Wafer Level
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Product
Wafer/Dicing Frame Prober
WDF 12DP+
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The WDF 12DP is a prober/handler capable of transporting and testing standard 300-mm wafers and dicing frames without need of a changeover kit. To support multiple tests after dicing, it has a special positioning function that differs from former types, as well as image-processing functions such as wafer level packaging.
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Product
System to Handle Wafer Levels
AMI AW Series
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Operator-Free Wafer Inspection, Analysis and Sorting The AW Series are advanced high-capacity, high throughput automated wafer C-SAM® instruments specialized to deliver maximum sensitivity for the evaluation of wafer and device level applications.
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Product
High Voltage 50 Ω Pulse Generator
TLP-3010C
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High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±8 kV*High pulse output current up to ±30 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components
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Product
High Voltage 50 Ω Pulse Generator
TLP-4010C
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High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±10 kV*High pulse output current up to ±40 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components
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Product
Wafer Test
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Silicon Turnkey Solution, Inc.
Most foundries provide wafers already probed to a set of DC parameters at room temperature to ensure they meet a basic subset of the package-part specification. Beyond this basic set of tests, more rigorous testing is often needed to meet specifications requiring die to be 100 percent probed, identify and segregate devices with higher performance levels and guarantee that parts will perform to a certain specification level.
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Product
Wafer Sorter and Inspection
SolarWIS Platform
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Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
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Product
Level Measurement
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Displacer level gauge for liquids from KOBOLD Instruments operates on the Archimedes principle. The level gauge's displacer tube rests inside the tank and is connected to the measuring unit via a spring. As liquid level increases, the buoyant forces of the liquid act on the displacer tube to reduce spring tension, allowing the spring to expand. The spring connects to a magnetic actuator, and the motion of the actuator is picked up by a magnetically linked indicator to yield the tank level measurement. The displacer level gauge is calibrated at the factory for the user's specified liquid density. Special designs with higher pressure or temperature ratings, as well as those made of exotic materials, are always available on request.
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Product
Silicon & Compound Wafers
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Compound semiconductors are undergoing a major expansion addressing many new applications and using various materials such as SiC, GaN, GaAs and others, to improve the performance of new devices in several segments such as Power and Face Recognition.
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Product
Level Controllers
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Measure and control fluid levels in a contained area or facilitate automatic filling and emptying operations with Omega's dependable single and multi-sensor level controllers.
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Product
Wafer Edge Profile Measurement
WATOM
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WATOM can carry out fully automatic, non-contact measurements of the edge profiles and diameter in accordance with SEMICON standards. A special feature is the system's ability to make measurements of the mark cut into the edge of the wafer to indicate the crystal orientation. Because of its high measurement accuracy of less than 1.5 µm, leading wafer manufacturers across the world use WATOM for shop-floor geometrical quality control.
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Product
WAFER MVM-SEM
E3300 Family
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The E3310 is a WAFER MVM-SEM* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
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Product
Ultrasonic Wafer Scanner
AutoWafer
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Installed in more wafer applications than all other automatic ultrasonic testing tools combined, AutoWafer provides a complete, production-ready wafer scanner for wafers from 100mm to 200mm, including multiple sizes in a single batch.
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Product
Level Measurement
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Omega provides contact and non-contact instruments for liquids, and non-contact instruments for solids. Choose from continious measurement or point level measurement with one of our level switches.
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Product
Solar Wafer Transfer Tool
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises Solar Wafer Transfer Tool
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Product
Wafer Demounting And Cleaning Machines
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Demounting and cleaning to high throughput fully automatic ingot after cutting in the slicing machine and wire saw.
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Product
LED Tester For Chip And Wafer
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Electrical Testing: Forward：VF,DVF,VFDReverse：VZ,IROptical Testing: can test LOP in cd/mcd/W/mW/lm... from different optical componentsWavelength λp,λd,λc,hw,purity,(x,y),CCT,CRIFour-wire measurement and contact resistance in case of deviation.Auto polarity identification and preheat function.Compatible mechanical interface.Optional ESD static test system or polycrystalline test system
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Product
Wafer & Die Inspection
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SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
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Product
Sound Level Meter
3M SE-402 | VP 185057
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Maschinenbau Haldenwang GmbH & Co. KG.
