Memory Device
directly accessible computer's internal or main memory.
See Also: Memory, Memory Test, DDR, NAND, DRAM, RAM, ROM, Memory Testers, DUT
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Product
*PCIe-5785, 12-Bit, 6.4 GS/s, 2-Channel FlexRIO IF Transceiver Device
785587-02
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The PCIe-5785 enables direct RF acquisition up to 6 GHz and generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The PCIe-5785 is ideal for applications that require wideband acquisition and generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for acquiring and generating waveforms out of the box, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA to implement custom algorithms for real-time signal processing.
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Product
Memory Tester
SP3000
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CST is proud to offer a portable stand alone and affordable memory tester, combining DIMM and SODIMM testing capability all on the same universal base unit with optional easy plug-on test adapters.
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DRAM DDR4 Memory
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Improve performance up to 50% (compared to DDR3.) with Advantech! We offer industrial grade DDR4 2666/2400/2133 memory with 30μ" gold plating connector (288 pin), featuring 1.2v low operating voltage and faster burst accesses.
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Discrete Devices High-speed Testing System
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QT-6000 discrete device high-speed testing machine is suitable for testing small and medium-power diodes, transistors, field effect transistors and other products and wafers. It can expand built-in capacitance testing (DC+CAP), EAS, VC, pA modules, as well as external LCR (ultra high precision capacitance testing), Scanbox, etc. The machine can be used for FT mass production testing or laboratory testing.
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Product
4-CH 16-Bit 10/40 MS/s PCI Digitizers with 512 MB Memory
PCI-9816/9846
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The ADLINK PCI-9816/9846 are 10MS/s, 40MS/s sampling 16-bit 4-CH digitizers designed for digitizing high frequency and wide dynamic range signals with an input frequency up to 20 MHz. The analog input range can be programmed via software to ±1 V or ±0.2 V and ±5 V or ±1 V. With a deep onboard acquisition memory up to 512 MB, the PCI-9816/PCI-9846 are not limited by the data transfer rate of the PCI bus to enable the recording of waveforms for extended periods of time.
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Product
Dynamic Digital I/O (3U), 32 Channels Up To 200 MHz W/512MB On-Board Memory, W/LVDS
GX5283
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The GX5280 Series are high performance, cost-effective 3U PXI dynamic digital I/O boards with 32 TTL input or output channels and 32 LVDS input or output channels. The GX5280 Series offers an industry leading 512 MB of on-board memory and supports test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.
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Product
TrainLink™ Head Of Train Device
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Wabtec Trainlink telemetry systems provide a critical link to last-car information, such as brake pipe pressure, motion status, battery condition, and high visibility marker status.
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Photonic Device Assembly
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Although the lion’s share of photonic device assembly is still for discrete components and devices, the recent developments in photonics integration illustrate well the ensuing dramatic evolution of the photonics market. In transitioning from the use of bulky macro-systems to micro-optical components to integrated optics, the photonics sector is experiencing what has become true for the electronics market since the 1970’s.
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Wireless Device Functional Test Reference Solution
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The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Product
PCIe-5774, 12-Bit, 6.4 GS/s, DC-Coupled, 2-Channel PCI FlexRIO Digitizer Device
785648-01
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The PCIe-5774 is a PCI FlexRIO Digitizer Device that provides up to 3.2 GHz of DC-coupled analog bandwidth and 12 bits of resolution. You can operate the PCIe-5774 in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The voltage ranges are software-selectable and include 200 mV peak-to-peak and 1 V peak-to-peak, with a selectable DC offset. The PCIe-5774 is ideal for time-domain measurements in areas such as scientific instrumentation, medical imaging, and particle physics. The FlexRIO driver includes support for finite acquisition, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA.
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Product
Programmable Serial Device
HR-16P
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The HR-16P is a programmable RS-232 serial device designed to control any device with a serial port based on sensing level changes (open-to-close and close-to-open, or digital high to low and vice versa).
