Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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PCI High Density Pecision Resistor Card, 9-Channel, 2Ω To 122Ω
50-298-112
The 50-298-112 is a high density programmable resistor card with 9 channels which can be set between 2Ω and 122Ω with 0.5Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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NFC Conformance Test System
T3111S
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
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High Volume Manufacturing Handling, Stimulus
ULTRA P
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Simulation Systems
Bloomy offers Simulation Systems for Hardware in-the-Loop (HIL) and open loop test of electronic controls and mechanical actuators for all types of transportation and defense systems including aircraft, rail, automobiles and ships. These systems, now deployed at major aerospace, locomotive and military manufacturers and research facilities worldwide, provide world-class, high-fidelity simulated environments for use in both closed-loop and open-loop testing. Because Bloomy’s Simulation Systems are largely constructed from COTS components, time to first test can be reduced significantly, and their highly-customizable nature allows your test system experts to provide your unique IP to differentiate your product from your competitors.
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Transducer Test System
TTS-030
For the generation of unique bond links the use of high-quality components is an essential precondition. Despite all care in the production of ultrasonic transducers again and again unexpected effects occur, which only manifest themselves in the use of those transducers and which also have the reason in the transducer itself.
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Resonant Testing System
Originally designed to precrack specimens for fracture mechanics, the current versions offer much more possibilities due to a modular concept:*Bending up to 160 Nm*Tension/Compression up to 8 kN*Torsion
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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PXI Programmable Power Supply
PXI Programmable Power Supply modules feature multiplechannels that you can combine for higher voltage or current capabilities. Some modules include isolatedchannels and an output disconnect functionality that allows isolation from the device under test(DUT) when not in use and remote sense to correct for losses in system wiring. You can use these models to simplify the task of designing automated test systems for a wide range of applicationsfrom aerospace and defense to automotive and component testby eliminating the need to mix multiple instrumentation form factors in a given test system.
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Impulse Voltage Generator
Hilo-Test manufactures Surge generators for surge voltage and safety tests as well as for testing the insulation withstand voltage, the waveform in accordance with IEC 60060. Especially for EMC tests on photovoltaic systems and surge voltage tests, for example, to relay, capacitors, coils.
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PXI 10W Programmable Resistor Module, 2-Channel, 1Ω to 122Ω
40-253-012
The 40-253-012 is a programmable resistor module with 2 channels which can be set between 1Ω and 122Ω with 0.5Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Chamber/Pyroelectric Task
Radiant's Chamber/Pyroelectric Task sets the sample to a series of temperatures by performingGPIB control of an external thermal device. At each temperature it captures the sample’s polarization response and/or small-signalcapacitance. These are combined to calculate the pyroelectric coefficient. The Pyroelectric Task is to be used with a Radiant Test System and a Linkam Stage (-196C to 600C), Thermal Chambers, Hot Chucks, or a Furnace to automatically measure the Pulse Polarization response and Small Signal Capacitance of a Pyroelectric material that is being heated and/or cooled. Radiant's Pyroelectric measurement Task can be added to Vision at additional cost. This measurement suite fully characterizes the pyroelectric charge (polarization) response of the sample under test. The Pyroelectric Task suite controls various thermal controllers such as Quantum Design, Lake Shore, Delta Design, and many others. Detailed Listing of Thermal Controllers Registered in Vision. The Chamber/Pyroelectric Task is quoted upon request.
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50 Channel Linear Vibration Motor Aging Unit
BK2021
The BK2021 50 Channel Linear Vibration Motor Aging Test System was designed to test your linear vibration motors so you know they are working. Load a jig drawer in the jig assembly unit with 10 DUT's. Close the drawer to start testing and begin loading the next of the 5 drawers. When the machine has finished running up to 4 test sequences that you've programmed in, the drawer opens. On the front, a green light tells you the motor is good, a red light tells you there was a short and if there is no light you know there was an open circuit.
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Wafer Level Multi-Die Test System
ITC55WLMD
The ITC55WLMD series of test systems has been developed by ITC to be stand-alone UIL test systems configured specifically to test on wafer. The systems include an ITC55series UIL tester and inductor box, a current limiter module and a system controller
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4 TAP JTAG Boundary-scan Controller for Teradyne Systems
QuadTAP/CFM
The Corelis QuadTAP/CFM high-speed multi-TAP boundary-scan system makes advanced, multi-TAP boundary-scan testing within ICT systems a reality. By combining ICT and boundary-scan, test engineers gain benefits from both technologies for the highest possible test coverage, speed, and capability.Specifically designed for integration into Teradyne TestStation and GR228x testers, the QuadTAP/CFM and QuadTAP/CFM Expander enable a clean, convenient multi-TAP boundary-scan solution.