The 3M SE-402 of quality class 2 is the ideal sound level measuring device for almost every acoustical environment. The frequency weighting can be done according to the characteristics A, C and Z and the time weighting can be set to 'Fast' or 'Slow'. Ergonomically arranged buttons and the clear digital display (resolution 0.1 dB) ensure a high level of user-friendliness.
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Product
Sound Level Meter
SoundExpert LxT
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The Larson Davis SoundExpert LxT Sound Level Meter is a full-featured meter designed for general product evaluation and noise monitoring applications. SoundExpert LxT comes with a graphic display and a fixed set of firmware options applicable for these applications. It is available as a general hand-held meter or data acquisition tool and also in a short-term noise monitoring kit. The meter expands upon the Larson Davis tradition of delivering value, innovation and function in a rugged, single-handed package, and is backed by our 2-year factory warranty, 24-hour application support, and accredited factory service/calibration.
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Product
Portable Wafer Probe Station
PS-5026B
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High Power Pulse Instruments GmbH
The PS-5026B is a rugged portable wafer probing solution which has been designed for high reliability, compact size and minimum cost.
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Product
Radar Level Gauge
HRRD730 Series
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HighReach Measuring & Controlling System Co.,Ltd
At The Radar Level gauge Antenna emits and Narrows at The Microwave Pulse. This Pulse propagates in Space AT at The Speed of Light. The When IT Encounters at The Surface of at The the Measured Medium, Part of the ITS Energy IS the REFLECTED the Back and Received by at The Same, Antenna. At The Time interval The Between the transmitted pulse and the received pulse is proportional to the distance from the antenna to the surface of the measured medium.Because the electromagnetic wave propagation speed is extremely high, the time interval between the transmitted pulse and the received pulse is very small (on the order of nanoseconds). It is difficult to confirm. The 90X series 26G radar level gauge uses a special demodulation technology To accurately identify the transmitted pulse and the time interval of the pulse is received to further calculate the distance of the antenna from the surface of the measured medium.
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Product
Level Switch
Z-Tron IV
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The Z-Tron IV level switch is one of our most popular on/off level switches offering an effective, low-cost material level detection in a wide variety of applications. It is widely used as an alternative to electromechanical level switches.
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Product
Wafer ESD Tester lineup
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Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
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Product
Water Levels Tools
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Zircon’s line of indoor and outdoor electronic leveling tools are ideal for everyone whether they are professionals or hobbyists. Learn more about our WL25 Water Level and WL25 Pro Water Level here.
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Product
Liquid Level Sensors
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Are used to detect liquid levels or interfaces between liquids such as oil and water or liquids and solids. They can be defined as sensors or transducers, or as integrated systems with instrumentation and control capabilities.
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Product
Sound Level Calibrator
511E
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Accepted internationally 1 kHz represents the "0 dB" reference point of A, B, C Weighting and other filters utilized in acoustic measurement. The Pistonphone - a mechanical sound source - offers a slightly higher degree of accuracy at a substantial increase in cost. In addition, the 200 or 250 Hz operating frequency is mechanically limited and not suited for measurements of filtered inputs. The 0.2 dB accuracy is quickly lost in the 0.7 to 1.5 dB tolerances acceptable for weighting filters at frequencies around 250 Hz.
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Product
Wafer Analyzer
RAMANdrive
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RAMANdrive is the specialized Raman microscope for wafer analysis equipped with our dedicated 300 mm stage. RAMANdrive gives you an ultra-fast, highest resolution analysis of the whole wafer with unique stability and accuracy
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Product
Signal Level Meters
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Wuhan Sunma Technology Co., Ltd.
Signal Level Meter is specially designed and manufactured for CATV system installation and testing. It‘s a portable instrument, easy to carry with many functions.It can test CATV signal level both at channel and frequency mode. Also it can measure CATV TILT,C/N, trunk cable Voltage, ect. The big character TN LCD clear1y displays all testing results. It especia1ly fit for CATV station as a professional measurement instrument. it can display 2 channels at the same time.
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Product
Sound Level Meter
DE-3301
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LCD Display4 digits LCD DisplayLow Battery display on LCDMeasuring Range30~130dBFrequency WeightingA,CDynamic Range50dBFrequency Range31.5Hz~8kHzTime WeightingFast125 ms