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Product
Test Line • Devices for measuring electrostatic charges
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HAUG offers a wide selection of easy-to-use gauges. These are field charges with which electrical charges, fields and potential can be measured. The measured values show how strongly a surface is covered with an electrostatic charge.
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Product
PCI-5152, 300 MHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device
779945-01
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300 MHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device—The PCI‑5152 high-speed oscilloscope device has two channels that sample up to 2 GS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 300 MHz of analog bandwidth and flexible measurement configurations.
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Active Device Characterization Solution Up To 43.5 GHz For 5G
N5244BM
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The N5244BM provides the N5244B 43.5 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 43.5 GHz for 5G applications.
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Wireless Device Test Sets & Wireless Solutions
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Keysight products provide mobile phone designers and manufacturers with increased measurement speeds, improved accuracy, and exceptional flexibility for testing mobile devices. Our one box test sets cover all the major technology formats: LTE-Advanced, LTE (FDD and TDD), GSM/GPRS/EGPRS/E-EDGE, W-CDMA/HSPA/HSPA+/DC-HSDPA, cdma2000®/1xEV-DO/eHRPD, TD-SCDMA/TD-HSDPA/TD-HSUPA, IS-95, TIA/EIA-136, AMPS, Bluetooth®, Bluetooth Enhanced Data Rate (EDR), Bluetooth Low Energy, ZigBee™, Wireless LAN (WLAN), 802.11a/b/g, 802.11n, NFC/EMV, MIMO, and WiMAX™.
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Handheld Testing Device
GPON Tracer
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GPON Tracer is the ideal tool for both telecom operators' field engineers and customer support teams of OLT and ONT/ONU manufacturers. Featuring a compact handheld device with a user-friendly touch screen interface, the GPON Tracer provides a rich variety of real-time indications in simple graphical and textual formats, giving accurate indications of network and service issues and their root causes. Moreover, GPON Tracer reduces repair charges by preventing unnecessary replacements of properly working equipment.
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Product
Power Device Analyzer / Curve Tracer For Circuit Design
B1506A
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The Keysight B1506A Power Device Analyzer / Curve Tracer for Circuit Design is a complete solution that can help power electronic circuit designers maximize the value of their power electronics products by enabling them to select the correct power devices for their applications. It can evaluate all relevant device parameters under a wide range of operating conditions, including IV parameters such as breakdown voltage and on-resistance, as well as three terminal FET capacitances, gate charge, and power loss. The B1506A Power Device Analyzer/Curve Tracer for Circuit Design meets and exceeds all curve tracer capabilities.
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Active Device Characterization Solution Up To 67 GHz
N5247BM
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The N5247BM provides the N5247B 67 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 67 GHz.
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Product
Ultra-High Performance FLASH and DRAM Memories Test Solution
Magnum V
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Teradyne’s Magnum V systems delivers high throughput and high parallel test efficiency for ultra-high performance FLASH and DRAM memories. Magnum V’s largest configuration delivers up to 20,480 digital channels at 1600Mbps per channel.
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Product
PCI-8511, 2-Port, Low‑Speed/Fault-Tolerant CAN Interface Device
780682-02
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The PCI‑8511 is a fault-tolerant controller area network (CAN) interface for developing applications with the NI‑XNET driver. The PCI‑8511 excels in applications requiring real-time, high-speed manipulation of hundreds of CAN frames and signals such as hardware‑in‑the‑loop simulation, rapid control prototyping, bus monitoring, automation control, and more. The NI‑XNET device‑driven DMA engine enables the onboard processor to move CAN frames and signals between the interface and the user program without CPU interrupts, minimizing message latency and freeing host processor time for processing complex models and applications.
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Product
FD-11601, 8-Channel, ±10 V Powered-Sensor Voltage Input Device for FieldDAQ
786374-01
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The FD-11601 measures up to eight channels with a voltage input range of ±10 V. Each input channel supports TEDS and provides 24 V DC to power external-powered sensors without additional power supplies. The FD-11601 features 24-bit resolution, simultaneous sample rates up to 100 kS/s/ch, and channel-to-channel isolation. It is IP65/IP67 rated to be dust-tight and water-submersible, operates in -40 °C to 85 °C environments, and can sustain 100 g shock and 10 g vibration. The FD-11601 incorporates Time Sensitive Networking (TSN) and features an integrated network switch and built-in power circuitry for simple daisy chaining. You program the FD-11601 with NI-DAQmx, which automatically synchronizes multiple FieldDAQ™ devices. The FD-11601 is ideal for test cell and outdoor environments.
