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In-Circuit Test System Repairs
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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High Volume Manufacturing Handling, Stimulus
ULTRA P
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Off-line Automated Liquid Handling Station
SimPrep
- Wide range of syringes from 10 μL to 50 mL- A single system can serve multiple techniques such as ICP-MS, ICP, AA, Colorimeter, IC, FIA- An extra autosampler - easily switch between sample prep and sample analysis with a switching USB hub (see below).
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System to Handle Wafer Levels
AMI AW Series
Operator-Free Wafer Inspection, Analysis and Sorting The AW Series are advanced high-capacity, high throughput automated wafer C-SAM® instruments specialized to deliver maximum sensitivity for the evaluation of wafer and device level applications.
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EMI Test System
TS9975
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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Handles for PCB Slot
No matter what kind of standard is required. We supply ejector and card handles accodring to standards like IEC, IEEE or ATCA. Additionaly, simple bolted handles for cards are available.
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In-Circuit Test System
TestStation LX
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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LTE RRM Test System
T4010S
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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The Most Versatile Stable Isotope Sample Handling Platform Ever Created
iso FLOW
Elementar Analysensysteme GmbH
The iso FLOW is the first complete platform solution for the analysis of trace and pure components of simple gases derived from air, carbonates, water, and life. Driven by a new concept in separation science, the UltiTrapTM permits cryogen-free concentration prior to dynamic chromatographic separation.
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Safety Compliance Test System
EN 60601
Test system for electrical safety compliance testing of medical products in accordance with EN 60601-1, 3rd edition.The system is equipped with three test fixtures which are connected in parallel order to reduce the number of setup tasks for different variants in the course of day-to-day manufacturing processes. Its purpose is to test medical products, e. g. patient monitors, which are employed at hospitals to monitor heartbeat and oxygen saturation.Based on the integrated electrical safety tester by Associated Research, in combination with an AC power source and a switching matrix, it is possible to fully automate tests like for instance AC/DC high-voltage tests, insulation resistance measurements, earth connection tests and leakage current measurements.The required occupational safety is provided by a high-voltage safety hood in accordance with EN 501191. The entire safety technology, as well as the control PC, is mounted in an aluminum-profile cart.
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Scan Systems
Allows its user to achieve previously unreachable levels of dynamic performance and precision.
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Systems
Datum Electronics Systems - Silo Hawk silo weighing system, Datum Hawk engine condition monitoring system, Cargo Hawk SOLAS compliant container weight verification system, and more
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Exposure Systems
Model 2012AF & 2012SM
The Model 2012AF Flood Exposure System provides a cost-effective method for automated flood exposure. Designed to accommodate wafers from 8” to 300mm, the tool features automated FOUP loading. Mask and substrate changeover can be accomplished quickly and easily adding to both versatility and high-volume throughput of this production tool.The Model 2012SM Automated Edge-bead Exposure System provides a cost-effective method for edge-bead removal using standard shadow mask technology. Designed to accommodate wafers from 8” to 300mm, the tool features automated FOUP loading. Mask and substrate changeover can be accomplished quickly and easily adding to both versatility and high-volume throughput of this production tool.
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RFIC ATE System
RI 7100A
The RI 7100A, which RI has shipped for over 10 years, has proven itself as the most advanced, reliable (> 4500 hours MTBF) and cost effective RFIC ATE System available. "Our recipe for high performance microwave test has always been dependent on an extremely elegant RF signal path while maintaining the most advanced microwave calibration software," said RI President, Mark Roos.
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Development System
FE-C450
* Emulates Dallas Semiconductors DS89C450 * 62K Code Memory * Real-Time Emulation * Frequency up to fmax at 5V * Windows Debugger For C/C++ And Assembler * 44-PLCC Emulation Header * Target Board and Programmer Included * RS-232 or USB Interface * 64K C/ASM and 8K C++ Included
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Receiver, 9025, 25 Module, Slide Mount, Telescopic Handle - Left Side
310104498
The 9025 is a 25 module receiver designed to fit into a standard 19" rack. This model is equipped with a telescopic handle on the left side. This handle is designed to rest flush against the side of the receiver as a standard handle, or can be extended out to the left up to 3" to accommodate a larger ITA enclosure or other obstruction that may prevent normal handle operation/ engagement.As with the standard 9025, a microswitch is included. Mounting flanges and an instrument bracket are also included for slide mounting. A slide kit is required, but not included. See 9025 procedure sheet/ user manual for instructions on choosing the correct slide kit length for your test rack. *Please note: Consult procedure sheet/user manual for information regarding slight slide mechanism bracket protrusion downward into next U height on test rack on both sides of receiver.
