Total Reflection X-ray Fluorescence
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Total Reflection X-ray Fluorescence (TXRF) Services
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A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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Total Reflection X-Ray Fluorescence (TXRF) Products
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Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
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TXRF Spectrometers
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Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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TXRF Spectrometers
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Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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X-ray Fluorescence
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XRF is an elemental analysis technique with unique capabilities including (1) highly accurate determinations for major elements and (2) a broad elemental survey of the sample composition without standards. For example, XRF is used in analysis of rocks and metals with an accuracy of ~0.1% of the major elements.
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X-ray Fluorescence Spectrometers
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Is a non-destructive analytical technique used to determine the elemental composition of materials.
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X-ray Fluorescence Spectrometer
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X-ray fluorescence spectrometer that provides quick, easy elemental analysis using touch screen operation. It is equipped with functions for conventional qualitative and quantitative analysis (FP method, calibration curve method), as well as screening for RoHS elements. With a variety of both hardware and software options available, it is customizable to cover a wide range of analysis needs.
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X-Ray Fluorescence Analyzer
MESA-50
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HORIBA has been selling the XGT-WR series of EDXRF analyzers for many years, providing screening measurements of samples containing hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS, ELV, and Cl for halogen free applications.XGT systems are used daily throughout the world. HORIBA has now developed the new MESA-50 EDXRF analyzer, based on its long experience with customer requirements and knowledge. MESA-50 provides user friendly operation and good performance. MESA-50 includes three analysis diameters, suitable for every sample, from thin cables and electronic parts to bulk samples. The combination of SDD detector and Digital pulse processor(DPP) changes the image of EDXRF.HORIBA's new MESA-50 supports ecological procurement; it contributes not only to EU RoHS and ELV compliance testing, but also regulatory work for many other countries.
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Wavelength Dispersive X-ray Fluorescence Spectroscopy
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Wavelength Dispersive X-ray Fluorescence Spectroscopy
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY 5000
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Inline measuring with highest precision for thin films. Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
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X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-20
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The SLFA-20 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
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X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
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Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
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UV Fluorescence Total Reduced Sulfur Analyzer
Model T102
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The Model T102 TRS analyzer uses the proven UV fluorescence principle to measure Total Reduced Sulfur at levels commonly required for ambient air monitoring.The Model T102 uses a high temperature external converter set at 850°C to allow conversion of H2S, methyl mercaptan, dimethyldisulfide, and methyl-disulfide to SO2 at this temperature with efficiency greater than 98%. A switching option alternately measures TRS and SO2 while showing both readings concurrently on the front display.All T Series instruments offer an advanced color display, capacitive touch screen, intuitive user interface, flexible I/O, and built-in data acquisition capability. All instrument set up, control and access to stored data and diagnostic information is available through the front panel, or via RS232, Ethernet, or USB com ports, either locally or by remote connection.The Model T102 comes with NumaView ™ Software. NumaView™ Remote PC Software allows for a remote connection with virtual interface and data downloading capability to analyzers operating NumaView ™ Software.
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Reflectance Standards
STAN Series
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Ocean Optics offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin film coatings. The STAN-SSH varies in reflectivity from 87%-98% over the 200-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2500 nm.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDAL®
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Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
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Continuous Particulate Monitor with X-ray Fluorescence
PX-375
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There has been a growing concern regarding particulate matter (PM) pollution and its effects on health. For effective preventative measures, the determination of source PM concentration is extremely important. Therefore, indication of PM and elemental concentrations is critical. The PX-375 analyzer employs automatic sampling, continuous on-line PM quantitative and qualitative analysis for rapid air pollution measurements.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
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Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
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Total Stations
Zoom40 Series
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The Zoom40 manual total station, with its high resolution color and touch display, gives you the flexibility to run X-PAD, Field Genius, SurvCE, or any custom windows CE software.
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Energy Dispersive X-ray Fluorescence Spectrometer
EDX-LE
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EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability. The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive.
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Total Stations
Zoom50 Series
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When you need highest performance on all levels even under most challenging conditions, the GeoMax Zoom50 series is the perfect choice for you. The longer measurement range means a wider operational coverage and significant less time lost with switching setups. The new PowerLock protection mechanism prevents use by unauthorized persons and deters theft.
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Transmission / Reflection Measurement
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Measure spectral transmittance and reflectance of optical elements such as lens, plate glass, filter, reflector, prism and so on.The wavelength range is 350 to 1100 nm as standard and 220 to 2000 nm as an option.Reflection measurement of a general spectrophotometer can only measure several types of fixed angles, but in this device the incident angle of the sample at the time of reflectance measurement is variable at an arbitrary angle and the minimum incident angle at reflectance measurement is 15 ° ( Optical axis angle 30 °) can be set up.
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Fluorescence Microscopes
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Bruker’s suite of fluorescence microscopy systems provides a full range of solutions for life science researchers. Our multiphoton imaging systems provide the imaging depth, speed and resolution required for intravital imaging applications in neuroscience, oncology and immunology. Our confocal systems enable cell biologists to study function and structure using live-cell imaging in cell cultures and invertebrate model organisms at speeds and durations previously not possible. Bruker’s super-resolution microscopes are setting new standards with quantitative single molecule localization which allows for the direct investigation of the molecular positions and distribution of proteins within the cellular environment. Our latest addition, Luxendo light-sheet microscopes, are revolutionizing long-term studies in developmental biology and investigation of dynamic processes in cell culture and small animal models.
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Fluorescence Microscope
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Our range of products include classic fl fluorescence microscope, optima fl led fluorescence microscope, optima fl fluorescence microscope, ultima fl fluorescent microscope, zoomstar fl fluorescence microscope and crown fl led trinocular medical microscope.
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Total MIPI Solutions
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MIPI Standards starting with it's active participation as a Contributor to the MIPI Association in 2004 followed by the launch of the Industry First MIPI IP's the CSI, DSI and D-PHY IP Cores. With over 10 years of MIPI experience, Arasan has the broadest library and foundry history.
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Fluorescence Spectrophotometry
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Agilent’s fluorescence systems, built by a global leader in fluorescence technology and molecular spectroscopy, are used by labs all over the world. The unique Xenon flash lamp technology in our Cary Eclipse Spectrophotometer delivers superior flexibility and sensitivity, and is ideally suited for use with fiber optic technology and bio-sample analysis. The Cary Eclipse is a high-performance workhorse for your analytical needs, providing robust, consistent results in every application.
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Fluorescence and Absorbance Spectrometer
Duetta
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Duetta™ is a spectrofluorometer that combines, simultaneously, the functions of fluorescence and absorbance spectrometers. Thanks to its high-speed built-in CCD detector, the Duetta can acquire a full spectrum from 250 nm to 1,100 nm in less than one second, making it the fastest fluorescence spectrometer on the market.
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X-Ray Cameras
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A range of scientific camera solutions optimized for high energy / X-Ray detection.
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X-ray Fluorescence
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XRF analysis – one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed.
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Reflectance Standards
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Diffuse reflectance calibration standards in white or different grey levels. Traceable calibration for the wavelength range from 250 nm to 2450 nm.
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Fluorescent Light Tester
1000FLT
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The Fluke 1000FLT performs all five essential tests with one compact tool. If your job requires keeping large numbers of fluorescent lights shining, the Fluke 1000FLT is an indispensable tool that saves time and money.
