Wafer Level
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Product
MPI Automated Probe Systems
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MPI Advanced Semiconductor Test
MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.
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Product
Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System
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The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
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Product
Probe Card
T90™ Series
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The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.
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Product
Bond Tester for Wafers 2 - 12 inch
Sigma W12
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Bondtester for wafers or at wafer level 2” – 12” (up to 300 mm)Precise testing and Cold Bump Pull (CBP) testingLarge X/Y stages X: 600mm, Y: 370 mmForce range from 1gf – 10 kgfBump pitch down to 20 µm
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Product
Wafer Test
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Based on the reliability test, CSE conducts the test of the IC chip through electrical signals to the semiconductor wafer. We provide various Test Solutions according to the needs of designers/manufacturers. by sorting out good and bad products.
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Product
Wafer Tester
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Tokyo Electronics Trading Co., Ltd.
A vital step in the Semiconductor Value Stream, focusing on electrical screening and consumption of Known Good Die (KGD).
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Product
Wafer Sort
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TestEdge offers complete wafer sort solutions. Our range of wafer sort capabilities demonstrates our ability to handle a wide range of devices and device characteristics. State of the art Electroglas probers Sort experience with high probe count Less than 4 mil pitch on probes Experience with C4 Bump and Aluminum pad Experience on Bipolar, CMOS, GaAs, & SiGe Overhead sort or cable harness sort Microsite testing capability
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Product
Wafer Analyzer
RAMANdrive
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RAMANdrive is the specialized Raman microscope for wafer analysis equipped with our dedicated 300 mm stage. RAMANdrive gives you an ultra-fast, highest resolution analysis of the whole wafer with unique stability and accuracy
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Product
Level Measurement
Level Measurement
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AMETEK Sensors, Test & Calibration
B/W Controls uses the same advanced magnetostrictive technology as in Gemco products providing high accuracy and reliability for continuous liquid level measurement.
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Product
In-situ Wafer Temperature Monitoring
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CI Semi's family of noncontact temperature monitors (the NTM line), offers high end pyrometry products for the measurement of wafer temperatures during process. CI Semi’s flag ship of the line, the NTM Delta, incorporates real-time, same point emissivity measurement and compensation making it the ideal solution for in situ monitoring for processes such as RTP, CVD and PVD. The NTM family is sold to leading tool manufacturers.
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Product
Contactless Wafer Geometry Gauge
MX 20x series
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The E+H geometry gauges are based on two heavy plates mounted parallel to each other. Embedded in the plate are a set of capacitive distance sensors. The wafer will be moved manual or automatically between the plates and measured without any movement.
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Product
Wafer Demounting And Cleaning Machines
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Demounting and cleaning to high throughput fully automatic ingot after cutting in the slicing machine and wire saw.
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Product
Wafer Probe Loadboards/PIB
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DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. DTS wafer test loadboards are compatible with a variety of pogo pin interface towers. All PIBs are constructed with impedance control, precision matched line lengths, full power and ground planes and both analog and digital resources to provide high quality signal integrity directly to the device.
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Product
Wafer Back Side Cooling System
GR-300 Series
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The GR-300 Series can control gases used to cool the back side of wafers that are fixed in position by an electrostatic chuck system.The stability and accuracy of the GR-300 makes it ideal for controlling the flow of Helium and Argon in wafer cooling systems.
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Product
Level Translators
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ADI’s level translators offer the most flexible level translation solutions in the industry. The ADG3241 series translators allow direct 3.3 V to 1.8 V translation by means of the innovative SEL pin function while allowing bidirectional data transfer. The ADG3231 series allows wide range 1.65 V to 3.6 V translation and the ADG3308 series allows the industry's widest 1.2 V to 5.5 V up or down translation while permitting bidirectional data transfer.
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Product
Specialty Level Instruments
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As a comprehensive provider of level measurement products, ABB offers a variety of specialty level instruments that complement field instrumentation to provide the customer with the total level solutions.
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Product
Wafer Test Solutions
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Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.
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Product
Solar Wafer Transfer Tool
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises Solar Wafer Transfer Tool
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Product
Level Switches
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Omega can meet your level measurement requirements by offering switches of various technologies including capacitance and conductivity, tuning fork, ultrasonic, optical, and rotating paddle switches.
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Product
Sound Level Meters
Optimus
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The Optimus Sound Level Meters are a range of high performance sound level meters that use the very latest technology to provide you with a simple and accurate tool to measure and record noise levels. Combining the latest digital technology with ease of use. Class 1 & Class 2 to IEC 61672-1:2013 & IEC 61672-1:2002. High performance guaranteed - Class 1 & Class 2 Sound Level Meters.
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Product
Liquid Level Sensors
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Are used to detect liquid levels or interfaces between liquids such as oil and water or liquids and solids. They can be defined as sensors or transducers, or as integrated systems with instrumentation and control capabilities.
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Product
Photonics Wafer Probing Test System
58635
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The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
Level Transmitter (Immersion)
LS
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● Outer diameter Φ 28 stainless steel shell, rugged exterior is easy to install● 3 sealing process, rigorous and reliable sealing● High accuracy, high stability, low cost● Signal isolation amplifier, anti-jamming● PTFE breathable cable
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Product
Magnetostrictive Level Transmitter
DM330
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The Drexelbrook DM330 magnetostrictive level transmitter is a two wire loop powered intrinsically safe sensor with a configurable 4 -20 mA span.This level transmitter uses proven machine tool positioning accuracy combined with a process compatible float to offer a liquid level, and interface measurement system for the process industry.It comes in a patented low clearance design with all of the sensor’s electronics integrated in a 5/8” diameter sensing tube eliminating the electronics enclosure at the top of the sensor. Not only does this result in reduced cost it also offers its user greater options for insertion and mounting.The DM330 is available in two models.The rigid 316SS model offers a choice of a mini-connector or an optional housing including terminal connectors with zero and span adjustments.
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Product
Wafer Thickness Measurement System
MPT1000
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Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
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Product
IK Level Tester
IK07-10
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IK ratings are defined as IKXX, where “XX” is a number from 00 to 10 indicating the degrees of protection provided by enclosures (including luminaires) against external mechanical impacts. The different IK ratings relate to the ability of an enclosure to resist impact energy levels measured in joules (J). IEC 62262 specifies how the enclosure must be mounted for testing, the atmospheric conditions required, the quantity and distribution of the test impacts and the impact hammer to be used for each level of IK rating. The IK test applicate on lighting luminaires test according to IEC60598 (GB7000) and IEC60068-2-75 (GB2423.55).
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Product
Sound Level Calibrator
521
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Accepted internationally 1 kHz represents the "0 dB" reference point of A, B, C Weighting and other filters utilized in acoustic measurement. The Pistonphone - a mechanical sound source - offers a slightly higher degree of accuracy at a substantial increase in cost. In addition, the 200 or 250 Hz operating frequency is mechanically limited and not suited for measurements of filtered inputs. The 0.2 dB accuracy is quickly lost in the 0.7 to 1.5 dB tolerances acceptable for weighting filters at frequencies around 250 Hz.
