shelf technologies for mechanical subsystems and components. Our hydraulic test equipment has been deployed in aerospace and defense, automotive, industrial, commercial, and many other industries.
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Product
Engine Test Systems
TITAN Engine
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The TITAN engine test system series contains fully equipped engine test stands which are designed for various categories of internal combustion engines, ranging from light-to heavy-duty engines and also offering solutions for component tests such as testing the exhaust line. Further adjustment for off-road engines, powered two-wheeler engines, small internal combustion engines from carts, snowmobiles or motorboats as well as aircraft turbines are available. Additionally, it is also possible to test alternative engine concepts.
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Product
EW System Test Set
MS 1107
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PSS LRU Test Set is used to test the RWR (Radar Warning Receiver) system by simulating the input signals and testing the output signals.
