Probing
See Also: Probers, Probing Stations, Nano Probes
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1L18-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Contact Resistance Measurement Kit
LRM-10
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The LRM-10 is a 10A micro-ohmmeter kit designed to measure low resistance for electrical interconnections integrity testing. The LRM-10 has a range from 0.01µΩ to 200Ω. It comes with heavy duty four points probes and it is compatible with a great variety of optional accessories.
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Product
High Voltage Clip for Test Leads
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- The new Parrot clips are high voltage gripping clips for test leads and probes. High Voltage Parrot clips replace insulated alligator clips, plastic coated miniature alligator clips, small crocodile clips or large alligator clips.- Parrot Clips have a design with a new metal tube tip which is connected directly to the lead.- The tip, the hooked rod and the spring are housed in a plastic support.
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Product
Active Voltage Probes
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Engineers must commonly probe high-frequency signals with high signal fidelity. Typical passive probes with high input R and C provide good response at lower frequencies, but inappropriately load the circuit, and distort signals, at higher frequencies. Active voltage probes feature both high input R and low input C to reduce circuit loading across the entire probe/oscilloscope bandwidth. With low circuit loading, and a form factor that allows probing in confined areas, the active voltage probe becomes the everyday probe for all different types of signals and connection points.
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1Z1-7
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
ICT Probes
Merica Series-MPI50
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minimum center: 1.27mm (50mil)Current Rating: 3 amps, continuousContact Resistance: 60 milliohmsMounting Holes Size: 1.0Full Stroke: 6.35mmRated Stroke:4.30mmSpring Force: 150gf(5.5oz)
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Product
Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-25I8-6
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.10 (31.00) - 3.85 (109.00)General Purpose Probe
SPA-64-2
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3: 0,365″; Tip 8: 0,385″; Tip ,9,10: 0,363″
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type C, Ø1.50mm, 230gf
K100-C150230-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style C, Tip Diameter Ø1.50mm, Spring force 230gf, Steel with Gold Plating.
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Product
Microprocessor Development System
DS-85
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* Real-Time and Transparent In-Circuit Emulator * Windows Debugger - Update 2009 * Symbolic Debugger compatible with Intel Object Files * 64K Hardware Breakpoints * 64K of Internal Memory * 32K x 32 Bit Trace Memory and Logic Analyzer with External Probes * Serially linked to IBM PC or Compatible Hosts * On-line Assembler and Disassembler * Source and Listing Windows
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Product
DDR4 MSO Probes
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The DDR4 DIIM and SO-DIMM Mixed Signal Interposers connect Address, Command and Control signals of a DDR4 bus to the Keysight V-Series Oscilloscopes with the MSO option. These interposers also provide accessibility to DDR4 signals for convenient analog probing. The user can then easily observe both the digital and analog representation of the DDR4 Address, Command and Control bus. Solder down N5541A analog probes purchased separately from Keysight Technologies.
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Product
Probing Solutions
ES62X-CMPS
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The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.
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Product
High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25Z-8
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
K Thermocouple Penetration Probe
TP657/1
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“K” Type thermocouple flexible penetration probe. Tolerance according to IEC 60584-2 standard.
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Product
Standard 0.39 (11.00) - 1.39 (39.00) Non Replaceable General Purpose Probe
MEP-20J
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 25Test Center (mm): 0.635Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 750Overall Length (mm): 19.05Rec. Mounting Hole Size (mil): 20.5Rec. Mounting Hole Size (mm): 0.52Rec. Mounting Hole Remark: 20.5 to 21.5 mil / 0.52 to 0.55 mmRecommended Drill Size: #75 or 0.52 mm
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Product
Light 0.60 (17.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-72T1-2
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Alternate 1.30 (37.00) - 4.50 (128.00) General Purpose Probe
HPA-1A-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Product
Low & High Voltage Differential Probes
T3
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Teledyne Test Tools Low & High Voltage Differential Probes offer end user versatility with all models powered by an external universal power supply and work with any Oscilloscope with a high-impedance BNC input. The range consists of one Low Voltage and three High Voltage models with varying bandwidths to satisfy a wide array of customer applications.
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Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3H
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Stimulus Induced Fault Testing
SIFT
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SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Product
Meat Cooking and Cool Down Temperature Data Logger
OT1000
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The OT1000 is made of Tecaform®, with a convenient mounting hook. The device is rated IP67, making it splash proof and easy to clean. The OT1000 is simple to use, just activate the logger, insert the probe into a meat product, and then with a couple clicks of the mouse data can be downloaded to a PC for analysis.
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Product
SP200B, 200 MHz, ±60 V, 1X or 10X Attenuation, Single-Ended Passive Oscilloscope Probe
780284-01
Oscilloscope Probe
The SP200B is a standard switchable passive probe for oscilloscopes that provide 1 MΩ input impedance. Depending on the attenuation ratio, the probe has an analog bandwidth of 6 MHz in the 1x attenuation setting or 200 MHz in the 10x attenuation setting.
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Product
Adapter/Stainless Steel
WADP-NMNM-01
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Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Product
Active Loop Antennas / Magnetic Field Probes
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Is an active, shielded handheld loop antenna with nearly con- stant antenna factor over the entire frequency range. It can be used for testing according to CISPR, MIL, FCC, EN, ISO, ANSI, ETSI and many other standards.
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Product
Skin Surface Probe
SST-1
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The SST-1 skin surface temperature probe for humans, to be taped on is re-useable and has a fast response time.
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1I35-7
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Packet Analysis Probe for PCI Express
N4220A/B
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When purchased with a logic analyzer, the application software you order is installed on the instrument hard drive. If you need to add application support after your initial logic analyzer purchase or are controlling a logic analyzer from a host PC, you must install the appropriate software before you can make measurements.
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Product
24V Heavy Duty Circuit Tester
27430
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Heavy duty probe, cord and clamp. The probe is insulated with high-visibility shrink tubing to prevent the possibility of shorting the side of the probe to other components. Comes with a strain relief spring on the cord.
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Product
Crack Testing
STATOGRAPH® Product Family
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Foerster Instruments, Incorporated
The STATOGRAPH product family is used for testing surface cracks with the help of eddy current sensors. Eddy current testing for material cracks requires the appropriate evaluation electronics and probes adapted to the testing task. Depending on the test situation and test object, the STATOGRAPH family of test instruments offers the right system for this purpose.
