Wafer Level
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Product
MPI Automated Probe Systems
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MPI Advanced Semiconductor Test
MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.
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Product
High Voltage 50 Ω Pulse Generator
TLP-8010A
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High Power Pulse Instruments GmbH
*Wafer and package level TLP/HMM testing*Fast 50 Ω high voltage pulse output with typical 300 ps rise time*Up to 80 kW peak output power into 50 Ω load*Built-in HMM pulse up to ±15 kV with 50 Ω-configuration*High pulse output current up to ±80 A (short circuit) with 6 dB reflection suppression*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 GPIB programmable pulse rise times: 300 ps to 50 ns*1 built-in pulse width: 100 ns*Optional external pulse width extensions 5/10/50/100/200/500 ns using an external pulse width extender TLP-8012A5*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurements of complete wafers*High performance and high quality components
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Product
Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
High Voltage 50 Ω Pulse Generator
TLP-3010C
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High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±8 kV*High pulse output current up to ±30 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components
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Product
Wafer & Die Inspection
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SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
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Product
Wafer Sorter and Inspection
SolarWIS Platform
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Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
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Product
Level Sensors
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*High reliability due to the elimination of mechanical components*Different function principles: Guided wave radar, capacitive and hydrostatic*Devices for limit level detection or continuous level measurement*Clearly visible LED display*Suitable for all common industrial and process fluids
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Product
Level Measurement
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HighReach Measuring & Controlling System Co.,Ltd
The process of measuring the level of a liquid or solid material inside a vessel for monitoring and process control.
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Product
Silicon & Compound Wafers
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Compound semiconductors are undergoing a major expansion addressing many new applications and using various materials such as SiC, GaN, GaAs and others, to improve the performance of new devices in several segments such as Power and Face Recognition.
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Product
Wafer Test
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Silicon Turnkey Solution, Inc.
Most foundries provide wafers already probed to a set of DC parameters at room temperature to ensure they meet a basic subset of the package-part specification. Beyond this basic set of tests, more rigorous testing is often needed to meet specifications requiring die to be 100 percent probed, identify and segregate devices with higher performance levels and guarantee that parts will perform to a certain specification level.
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Product
Wafer Flatness Measurement System
FLA-200
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*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Product
Level System
Universal II
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The Universal II level transmitter offers increased reliability, low maintenance and an intrinsically safe design for dependable level measurements in all kinds of process liquids, slurries, granulars and interfaces.Universal IIThe Universal II is a two wire level transmitter that eliminates the need for line power in the field and saves costs for additional hardware. It provides reliable level measurements in all kinds of process liquids, slurries, granulars and interfaces.When powered from an approved source this level transmitter can be made intrinsically safe. Its rugged contruction resists corrosion and abraision. The no moving parts design eliminates break downs.The Universal II level transmitter utilizes RF Admittance technology with manual calibration and a 4 – 20 mA output signal. The patented Cote-Shield circuitry ensures accuracy and reliability regardless of product build-up on the level transmitter.This level system is unaffected by changes in the process material density, pressure, or temperature variations.
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Product
Level Controllers
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Measure and control fluid levels in a contained area or facilitate automatic filling and emptying operations with Omega's dependable single and multi-sensor level controllers.
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Product
Sound Level Meter
SoundTrack LxT
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The SoundTrack LxT® Sound Level Meter was developed to meet the unique needs of those involved in workplace noise exposure assessment and plant noise surveys.
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Product
DVB-Signal Level Meters
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PeakTech Prüf- und Messtechnik GmbH
Is a comprehensive multifunction measuring device for channel levels from DVB systems. Channel searches for cable, satellite or terrestrial systems can be carried out, channel lists can be created and managed, or satellite systems can also be aligned.
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Product
Liquid Level Switch
CL-10GH
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The Dynatrol® CL-10GH Liquid Level Detector and EC-501A(G) Control Unit is used for high, intermediate or low point level detection of liquids and slurries. A unique vibrating principle permits design and operation features not available with other types of liquid level detectors.
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Product
Level Switches
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Omega can meet your level measurement requirements by offering switches of various technologies including capacitance and conductivity, tuning fork, ultrasonic, optical, and rotating paddle switches.
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Product
Continuous Level Measurement
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Drexelbrook manufactures a full range of continuous level measurement instruments, providing the highest level of performance for liquids, slurries and bulk solids applications. With a wide variety of technology options, Drexelbrook is uniquely qualified to properly evaluate and recommend the very best solution for your application.
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Product
Sound Level Calibrator
521
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Accepted internationally 1 kHz represents the "0 dB" reference point of A, B, C Weighting and other filters utilized in acoustic measurement. The Pistonphone - a mechanical sound source - offers a slightly higher degree of accuracy at a substantial increase in cost. In addition, the 200 or 250 Hz operating frequency is mechanically limited and not suited for measurements of filtered inputs. The 0.2 dB accuracy is quickly lost in the 0.7 to 1.5 dB tolerances acceptable for weighting filters at frequencies around 250 Hz.
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Product
Audio Level Analyzer
BK3011C
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In keeping with our goal of constant improvement, we have upgraded our BK3011 MEMS mic tester! The BK3011C is more modular, easier to connect and with the new Test Shop upgrade, easier to use. But the basic features are still the same. Then BK3011C enables you to check mic characteristices over a frequency range using a stable, constant SPL sweep. It still produces both graphs and numerical data but now will automatically classify both PASSing and FAILing DUT's so you can keep track of quality issues and trends.
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Product
Non-Contact Level Sensors
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Omega's Non-Contact Level Sensors include Pulse Radar and Ultrasonic Transmitters for liquids, and Pulse Radar Transmitters for solids. Pulse Radar are available in intrinsically safe designs.
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Product
Level Translators
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Renesas offers a 6-channel bidirectional, auto-direction sensing, level translator that simplifies the interface between two logic ICs operating at different supply voltages.
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Product
Package Level Test
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Applicable for burn-in, reliability andlife testingACC and APC control modesIndividual channel driving and measurementDriving current 500mA per channel
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Product
Non-Contact Level Transmitters
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Three operate at 24 GHz and three more at 80 GHz which complement the existing 6 GHz and 10 GHz devices. They will appeal to a wide range of industries from chemical and petrochemical to mining, minerals and metals processing and cover liquid and solid applications.
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Product
Specialty Level Instruments
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As a comprehensive provider of level measurement products, ABB offers a variety of specialty level instruments that complement field instrumentation to provide the customer with the total level solutions.
