Probing
See Also: Probers, Probing Stations, Nano Probes
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Product
Phasing Meters
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A unique tool in that it may be used as a conventional phasing meter, or the meter probe may be used as a stand-alone voltage detector on primary or secondary voltages or capacitive test points.
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Product
Temperature Transmitter
T4111
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Transducer is designed for temperature measurement at C or F by means of an externaltemperature probe with Pt1000 sensor. Measured temperature is converted to linearized unified signal 4-20 mA. Measured values are displayed on LCD display. It is possible to switch OFF theLCD at all. Current loop has two-wire connection and requires power from evaluation device.
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Product
Optoelectronics and Photonics
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SemiProbe has developed probe stations for a wide variety of optoelectronic and photonic device applications, including light emitting diodes (LEDs), vertical cavity surface emitting lasers (VCSEL) and photo diodes. Testing and handling small, fragile, thin wafers with thousands of die on them poses unique challenges that require innovative solutions.
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Product
PRO 3-in-1 pH, EC, TDS Combo Meter
MW802
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This Milwaukee 3-in-1 combo meter allows you to measure pH, EC (conductivity) and TDS with a single meter and one single probe.
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Product
RF/High Frequency Probes
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Everbeing is proud to distribute GGB Industries line of PicoProbes for customers everyday RF probing needs. The popular model 40A has been serving the needs of many high frequency researchers in the sub-40 GHz range. For more information on their products, visit www.ggb.com. If a product they sell is not shown here, we are still able to acquire for you. Please contact us for more details.
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Product
Digital Circuit Tester 3-30V
29050
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The probe is insulated to prevent the possibility of shorting the side of the probe to other components. 47" cord and heavy-duty alligator clamp for secure connections.
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Product
Light 0.75 (21.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-25I-2
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Precision Coating Thickness Gauge Probe Range
Elcometer 355
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Unique probe modules allow the Elcometer 355 Coating Thickness Gauge to be versatile and flexible for any coating thickness measurement application.
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Product
High 3.12 (88.00) - 8.00 (227.00) Bead Probe
BTP-72HC-8
Bead Target Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
High 2.90 (82.20) - 12.60 (357.00) Switch Probe
TSP100-H150-3
Switch Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Product
Probe & Pickup
1035
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TESCO’s Catalog No. 1035 Probe & Pickup combines the best of communication between a PC and a meter. No longer do you have to disconnect the pickup to reconnect to a PC with this all-in-one device. Save time with less hassle.
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Product
1kV, 25 MHz High Voltage Differential Probe Without Tip Accessories and with Auto Zero Disconnect
HVD3102A-NOACC
Differential Probe
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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Product
Probe Antennas
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Probe antennas are offered as both standard and custom models with a rectangular waveguide interface. Probe antennas can only support linear polarization. These antennas are often used to measure the gain of other antennas by comparing the signal levels of the probe antenna and antenna under testing. The standard models operate across the full waveguide band and offer 6.5 dB nominal gain and 115 and 60 degrees half power beamwidth at center frequency. The below standard offering covers the frequency range of 8.2 to 170 GHz.
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Product
Portable Oscilloscope
IkaScope WS200
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IkaScope is a new kind of instrument: It’s a full featured oscilloscope fitted inside a WiFi connected probe. IkaScope takes no extra space on your desk and follows you everywhere with a 1-week battery life. It connects to your computer, smartphone or tablet to display captured signals.
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Product
In-Line Full Automatic Testing System
ALMAX
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Automated press unit with board loading belt.ALMAX can become automated in-line type in-circuit tester in case our ICT is integrated. And it also can become automated in-line function tester as well.PLC is not used in order to reduce cost as a PC control mechanical part.Press unit is 4 shaft structures which reduce unbalanced load and contact fail of probe pins.
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Product
Elevated 1.68 (4.00) - 7.00 (198.00) Bead Probe
BTP-1HL-7
Bead Target Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
MECHANICAL TEST FIXTURE KITS
TX-MT-100 SERES
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Test-X MT-100 Series mechanical kits are an inexpensive solution for testing smaller printed circuit boards and other devices.The MT-100 Series features a 1/2" thick FR4 probe plate and a 3/8" thick Lexan top plate. Precision alignment is assured through tooling holes in both the probe and top plates. Units are available with a 2-1/2" pan or an upper head assembly
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Product
Drop-In Functional Test Fixtures
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Circuit Check’s drop-in base fixture and replaceable personalized plates are the ideal solution where production volumes are lower and the need to change from one fixture and test program to another occurs quickly. Interchangeable test fixture drop-ins enable the same test system to be quickly reconfigured with different tooling and probe patterns for different products. This maximizes equipment re-use, while minimizing the cost for each new test. With Circuit Check’s base fixture and drop-ins, the wiring and test electronics are not disturbed, thus ensuring configuration consistency each time the system is re-tooled.
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Product
High 1.73 (49.00) - 8.00 (127.00) High Performance Lead Free Probe
LFRE-1T30-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
ICT / FCT Probes
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*Decades of experience*Proprietary base materials and coatings*Innovative designs*Optimized electrical path
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Product
K Thermocouple Surface Probe
TP746
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Surface thermocouple Type “K” probe. Tolerance according to IEC 60584-2 standard.
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Product
High Voltage Probe, AC or DC Measurement, 40 kV, 1000 MΩ
72-3040
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A high voltage probe that allows most 10MΩ multimeters to be turned into a high voltage meter.
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Product
Photometer II
Spectra Film Gate
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The Spectra Film Gate Photometer II offered by Spectra Cine is a significant advance in the field of photometry. It is extremely sensitive and solid state throughout. Reads directly in printer steps of 0.025 log exposure units. The large, uncrowded scale has an 80 printer point range and affords ease and accuracy in reading. A variety of probes are available for use in Acme optical printers, Bell & Howell Model "C", "J", and "A" contact printers, ARRI printers and Oxberry printers.
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Product
Standard 2.00 (57.00) - 4.00 (113.00) General Purpose Probe
P2757G-3W1S
General Purpose Probe
Current Rating (Amps): 20Average DC Resistance lower than (mOhm): 10Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,210Overall Length (mm): 30.73Overall Length Remark: Tip 2C: 1140 mil (28.96 mm) Tip 1W: 1205 mil (30.61 mm) Tip 2W: 1205 mil (30.61 mm)
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Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2E-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
16 Channel, Single Slot, Bench Data Acquisition Unit with 6.5 Digit DMM
T3DAQ1-16
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÷10 HiZ 500 MHz Passive Probe for WaveSufer 400 Series Oscilloscopes. Includes Spring Tip, tip protector, and standard accessories package.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1L-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.08 (31.00) - 3.50 (99.00) General Purpose Probe
EPA-2B40
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Measuring Probes and Instruments for Meteorology
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In meteorology, precise and reliable measurement data are critical for the preparation of accurate weather forecasts; as well as monitoring external conditions for integration with the building environmental systems.





