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Product
Test & Burn-In Socket for Devices up to 13mm Square
CSP/MicroBGA
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Test & Burn-In Socket. Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with four stainless steel screws. Standard molded socket format can accommodate any device package of 13mm or smaller, by using machined (for small quantities) or custom molded (for large quantities) pressure pads and interposers.
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Product
USRP-2901, Software Defined Radio Device Bundle
784114-01
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USRP-2901 Software Defined Radio Device Bundle - The USRP-2901 Teaching Bundle includes two USRP (Universal Software Radio Peripheral) Software Defined Radio Devices, turnkey courseware, and other accessories such as USB 3.0 cables and SMA attenuators. Students can use USRP … Software Defined Radio Devices with LabVIEW to experiment with real-world signals in introductory communications and digital communications laboratories. The USRP-2901 Teaching Bundle helps students experiment with FM radio, GPS, GSM, Bluetooth, and ISM signals. The bundle also includes components of a lab station that students can use to gain hands-on experience with live communication links between multiple USRP Software Defined Radio Devices.
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Product
Measuring Devices for Magnetically Soft Materials
TMAG-RJJ-3.1
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The system is a mobile version of computerized measuring system MAG-RJJ-6.0 and is designed for measure the dynamic magnetic properties of the soft magnetic materials e.g. oriented or not-oriented electrical sheet. The system provides the opportunity of a tabular and graphic presentation of the obtained data, which can be presented by means of monitor, printer or plotter. The system works under Windows 2000/XP.
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Device Cloud for Web & Mobile App Testing
Remote Testkit
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*Better test efficiency and productivity.*Flat rate for 24/7/365 unlimited device access.*Stable and secure operation by NTT
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Loading Devices
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Educated Design & Development, Inc.
Sometimes you may need additional loading for abnormal testing (i.e. overload test). Other times, you may need additional loading to simulate worst case normal operation conditions (i.e. input test, temperature test). No matter what your application, we have the loading device to fit your needs! TECH NOTE: Be sure to request our outline titled "Selecting Loads" for assistance in determining the proper rated device for your application.
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Charge Coupled Device (CCD) Image Sensors for Space and Ground-Based Astronomy
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(CCDs) for Space science, Ground-based Astronomy, and Earth observation applications with an impressive record of successful deliveries to a wide range of customers over 40 years.All Teledyne e2v devices can be supplied partially or fully customised to fit the application and achieve the best possible system performance. CCD image sensor design, manufacture, test and characterisation are carried out in-house enabling control from start to finish. Multi-polysilicon, multi-metal and back-illumination options are available for high resolution, high sensitivity and very low noise.
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Highest Throughput For Fragile Devices
Ismeca NY20
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20-position turret platform for semiconductor test, inspection and packaging, provides the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity.
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Product
Measuring Devices For Drawing Rings And Punches For 2-part Can Production
RINGMASTER - The Benchmark For Accuracy
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Optik Elektronik Gerätetechnik GmbH
High-precision, non-contact measurement of inside and outside diameter, roundness (inside and outside) and concentricity of drawing rings for 2-piece can production. The Ringmaster sets standards in measuring accuracy, user friendliness and reliability and is therefore used in can factories on all continents.
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IoT Device/ App Energy Optimization Tool
Otii
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Otii is a developer tool for energy optimization of IoT devices and apps, created by developers for developers. The tool is easy to use, requires minimal setup, and lets developers measure and analyze energy usage at any stage of development. The Otii solution comprises a compact and portable source measurement unit, Otii Arc, and an easy to use, yet comprehensive desktop app for Ubuntu, Windows & macOS.
