Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Multiport Electromechanical Coaxial Switch, DC to 40 GHz, SP4T
87104D
The Keysight 87104D multiport switch improves signal accuracy in RF and microwave signal routing and testing applications. This high performance electromechanical switch provides unmatched isolation and a 0.03 dB insertion loss repeatability, which is warranted for the 5-million life cycle of the switch. The 87104D’s low insertion loss repeatability reduces sources of random errors in the measurement path, which improves measurement accuracy. The repeatability and reliability of this switch guarantee measurement accuracy and can cut the cost of ownership by reducing calibration cycles and increasing test system up time. Highly repeatable switching capability is made possible through Keysight's rigorous design and tight manufacturing specifications.
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HV AC Voltage Test Systems
Fivestar HV Testing Equipment Co., Ltd.
FSHV offers three different types of AC voltage test systems, the conventional type is AC test transformer design, mainly for testing objects of medium & low capacitance products, particularly for tests requiring stable voltage even if the load changes under voltage (corona, wet & pollution tests) or when the load is inductive (like inductive voltage transformers). Another is AC resonant test systems, according to series resonance circuit XL=XC (2πfL=1/2πfC), by setting F frequency of power supply or L inductance of reactor, generate a pure sinusoidal waveform of the test voltage, and the required input power is only 1/Q. Variable frequency type operates in a frequency range from 20Hz to 300Hz, ideal for field commissioning test of power cables and GIS/GIL. Variable inductance type outputs continuous AC voltage of power frequency (50/60Hz), mainly for factory testing of high and ultra-high voltage cables, power transformers, GIS, etc.
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LED Tester For Chip And Wafer
Electrical Testing: Forward：VF,DVF,VFDReverse：VZ,IROptical Testing: can test LOP in cd/mcd/W/mW/lm... from different optical componentsWavelength λp,λd,λc,hw,purity,(x,y),CCT,CRIFour-wire measurement and contact resistance in case of deviation.Auto polarity identification and preheat function.Compatible mechanical interface.Optional ESD static test system or polycrystalline test system
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Integrated Development Environment for the Creation and Execution of IEEE1641 Test Programs
SigBase
SigBase is an Integrated Development Environment for the creation and execution of IEEE 1641 test programs. It supports the development of tests using flow-charting techniques and the graphical design of signals using newWaveX. It includes fully integrated compilation and signal path allocation software that determines the appropriate instrument and switch path for each signal and test. The run-time system, which is also available as a separate product for use on multiple test stations, controls the operation of the ATS and can provide test results in ATML format.
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Test System
Griffin III
The Griffin III system brings new price/performance efficiency to the Tester-in-a-Head tradition, a concept created and introduced by HILEVEL in 1987. This tester is a superior cost-effective solution for Engineering, Production, and Failure Analysis test applications.
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Microtester Test Systems
With the micro probes and the fine-pitch adapters used on them, you are able to contact the finest test structures. E-tests, functional tests, IC tests or high-current tests are made to be affordable, efficient and with a short cycle time. With the integration of HF adapters we also enable the double-sided testing of HF substrates up to high frequency ranges.
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High-Speed Transformer Test System
DU-7211
Delta United Instrument Co., Ltd.
Inductance, Q factor, Leakage Inductance, AC Resistance, Capacitance, DC Resistance, Balance,Turn ratio, Open/Short check
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Residential Meter Test System
RADIAN RM-17
The Radian Research RM-17 Residential Meter Test System offers simplicity for testing residential watthour meters. In a compact, lightweight package of 7 pounds, the RM-17 delivers accuracy and flexibility in a practical solution to watthour meter testing. The RM-17 combines simple operation, advanced data management, and exceptional accuracy to provide a cost effective approach to field testing.
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Data Acquisition
For devices with analog outputs, we are now shipping our new multi-channel data acquisition system. This high-speed, low-noise solution is highly modular, so you can test scientific CCDs and high-speed machine-vision CMOS sensors with the same basic system. Swappable pre-amps and A/D converter modules enable you to reconfigure your test system to fit your needs.
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Automated Optical Switch - MATRIQ
Add optical switching capability to your test system with Quantifi Photonics’ automated optical switches. The fast and reliable optical switch will enable automated sequential testing, saving time and streamlining your test procedures.
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Multi Channel Optical Fibre Verification
The multi-channel optical fibre test system is used in the development and qualification of single mode optical fibres. The fibres are exposed to environmental influences in a climatic chamber in order to analyse the data on insertion loss and reflection. In addition, the current temperature in the climatic chamber is documented. Insertion loss measurement is performed with the help of an optical power meter, laser sources and optical switches. An Optical Time Domain Reflectometer (OTDR) from Exfo is used for the reflection measurements. The system was designed for the simultaneous characterization of 15 sample fibres and one reference fibre.
