Product

Single-Point Kelvin Probe

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KP Technology

KP Technology

Our Single-Point Kelvin Probe system (KP020) is the introductory system in the KP Technology product family. The off-null signal detection method allows high-quality measurements of the Work Function/Fermi Level of materials.

Product

PCB Test Fixture Kits

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Emergent Electro-Mechanical

Emergent Electro-Mechanical

Emergent's fixture kits are available in bottom and double sided probing versions. They are fully scalable, from compact benchtop testers to full size multi-UUT production floor models. The removable, interchangeable plate design allows you to easily add and move test points, or swap out plates to test a completely different product. Each kit comes with a standard linear collapse over-clamp. A cam-follower closing system can be specified for higher force applications. Our fixture kits are manufactured using industrial grade phenolic laminate, which is similar to G10 in hardness and strength but easier to machine. The standard kit comes pre-assembled with blank plates for machining.

Product

Ultra-High Vacuum Kelvin Probe

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KP Technology

KP Technology

Our Ultra-high Vacuum Kelvin Probes give the user full access to work function and contact potential difference (CPD) measurements under vacuum. Each system comes with a high-quality, manual, or motorized translator that enables reliable and accurate tip-to-sample positioning, and the unrivalled tracking system always holds the tip separation constant during the measurement. Even under vacuum, the work function resolution is 1 - 3 meV.

Product

Standard Probe Station Chucks & Accessories

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ABET Technologies, Inc.

ABET Technologies, Inc.

In this test solutions section of our website we describe the expanding line of Abet PV IV probe stations for the growing variety of solar cell types and sizes being developed around the world. This page describes a line of vacuum chucks and accessories for top/bottom, top/top, and bottom/bottom solar cells from 3 x 3 mm to 300 x 300 mm. Probe stations for multiple device on a single substrate and multifunction probe stations are described further in the sections highlighted to the left of this page.

Product

Portable Wafer Probe Station

PS-5026B

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High Power Pulse Instruments GmbH

PS-5026B - High Power Pulse Instruments GmbH

The PS-5026B is a rugged portable wafer probing solution which has been designed for high reliability, compact size and minimum cost.

Product

Current Probe

DCFlex

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Power Electronic Measurments Ltd

DCFlex - Power Electronic Measurments Ltd

The DCflex is an easy to use, low cost, thin and clip-around DC current probe. It is suitable for measuring large DC currents of >2kA. The DCflex takes a single shot measurement of the DC current with a typical accuracy of ±1%. It is important to understand that the DCflex does not provide a continuous measurement of DC current.

Product

Sub-Micron Probe Positioner

QP150 Series

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Quarter Research and Development

QP150 Series - Quarter Research and Development

Quater’s new QP150 sub-micron probe positioners are designed to significantly reduce mechanical crosstalk between axes resulting in fast and accurately placed probe touchdowns with zero pad or trace damage from unwanted needle deflections. Overall ergonomic design places micrometers within a compact zone allowing users to precisely control needle direction and speed.

Product

Pulse generator

9355-1

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Solar Electronics Company

9355-1 - Solar Electronics Company

Solar Model 9355-1 Pulse Generator is designed to provide impulse excitation by means of an injection probe placed around interconnecting cables or power wires. The unit uses a charged transmission line (50 ohms) to generate a pulse with less than 2 nanoseconds rise and fall time, and duration of approximately 30 nS, calibrated in a 50 ohm fixture to deliver up to 5 amperes at a rate of 30 p.p.s. for one minute as required by MIL-STD-461D/E, test method CS115.

Product

Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe

LFRE-25H-12

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ECT

LFRE-25H-12 - ECT

Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

Product

Probes And Digital Display Units

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Sylvac

Sylvac

• Modern and compact display unit• Digital probe inputs• Large touch screen display with intuitive functions• Shockproof construction• Basic formulas (Standard model) and dynamic measurements (Advanced model)

Product

High Frequency Cartridge for HFP Series Probes

PACC-MS003

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Teledyne LeCroy

PACC-MS003 - Teledyne LeCroy

High Frequency Cartridge for HFP Series Probes

Product

3D Guidance®

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Northern Digital Inc.

Northern Digital Inc.

The 3D Guidance® electromagnetic tracking solution delivers exceptional performance and value for OEM image-guided interventional and therapy systems and medical trainers that require real-time navigation tracking capabilities. The 3D Guidance solution tracks 6DOF sensors that can be embedded into OEM instruments such as ultrasound probes, rigid and flexible scopes, and laparoscopic tools. Continuous in-vivo tracking is maintained through difficult anatomy, even when sensors are out of sight. Low latency and fast update rates ensure the most subtle tool movements are instantly tracked and visualized within the OEM host interface. The 3D Guidance solution is available in the driveBAY™ and trakSTAR™ configurations, as based on the Electronics Unit. The trakSTAR is a standalone desktop unit that connects to a direct power source. The smaller driveBAY fits inside the drive bay of a computer, OEM imaging cart, or medical trainer/simulator, using the host’s power supply. Both share the same tracking accuracy and reliability. The ready-to-use configuration facilitates cost-effective integration and speeds time to market.

Product

CAM/TRAC Test Kits

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Semco Machine Corp.

Semco Machine Corp.

The Camtrac (registered trademark) series test fixtures provides ‘Z’ axis motion that reduces probe side loading typically seen with Clamshell type test fixtures. This not only extend the life of the probes, but additionally, provide better probing accuracy, especially on fine pitch test centers. Camtrac fixtures are available with the most widely used interfaces in the test industry.

Product

Wafer Test Solutions

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AEM Holdings Ltd

AEM Holdings Ltd

Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.

Product

In Line HT Ignition Tester

1177

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Draper Tools Ltd

1177 - Draper Tools Ltd

Establishes whether there is a high tension spark potential at the spark plug. Hands free operation means no risk of electric shock to user. Ideal for modern vehicles with sensitive electronics. Probe is 55mm long with a lead 100mm in length.

Product

Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe

LFRE-25I15-16

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ECT

LFRE-25I15-16 - ECT

Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

Product

Smart Probes

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Omega Engineering, Inc

Omega Engineering, Inc

A wide selection of rugged smart probes for your sensing needs. From non-contact IR sensors to a full range of sensor types including Temperature, Humidity, Process, RTD, Thermocouple, pulse, and mor...

Product

Temperature logger with self-contained sensor and connection for a probe

TGU-4510

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Gemini Data Loggers Ltd.

TGU-4510 - Gemini Data Loggers Ltd.

Dual channel temperature recorder 32,000 readings capacity High accuracy and reading resolution Fast data offload Splashproof case Low battery monitor User-replaceable battery USB or serial download cables User-programmable alarms

Product

Small size non-steady-state probe for thermal conductivity measurement

TP08

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Hukseflux Thermal Sensors B.V.

TP08 - Hukseflux Thermal Sensors B.V.

TP08 is a probe that offers the possibility to perform a practical and fast measurement of the thermal conductivity (or thermal resistivity) of the medium in which it is inserted at a high accuracy level. It works in compliance with the ASTM D 5334-00, D 5930-97 and IEEE 442-1981 standards. The TP08 is a small version of type TP02, made for situations where the length of the TP02 poses a problem. The standard TP08 probe has proven its suitability for soils, thermal backfill materials, sediments, foodstuff, powders, sludges, paints, glues and various other materials.

Product

Differential Probe

DP-15K

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PINTEK Electronics

DP-15K - PINTEK Electronics

DP-15K is a 100mV high sensitivity and able to measure 15KVp-p high voltage and high dynamitic range model.