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Waveguide Harmonic Mixers (smart mixer), 50 to 75/80 GHz
M1970V
The Keysight M1970V 50 to 75/80 GHz waveguide harmonic mixer is an un-preselected mixer that will extend the operating frequency range of the N9030A PXA, N9020A MXA, and N9010A EXAsignal analyzers up to 80 GHz. Smart features are embedded to help you to greatly simplify your overall test setup and improve your DANL and TOI of your test system. Go smart with harmonic mixing for your millimeter-wave applications.
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Programmable Step Attenuator DC~50GHz, 0~115dB Att.
The programmable step attenuator achieves step attenuation over a wide frequency band. It features high attenuation accuracy, excellent repeatability, low insertion loss, and long service life. Its primary applications include controlling the amplitude of signals entering systems, regulating output signal power in systems, and adjusting impedance matching between signal sources and loads. It is widely used in various broadband spectrum analyzers, broadband vector network analyzers, broadband synthesized signal sources, noise figure test sets, and diverse microwave automatic test systems.
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Zero-distance Drop Test System
KRD40 series
KRD40 series drop tester, mainly simulates the resistance to drop and impact of large and heavy packaging products. Its strong power system and unique sample holder facilitate easy loading and unloading of oversized and overweight items and automatically rise to the setting. After the height, the drop test is completed. It can realize the drop test of the edge, surface and angle of the sample. This equipment is mainly used to evaluate the ability of product or packaging to withstand drops during transportation and loading and unloading, so as to improve product and packaging design.
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Battery Tester
CS-3001
The CS-3001 test system records all block voltages, total voltage and current during a discharge test. The modular design makes it easy to connect most of all battery installations, starting from a single block and ending up with 960 block voltages. Up to four parallel strings can be tested. All measuring modules are electrically isolated (600VDC CAT III, 5000VAC test voltage).
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PXI Precision Resistor Module 6-Channel, 3 to 1.51M
40-297-050
A simple solution for applications requiring accurate simulation of resistive sensors. The series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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802.11ad & ay (WiGig) Test System
IQgig-IF
When used in conjunction with IQgig-RF, it supports over-the-air (OTA) testing of WiGig RF modules and end-products. The IQgig family products provide total test solution for R&D characterization and high volume manufacturing.
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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PXI System for LRU Test
ARINC 629
PXI System for LRU Test Support. The system shown here was developed in support of Boeing 777 LRU Production Test.
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RF/Microwave ATE Systems
Over two decades ago, In-Phase Technologies founded our company for the purpose of designing and producing reliable high quality RF and microwave Automated Test Equipment (ATE). We continue that tradition today, providing the best, world-class automated test equipment. Our system designs bring together the right combination of Commercial Off the Shelf (COTS) test equipment, custom designed and built Interface Test Adapters (ITAs), lightning fast and accurate measurement software, and the optimum user interface to make all of this technology easy to use.
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PXI-2532B, 512-Crosspoint PXI Matrix Switch Module
782383-01
512-Crosspoint PXI Matrix Switch Module—The PXI‑2532B is a high-density PXI matrix switch module built to serve high‑channel‑count automated test systems. Featuring compact reed relays with switching speeds up to 2,000 cycles/s, the PXI‑2532B can be configured in more than 10 matrix topologies by using different terminal block accessories. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
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Multiple Module Serial Bus Test Instrument
Bi4-Series
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
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Scienlab Measurement And Control Module
SL1068B
The Measurement & Control Module SL1068B is a rack-mount measurement module which provides voltage outputs for analog signaling – useful e.g. for the emulation of temperature sensors or the controlling of regulation vents with voltage input with 8 channels. The module can be used either as a stand-alone device or as extension for a Scienlab Battery Test System.
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PXI Precision Resistor Module 3-Channel, 3 to 2.97M
40-297-151
This PXI Precision Resistor module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI Precision Resistor Module 9-Channel, 2 to 26.7k
40-297-032
This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Phase Noise Analyzer
NXA-6
This new NXA-6 is a sea-change in Phase Noise Test Systems. Making both residual and absolute noise measurements out to 6 GHz, this self-contained instrument uses either internal or external references with cross correlation for maximum dynamic range.
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Automated Calibration
ORION
ORION automates the process of characterization and calibration of engines. It facilitates the calibration process by taking control of both the ECU calibration system and the test cell control system to run experiments as part of an automated calibration process. With connectivity to IAV’s EasyDOE, Mathworks’ MBC Toolbox and other DOE tools, ORION provides an extremely powerful environment for mapping an engine and generating the Engine Management System calibration tables. The modular design means the product can be configured to a users’ specific requirements and work practices, rather than having to adhere to rigid methodologies dictated by prescriptive software.