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Wide FOV Target Projector
The Model 13792 is a broadband portable target projector used for characterizing the performance of a wide variety of infrared sensor systems. The system incorporates SBIR standard components to provide accurate and precise stimulus to sensors under test in laboratory, depot and production line environments. Testing can be automated with the use of IRWindows™ test system controller that reduces test times and cost, while improving the consistency and accuracy of test results.
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Torque Instruments
Advanced Force & Torque Indicator
Used with a range of 'plug and play' torque and force sensors - ideal for 'static' or 'dynamic' (rotary) torque measurementCan be used as part of a Mecmesin test system or mounted to one of your own test rigs
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Count Down Test System
The Second Launch Pad Count Down system is implemented using VXI hardware designed by Data Patterns specific to the application requirements, featuring a redundant system handling upto 14000 I/O points.
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Protective Cover, G12x, Receiver
310113518
The Receiver Protective Cover prevents damage to your modules and contacts and keeps your test system in proper working order.
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High-Speed Memory Test Solution
UltraFLEX-M
The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.
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Automatic Current Transformer Comparator
KATC-C2
Got older, slower equipment? Knopp’s Automatic Current Transformer Comparator (KATC-C2) is faster, more robust and more accurate! Knopp’s KATC-C2 is a high accuracy current comparator that is compatible with all older generation Knopp comparators, and is designed to be a direct, plug-in replacement requiring no modification of the existing Knopp Current Transformer Test Systems. Save time and money on service by upgrading your comparator to our new next generation model!
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PXI 2.5W Programmable Resistor Module, 8-Channel, 1Ω to 239Ω
40-251-013
The 40-251-013 is a programmable resistor module with 8 channels which can be set between 1Ω and 239Ω with 1Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PCB Test System
Circuit Wizard - CW409
Qmax Test Technologies Pvt. Ltd.
CW 409 –Circuit Wizard PCB Test System has all the features of QT9627 such as Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test.Maximum Digital Test Speed 10MHz in the QT9627 .It can be connected to any PC/AT or Laptop with Windows 10 operating system through USB Plug and play interface. It operates on user friendly Qmax Test Director software platform with different modes like Test Station for operator level use Test Sequencer mode for Programmer level use and Interactive Workstation mode for quick working.
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Automatic Circuit Breaker Test Systems
UPA-1 (UPA-3)
These portable systems for primary injection testing of circuit breakers which are used in in AC circuits of industrial frequency.
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Rockwell Hardness Tester
Versitron® Series
Newage Testing Instruments, Inc.
The Versitron Rockwell hardness testing system is the industry workhorse of hardness testing - designed to meet the toughest challenges: clamp large parts, operate in poor environments, and test high volumes - all with less service problems and less operator skill requirements. Available with 2 different test stands types (in a range of sizes) and 2 test heads and also a wide range of other options.
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Pulsed SMU Systems
AMCAD Engineering has created professional, industry-proven pulsing technology for both pulsed-bias load pull (Pulsed Load Pull, PLP) and 50ohm transistor test applications. Systems come equipped with a mainframe controller which includes integrated power supplies and integrated input pulser with ±25V/200mA capability. The external output pulser module (probes, pulsers) is configured for 120V/30A pulsing.
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Test System
Maynuo Electronic Co.,Ltd a professional R & D and production of programmable DC electronic loads, programmable DC power supply, high power load, power supply, AC power supply, power supply, such as testing high-performance mobile phone test equipment and facilities, as well as electrical, electronic, aerospace, military, chemical, automotive, battery charger, battery, solar cell production lines and other industries to provide automated testing program. The company has many years experience in a number of outstanding technical R & D, product innovation by the majority of users. We are committed to provide users with more accurate and more stable more easily accessible to the higher cost of test instruments, to create the industry in testing the influence of an international brand of excellence.
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Cable Tester
The Cable Test System is a perfect example of a special solution built on existing DapTechnology building blocks. The system, which was developed with the cooperation of a key A&D cable harness supplier, replaces a cable test system with proven FireSpy Technology.
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Safety Chamber, Hydrostatic Test
9901HTX-72x24x12
The 6 ft wide by 2 ft deep Hydrostatic Test Safety Chamber, when combined with one of our pump systems, provides a complete hydrostatic test system for testing hose and assemblies or other components requiring pressure testing.
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802.11be Test System
IQxel-MX
Next generation wireless devices Access Points, CPEs and client devices like smartphones or tablets based on the IEEE 802.11be EHT (Extremely High Throughput) standard require stringent RF performance to meet the latest standard requirements.
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Cable Harness Test System
Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
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3U Intel® Core™ i7-7820EQ Quad-Core Processor-Based PXI Express Gen3 Controller
PXIe-3987
The ADLINK PXIe-3987 PXI Express embedded controller, based on the 7th gen Intel® Core™ i7 processor, is specifically designed for hybrid PXI Express-based testing systems, delivering maximum computing power for a wide variety of testing and measurement applications.