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Pulsed-DC Systems
Extend process innovation with Advanced Energy’s comprehensive pulsed-DC suite. Minimize arcing, enhance deposition rate, improve film flatness and packing density.
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Deposition Systems
When a thin film requires the most stringent structural or compositional properties consistently across every layer, Veeco’s Ion Beam Deposition (IBD) technology is often the answer. Using a focused beam of ions to sputter material from a target, this physical vapor deposition technique builds dense, uniform films with standout adhesion and stability.
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Inertial Systems
ACEINNA’s inertial systems provide end-users and systems integrators with fully-qualified MEMS-based solutions for measurement of static and dynamic motion in a wide variety of challenging environments, including; avionics, remotely operated vehicles, agricultural and construction vehicles, and automotive test.
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Hub of the System
Net-ESVR
The Enterprise Server NET-ESVR is a hub of the system. Its central role is to receive every 5 seconds the alarm status of each probe NET-XXX and to store the status and update system alarm matrix. It also provides communication with the multiple Clients NET-NMSC.
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System
SYS-24
The system shown here was built for a customer to be used in metallization, a common use for many smaller systems. It is also fully capable of performing optical coatings when equipped to do so. This particular system came equipped with a 16" APD ISO Flange mounted cyropump, and a Varian tri-scroll for roughing. The cooling tubes for the crystals as well as the drive motor for the parts holder can be seen on the top of the chamber.
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Test System
2000/DATS
WesTest Engineering Corporation
The WesTest-2000/DATS features Teradyne's high performance Digital Test Instrument and state-of-the-art intrsuments from Agilent, Elgar and North Atlantic.
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Control Systems
Complete real-time control and data acquisition solutions for hydraulic and servo-hydraulic applications. Don’t have the time or budget for a fully custom-built test system? Consider one of Genuen’s turnkey solutions for multi-loop control and data acquisition. We offer powerful, flexible solutions ranging from low cost desktop controllers to pre-configured rack systems, all standardized on the same technology platform.
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Enhanced Vision Systems for Aviation
Astronics offers the world’s most widely deployed enhanced vision systems for airframe OEMs and general aviation pilots. Used in search and rescue, firefighting, police, construction, and other critical missions, our EVS units are improving visibility and safety every day on fixed-wing and rotorcraft worldwide.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Test Systems
In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Vision Systems
Starrett Video-based measurement systems combine high-resolution images, powerful intuitive software and precision mechanical platforms to deliver superb accuracy and repeatable measurement results for a wide range of precision measurement applications.
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Burn-in System
Sonoma
High power burn-in system with advanced testing functionality at DUT level for substantially lower cost and high performance using State-of-the-Art technology
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PLD Systems
Pulsed Laser Deposition
Is a versatile thin film deposition technique. A pulsed laser (~20 ns pulse width) rapidly evaporates a target material forming a thin film that retains target composition. This unique ability of stoichiometeric transfer of target composition into the film was realized first by the research team led by Dr. Venkatesan at Bell Communications Research, NJ, USA, nearly 30 years ago while depositing high temperature superconducting (YBa2Cu3O7) thin films. Since then, PLD has become the preferred deposition technique where ever thin films of complex material compositions are considered. Another unique feature of PLD is its ability for rapid prototyping of materials. The energy source (pulsed laser) being outside the deposition chamber, facilitates a large dynamic range of operating pressures (10-10 Torr to 500 Torr) during material synthesis. By controlling the deposition pressure and substrate temperature and using relatively small target sizes, a variety of atomically controlled nano-structures and interfaces can be prepared with unique functionalities.





























